Entries |
Document | Title | Date |
20080297191 | APPARATUS AND METHOD OF ERROR DETECTION AND CORRECTION IN A RADIATION-HARDENED STATIC RANDOM ACCESS MEMORY FIELD-PROGRAMMABLE GATE ARRAY - The present system comprises a radiation tolerant programmable logic device having logic modules and routing resources coupling together the logic modules. Configuration data lines providing configuration data control the programming of the logic modules and the routing resources. Error correction circuitry coupled to the configuration data lines analyzes and corrects any errors in the configuration data that may occur due to a single event upset (SEU). | 12-04-2008 |
20090027078 | FAULT TOLERANT ASYNCHRONOUS CIRCUITS - New and improved methods and circuit designs for asynchronous circuits that are tolerant to transient faults, for example of the type introduced through radiation or, more broadly, single-event effects. SEE-tolerant configurations are shown and described for combinational logic circuits, state-holding logic circuits and SRAM memory circuits. | 01-29-2009 |
20090102506 | ADAPTER - An exemplary adapter comprises an input port for connecting to a first hardware device; an output port for connecting to a second hardware device; a standby output port for connecting to the second hardware device; a programmable logic device (PLD) having at least one input terminal connected to the input port, at least one output terminal connected to the output port, at least one standby output terminal connected to the standby output port, and at least one control terminal to receive a voltage signal; and a jumper connected to the control terminal of the PLD to send a voltage signal thereto, wherein the input terminal of the PLD is selectively coupled to the output terminal or the standby output terminal of the PLD under the control of the voltage signal. | 04-23-2009 |
20090108866 | RADIATION HARDENED LOGIC CIRCUITS - A radiation hardened inverter includes first and second electrical paths between an input terminal and an output terminal. A first PFET is disposed in the first electrical path, and a bipolar junction transistor (BJT) is disposed in the second electrical path. The first PFET is configured to convert a low level signal at the input terminal to a high level signal at the output terminal, and the BJT is configured to convert a high level signal at the input terminal to a low level signal at the output terminal. The radiation hardened inverter includes a second PFET disposed in the second electrical path. The second PFET is configured to provide a path for bleeding excess current away from the BJT. The radiation hardened inverter also includes a current limiting PFET disposed in the second electrical path. The current limiting PFET is configured to limit current flowing into a base of the BJT. The radiation hardened inverter is free-of any NFETs. | 04-30-2009 |
20090115447 | Design Structure for an Integrated Circuit Having State-Saving Input-Output Circuitry and a Method of Testing Such an Integrated Circuit - A design structure for an integrated circuit that includes input/output (I/O) state saving circuitry capable of stabilizing the I/O states during any predicted I/O disturbance event. The I/O state saving circuitry includes a plurality of transparent latches arranged between the output of a plurality of respective I/O receivers and the internal digital, analog, or mixed-signal circuitry of the integrated circuit. The transparent latches are transitioned between a pass-through mode and a state-saving mode via a common control signal. In anticipation of, for example, a predicted I/O signal disturbance generating event, the transparent latches are set to the state-saving mode. Consequently, the outputs of the transparent latches are held stable and glitchless during the disturbance event, which ensures that the internal logic of the integrated circuit does not lose state. | 05-07-2009 |
20090134906 | Resilient Integrated Circuit Architecture - The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function. The assignment, routing, fault detection, and re-assignment and data re-routing can occur in real time for a wide variety of programs and algorithms, providing for the IC to continue the same functioning despite defects which may arise during operation. | 05-28-2009 |
20090134907 | Fault Tolerant Integrated Circuit Architecture - The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function. The assignment, routing, fault detection, and re-assignment and data re-routing can occur in real time for a wide variety of programs and algorithms, providing for the IC to continue the same functioning despite defects which may arise during operation. | 05-28-2009 |
