Entries |
Document | Title | Date |
20080238512 | Circuit and method for data alignment - A circuit for data alignment includes a first latch unit and a second latch unit. The first latch unit latches serial input data by using a plurality of first clocks with different phases and the same frequency to output latched data. The second latch unit latches the data from the first latch unit by using a plurality of second clocks with a lower frequency than the first clocks and more diverse phases to thereby output parallel data. | 10-02-2008 |
20080303573 | DATA-RETENTION LATCH FOR SLEEP MODE APPLICATION - A latch includes a data input terminal for receiving a data signal; a data output terminal for outputting the data signal; a first control terminal for receiving a control signal to set or reset the data signal derived from the data output terminal; a sleep signal input terminal for receiving a sleep signal to determine a sleep mode; a first logic circuit having input terminals coupled to the data input terminal, the first control terminal and the sleep signal input terminal and an output terminal coupled to the data output terminal; and a second logic circuit having input terminals coupled to the data output terminal, the first control terminal and the sleep signal input terminal and an output terminal coupled to the data input terminal; wherein the first logic circuit or the second logic circuit ignores the first control signal in response to the sleep signal when the latch is operated in the sleep mode. | 12-11-2008 |
20090085625 | TIME-BASED CONTROL OF A SYSTEM HAVING INTEGRATION RESPONSE - A time-based controller provides control for a controlled system including a plant having an integration response. The time-based controller includes a comparator that detects a polarity change in a comparison of a sensed signal from the plant and a reference signal while a control signal is in a first state, time calculation logic that, responsive to detection of the change in the comparison, determines a time at which to change a state of a control signal supplied to the plant, and a modulator that, at the determined time, changes the state of the control signal supplied to the plant from the first state to a second state. | 04-02-2009 |
20090174451 | Method of stitching scan flipflops together to form a scan chain with a reduced wire length - The scan flipflops on a semiconductor chip are stitched together to form one or more scan chains, located in one or more standard cell placement regions, after the optimal physical location of each scan flip-flop has been determined. As a result, the total length of the scan chain wires is substantially reduced, thereby reducing on-chip wiring congestion, flip-flop load capacitance, and flipflop power dissipation. | 07-09-2009 |
20090174452 | DEVICE AND METHOD FOR HANDLING METASTABLE SIGNALS - A method and device for managing metastable signals. The device includes: a first latch and a second latch, a multiple switching point circuit, connected between an output node of the first latch and an input node of the second latch, wherein the multiple switching point circuit includes at least one pull up transistor and at least one pull down transistor that are selectively activated in response to a feedback signal provided from the second latch and in response to a an output signal of the first latch such as to define at least a low switching point that is lower than a high switching point of the multiple-switching point circuit; wherein a switching point of an inverter within the first latch is between the high and low switching points. | 07-09-2009 |
20090189662 | Apparatus and circuit including latch circuit, and method of controlling latch circuit - An apparatus includes a first selector which selects a test data during a first operation mode, and selects a first input data during a second operation mode, a first latch circuit which latches an output signal of the first selector according to a first clock signal, a second selector which selects one from a second input data and an output signal of the first latch circuit, and a second latch circuit which latches the second input data sent from the second selector according to a second clock signal during the second operation mode, and passes through the output signal of the first latch circuit sent from the second selector during the first operation mode. | 07-30-2009 |
20090189663 | STANDARD CELL AND SEMICONDUCTOR DEVICE - The present invention provides a standard cell and a scan flip flop circuit capable of introducing a scan test also to a system LSI having an ACS circuit. One standard cell is configured by: a 3-input selection circuit for selecting one signal from three input signals; and a flip flop circuit. The 3-input selection circuit receives a control signal and a test signal at its control input part and its first input part, respectively. First and second signals are supplied to second and third input parts, and a selection signal is supplied to a selector input part. On the basis of the control signal and the selection signal, any of the signals input to the first to third input parts is output from the output part. | 07-30-2009 |
