| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 348094000 | Position detection | 32 |
| 20120229620 | IMAGE PROCESSING APPARATUS AND IMAGE PROCESSING SYSTEM, AND GUIDANCE APPARATUS THEREFOR - An image processing apparatus includes a management unit to manage position information of a workpiece on the conveying apparatus, an obtaining unit to perform measurement processing on an image obtained by image capturing with an image capturing unit and thereby obtaining position information of a region corresponding to a pre-registered workpiece in the image, an update unit to update the position information of the workpiece managed by the management unit to values corresponding to a time when the image capturing unit performed image capturing, an identifying unit to identify a workpiece newly conveyed into the image capturing range of the image capturing unit by comparing the position information that has been updated by the update unit and the position information of the workpiece obtained by the measurement processing, and a transmitting unit to transmit position information of the workpiece identified by the identifying unit to the control apparatus. | 09-13-2012 |
| 20090284592 | METHOD OF DETERMINING THE DYNAMIC LOCATION OF A PROTECTION DEVICE - The method uses a location device and a timing element to determine the location of a protection device at various periods of time. During these periods of time, the human may be participating in a variety of activities and positions. | 11-19-2009 |
| 20080278576 | Object detection apparatus, object detection method and object detection program - An object detection apparatus and method for accurately detecting a movable object in a region around a vehicle from a time series of images obtained through a camera mounted on the vehicle by eliminating the influence of the movement of the camera through simple processing, and a program for making a computer execute processing in the apparatus. The object detection apparatus has a feature point extraction unit which extracts a feature point contained in a feature region of each image in the time series of images obtained through a camera mounted on the vehicle, a correspondence degree computation unit which computes the degree of correspondence for each pair of the feature points, wherein one of the feature points in the each pair is each of one or more of the feature points extracted by the feature point extraction unit from one of two images taken by the camera at different times, and another of the feature points in the each pair is each of a plurality of the feature points extracted by the feature point extraction unit from another of the two images, and a detection unit which detects the movable object on the basis of the degree of correspondence computed by the correspondence degree computation unit. | 11-13-2008 |
| 20100141755 | SUBSTRATE INSPECTION METHOD, SUBSTRATE INSPECTION SYSTEM AND STORAGE MEDIUM - A substrate inspection method capable of accurately inspecting a substrate is provided. A jig having reference points represented by known coordinates in a three-dimensional world coordinate system is photographed by a camera and coordinates of the reference points in a pixel image coordinate system defined by pixels of an image forming device is determined. The coordinates in the pixel image coordinate system are transformed into those in a camera coordinate system set on the camera, and world-camera coordinate system transformation parameters are calculated. Image data in the pixel image coordinate system obtained by photographing a substrate to be inspected is transformed into image data in a world coordinate system for inspection. The accurate inspection of the substrate to be inspected can be achieved because distortion in the image of the substrate to be inspected in the world coordinate system attributable to the position and attitude of the camera is reduced. | 06-10-2010 |
| 20120154571 | EDGE DETECTION USING STRUCTURED ILLUMINATION - A machine vision inspection system (MVIS) and a related light stripe edge feature location method are disclosed. The MVIS comprises a control system, a light stripe projection system, an imaging system, and a user interface. In a region of interest including the edge feature, the light stripe projection system focuses a light stripe transverse to the edge direction and across the edge feature, such that the light stripe has a changing stripe intensity profile along the light stripe. The imaging system acquires an image of the light stripe and the control system analyzes the image to determine the location of the edge feature based on a changing light intensity profile along the stripe. The method may be implemented in an edge detection video tool. The method may be advantageous for inspecting highly textured, beveled, chamfered, rounded or damaged edges, for example. | 06-21-2012 |
| 20120249773 | WAFER HANDLER COMPRISING A VISION SYSTEM - A wafer handler including, a wafer loading station ( | 10-04-2012 |
| 20120249772 | COMPONENT MOUNTING DEVICE, INFORMATION PROCESSING DEVICE, POSITION DETECTION METHOD, AND SUBSTRATE MANUFACTURING METHOD - A component mounting device includes a transport unit which transports a substrate, a mounting unit which mounts a component on the substrate, a detection unit which is able to detect a first detection target which is provided on the substrate and a second detection target which is provided to be separated by a predetermined distance from the first detection target on the substrate at least in the transportation direction and is a reference position of a mounting action by the mounting unit, and a control unit which outputs a stop signal for stopping the transport of the substrate to the transport unit and detects the second detection target of the substrate which has been stopped using the detection unit based on the detection of the first detection target by the detection unit. | 10-04-2012 |
