Class / Patent application number | Description | Number of patent applications / Date published |
327225000 | With logic element (e.g., NOR gate, etc.) | 20 |
20080211559 | DATA HOLDING CIRCUIT AND SIGNAL PROCESSING CIRCUIT - A data holding circuit is capable of latching an input signal at both a rising edge and a falling edge of a clock signal. Several flip-flops and exclusive OR circuits cooperate to achieve this function. | 09-04-2008 |
20100079184 | Sequential circuit with error detection - Sequential circuits with error-detection are provided. They may, for example, be used to replace traditional master-slave flip-flops, e.g., in critical path circuits to detect and initiate correction of late transitions at the input of the sequential. In some embodiments, such sequentials may comprise a transition detector with a time borrowing latch. | 04-01-2010 |
20100148837 | LATCH CIRCUIT WITH SINGLE NODE SINGLE-EVENT-UPSET IMMUNITY - A latch circuit, such as a memory cell or a flip-flop, that is immune to single-event upset at any single node. The latch circuit includes two banks of four logic gates each. The output of each logic gate in the first bank is connected to inputs of two logic gates in the second bank, and the output of each logic gate in the second bank is connected to inputs of two logic gates in the first bank. Each logic gate includes a logic function receiving an input node and an enable signal, such as a load signal. The interconnection of the logic gates corrects single-event upset at any one of the nodes. In the memory cell arrangement, redundant data paths are used to produce two input nodes provides single-event upset immunity at those input nodes. A layout of the latch circuit that ensures that random ionization affects only a single node is also disclosed. | 06-17-2010 |
20110215853 | DATA TRANSFER CIRCUIT - A data transfer circuit includes primary data holding circuits that hold input data according to a first clock pulse signal and output data being held; and secondary data holding circuits that hold the output data of the primary data holding circuits according to a second clock pulse asynchronous to the first clock pulse and output data being held. Pulse signal generator generates a pulse signal synchronous with the second clock pulse signal when a pulse edge of the first clock pulse signal and a pulse edge of the second clock pulse signal occur at different timings and generates a pulse signal having the pulse edge the second clock pulse signal removed therefrom when the pulse edge of the the first clock pulse signal and the pulse edge of the the second clock pulse signal occur at the same timing. The secondary data holding circuits hold the output data of the primary data holding circuits synchronously with the pulse signal generated by the pulse signal generator. | 09-08-2011 |
20120212272 | SEMICONDUCTOR DEVICE HAVING PLURAL PENETRATION ELECTRODES PENETRATING THROUGH SEMICONDUCTOR SUBSTRATE AND TESTING METHOD THEREOF - Disclosed herein is a device that includes first and second current paths, first and second latch circuits electrically connected to the first and second current paths, respectively, a driver circuit supplying first data to the first latch circuit, and supplying second data representing a logical value opposite to a logical value of the first data to the second latch circuit, a control circuit controlling the driver circuit to be alternately and repeatedly in a first period in which the driver circuit supplies the first data to the first latch circuit and does not supply the second data to the second latch circuit, and in a second period in which the driver circuit supplies the second data to the second latch circuit and does not supply the first data to the first latch circuit, and a monitor circuit. | 08-23-2012 |
20130002328 | SEMICONDUCTOR DEVICE AND METHOD FOR CONTROLLING FLIP-FLOP - A semiconductor integrated circuit includes a first retention flip-flop configured in a first type in which a retention flip-flop is able to retain data based on one of a low-level clock signal and a high-level clock signal, and unable to retain data based on another one of the low-level clock signal and high-level clock signal, and a second retention flip-flop configured in a second type in which a retention flip-flop is able to retain data based on the low-level clock signal and also able to retain data based on the high-level clock signal. | 01-03-2013 |
20130063195 | DIGITAL INPUT BUFFER - A digital input buffer and method. The input buffer includes a voltage regulator configured for operating in weak inversion and outputting a regulated potential, an inverter having as its power source the regulated potential and configured for receiving an input signal, a first latch having its input coupled to the inverter input, and a second latch having its input coupled to the inverter's output, having its output coupled to the first latch's enable input, and having its enable input coupled to the first latch's output. A first latch output signal from the first latch output and a second latch output signal from the second latch output enable switching the first latch output signal to the complement of the input signal and switching the second latch output signal to that of the input signal. | 03-14-2013 |
20130241617 | SCAN FLIP-FLOP, METHOD THEREOF AND DEVICES HAVING THE SAME - A scan flip-flop, which performs a normal operation latching a data input and a scan operation latching a scan input, includes a first circuit, a second circuit and a latch. The first circuit determines a voltage of an intermediate node based on a clock signal, one of the data input and the scan input, and data of a latch input node. The second circuit determines the data based on the clock signal, the voltage of the intermediate node and the data input during the normal operation, and determines the data based on the clock signal and the voltage of the intermediate node during the scan operation. The latch latches the data based on the clock signal. | 09-19-2013 |
20130265092 | Flip-Flop Circuits - A flip-flop circuit includes an input portion that receives a first external input signal through a first external input terminal, a storage portion that stores a signal transmitted from the input portion, and an output portion that outputs the signal stored in the storage portion through an external output terminal as a logic operation result with respect to a second external input signal received through a second external input terminal of the input portion. The output portion includes a logic gate directly connected to the external output terminal and an input terminal of the logic gate receives the signal stored in the storage portion. | 10-10-2013 |