20090206904 | SEMICONDUCTOR INTEGRATED CIRCUIT - A semiconductor integrated circuit includes: a first flip-flop, a combined circuit and a second flip-flop that form a critical path; a first delay circuit and a third flip-flop that are provided in the post-stage of the combined circuit; a second delay circuit and a fourth flip-flop that are provided in the post-stage of the combined circuit; a first comparison circuit that compares the output of the second flip-flop with the output of the third flip-flop; a second comparison circuit that compares the output of the second flip-flop with the output of the fourth flip-flop: and a control circuit that controls a source voltage supplied to the combined circuit in accordance with the outputs of the comparison circuits. A delay time by the first delay circuit is different from a delay time by the second delay circuit. | 08-20-2009 |
20090219072 | Apparatus, circuit and method of transmitting signal - An apparatus includes a transmission circuit which transmits a data by a differential signal, and a control circuit which halts a portion of the differential signal under a predetermined condition. | 09-03-2009 |
20090243686 | LATCH CIRCUIT AND ELECTRONIC DEVICE - A latch circuit includes: four or more gates; three input terminals and one or two output terminals which are connected to at least one of the four or more gates; a feedback circuit in which respective input terminals of the four or more gates are connected to output terminals of at least another two of the four gates; and a data inverting gate which, when all data input into the three input terminals is the same, outputs inverted data of the data from the output terminals, and when all the data input into the three input terminals is not the same, retains previous data. | 10-01-2009 |
20090267670 | CIRCUIT WITH PARALLEL FUNCTIONAL CIRCUITS WITH MULTI-PHASE CONTROL INPUTS - A circuit has a plurality of functional circuits ( | 10-29-2009 |
20100141321 | Buffer enable signal generating circuit and input circuit using the same - An input circuit comprises a buffer enable signal generating circuit for generating a buffer enable signal having an predetermined enable period in response to an external command, and a buffer circuit for buffering and outputting the external command and an external address signal in response to the buffer enable signal. | 06-10-2010 |
20100148836 | Contention-Free Level Converting Flip-Flops for Low-Swing Clocking - The present invention includes a family of level converting flip-flops that accepts data and clock inputs at a lower voltage level while producing data outputs at a higher voltage level. These flip-flops enable fine-grained dual supply voltage techniques such as low-swing clocking (distributing the clock signal at a lower voltage level) and clustered voltage scaling (CVS). The level conversion is accomplished in a very efficient manner by sharing the positive feedbacks inside a flip-flop for both storage and level conversion. Additionally, the presented flip-flops are contention-free and non-ratioed, thus having reduced timing and power overheads due to the level conversion function. | 06-17-2010 |
20100201420 | LOGICAL ELEMENT - In a logical element ( | 08-12-2010 |
20100207677 | LOW LATENCY FLOP CIRCUIT - A flop circuit comprises a precharge circuit for precharging a first node in response to an occurrence of a first phase of a timing signal, and a discharge circuit for conditionally discharging the first node in response to an occurrence of a second phase of the timing signal depending upon a data input signal. The flop circuit further comprises a voltage retention circuit, such as a latch, configured to store a retained logic value that depends upon a logic value present at the first node during at least a portion of the second phase of the timing signal, and an output circuit configured to generate an output signal that depends upon the data input signal. The output circuit may be configured to drive the output signal in a first logic state when the first node is discharged regardless of the retained logic value, and may be configured to drive the output signal in a logic state that depends upon the retained logic value when the first node is charged. In one particular embodiment, the output circuit is implemented using a NAND gate. | 08-19-2010 |
20110001533 | SAMPLING CIRCUIT - A sampling circuit for use in a semiconductor device, includes a first sampling unit configured to sample a data signal in synchronism with a reference clock signal and output a first output signal, a second sampling unit configured to sample a delayed data signal in synchronism with the reference clock signal and output a second output signal, and an output unit configured to combine the first and second output signals and output a sampling data signal. | 01-06-2011 |
20110068842 | Providing additional inputs to a latch circuit - A latch circuit for retaining and transmitting an input data value is disclosed, along with a memory, and a method for retaining and transmitting data. | 03-24-2011 |