20090140764 | Latch Circuit - A latch circuit includes a feedback circuit having inverter circuits and at least two input terminals and an input circuit for inputting input signals or signals having the same phase as the input signals to the input terminals of the feedback circuit in synchronization with a clock signal. In the feedback circuit section, only when the input signals or the signals having the same phase as the input signals are input to the at least two input terminals at the same time, positive feedback using a predetermined number of amplification stages is applied to the input terminals. | 06-04-2009 |
20090201044 | LOGIC PERFORMANCE IN CYCLIC STRUCTURES - Apparatus, systems, and methods may operate to identify state holding elements and functional logic elements in an original cyclic structure, and to insert additional state holding elements or initial tokens in series with the identified functional logic elements to create a modified cyclic structure, wherein the additional state holding elements or initial tokens have substantially identical functionality to the original state holding elements. Other activities may include coupling additional functional logic elements to output nodes of the modified cyclic structure, wherein the additional functional logic elements have substantially identical functionality to the original functional logic elements. Additional apparatus, systems, and methods are disclosed. | 08-13-2009 |
20090206872 | SYSTEM, METHOD AND APPARATUS FOR ENHANCING RELIABILITY ON SCAN-INITIALIZED LATCHES AFFECTING FUNCTIONALITY - A system, method, and apparatus for enhancing reliability on scan-initialized latches that affect functionality in a digital design are provided. The system includes a group of latches that affect functionality in the digital design based on state values of the latches, where the latches are scan initialized. The system also includes a disable allowance latch (DAL) allocated to the group of latches, where the DAL is a scan-initialized latch. The system further includes a gating function outputting the state value of at least one of the latches in the group to a functional block in the digital design in response to the DAL being in an enabled state and blocking the gating function output in response to the DAL being in a disabled state. | 08-20-2009 |
20090278564 | RECONFIGURABLE INTEGRATED CIRCUIT AND METHOD FOR INCREASING PERFORMANCE OF A RECONFIGURABLE INTEGRATED CIRCUIT - Methods are disclosed to increase yielded performance of a reconfigurable integrated circuit; improve performance of an application running on a reconfigurable integrated circuit; reduce degradation of an integrated circuit over time; and maintain performance of an integrated circuit time. | 11-12-2009 |
20090302884 | SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND COUNTERMEASURE METHOD AGAINST NBTI DEGRADATION - A semiconductor integrated circuit device includes a target circuit of a low power consumption mode having at least one flip-flop circuit to which a clock signal is supplied in a normal operation mode and in a low power consumption mode, and a logic circuit to which each output of the at least one flip-flop circuit is input, wherein each of the flip-flop circuits includes a selector that selects a normal data signal in the normal operation mode, selects an inverted output of the flip-flop circuit in the low power consumption mode, based on an operation-mode switching signal that designates switching between the normal operation mode and the low power consumption mode, and inputs the selected signal to a data input terminal of the flip-flop circuit. | 12-10-2009 |
20090309627 | Methodology and Apparatus for Reduction of Soft Errors in Logic Circuits - The present invention includes a circuit-level system and method for preventing the propagation of soft errors in logic cells. A radiation jammer circuit in accordance with the present invention, including an RC differentiator and a depletion mode MOS circuit, when inserted at the output of a logic cell, significantly reduces the propagation of transient glitches. The radiation jammer circuit is a novel transistor-level optimization technique, which has been used to reduce soft errors in a logic circuit. A method to insert radiation jammer cells on selective nodes in a logic circuit for low overheads in terms of delay, power, and area is also introduced. | 12-17-2009 |
20100033207 | Fault Tolerant Integrated Circuit Architecture - The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function. The assignment, routing, fault detection, and re-assignment and data re-routing can occur in real time for a wide variety of programs and algorithms, providing for the IC to continue the same functioning despite defects which may arise during operation. | 02-11-2010 |
20100039135 | SEMICONDUCTOR INTEGRATED CIRCUIT - Semiconductor integrated circuit has a control circuit. The control circuit causes the clock signal generating circuit to control the first clock signal and the second clock signal to make a logic of data held by the first data holding terminal and a logic of data held by the second data holding terminal equal to each other, and switches on the switch circuit, and the error detection circuit senses a logic of the first data holding terminal and a logic of the second data holding terminal after switching on the switching circuit. | 02-18-2010 |