| 20120236140 | USER SUPPORT APPARATUS FOR AN IMAGE PROCESSING SYSTEM, PROGRAM THEREOF AND IMAGE PROCESSING APPARATUS - An user support apparatus includes a display unit configured to display an image obtained by image capturing with the image capturing unit, an input unit configured to receive a designation of a region of a workpiece to be detected in the image displayed on the display unit, and a determining unit configured to determine an image capturing start condition for the image capturing unit that is defined in terms of the amount of movement of a conveying apparatus, based on the size of the region indicating the workpiece to be detected by using a relationship between the image capturing range of the image capturing unit and the physical length of the conveying apparatus. | 09-20-2012 |
| 348095000 | Alignment or positioning | 24 |
| 20100165098 | METHOD, DEVICE AND SYSTEM FOR POSITIONING A FIRST BODY AND A PART FIXED TO A SECOND BODY WITH RESPECT TO EACH OTHER - In a method for positioning a first body (B | 07-01-2010 |
| 20120224050 | HIGH-DENSITY BIOCHEMICAL ARRAY CHIPS - An array chip useful for biochemical assays is provided wherein the chip includes a field region arranged with attachment sites according to a first pitch and at least one track region having a one-dimensional spot pattern arranged according to a second pitch that is less dense and is a non-integer multiple of the first pitch so that one-dimensional Moiré averaging may be applied in the track region, thereby to attain alignment of the chip to the optical instrumentation with a higher density of attachment sites. | 09-06-2012 |
| 20100171824 | COMPONENT RECOGNIZING DEVICE, SURFACE MOUNTING MACHINE, AND COMPONENT TESTING MACHINE - To enable image recognition of a component at a high degree of accuracy in a stable manner over a long term with a component recognizing device configured to take an image of a component by moving a scan unit having an imaging device using a linear motor, and a surface mounting machine and a component testing machine each equipped with the component recognizing device. | 07-08-2010 |
| 20100171823 | ALIGNMENT APPARATUS FOR SEMICONDUCTOR WAFER - A wafer has an annular ridge formed along an outer periphery thereof to serve as a reinforcing portion, and a circuit pattern surrounded with the reinforcing portion. The wafer is placed on a wafer placement plane of a holding stage in a state that the circuit pattern is directed downward. The wafer placement plane is larger in size than the wafer. On the holding stage, a center of the wafer is aligned with a center of the holding stage in such a manner that a plurality of guide pins are engaged with relevant cutout portions formed on the reinforcing portion. Then, the holding stage rotates while suction-holding the reinforcing portion of the wafer, and simultaneously a photosensor detects a portion for alignment formed on the outer periphery of the wafer. | 07-08-2010 |
| 20090002486 | Coordinate measuring machine and method for calibrating the coordinate measuring machine - A coordinate measuring machine is disclosed having an orientor automatically orienting a substrate associated therewith. A control and computing unit is further associated with the coordinate measuring machine, so that self-calibration may be performed on the basis of at least two different and automatically set orientations of the substrate. | 01-01-2009 |
| 20110234788 | ASSEMBLY INSPECTION APPARATUS AND ASSEMBLY PROCESSING APPARATUS USING THE SAME - An assembly inspection apparatus includes a marker having four or more unit pattern marks which are provided, at a predetermined positional relationship, in a portion of an assembly component to be put into a receiving assembly component and which are formed in such a way that a density pattern sequentially changes from a center position to a periphery of the pattern mark; an imaging tool that is disposed opposite the assembly component put into the receiving assembly component and that captures an image of the marker; a layout information recognition block that recognizes layout information about a position and an attitude of the assembly component put into the receiving assembly component by use of at least imaging information about the marker whose image has been captured by the imaging tool; and an assembly inspection block that inspects whether or not a superior assembly state is achieved. | 09-29-2011 |
| 20110234789 | RECEIVING ASSEMBLY COMPONENT RECOGNITION STRUCTURE, AND ASSEMBLY INFORMATION RECOGNITION APPARATUS AND ASSEMBLY PROCESSING APPARATUS THAT USE THE STRUCTURE - A structure for recognizing a receiving assembly component, comprising:
| 09-29-2011 |
| 20120242828 | METHOD AND APPARATUS FOR ALIGNING A COMPONENT WITH A TARGET - Alignment systems and more particularly, to a split-screen camera system where multiple camera views are incorporated into a single composite image to align a component orthogonally to a target are provided. At least a first and second imaging device is used in conjunction with a processing unit adapted to extract or delete portions of at least a first image and a second image captured by the first and second imaging devices. The processor mirrors one of the images and creates a composite image of the first image and the second image as a split-screen image. The resulting processed image is displayed on a display terminal, and an operator aligns a component with a target. | 09-27-2012 |