20110102042 | APPARATUS AND METHOD FOR HARDENING LATCHES IN SOI CMOS DEVICES - A method of determining one or more transistors within a particular circuit to be respectively replaced with a hardened transistor includes: identifying, as not requiring hardening, one or more transistors; identifying, as candidates for hardening, each transistor in the circuit not previously identified as not requiring hardening; and employing the hardened transistor in place of a transistor identified as a candidate for hardening. The circuit is a latch and the transistor is an SOI CMOS FET. The transistor is also an SOI transistor. The series transistor includes first and second series-connected transistors having a shared source/drain region whereby a drain of the first series-connected transistor is merged with a source of the second series-connected transistor. | 05-05-2011 |
20110140751 | FLIP-FLOP CIRCUITS - A flip-flop circuit includes an input portion that receives a first external input signal through a first external input terminal, a storage portion that stores a signal transmitted from the input portion, and an output portion that outputs the signal stored in the storage portion through an external output terminal as a logic operation result with respect to a second external input signal received through a second external input terminal of the input portion. The output portion includes a logic gate directly connected to the external output terminal and an input terminal of the logic gate receives the signal stored in the storage portion. | 06-16-2011 |
20110148495 | DATA HOLDING CIRCUIT - A data holding circuit including a first input terminal through which data is inputted; at least one delay element for delaying the data inputted through the first input terminal; and a first element for holding data, wherein, when the data inputted through the first input terminal and the data delayed by the delay element are equal to each other, the first element holds data corresponding to the data inputted through the first input terminal and wherein, when the data inputted through the first input terminal and the data delayed by the delay element are different from each other, the first element continues to hold the data presently held by the first element. | 06-23-2011 |
20110204949 | APPARATUS AND METHOD FOR EXTERNAL TO INTERNAL CLOCK GENERATION - A phase recombination circuit includes a first phase input and a first one-shot pulse generator adapted to receive the first phase input and produce a first signal to pull a signal to a first state. The phase recombination circuit also includes a second phase input in phase relationship with the first phase input, and a second one-shot pulse generator adapted to receive the second phase input and produce a second signal to pull a signal to a second state. | 08-25-2011 |
20110234282 | Method And Circuit For Testing And Characterizing High Speed Signals Using An ON-Chip Oscilloscope - A method and structure for characterizing signals used to operate high speed circuitry on an integrated circuit chip. Signals to be characterized, such as column select signals, sense amplifier enable signals and word line signals, are generated on the chip. Each of these signals has an identical corresponding pattern during successive cycles of an input clock signal. These signals are sampled on the chip with successively delayed versions of the input clock signal, thereby generating a plurality of data samples that represent the patterns of the signals over a cycle of the input clock signal. The data samples are stored in a memory block on the chip, and are subsequently serialized and transferred to a location external to the chip. | 09-29-2011 |
20110279160 | SEMICONDUCTOR DEVICE HAVING INPUT/OUTPUT WRAPPERS, AND A METHOD OF CONTROLLING THE WRAPPERS - A semiconductor device include a first wrapper including a first scan flip-flop, first control flip-flops and a first pad, the first scan flip-flop receiving a first value and second values and storing the second value for determining a function of the first pad; a second wrapper including a second scan flip-flop, second control flip-flops and a second pad, the second scan flip-flop receiving the first value from the first wrapper and storing the first value for determining a function of the second pad; and an input/output controller configured to provide a shift input signal having the first and second values to the first wrapper. | 11-17-2011 |
20110285443 | DATA LATCH CIRCUIT - A serial-format data signal is input to a data input terminal. Each of n (n represents an integer of two or more) multiple clock input terminals is configured to receive a clock signal as an input signal. An input flip-flop latches the data signal at each timing that corresponds to the corresponding clock signal. A serial/parallel converter converts the serial-format data signal into a parallel-format intermediate data signal using the corresponding clock signal. A data selector selects one from among the n intermediate data signals according to a selection signal. | 11-24-2011 |
