Class / Patent application number | Description | Number of patent applications / Date published |
327080000 | Reference determined by threshold of single circuit element | 21 |
20090160491 | INFORMATION PROCESSING APPARATUS - According to one embodiment, an information processing apparatus includes a device connection detection module which monitors a potential of the signal line by disabling the function of a second pull-up resistor by means of a switch circuit and detects that the first or second device has been connected if the potential becomes no higher than a first threshold. The apparatus further includes a device determination module which assesses the potential of the signal line by enabling the function of the second pull-up resistor by means of the switch circuit, and determines, if the potential exceeds a second threshold that is higher than the first threshold, that the first device has been connected, or, if the potential is no higher than the first threshold, that the second device has been connected. | 06-25-2009 |
20100148826 | DIFFERENTIAL COMPARATOR WITH SKEW COMPENSATION FUNCTION AND TEST APPARATUS USING THE SAME - One of differential signals is inputted to a first input terminal. The other of the differential signals is inputted to a second input terminal. A first sample hold circuit samples the signal inputted to the first input terminal and hold it thereafter. A second sample hold circuit samples the signal inputted to the second input terminal and holds it thereafter. A comparison unit compares a signal corresponding to a difference between respective output signals from the first and the second sample hold circuits, with a predetermined threshold value. A latch circuit latches an output from the comparison unit. Sample timings of the first and the second sample hold circuits and a latch timing of the latch circuit can be adjusted independently. | 06-17-2010 |
20100327915 | SEMICONDUCTOR DEVICE AND METHOD FOR RESETTING THE SAME - An object is to provide a semiconductor device within which a signal which can be used as a reset signal or a mode signal is produced at an arbitrary timing to reduce the number of pads of the semiconductor device. To achieve the object, in a semiconductor device ( | 12-30-2010 |
20110199126 | SEMICONDUCTOR DEVICE HAVING RING-SHAPED GATE ELECTRODE, DESIGN APPARATUS, AND PROGRAM - A semiconductor device includes: a substrate; a transistor that has a ring-shaped gate electrode formed on the substrate; a plurality of external dummy electrodes that are arranged outside the gate electrode and are formed in the same layer as the gate electrode; and at least one internal dummy electrode that is arranged inside the gate electrode and is formed in the same layer as the gate electrode. | 08-18-2011 |
20110291705 | ELECTRONIC EQUIPMENT AND POWER SUPPLY CONTROL METHOD - Electronic equipment includes a battery, an interface portion to which a recording medium can be attached, a kind detection portion for detecting the kind of a recording medium, an access processing portion for executing a predetermined access process to a recording medium, a current consumption detection portion for detecting a value of current consumed by execution of the predetermined access process to the recording medium, an additional storage portion for storing a current consumption value corresponding to the detected kind into a storage portion, a power supply circuit for taking out and outputting electric power from the battery, and a power supply control portion for controlling the power supply circuit. The power supply control portion varies control on the power supply circuit in accordance with the current consumption value stored corresponding to the detected kind. | 12-01-2011 |
20120043993 | HOST COMPUTER - A host computer includes an enclosure, a motherboard mounted in the enclosure. The motherboard includes a battery, a reference voltage generating circuit, an electronic switch, an alarm unit mounted on the enclosure, and a comparator. The reference voltage generating circuit generates a reference voltage. The comparator is connected to the battery and the reference voltage generating circuit to receive the reference voltage and detect a voltage of the battery. The comparator compares the detected voltage of the battery with the reference voltage, and outputs a control signal to turn on the electronic switch to start the alarm unit when the voltage of the battery is less than the reference voltage. | 02-23-2012 |
20130088263 | ELECTRIC CHARGE FLOW CIRCUIT FOR A TIME MEASUREMENT - A charge flow circuit for a time measurement, including a plurality of elementary capacitive elements electrically in series, each elementary capacitive element leaking through its dielectric space. | 04-11-2013 |
327081000 | With transistor | 14 |