20100079164 | Systems and Methods for Improving the PN Ratio of a Logic Gate by Adding a Non-Switching Transistor - Systems and methods for improving a PN ratio of a logic gate by adding a non-switching transistor. In one embodiment, the logic gate includes a plurality of PMOS switching transistors and a plurality of NMOS switching transistors that are switched on and off by received input signals. The PMOS and NMOS switching transistors are interconnected to perform a logic operation on the input signals and produce a corresponding output signal. The non-switching transistor is inserted in the circuit to improve the ratio of PMOS and NMOS transistors between the power nodes of the logic gate. The non-switching transistor is either a PMOS transistor or an NMOS transistor as needed to make the PN ratio closer to 1. The non-switching transistor is biased to keep it switched on and does not affect the logic functions of the gate. | 04-01-2010 |
20100244889 | Resilient Integrated Circuit Architecture - The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function. The assignment, routing, fault detection, and re-assignment and data re-routing can occur in real time for a wide variety of programs and algorithms, providing for the IC to continue the same functioning despite defects which may arise during operation. | 09-30-2010 |
20100283502 | ASYNCHRONOUS NANO-ELECTRONICS - Asynchronous nanoelectronic circuits that operate according to principles of quasi-delay insensitive design are described. Circuit or logic elements comprising n-type devices are fabricated in a first n-plane, p-type devices are fabricated in a p-plane, and connections are formed in a routing plane of a compute tile. A state-holding element comprising a selected one of a C-element, a precharge function-block, and a read-write register is described. The state-holding element can hold a value of an output of a logic element during a time when the output is disconnected from a reference voltage. Isochronic forks having an adversary path designed to make state transitions safe are explained. | 11-11-2010 |
20100321058 | Fault Tolerant Integrated Circuit Architecture - The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function. The assignment, routing, fault detection, and re-assignment and data re-routing can occur in real time for a wide variety of programs and algorithms, providing for the IC to continue the same functioning despite defects which may arise during operation. | 12-23-2010 |
20110006803 | LATCH CIRCUIT - A latch circuit includes a feedback circuit having inverter circuits and at least two input terminals and an input circuit for inputting input signals or signals having the same phase as the input signals to the input terminals of the feedback circuit in synchronization with a clock signal. In the feedback circuit section, only when the input signals or the signals having the same phase as the input signals are input to the at least two input terminals at the same time, positive feedback using a predetermined number of amplification stages is applied to the input terminals. | 01-13-2011 |
20110025372 | METHOD AND APPARATUS FOR REDUCING RADIATION AND CROSS-TALK INDUCED DATA ERRORS - The different advantageous embodiments provide an integrated circuit comprising a number of latches and a number of filters. Each latch in the number of latches has a plurality of inputs and a plurality of storage nodes. The plurality of storage nodes includes a number of pairs of circuit nodes that form a number of upsettable circuit node pairs. Each input of the plurality of inputs is connected to a corresponding storage node in the plurality of storage nodes. Each filter in the number of filters has an input and a plurality of outputs. Each of the plurality of outputs is connected to a corresponding input of the plurality of inputs of a latch in the number of latches. Each filter in the number of filters is located between two circuit nodes forming an upsettable circuit node pair of the latch in the number of latches to increase critical node spacing. | 02-03-2011 |