| 20100289890 | Apparatus and Method for Aligning Containers, in Particular Bottles, in a Labeler - An apparatus and a method for aligning containers, in particular bottles, in a labeler, the apparatus having rotatable holders for containers to be aligned, and a camera unit for imaging the containers as well as a proximity switch for triggering an imaging function of the camera unit. This allows a precise alignment in combination with a reduced expenditure of time and reduced space requirements. | 11-18-2010 |
| 20100295936 | Optical connector inspection apparatus capable of inspecting a held posture of an optical fiber - The light source is disposed in a direction traversing the axial direction A of the optical connector. The optical connector holder comprises an inspection light reflecting portion. The inspection light reflecting portion deflects and reflects the inspection light from the light source to the axial direction A so that the inspection light enters the reference hole portion of the optical connector. | 11-25-2010 |
| 20100295935 | ON-HEAD COMPONENT ALIGNMENT USING MULTIPLE AREA ARRAY IMAGE DETECTORS - A sensor for sensing component offset and orientation when held on a nozzle of a pick and place machine is provided. The sensor includes a plurality of two-dimensional cameras, a backlight illuminator and a controller. Each camera has a field of view that includes a nozzle of the pick and place machine. The backlight illuminator is configured to direct illumination toward the plurality of two-dimensional cameras. The backlight illuminator is positioned on an opposite side of a nozzle from the plurality of two-dimensional cameras. The controller is coupled to the plurality of two-dimensional cameras and the backlight illuminator. The controller is configured to determine offset and orientation information of the component(s) based upon a plurality of backlit shadow images detected by the plurality of two-dimensional cameras. The controller provides the offset and orientation information to a controller of the pick and place machine. | 11-25-2010 |
| 20110050882 | WAFER ALIGNING APPARATUS AND RELATED METHOD - A wafer aligning apparatus includes a laser sensor that generates a trigger signal, a CCD camera imaging a wafer in response to the trigger signal, a signal processing unit that calculates a center alignment correction value for the wafer, and a robot controller that receives the center alignment correction value to control movement of a transfer robot. The laser sensor generates the trigger signal in accordance with a change in reflected light detected by the laser sensor, the change in the amount of reflected light being detected by the laser sensor when a boundary between a blade of the transfer robot and a coupler of the transfer robot passes under the laser sensor. | 03-03-2011 |
| 20110096158 | LIQUID CRYSTAL ARRAY INSPECTING APPARATUS - A liquid crystal array inspection apparatus for two-dimensional scanning on a liquid crystal substrate. It includes a stage for mounting the liquid crystal substrate; an imaging device provided above and distantly from the stage; an imaging control part for controlling the imaging of the imaging device; a stage driving part for driving the stage in a Y direction; an encoder for detecting a rotation state of a drive motor of the stage driving part; an imaging-start position reaching detection part for detecting that the liquid crystal substrate reaches the imaging-start positions in the Y direction in forward and return courses on the stages based on a detection quantity and an imaging range of the encoder; and an imaging-start trigger signal generating part for generating an imaging-start trigger signal to start the imaging by the imaging control part based on an output from the imaging-start position reaching detection part. | 04-28-2011 |
| 20120038763 | MEASURING APPARATUS AND MEASURING METHOD THEREOF, APPARATUS FOR CORRECTING PROCESSING POSITION OF CUTTING MACHINE AND METHOD THEREOF FOR CORRECTING PROCESSING POSITION, AND IMAGING APPARATUS AND CUTTING MACHINE COMPRISING THE SAME - Provided is an apparatus and a method thereof which can detect a displacement amount of a cutting tool with respect to a workpiece with high accuracy and can correct a processing position with high accuracy. Accordingly, a turret gauge | 02-16-2012 |
| 20120098958 | CALIBRATION METHOD FOR A MEASURING SYSTEM - According to the invention, the calibration measuring cycle is divided into several, particularly a plurality of partial cycles, with which one or more of the calibration measurements are associated. While maintaining the cycle, the partial cycles are now carried out in one of the positioning pauses such that the calibration measuring cycle is distributed over several, in particular a plurality of, positioning pauses and is integrated into the flow of the industrial process without interfering with the same. | 04-26-2012 |
| 20120044345 | PANEL ASSEMBLY ALIGNMENT SYSTEM AND ALIGNMENT METHOD THEREOF - A panel assembly alignment system and an alignment method thereof. A first panel has first alignment patterns arranged at equal pitches. A second panel has second alignment patterns arranged with a pitch between the adjacent patterns being wider as positions of the second alignment patterns are farther away from the pattern. A third panel has third alignment patterns and arranged with a pitch between adjacent patterns being narrower as positions of the third alignment patterns are farther away from the pattern. An operation unit controls a photographing unit to photograph each panel, so as to analyze an overlap portion between the first and the second alignment patterns, determine an offset direction of the second panel corresponding to the first panel, so that when the third panel is placed, the third alignment pattern conforming to the offset direction and a level of the overlap portion is overlapped with the overlap portion. | 02-23-2012 |