20100090727 | VOLTAGE DETECTION CIRCUIT AND BGR VOLTAGE DETECTION CIRCUIT - A voltage detection circuit of the present invention includes an NMOS transistor diode-connected, a gate and a drain thereof being supplied with a power supply voltage, a resistor connected between a source of the NMOS transistor and a ground potential, and a source voltage detection circuit receiving a voltage of the source, wherein an NMOS type transistor is employed as the NMOS transistor, a channel width and a channel length of the NMOS type transistor being set in such a manner that an operating point on a VG-ID curve of the NMOS type transistor may come to a certain point, at the certain point, a drain current of the NMOS type transistor being constant even if the temperature fluctuates. | 04-15-2010 |
20110260756 | Buffer Circuit for a Capacitive Load of High Value - A buffer circuit including an input terminal capable of receiving an input signal and an output terminal capable of being connected to a capacitive load, including an output circuit a series connection, between two terminals of application of a power supply voltage, of a first MOS transistor, a first and a second resistor of adjustable values, and a second MOS transistor, and means for controlling said first and second transistors receiving the input signal The buffer circuit further includes means for comparing the voltage on the output terminal of the circuit with at least one threshold voltage, the comparison means being connected to said control means. | 10-27-2011 |
20120133397 | System and Method for Driving a Switch - In accordance with an embodiment, a circuit for driving a switch includes a driver circuit. The driver circuit includes a first output configured to be coupled to a gate of the JFET, a second output configured to be coupled to a gate of the MOSFET, a first power supply node, and a bias input configured to be coupled to the common node. The switch to be driven includes a JFET coupled to a MOSFET at a common node. | 05-31-2012 |
20120242373 | METHODS AND DEVICES FOR DETECTING SINGLE-EVENT TRANSIENTS - Methods and devices for detecting single-event transients in combinational logic circuits and other circuits. A sensing circuit detects a voltage or current deviation at a bulk contact node of a transistor. Output of the sensing circuit is amplified and used to flip a latch. Output of the latch may be evaluated and used in possible error correction measures. | 09-27-2012 |
20120249185 | PROTECTION CIRCUIT FOR DRIVING CAPACITIVE LOADS - A detection circuit is coupled to an output terminal of a driver circuit. The detection circuit includes a comparator to compare a signal at the output terminal to a reference signal corresponding to a signal that would be generated if a capacitive load having a relatively high capacitance value were connected to the output terminal. Output of the comparator is sampled at a predetermined time after the driver circuit provides the drive signal. An error signal is generated when the sampled output indicates that the capacitive load having the relatively high capacitance value is actually connected to the output terminal. | 10-04-2012 |
20120256658 | COMPARATOR CIRCUIT - A comparator circuit, includes a first power source terminal having a first potential, a second power source terminal having a second potential different from the first potential, a detection voltage terminal, a reference voltage generator coupled between the first power source terminal and the second power source terminal, the reference voltage generator generating a middle potential which is a potential between the first potential and the second potential and outputting the middle potential at a middle potential node, the reference voltage generator further generating a reference voltage, a bias unit coupled between the first power source terminal and the middle potential node, the bias unit receiving the reference voltage and generating a corresponding reference voltage by using the first potential and the middle potential as energy sources thereof, and a comparator unit coupled between the first and second power source terminals and the detection voltage terminal. | 10-11-2012 |
20120274361 | COMPARATOR AND SEMICONDUCTOR DEVICE INCLUDING COMPARATOR - A chopper comparator with a novel structure is provided. The comparator includes an inverter, a capacitor, a first switch, a second switch, and a third switch. An input terminal and an output terminal of the inverter are electrically connected to each other through the first switch. The input terminal of the inverter is electrically connected to one of a pair of electrodes of the capacitor. A reference potential is applied to the other of the pair of electrodes of the capacitor through the second switch. A signal potential input is applied to the other of the pair of electrodes of the capacitor through the third switch. A potential output from the output terminal of the inverter is an output signal. A transistor whose channel is formed in an oxide semiconductor layer is used as the first switch. | 11-01-2012 |