20110057683 | DEFECT-AND-FAILURE-TOLERANT DEMULTIPLEXER USING SERIES REPLICATION AND ERROR-CONTROL ENCODING - One embodiment of the present invention is a method for constructing defect-and-failure-tolerant demultiplexers. This method is applicable to nanoscale, microscale, or larger-scale demultiplexer circuits. Demultiplexer circuits can be viewed as a set of AND gates, each including a reversibly switchable interconnection between a number of address lines, or address-line-derived signal lines, and an output signal line. Each reversibly switchable interconnection includes one or more reversibly switchable elements. In certain demultiplexer embodiments, NMOS and/or PMOS transistors are employed as reversibly switchable elements. In the method that represents one embodiment of the present invention, two or more serially connected transistors are employed in each reversibly switchable interconnection, so that short defects in up to one less than the number of serially interconnected transistors does not lead to failure of the reversibly switchable interconnection. In addition, error-control-encoding techniques are used to introduce additional address-line-derived signal lines and additional switchable interconnections so that the demultiplexer may function even when a number of individual, switchable interconnections are open-defective. | 03-10-2011 |
20110128035 | CLOSED-LOOP SOFT ERROR RATE SENSITIVITY CONTROL - Disclosed is a closed-loop feedback system for controlling the soft error rate (SER) due to radiation strikes on electronic circuitry. A variable sensitivity soft error rate detector provides and output corresponding to the soft error rate. This output is supplied to a voltage control. The output of the voltage control is fed back to the sensitivity control of the sensor—thus forming a feedback loop. The output of the voltage control may be the power supply of the soft error rate sensor. The output of the soft error rate sensor may also be used to enable and disable fault tolerant schemes or alert a user. | 06-02-2011 |
20110260750 | Fault Tolerant Integrated Circuit Architecture - The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function. The assignment, routing, fault detection, and re-assignment and data re-routing can occur in real time for a wide variety of programs and algorithms, providing for the IC to continue the same functioning despite defects which may arise during operation. | 10-27-2011 |
20110298490 | ASYMMETRICAL AGING CONTROL SYSTEM - An asymmetrical aging control system is described. This system actively varies associated dedicated circuits in a manner that minimizes power consumption, while preventing asymmetrical aging. | 12-08-2011 |
20110309856 | METHOD AND APPARATUS FOR REDUCING RADIATION AND CROSS-TALK INDUCED DATA ERRORS - The different advantageous embodiments provide an integrated circuit comprising a number of latches and a number of filters. Each latch in the number of latches has a plurality of inputs and a plurality of storage nodes. The plurality of storage nodes includes a number of pairs of circuit nodes that form a number of upsettable circuit node pairs. Each input of the plurality of inputs is connected to a corresponding storage node in the plurality of storage nodes. Each filter in the number of filters has an input and a plurality of outputs. Each of the plurality of outputs is connected to a corresponding input of the plurality of inputs of a latch in the number of latches. Each filter in the number of filters is located between two circuit nodes forming an upsettable circuit node pair of the latch in the number of latches to increase critical node spacing. | 12-22-2011 |
20120038386 | LATCH CIRCUIT - A latch circuit includes a feedback circuit having inverter circuits and at least two input terminals and an input circuit for inputting input signals or signals having the same phase as the input signals to the input terminals of the feedback circuit in synchronization with a clock signal. In the feedback circuit section, only when the input signals or the signals having the same phase as the input signals are input to the at least two input terminals at the same time, positive feedback using a predetermined number of amplification stages is applied to the input terminals. | 02-16-2012 |
20120086468 | Method and system for introducing physical damage into an integrated circuit device for verifying testing program and its results - According to an embodiment of the disclosure, a method verifies bitmap information or test data information for a semiconductor device. The method places a defect on a semiconductor device at an actual defect location using a laser to physically damage the semiconductor device. A logical address associated with the defect is detected and bitmap information or test data information is reviewed to determine an expected location corresponding to the logical address. Then, the accuracy of the bitmap information or the test data information is determined by comparing the actual defect location with the expected location. A deviation between the two indicates an inaccuracy. | 04-12-2012 |
20120098565 | Resilient Integrated Circuit Architecture - The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function. The assignment, routing, fault detection, and re-assignment and data re-routing can occur in real time for a wide variety of programs and algorithms, providing for the IC to continue the same functioning despite defects which may arise during operation. | 04-26-2012 |