20120112813 | Latch Circuits with Synchronous Data Loading and Self-Timed Asynchronous Data Capture - A latch integrated circuit has synchronous data loading and self-timed asynchronous data capture characteristics. The integrated circuit may include a latch, a pulse generator and a comparator. The latch can be responsive to a data signal and a write enable signal. The pulse generator may be configured to generate the write enable signal as a pulse. This pulse may have a leading edge synchronized with a first edge of a clock signal and a self-timed trailing edge synchronized with an edge of a comparison signal. The comparator may be configured to generate the comparison signal in response to comparing logic levels of at least two nodes within the integrated circuit. | 05-10-2012 |
20120206181 | MULTI-FUNCTION DELAY LOCKED LOOP - A delay circuit provides a quadrature-delayed strobe, a tightly controlled quadrature DLL and write/read leveling delay lines by using the same physical delay line pair. By multiplexing different usage models, the need for multiple delay lines is significantly reduced to only two delay lines per byte. As a result, the delay circuit provides substantial saving in terms of layout area and power. | 08-16-2012 |
20120212271 | DUAL-TRIGGER LOW-ENERGY FLIP-FLOP CIRCUIT - One embodiment of the present invention sets forth a technique for technique for capturing and storing a level of an input signal using a dual-trigger low-energy flip-flop circuit that is fully-static and insensitive to fabrication process variations. The dual-trigger low-energy flip-flop circuit presents only three transistor gate loads to the clock signal and none of the internal nodes toggle when the input signal remains constant. One of the clock signals may be a low-frequency “keeper clock” that toggles less frequently than the other two clock signal that is input to two transistor gates. The output signal Q is set or reset at the rising clock edge using separate trigger sub-circuits. Either the set or reset may be armed while the clock signal is low, and the set or reset is triggered at the rising edge of the clock. | 08-23-2012 |
20120268182 | CLOCK GATED CIRCUIT AND DIGITAL SYSTEM HAVING THE SAME - A clock gated circuit includes a pulse generator and a pulse level shifter. The pulse generator is driven by a first power supply voltage and is configured to receive a clock signal to generate a pulse and an inverted pulse. The pulse level shifter is driven by a second power supply voltage higher than the first power supply voltage and is configured to receive the pulse and the inverted pulse and to convert a level of the pulse in response to an enable signal. | 10-25-2012 |
20120274377 | SINGLE-TRIGGER LOW-ENERGY FLIP-FLOP CIRCUIT - One embodiment of the present invention sets forth a technique for technique for capturing and storing a level of an input signal using a single-trigger low-energy flip-flop circuit that is fully-static and insensitive to fabrication process variations. The single-trigger low-energy flip-flop circuit presents only three transistor gate loads to the clock signal and none of the internal nodes toggle when the input signal remains constant. The output signal Q is set or reset at the rising clock edge using a single-trigger sub-circuit. A set or reset may be armed while the clock signal is low, and the set or reset is triggered at the rising edge of the clock. | 11-01-2012 |
20120306556 | DOUBLE EDGE TRIGGERED FLIP FLOP - A dual edge triggered flip flop circuit uses clock signals that are delayed from a first clock signal and from one another by respective intervals. A first set of the plurality of clock signals are used to operate a first latch circuit to allow first data to be conducted to a storage element for a period of time after a rising edge of a first clock signal. The clock signals are further used to operate a second latch circuit to allow second data to be conducted to the storage element for a period of time after a falling edge of the first clock signal. | 12-06-2012 |
20130154707 | RECOVERABLE AND RECONFIGURABLE PIPELINE STRUCTURE FOR STATE-RETENTION POWER GATING - A system, electronic circuit, and method are disclosed. A method embodiment comprises receiving a control signal associated with a power gating operation mode of an electronic circuit, applying a reference voltage to the electronic circuit based upon the power gating operation mode, and maintaining data representing a state of a logic stage of the electronic circuit based upon the power gating operation mode. Maintaining comprises, in the described embodiment, storing data of a state of a first logic stage of the electronic circuit within a first storage element in a first power gating operation mode, and recovering data of a state of a second logic stage of the electronic circuit utilizing the data of the state of the first logic stage of the electronic circuit within the first storage element in a second power gating operation mode. | 06-20-2013 |