20130082742 | LOAD DETECTING CIRCUITS AND THE METHOD THEREOF - A no-load detecting circuit and the method thereof are disclosed. The no-load detecting circuit may be applied in switching mode power supplies or other circuits. The no-load detecting circuit comprises: a variable resistance circuit coupled in series to a load of the switching mode power supply; and a first comparison circuit coupled to the variable resistance circuit to receive the voltage across the variable resistance circuit, wherein based on the comparison of the voltage across the variable resistance circuit and a first threshold, the first comparison circuit generates a no-load detecting signal indicative of the load status; wherein the equivalent resistance of the variable resistance circuit varies based on the varying of the load of the switching mode power supply. | 04-04-2013 |
20130176058 | VOLTAGE COMPARISON CIRCUIT - There is provided a voltage comparison circuit including: a voltage adjustment section connected between a first potential supply line and a first node; a first constant current source connected between the first node and a fixed potential supply line; a switch element connected between a second potential supply line and a second node, and including a control terminal connected to the first node, the switch element operating in accordance with a voltage of the first node; and a second constant current source connected between the second node and the fixed potential supply line. | 07-11-2013 |
20140203843 | Desaturation Detection Circuit For Use Between The Desaturation Detection Input Of An Optocoupler And The Output Of A Power Switching Device - A desaturation detection circuit for use between the desaturation detection input of an optocoupler and the output of a power switching device, the desaturation detection circuit comprising: a threshold setting element having an input and an output, the input for connection to the output of a power switching device via one or more diode(s), the threshold setting element being arranged to set a threshold voltage at the input at which the threshold setting element will provide an output at the output of the threshold setting element when the input voltage is exceeded, and a detector having an input connected to the output of the threshold setting element and an output connectable to a desaturation detection input of an optocoupler, the detector being arranged to detect an output at the output of the threshold setting element and in response to provide a control signal at the output of the detector for the desaturation detection input to trigger a desaturation routine in the optocoupler. | 07-24-2014 |
20140266314 | Power Monitoring Circuit, and a Power Up Reset Generator - A power supply monitoring circuit for monitoring a voltage at a power supply node compared to a reference node, the power supply monitoring circuit comprising a first field effect transistor and first and second voltage dropping components arranged in current flow communication between the power supply node and the reference node and each having first and second nodes, and wherein a first node of the first voltage dropping component is connected to one of the first and second nodes of the field effect transistor, and a gate of the field effect transistor is connected to the second node of the first voltage dropping component, and an output signal is taken from a connection made with the first field effect transistor. | 09-18-2014 |
20150070052 | REFERENCE VOLTAGE GENERATOR FOR SINGLE-ENDED COMMUNICATION SYSTEMS - An improved reference voltage (Vref) generator for a single-ended receiver in a communication system is disclosed. The Vref generator in one example comprises a cascoded current source for providing a current, I, to a resistor, Rb, to produce the Vref voltage (I*Rb). Because the current source isolates Vref from a first of two power supplies, Vref will vary only with the second power supply coupled to Rb. As such, the improved Vref generator is useful in systems employing signaling referenced to that second supply but having decoupled first supplies. For example, in a communication system in which the second supply (E.g. Vssq) is common to both devices, but the first supply (Vddq) is not, the disclosed Vref generator produces a value for Vref that tracks Vssq but not the first supply. This improves the sensing of Vssq-referenced signals in such a system. | 03-12-2015 |
20160149567 | SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICE - In a configuration including a first circuit for retaining a plurality of analog voltages and a second circuit capable of reading one of the analog voltages as a digital signal, correct data can be read even when characteristics of transistors in the first and second circuits vary with the temperature change. A reference voltage is applied to a gate of a transistor in the second circuit whose threshold voltage varies with the temperature change, and a corrected reference voltage is generated by adding a threshold voltage variation of the transistor in the second circuit to the reference voltage. An analog voltage is read out as a digital signal with the use of the corrected reference voltage, resulting in readout of correct data obtained by canceling out variations in characteristics due to the temperature change of the transistor in the first circuit. | 05-26-2016 |
20160173077 | METHOD AND APPARATUS FOR A BROWN OUT DETECTOR | 06-16-2016 |