20120146685 | Fault Tolerant Integrated Circuit Architecture - The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function, providing for the IC to continue the same functioning despite defects which may arise during operation. | 06-14-2012 |
20120182042 | SEMICONDUCTOR APPARATUS, METHOD FOR ASSIGNING CHIP IDS THEREIN, AND METHOD FOR SETTING CHIP IDS THEREOF - A semiconductor apparatus having first and second chips includes a first operation unit disposed in the first chip, and is configured to perform a predetermined arithmetic operation for an initial code according to a first repair signal and generate a first operation code; and a second operation unit disposed in the second chip, and configured to perform the predetermined arithmetic operation for the first operation code according to a second repair signal and generate a second operation code. | 07-19-2012 |
20120223735 | DETECTION OF SINGLE BIT UPSET AT DYNAMIC LOGIC DUE TO SOFT ERROR IN REAL TIME - A circuit for detecting a single bit upset in a dynamic logic circuit includes a latch circuit having an input for receiving a reset signal, and an output for providing a flag output signal, the latch circuit being clocked by a first clock signal, a first transistor having a drain coupled to the output of the latch circuit, a gate for receiving a second clock signal, and a source, and a second transistor having a drain coupled to the source of the first transistor, a gate for receiving a third clock signal, and a source coupled to ground. | 09-06-2012 |
20130002287 | APPARATUS FOR IMPROVING RELIABILITY OF ELECTRONIC CIRCUITRY AND ASSOCIATED METHODS - In an exemplary embodiment, an apparatus includes a first set of circuit elements and a second set of circuit elements. The first set of circuit elements is used in a first configuration of the apparatus, and the second set of circuit elements is used in a second configuration of the apparatus. The first configuration of the apparatus is switched to the second configuration of the apparatus in order to improve reliability of the apparatus. | 01-03-2013 |
20130043898 | SYSTEM WITH A DEFECT TOLERANT CONFIGURABLE IC - Some embodiments of the invention provide a system that includes a first defect tolerant configurable integrated circuit and a second IC communicatively coupled to the defect tolerant configurable first IC. | 02-21-2013 |
20130127491 | Fault Tolerant Integrated Circuit Architecture - The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function. The assignment, routing, fault detection, and re-assignment and data re-routing can occur in real time for a wide variety of programs and algorithms, providing for the IC to continue the same functioning despite defects which may arise during operation. | 05-23-2013 |
20130176050 | DATA INTERFACE HAVING AN INTRINSICALLY SAFE, INTEGRATED ERROR DETECTION - An intrinsically safe digital circuit has at least two output signals and at least four input signals for detecting a potential error in the circuit and/or in one of its input signals, the at least four input signals forming two input signal pairs inverted in a double-track manner, and the at least two output signals forming an output signal pair inverted in a double-track manner. The output signal pair transmits a piece of information which is identical to the one of an input signal pair, when the error is not present. | 07-11-2013 |
20130181738 | SOFT ERROR RESILIENT FPGA - A field programmable gate array (FPGA) includes configuration RAM (CRAM) including at least one non-hardened portion and at least one hardened portion having an SER resilience greater than an SER resilience of the non-hardened portion. | 07-18-2013 |
20130229204 | Resilient Integrated Circuit Architecture - The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function. The assignment, routing, fault detection, and re-assignment and data re-routing can occur in real time for a wide variety of programs and algorithms, providing for the IC to continue the same functioning despite defects which may arise during operation. | 09-05-2013 |
20130234753 | Hysteresis-Based Latch Design for Improved Soft Error Rate with Low Area/Performance Overhead - A hysteresis-based logic element design for improved soft error rate with low area/performance overhead. In one embodiment, a hysteresis inverter block including one or more pairs of inverters can be coupled to a logic element to adjust a switching threshold of the logic element. | 09-12-2013 |
20130265080 | SOFT ERROR RESILIENT FPGA - A field programmable gate array (FPGA) includes configuration RAM (CRAM) including at least one non-hardened portion and at least one hardened portion having an SER resilience greater than an SER resilience of the non-hardened portion. | 10-10-2013 |
