Class / Patent application number | Description | Number of patent applications / Date published |
327087000 | Having feedback | 10 |
20080315924 | COMPARATOR WITH LOW OFFSET VOLTAGE - A differential comparator is provided. The comparator receiving two differential signals and generating a comparison result represented by an output signal on one of two output terminals respectively on two current paths. The comparator comprises two pairs of latch transistors respectively disposed on the two current paths and two pairs of input transistors respectively disposed on the two current paths, wherein gates of the latch transistors on one of the current paths are commonly coupled to the output terminal between the latch transistors on the other current path, gates of the input transistors on one of the current paths respectively receives an input signal of one of the differential signals and a reference signal of the other differential signal and each of the input transistors is disposed between the output terminal and one of the latch transistors on the current path thereof. | 12-25-2008 |
20110018588 | LEVEL-SHIFTER CIRCUIT - A level-shift circuit, comprising: an input, for receiving a first voltage; an output, for outputting a second voltage; a resistor array comprising one or more resistors connected in series to the input; a current sink for providing a current that is independent of the first voltage; a switch arrangement comprising a plurality of switch connections for establishing a selected one from a plurality of force paths between the current sink and the input, the selected force path comprising a selected number of the one or more resistors of said resistor array; and at least one connection between the output and the resistor array that provides a sense path between the resistor array and the output that does not comprise any of the switch connections used to establish each of the plurality of force paths. | 01-27-2011 |
20120013367 | Power stage control circuit - The present invention discloses a power stage control circuit including: a driver circuit for controlling a power stage according to an error amplified signal; an error amplifier circuit for comparing a feedback voltage at a feedback terminal with a reference signal to generate the error amplified signal; a current generator circuit coupled to the feedback terminal for generating a fault detection current flowing to the feedback terminal; and a feedback terminal short detection circuit for generating a fault signal to stop the operation of the power stage when the feedback voltage is smaller than a short-circuit threshold voltage or when the fault detection current is larger than a short-circuit threshold current. | 01-19-2012 |
20120218004 | POWER SUPPLY APPARATUS FOR TEST APPARATUS - A first A/D converter converts an analog observed value, which corresponds to a power supply signal supplied to a power supply terminal of a DUT, into a digital observed value. By means of digital calculation processing, a digital signal processing circuit generates a control value that is adjusted such that the digital observed value matches a predetermined reference value. A first D/A converter supplies, via a power supply line to the power supply terminal of the DUT, an analog power supply signal obtained by performing digital/analog conversion of the control value. A load estimating unit applies a test signal containing a predetermined frequency component via the power supply line to a node via which the power supply terminal is to be connected, and generates a control parameter for the digital signal processing circuit according to the test signal and the observed signal. | 08-30-2012 |
20130027089 | CIRCUIT AND METHOD FOR DETECTING MULTIPLE SUPPLY VOLTAGES - An apparatus comprises a supply voltage divider, a state machine, two comparators and a threshold selector. The supply voltage divider divides a V | 01-31-2013 |
20130043908 | SENSOR INTERFACE MAKING USE OF VIRTUAL RESISTOR TECHNIQUES - Some embodiments of the present disclosure relate to a sensor interface module. The sensor interface module includes a comparator having a first comparator input, a second comparator input, and a comparator output. A current- or voltage-control element has a control terminal coupled to the comparator output and also has an output configured to deliver a modulated current or modulated voltage signal to an output of the sensor interface module. A first feedback path couples the output of the current- or voltage-control element to the first comparator input. A summation element has a first summation input, a second summation input, and a summation output, wherein the summation output is coupled to the second comparator input. A supply voltage module provides a supply voltage signal to the first summation input. A second feedback path couples the comparator output to the second summation input. | 02-21-2013 |
20130207693 | Resistance-Capacitance Calibration Circuit without Current Mismatch and Method thereof - A resistor-capacitor (RC) calibration circuit includes: a current source, providing a current to a first node; a first switch, coupled between the first node and a second node; a second switch, coupled between the first node and a third node; a resistor, coupled between a reference terminal and the second node; a variable capacitor, coupled between the reference terminal and the third node; a third switch, coupled between the third node and the reference terminal; a comparator, comprising a first input coupled to the second node and a second input coupled to the third node; and a logic controller, coupled between an output of the comparator and the variable capacitor for outputting an adjusting signal according to an output signal of the comparator to adjust a capacitance of the variable capacitor. | 08-15-2013 |
20140152346 | COMPARATOR - A comparator comprises a differential amplifier type including input MOSFETs receiving differential input of a reference voltage and an input voltage, load MOSFETs for the input MOSFETs, and a constant current source to supply the sources of the input MOSFETs. The comparator comprises a Zener diode that is connected between the gate and source of the input MOSFETs and exhibits a breakdown voltage lower than the withstand voltage of the gate oxide film of the input MOSFET. Another comparator further comprises a feedback MOSFET that performs negative feedback of an output voltage of a main body comparator to the gates of the load MOSFETs to restrict the amplitude of the output voltage. Still another comparator further comprises a semiconductor rectifying element that exhibits a reverse-blocking characteristic higher than the power supply voltage and is interposed between the constant current source and the source of each of the input MOSFETs. | 06-05-2014 |
20140266315 | VOLTAGE THRESHOLD CALIBRATION TECHNIQUES FOR LEVEL DETECTORS - Some embodiments relate to a level detector, comprising a current mirror including first and second current legs to carry first and second signals, respectively. The first current leg includes a first variable resistor and the second current leg includes a second variable resistor. During a calibration mode, a switching element provides a predetermined reference voltage across first and second control terminals of the first and second variable resistors, respectively. During a non-calibration mode, the switching element decouples the predetermined reference voltage from the first and second control terminals, and provides a signal across the first and second control terminals. Other embodiments are also disclosed. | 09-18-2014 |
20150145562 | LOAD DETECTION CIRCUIT AND METHOD - In one embodiment, a load detection circuit may include a first circuit configured to control a first transistor to form a load current to a load in a first operating mode of the load detection circuit, a second circuit configured to be coupled to form at least a portion of the load current in a second operating mode of the load detection circuit, and a detection circuit configured to detect the control electrode of the first transistor having a value that is less than a threshold value of the first transistor. | 05-28-2015 |