20130169331 | APPARATUS - An embodiment of a circuit includes a data latch and a plurality of cascaded latches, wherein a first of the plurality of cascaded latches is configured to receive a first signal from the data latch and each subsequent cascaded latch is configured to receive a data output signal of a preceding cascaded latch, and an error-detection circuit configured to receive the respective data output signals and detect error in operation of the cascaded latches based thereon. | 07-04-2013 |
20130194016 | SYSTEM AND METHOD FOR GENERATING A CLOCK GATING NETWORK FOR LOGIC CIRCUITS - A system and method for generating a power efficient clock gating network for a Very Large Scale Integration (VLSI) circuit. Statistical analysis is performed upon the activity of component registers of the circuit and registers having correlated toggling behavior are clustered into sets and provided with common clock gaters. The clock gating network may be generated independently from the logical structure of the circuit. | 08-01-2013 |
20130222030 | PULSE SHIFTING CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT - A semiconductor integrated circuit includes a rupture instructing pulse generation unit configured to generate a rupture instructing pulse signal in response to a fuse rupture command signal and an address; a first anti-fuse rupture unit configured to perform an operation for rupturing a first anti-fuse during an enable period of the rupture instructing pulse signal, and generate rupture information of the first anti-fuse; a pulse shifting unit configured to delay the rupture instructing pulse signal and generate a delayed rupture instructing pulse signal; and a second anti-fuse rupture unit configured to perform an operation for rupturing a second anti-fuse during an enable period of the delayed rupture instructing pulse signal, and generate rupture information of the second anti-fuse. | 08-29-2013 |
20130234770 | DELAY MEASURING CIRCUIT AND DELAY MEASURING METHOD - A delay measuring circuit includes a first trigger-signal generating unit that, when a value of a signal input to a circuit under test, changes, generates a first trigger signal. The delay measuring circuit includes a second trigger-signal generating unit that, when a value of a signal output from the circuit under test changes, generates a second trigger signal. The delay measuring circuit includes a delay unit that includes a plurality of delay elements connected in series. The delay measuring circuit includes a delay information retaining unit that individually captures and retains the first trigger signal output from each of the delay elements included in the delay unit between when the first trigger signal is generated by the first trigger-signal generating unit and when the second trigger signal is generated by the second trigger-signal generating unit. | 09-12-2013 |
20130271196 | High Precision Single Edge Capture and Delay Measurement Circuit - A method and circuit for providing on-chip measurement of the delay between two signals includes first and second delay chains ( | 10-17-2013 |
20140028361 | SEMICONDUCTOR MODULE INCLUDING MODULE CONTROL CIRCUIT AND METHOD FOR CONTROLLING THE SAME - A module control circuit includes an input unit configured to receive a plurality of data signals from a plurality of data input/output pins and output an identification signal and an internal command signal. A latch unit is configured to latch the identification signal in accordance with a first enable signal to output a first group identification signal, latch the identification signal in accordance with a second enable signal to output a second group identification signal, and latch the internal command signal in accordance with the second enable signal to output a group command signal. A comparator is configured to compare the first group identification signal with the second group identification signal, and generate a selection signal. A multiplexer is configured to select one of the group command signal and a module command signal as an input command in response to the selection signal. | 01-30-2014 |
20140043078 | OPTIMIZED FLIP-FLOP DEVICE WITH STANDARD AND HIGH THRESHOLD VOLTAGE MOS DEVICES - A flip-flop operating with standard threshold voltage MOS devices as compared with high threshold voltage MOS devices may have improved speed performance, but greater leakage current. Likewise, a flip-flop operating with high threshold voltage MOS devices may reduce the leakage current and have better power efficiency, but decreased speed and performance. An optimized flip-flop may include a combination of standard threshold voltage MOS devices and high threshold voltage MOS devices. The optimized flip-flop may have less leakage during stand-by mode as compared to a flip-flop with standard threshold voltage MOS devices. In addition, the optimized flip-flop may have better performance and speed as compared to a flip-flop with high threshold voltage MOS devices. | 02-13-2014 |