| 20120162406 | Accessory of a Machine Drill and Control Method - An accessory that can be connected to a machine drill is provided. A projector is provided to project a first light spot and a second light spot to a work piece to be processed. A camera is provided to record the first light spot and the second light spot in an image. A processing device is provided to determine an incline of the machine drill in reference to the work piece, based on a first distance of the first light spot from a reference point recorded in the image and a second distance of the second light spot from the reference point recorded in the image. A display device is coupled to the processing device and displays the determined incline. The light spots may be embodied punctual or planar. | 06-28-2012 |
| 20100289889 | ALIGNMENT METHOD FOR SINGULATION SYSTEM - A method for determining cutting lines for a substrate prior to its singulation is provided whereby the substrate comprises first and second rows of alignment marks which are substantially parallel to each other such that a pair of alignment marks each from the first and second rows of alignment marks is configured for determining a position of a cutting line. The method comprises the steps of positioning the first row of alignment marks along a relative motion path of a first camera and positioning the second row of alignment marks along a relative motion path of a second camera. While the substrate is being moved relative to the first and second cameras along the respective relative motion paths without stopping, the first and second cameras capture images of multiple pairs of alignment marks from the first and second rows of alignment marks during such motion. Thereafter, the position of each cutting line is determined from the images of each pair of alignment marks along the first and second rows of alignment marks relating to the cutting line and stored in a storage device for use during singulation. | 11-18-2010 |
| 20120300058 | CONTROL COMPUTER AND METHOD FOR REGULATING MECHANICAL ARM USING THE SAME - In a method for regulating a mechanical arm using a control computer. The method obtains a first position and a second position of a center of an image plane of an image capturing device on the mechanical arm by controlling movements of the mechanical arm, and calculates a movement vector from the first position to the second position. The method further calculates a regulating angle according to the movement vector and an axial vector of the mechanical arm, and moves the mechanical arm according to the regulating angle such that the axial vector is perpendicular to a measurement plane determined by the first object and the second object. | 11-29-2012 |
| 20120236141 | Automatic Conveying Equipment For Roll Body - In order to provide an automated roll transport vehicle with which the work required to install the vehicle in a production facility is simplified, a transport carriage includes a transport vehicle side support element that supports a roll upwardly of the transport carriage such that the roll can be transferred to a receiving device, moving operation means for moving a core a of the roll supported by the transport vehicle side support element with respect to the transport carriage, control means for controlling operation of the moving operation means to locate the core a in a proper position at which both ends of the core a can be supported by a pair of device side support elements with the transport carriage stopped at a transfer location. One or more imaging device or devices for capturing an image of the device side support element is provided. | 09-20-2012 |
| 20120081539 | APPARATUS FOR MEASURING POSITION AND SHAPE OF PATTERN FORMED ON SHEET - An apparatus for measuring the position and shape of a pattern formed on a sheet includes a sheet on which a pattern is formed, a camera holding mechanism that is disposed perpendicular to a transportation direction of the sheet, at least one camera that is disposed such that the camera is movable in a longitudinal direction of the camera holding mechanism, and an image processing computer that processes an image picked up by the at least one camera. In the measuring apparatus, when calibration is performed, calibration is performed with reference to a picked up image of the coating pattern and a picked up image of a reference body for calibration. | 04-05-2012 |
| 20110249113 | METHOD AND APPARATUS FOR FABRICATING INTEGRATED CIRCUIT DEVICE USING SELF-ORGANIZING FUNCTION - In a method of fabricating an integrated circuit device having a three-dimensional stacked structured, the step of fixing many chip-shaped semiconductor circuits to a support substrate or a circuit layer with a predetermined layout can be performed easily and efficiently with a desired accuracy. Temporary adhesion portions | 10-13-2011 |
| 20120327216 | Machine Tool System, especially for Hand-Held Machine Tools - A machine tool system is provided with a detection device for a working line specified for the surface of a workpiece, the marking contour of the working line being viewed from different wavelength ranges. | 12-27-2012 |
| 20120287260 | PANEL ALIGNMENT APPARATUS AND PANEL ALIGNMENT METHOD - The present invention provides a panel alignment apparatus and a panel alignment method. The panel alignment apparatus comprises an image detection device and a first clamp. The method comprises the following steps: utilizing the image detection device to detect a position of a display panel, and to calculate a position adjustment value; and utilizing the first clamp to hold the standing display panel, and to rotate the display panel according to the position adjustment value for adjusting a position of the display panel. The present invention can utilize the clamps to precisely align the standing display panel. | 11-15-2012 |
