Class / Patent application number | Description | Number of patent applications / Date published |
356306000 | With internal standard comparison | 12 |
20080297791 | Reflection characteristic measuring apparatus, and method for calibrating reflection characteristic measuring apparatus - In a reflection characteristic measuring apparatus | 12-04-2008 |
20090073433 | OPTICAL ANALYSIS SYSTEM AND METHODS FOR OPERATING MULTIVARIATE OPTICAL ELEMENTS IN A NORMAL INCIDENCE ORIENTATION - A method of arranging and utilizing a multivariate optical computing and analysis system includes transmitting a o first light from a light source; generating a second light by reflecting the first light from the sample; directing a portion of the second light with a beamsplitter; and arranging an optical filter mechanism in a normal incidence orientation to receive the portion of the second light, the optical filter mechanism being configured to optically filter data carried by the portion of the second light. | 03-19-2009 |
20090316147 | METHOD AND APPARATUS FOR FAILURE DETECTION IN LIGHTING SYSTEMS - A method and apparatus for continuous monitoring of a light bulb or group of light bulbs. The light emission of a light bulb is compared with known emission failure values for similar types of light bulbs, and a determination of a near failure status for the bulb is made. | 12-24-2009 |
20120287431 | SYSTEMS AND METHODS FOR THE IDENTIFICATION OF COMPOUNDS USING ADMITTANCE SPECTROSCOPY - Described herein are systems and methods for determining the location, composition and concentration of a hydrocarbon containing plume in environmental seawater. These systems and methods disclosed use multiple complex admittance measurements from seawater in order to identify the contents, concentration, and location of the hydrocarbon containing plume. In preferred variations system includes a sensor array that substantially simultaneously records plume location, depth, and composition. | 11-15-2012 |
20130063721 | PATTERN INSPECTION APPARATUS AND METHOD - In one embodiment, a pattern inspection apparatus includes a light source configured to generate light, and a condenser configured to shape the light into a line beam to illuminate a wafer with the line beam. The apparatus further includes a spectrometer configured to disperse the line beam reflected from the wafer. The apparatus further includes a two-dimensional detector configured to detect the line beam dispersed by the spectrometer, and output a signal including spectrum information of the line beam. The apparatus further includes a comparison unit configured to compare the spectrum information obtained from corresponding places of a repetitive pattern on the wafer with each other, and a determination unit configured to determine whether the wafer includes a defect, based on a comparison result of the spectrum information. | 03-14-2013 |
20130250291 | CHECK-TILE FOR COLOUR MEASUREMENT INSTRUMENTS - The invention relates to a check-tile for validating instrument scales of colour measurement instruments, in particular of goniospectrophotometers, said check-tile comprising a transparent substrate coated with a multi-layer coating, said multi-layer coating comprising:
| 09-26-2013 |
20130250292 | CHECK-TILE FOR COLOUR MEASUREMENT INSTRUMENTS - The invention relates to a check-tile for validating instrument scales of colour measurement instruments, in particular of goniospectrophotometers, said check-tile comprising a transparent substrate coated with a multi-layer coating, said multi-layer coating comprising:
| 09-26-2013 |
20130321802 | SPECTRAL CHARACTERISTIC MEASURING DEVICE, METHOD FOR CORRECTING SPECTRAL CHARACTERISTIC MEASURING DEVICE AND PROGRAM - Wavelength information indicating a correspondence relationship between a plurality of light receiving elements of a light receiving unit and wavelengths of pieces of lights is stored. First and second intensity distributions of the light related to first and second dispersion images are acquired based on a signal outputted from each of the light receiving elements when a monochromatic light is passed through a opening of a light shielding body and first and second dispersion images related to primary and secondary diffracted light are formed on the light receiving unit. An estimated intensity distribution of the light related to the second dispersion image is calculated from the first intensity distribution according to a predetermined relational expression. A change amount related to the wavelength information is calculated based on the estimated intensity distribution and the second intensity distribution. The wavelength information is corrected according to the change amount. | 12-05-2013 |
20140152984 | METHOD OF EVALUATING DISPERSION DEGREES OF MIXED EPOXY RESINS - A method of evaluating dispersion degrees of mixed epoxy resins includes, first, obtaining a resin mixture by mixing a plurality of aromatic epoxy resins, and taking a plurality of measurement samples from a plurality of sites of the resin mixture. The measurement samples are spectroscopically analyzed to obtain the spectra, and a plurality of common functional group peaks in the spectra are selected. The absorbances of the selected peaks are standardized to obtain absorbance ratios, based on the absorbance of a standard peak, in each of the spectra. Then, the standard deviations of the absorbance ratios of the selected peaks are calculated between the measurement samples. The maximum value of the obtained standard deviations is compared with a predetermined threshold value to evaluate the dispersion degrees of the aromatic epoxy resins. | 06-05-2014 |
20150085279 | Systems and Methods for Measuring Spectra of Skin and Other Objects and Materials and Making Predictions Based Thereon - Systems and methods for measuring spectra and other optical characteristics such as colors, translucence, gloss, and other characteristics of objects and materials such as skin. Instruments and methods for measuring spectra and other optical characteristics of skin or other translucent or opaque objects utilize an abridged spectrophotometer and improved calibration/normalization methods. Improved linearization methods also are provided, as are improved classifier-based algorithms. User control is provided via a graphical user interface. Product or product formulations to match the measured skin or other object or to transform the skin or other object are provided to lighten, darken, make more uniform and the like. | 03-26-2015 |
20150092191 | Systems and Methods for Measuring Spectra of Skin and Other Objects and Materials and Making Predictions Based Thereon - Systems and methods for measuring spectra and other optical characteristics such as colors, translucence, gloss, and other characteristics of objects and materials such as skin. Instruments and methods for measuring spectra and other optical characteristics of skin or other translucent or opaque objects utilize an abridged spectrophotometer and improved calibration/normalization methods. Improved linearization methods also are provided, as are improved classifier-based algorithms. User control is provided via a graphical user interface. Product or product formulations to match the measured skin or other object or to transform the skin or other object are provided to lighten, darken, make more uniform and the like. | 04-02-2015 |
20160131526 | Spectroscopic Analysis System and Method - In a spectroscopic analysis system and a spectroscopic analysis method of the present invention, in determining a content percentage of a component contained in a measurement object based on a measurement object spectrum, one or more calibration curves for obtaining the content percentage of the component contained in the measurement object are selected out of a plurality of calibration curves generated based on reference spectra corresponding to a plurality of sections, into which a content percentage of each of a plurality of components is divided, and classified according to the sections using the measurement object spectrum and the reference spectra. | 05-12-2016 |