20140055186 | ASYMMETRIC PROPAGATION DELAYS IN LEVEL SHIFTERS AND RELATED CIRCUITS - Aspects of the present disclosure are directed towards apparatus useful for processing communications between different signaling voltage levels. Different signaling voltage levels are accomplished by creating true and complement signals from at least one input signal, each of which are subject to different delays, and level shifting the true and complement signals to a new signaling voltage level. The true or complement signal subject to a smaller timing delay is selected, and used to provide an output signal. | 02-27-2014 |
20140210535 | Signal Level Conversion in Nonvolatile Bitcell Array - A system on chip (SoC) includes one or more core logic blocks that are configured to operate on a lower supply voltage and a memory array configured to operate on a higher supply voltage. Each bitcell in the memory has two ferroelectric capacitors connected in series between a first plate line and a second plate line to form a node Q. A data bit voltage is transferred to the node Q by activating a write driver to provide the data bit voltage responsive to the lower supply voltage. The data bit voltage is boosted on the node Q by activating a sense amp coupled to node Q of the selected bit cell, such that the sense amp senses the data bit voltage on the node Q and in response increases the data bit voltage on the node Q to the higher supply voltage. | 07-31-2014 |
20140247077 | SEMICONDUCTOR CIRCUIT - Provided is a semiconductor circuit. The semiconductor circuit includes a pulse generator which is enabled by a rising edge of a clock signal and generates a read pulse which varies depending on a voltage of a feedback node; and a sense amplifier which generates a voltage of a dynamic node and the voltage of the feedback node in accordance with a data value of an input signal using the read pulse. | 09-04-2014 |
20140340135 | CONTROLLING CLOCK INPUT BUFFERS - An integrated circuit may have a clock input pin coupled to a buffer ( | 11-20-2014 |
20140354338 | LENGTH-OF-DIFFUSION PROTECTED CIRCUIT AND METHOD OF DESIGN - A circuit includes a pulsed-latch circuit. The pulsed-latch circuit includes a first plurality of transistors. One or more of the first plurality of transistors is length-of-diffusion (LOD) protected. | 12-04-2014 |
20150015316 | PERSISTENT NODES FOR RFID - An RFID transponder in one embodiment comprises a radio frequency (RF) transceiver, processing logic coupled to the RF transceiver, a switch coupled to the processing logic, a tunneling device coupled to the switch and a differential sensing circuit having a first input coupled to the tunneling device and a second input coupled to a predetermined reference voltage. In one embodiment, the tunneling device can discharge to a voltage below the predetermined reference voltage. | 01-15-2015 |
20150070062 | Filtered Radiation Hardened Flip Flop with Reduced Power Consumption - A flip flop circuit has a first stage and a second stage. The first stage and the second stage each have interleaved filters. | 03-12-2015 |
20150091626 | STATE RETENTION POWER GATED CELL - A state retention power gated cell includes a logic cell arranged in two or more rows. The logic cell has an active layer including at least a first well and a second well disposed in first and second rows, respectively. In a normal operation mode, the first well is powered with a first bias voltage, the second well is powered with a second bias voltage, the first power supply line is powered with VDDC, and the second power supply line is powered with VDD. In a standby mode, the first well preferably is powered down, the second well is powered with the second bias voltage, the first power supply line is powered with VDDC, and the second power supply line is powered down. | 04-02-2015 |
20160049937 | ACTIVITY CORRELATION BASED OPTIMAL CLUSTERING FOR CLOCK GATING FOR ULTRA-LOW POWER VLSI - A clustering bus-specific clock gating method is described to reduce the dynamic power consumed by redundant clock ticks in gate-level. The method exploits correlations between flip-flops for clock gating. An activity correlation matrix is introduced to describe the correlations between the flip-flops. Based on activity correlation information, the flip-flops are classified into several clusters. A payoff function is also described to find an optimal classification scheme. Based on the classification strategy, flip-flop clusters that are less active and more correlated will be gated. | 02-18-2016 |
20160087610 | SEMICONDUCTOR DEVICE - A semiconductor device includes a first sampling circuit for outputting a data value and an edge value corresponding to odd-numbered data of data contained in an input signal, using multiphase sampling clocks including a plurality of sampling clocks having different phases by 90 degrees; and a second sampling circuit for outputting a data value and an edge value corresponding to even-numbered data of data contained in the input signal, using the multiphase sampling clocks. One piece of data is sampled in one sampling period, and two sampling periods are included in one cycle of the sampling clock, the first sampling circuit and the second sampling circuit each including a first data sampling circuit which adds a negative offset to a signal level of the input signal, samples the input signal, and outputs a first data value. | 03-24-2016 |