20130271197 | POWER DROOP REDUCTION VIA CLOCK-GATING FOR AT-SPEED SCAN TESTING - A clock gating mechanism controls power within an integrated circuit device. One or more clock gating circuits are configured to couple a system clock to a different portion of the integrated circuit device. A logic circuit applies an enabling signal to one of the clock gating circuits to control whether the system clock passes through the clock gating circuit to a portion of the integrated circuit device associated with the clock gating circuit. A plurality of scan flip-flops is configured to provide a binary code to the logic circuit, where the binary code indicates to the logic circuit that the enabling signal should be applied to the clock gating circuit. One advantage of the disclosed technique is that power droop during at-speed testing of a device is reduced without significantly increasing the quantity of test vectors or reducing test coverage, resulting in greater test yields and lower test times. | 10-17-2013 |
20150015317 | SPARE CELL STRATEGY USING FLIP-FLOP CELLS - Configurable flip-flop cells for use in scan chain configurations include one or more multiplexers, a flip-flop, and one or more logic gates. The logic gates are configurable, through modification of different metallization or semiconductor layers, to operate as spare gates or to disable flip-flop cell outputs based selection signal switching between scan shift and capture mode. When disabling flip-flop cell outputs, the logic gates are configured to receive both a test signal and a data input signal and select one of the two to pass to the flip-flop based on the selection signal. When used as spare gates, the logic gates receive external inputs and provide spare gate outputs to circuitry on an integrated circuit that is external to the flip-flop cells. | 01-15-2015 |
20150022252 | DIGITAL CIRCUITS - A digital circuit portion comprises a flip-flop ( | 01-22-2015 |
20150054557 | DUAL-PORT NEGATIVE LEVEL SENSITIVE PRESET DATA RETENTION LATCH - In an embodiment of the invention, a dual-port negative level sensitive preset data retention latch contains a clocked inverter and a dual-port latch. Data is clocked through the clocked inverter when clock signal CKT goes low, CLKZ goes high, preset control signal PRE is low and retention control signal RET is low. The dual-port latch is configured to receive the output of the clocked inverter, a second data bit D | 02-26-2015 |
20160036440 | CLOCK STATE CONTROL FOR POWER SAVING IN AN INTEGRATED CIRCUIT - Sequential logic elements may consume less static power in response to a first state of a clock signal than in response to a second state of a clock signal (the first and second state may be either low or high depending on the type of sequential logic). This can be exploited to reduce static power consumption of an integrated circuit by controlling the level of a clock signal so that is in the first state for a greater amount of time than the second state. | 02-04-2016 |
20160049926 | ELECTRONIC CIRCUIT, ELECTRONIC APPARATUS, AND METHOD FOR ELIMINATING METASTABILITY - An electronic circuit includes a clock control unit having a first input for receiving a first clock signal, a second input for receiving a second clock signal, a first clock output, and a second clock output, a first flip-flop having a first data input, a first clock input connected to the first clock output, and a first output, and a second flip-flop having a second data input, a second clock input connected to the second clock output, and a second data input connected to the first output of the first flip-flop. The clock control unit provides the first clock signal to the first clock input of the first flip-flop through the first clock output and the second clock signal to the clock input of the second flip-flop through the second clock output terminal in a sequential order. | 02-18-2016 |
20160065184 | FLIP-FLOP CIRCUIT - A flip-flop circuit is provided. The flip-flop circuit includes a first latch, a trigger stage and a second latch. The first latch is configured to latch a selected signal in response to a first state of a clock signal, and provide a first output signal. The trigger stage, connected to the first latch, is configured to provide a trigger signal based on the clock signal and the first output signal. The second latch, connected to the trigger stage, is configured to latch the trigger signal in response to a second state of the clock signal, and provide a second output signal. The first state and the second state of the clock signal are complementary to each other. | 03-03-2016 |
20160087612 | SEMICONDUCTOR DEVICE - If an exclusive OR circuit itself, a component of a signal delay detecting circuit, has failed to operate properly, a signal delay cannot be detected accurately. A malfunction pre-detecting circuit | 03-24-2016 |
20160098506 | SIGNAL DELAY FLIP-FLOP CELL FOR FIXING HOLD TIME VIOLATION - A signal delay cell for use in resolving hold time violations in an IC has a first multiplexer having a first functional data input node and a scan data input node TI and a second multiplexer having a second functional data input node, a second input node connected to the output of the first multiplexer and a flip-flop module. The propagation of a data input signal applied to the first multiplexer is delayed, and the hold margin of the flip-flop module is increased by transit through the first multiplexer. The signal delay cell is available to replace a flip-flop having a scan data hold problem, and also for use in solving a functional data violation in the same or another cell. | 04-07-2016 |
20160142062 | DIFFERENTIAL PHASE-FREQUENCY DETECTOR - A phase-frequency detector (PFD) is electrically coupled to a charge pump of a phase-locked-loop (PLL). The PFD includes a first differential latch electrically coupled to the charge pump. The first differential latch drives a differential pair of increment signals to the charge pump in response to differential pairs of both reference clock signals and reset signals. The PFD also includes a second differential latch electrically coupled to the charge pump. The second differential latch drives a differential pair of decrement signals to the charge pump in response to differential pairs of both feedback clock signals and reset signals. The PFD also includes a differential AND gate electrically coupled to both the first differential latch and the second differential latch. The differential AND gate drives the differential pair of reset signals to both of the differential latches in response to the differential pairs of both increment signals and decrement signals. | 05-19-2016 |
20190149139 | RQL PHASE-MODE FLIP-FLOP | 05-16-2019 |