Class / Patent application number | Description | Number of patent applications / Date published |
356320000 | Having plural wavelengths | 12 |
20080285029 | Calibration Device for a Spectrophotometric System - A method and apparatus for calibrating an NIRS system which includes a sensor portion ( | 11-20-2008 |
20090009761 | SPECTROPHOTOMETER AND LIQUID CHROMATOGRAPHY SYSTEM - Detection sensitivity is improved by increasing the amount of light of beams that irradiate a sample cell without causing saturation of a detector with ultraviolet beams or visible beams. This spectrophotometer includes a sample cell, which stores a sample to be measured, a visible light source and an ultraviolet light source each for supplying an incident beam that enters the sample, a spectroscope, which disperses a beam that has passed through the sample, an optical detector, which detects beams dispersed from such beam (spectrum), and a dichroic element which reflects or transmits ultraviolet beams from the ultraviolet light source and which transmits or reflects visible beams from the visible light source. Optics are configured such that ultraviolet beams and visible beams that have passed through or have been reflected by the dichroic element enter the sample cell. | 01-08-2009 |
20090103085 | Method and Apparatus for Spectrophotometric Characterization of Turbid Materials - Method and apparatus for spectrophotometric characterization of turbid materials are provided. An incident light beam is used to illuminate a turbid material sample and optical signals of coherent reflectance, diffuse reflectance, collimated transmittance and diffuse transmittance are measured from the sample as functions of wavelength. The following optical parameters are determined as functions of wavelength for spectrophotometric characterization of the turbid material sample in the spectrum of interest: absorption coefficients μ | 04-23-2009 |
20090303475 | Multi-wavelength light source for spectroscopy - The invention discloses a multi-wavelength semiconductor light source comprising a plurality of semiconductor light sources mounted on a silicon sub-carrier and emitting radiation spanning a wavelength range. In preferred embodiments, these sources are configured in a linear and circular array. The radiation is coupled to a waveguide array disposed on the same silicon subcarrier, with a lower cladding of silicon dioxide and deposited core layer which is preferably the spin-on epoxy resin SU-8. Output from the waveguide array provides a compact multi-wavelength laser source with wide tuning range via a plurality of laser sources. An output spatial span of the waveguide array is smaller than an input spatial span and sufficiently small to probe the properties of a sample. A compact system for optical spectroscopy is constructed from the multi-wavelength semiconductor light source, a means for directing radiation from the source to a sample, and an optical detector configured to detect one of a radiation reflected from and transmitted through said sample. In various preferred embodiments, the semiconductor light sources can comprise lasers, light-emitting diodes, and superluminescent diodes. | 12-10-2009 |
20100231905 | Method and Apparatus for Performing Spectroscopy Downhole with a Wellbore - An analysis system, tool, and method for performing downhole fluid analysis, such as within a wellbore. The analysis system, tool, and method provide for a tool including a spectroscope for use in downhole fluid analysis which utilizes an adaptive optical element such as a Micro Mirror Array (MMA) and two distinct light channels and detectors to provide real-time scaling or normalization. | 09-16-2010 |
20110026021 | Optical Assemblies For Low Cost Spectral Imaging With High Spectral Resolution - The optical assemblies disclosed herein advantageously utilize a beamsplitting apparatus in association with either (i) the illumination path or (ii) the collection path of a color measurement instrument. For implementations involving the illumination path, the beamsplitting apparatus may be configured to spectrally divide one or more initial beams of light so as to emit a plurality of resultant beams of light, wherein the optical assembly is configured to illuminate a target using at least a first and a second of the plurality of resultant beams of light. Similarly, for implementations involving the collection path, the beamsplitting apparatus may be configured to spectrally divide light received from a target so as to emit a plurality of resultant beams of light, wherein the optical assembly is configured to detect at least a first and a second of the plurality of resultant beams of light. Advantageously, each of the first and second resultant beams of light is a product of a distinct set of one or more spectral constraints exacted by the beamsplitting apparatus. | 02-03-2011 |
20110188036 | MONOCHROMATIC MEASUREMENT SYSTEM - The present invention relates to a monochromatic measurement system. The system mainly includes a monochromator, a light-detecting device and a filter device. The monochromator functions to split light under test into respective light beams with different wavelengths. The filter device modulates the transmission efficiency of the respective light beams, so that the wavelengths of the light beams to which the light-detecting device displays a better response have a lower transmission efficiency while the wavelengths of the light beams to which the light-detecting device displays a lower response have a higher transmission efficiency. The response values measured by the light-detecting device with respect to different wavelength intervals are normalized accordingly. The measurement errors attributed to the measurement precision of the instrument and the environmental noise are independent from the variation of wavelength. The reliability of the measurement instrument is elevated. | 08-04-2011 |
20110273709 | Spectrophotometer - A spectrophotometer comprising a monolithic semiconductor substrate, one or more wavelength dispersing means, and one or more wavelength detecting means, wherein the monolithic substrate ( | 11-10-2011 |
20120019822 | METHOD FOR MEASURING AND METHOD FOR VIEWING A WAVE SURFACE USING SPECTROPHOTOMETRY - A method for measuring a wave surface of an optical component formed of a stack of at least two layers of different refraction indices from reflection or transmission measurements of points located on a face of the said optical component. | 01-26-2012 |
20120250015 | High-Resolution Spectral Volume Sampling - For high-resolution spectral volume sampling, a band-pass filter spectrally filters electromagnetic radiation from a scene to wavelengths within a specified wavelength range. A slit array is located at an image of the scene and includes a plurality of slits arranged in parallel. Each slit has a specified width and a specified spacing between slits. Each slit further transmits the electromagnetic radiation. A dispersion device disperses the transmitted electromagnetic radiation from the slit array with a specified dispersion while focusing the transmitted electromagnetic radiation onto a detector array so that each wavelength of electromagnetic radiation from each slit is focused as a unique, non-overlapping line on the detector array. | 10-04-2012 |
20130010293 | SPECTROPHOTOMETER, SPECTROPHOTOMETER TOOL, SPECTROPHOTOMETRIC METHOD, AND RECORDING MEDIUM - A light emitter emits light with a plurality of wavelengths towards a test object held in a spectrophotometer tool. A light receiver receives the light passing through the test object. A detector detects absorbances of wavelength components from the light received by the receiver. An optical path length calculator compares, in the absorbances of the wavelength components detected, a wavelength component absorbance of light absorbed by a pigment that absorbs light with a wavelength other than a wavelength of light absorbed by an analyte in the test object and a predetermined value of the wavelength component absorbance to calculate an optical path length passing through the test object. A corrector corrects the wavelength component absorbance detected excluding the wavelength of the light absorbed by the pigment using the optical path length calculated by the optical path length calculator to calculate a corrected wavelength component absorbance in a reference optical length. | 01-10-2013 |
20130077095 | FARADAY SHIELD INTEGRATED INTO SENSOR BANDAGE - Present embodiments include a bandage sensor having an electrically conductive adhesive transfer tape layer as a Faraday shield. The electrically conductive transfer tape layer may be used in lieu of a fully metallic Faraday shield. The present embodiments also include a sensor cable having one or more conductive polymer EMI/RFI shields in place of a fully metallic EMI/RFI shield. Methods for manufacturing and remanufacturing such sensors and cables are also disclosed. | 03-28-2013 |