20140043059 | SECURE DIGEST FOR PLD CONFIGURATION DATA - A method for verifying that data is correctly loaded into an individual programmable logic device includes computing a reference digest of the data to be loaded into the individual programmable logic device, loading the data into the individual programmable logic device, computing inside the individual programmable logic device an as-programmed digest of the data that was loaded into the individual programmable logic device, reading the as-programmed digest out of the individual programmable logic device, comparing the as-programmed digest with the reference digest, and verifying the loaded data if the as-programmed digest matches the reference digest, and indicating an error if the as-programmed digest does not match the reference digest. | 02-13-2014 |
20140062526 | Fault Tolerant Integrated Circuit Architecture - The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function. The assignment, routing, fault detection, and re-assignment and data re-routing can occur in real time for a wide variety of programs and algorithms, providing for the IC to continue the same functioning despite defects which may arise during operation. | 03-06-2014 |
20140145753 | THROUGH SILICON VIA REPAIR CIRCUIT OF SEMICONDUCTOR APPARATUS - A through silicon via (TSV) repair circuit of a semiconductor apparatus is provided. The TSV repair circuit includes a first chip, at least one second chip, at least two TSVs, at least two data path circuits, and an output logic circuit. Each data path circuit includes an input driving circuit, a short-circuit detection circuit, a bias circuit, and a leakage current cancellation circuit. The input driving circuit transforms an input signal into a pending signal and transmits the pending signal to a first terminal of the corresponding TSV. The short-circuit detection circuit detects a short circuit between the corresponding TSV and a silicon substrate according to the input signal and the first terminal of the TSV and generates a short-circuit detection output signal. The leakage current cancellation circuit prevents a leakage current produced by a first level voltage from entering the silicon substrate according to the short-circuit detection output signal. | 05-29-2014 |
20140197863 | PLACEMENT OF STORAGE CELLS ON AN INTEGRATED CIRCUIT - A method for configuring the placement of a plurality of storage cells on an integrated circuit includes grouping the plurality of storage cells into a plurality of words, where each of the plurality of words is protected by an error control mechanism. The method also includes placing each of the storage cells on the integrated circuit such that a distance between any two of the storage cells belonging to one of the plurality of words is greater than a minimum distance. The minimum distance is configured such that a probability of any of the plurality of words experiencing multiple radiation induced errors is below a threshold value. | 07-17-2014 |
20140266297 | HARDWARE-EMBEDDED KEY BASED ON RANDOM VARIATIONS OF A STRESS-HARDENED INEGRATED CIRCUIT - An IC cell designed to assert one of multiple possible output states, each with equal probability, implemented to assert a pre-determined one of the multiple output states based on random variations within the IC cell, such as random process variations. An array of IC cells is configurable to provide a hardware-embedded key upon power-up that is unique to the combination of random variations of selected IC cells, resistant to tampering prior to and during manufacture, and tolerant to aging, instantaneous thermal noise, and environmental variations, such as voltage and temperature fluctuations. The key may be used as, without limitation, a Platform Root Key, a High-Bandwidth Digital Content Protection (HDCP) key, an Enhanced Privacy Identification (EPID) key, and/or an Advanced Access Content System (AACS) key. Also disclosed are techniques to measure stability and stress-harden an IC cell based on output states of the IC cell. | 09-18-2014 |
20140340113 | THROUGH SILICON VIA REPAIR CIRCUIT OF SEMICONDUCTOR DEVICE - TSV repair circuit of a semiconductor device includes a first chip, a second chip, at least two TSV, at least two data path circuits and an output logic circuit. Each data path circuit comprises an input driving circuit, a TSV detection circuit, a memory device, a protection circuit and a power control circuit. The TSV detection circuit detects a TSV status, the memory device keeps the TSV status, the protection circuit determines whether to pull a first end of the TSV to a ground voltage according to the TSV status, and the power control circuit prevents a leakage current of a power voltage from flowing through a substrate. | 11-20-2014 |
20150022233 | Stable Supply-Side Reference Over Extended Voltage Range With Hot-Plugging Compatibility - In one embodiment, the operating range of an over-current detection circuit is extended to higher input voltage levels by providing a reference-voltage generation circuit for the detection circuit with voltage protection circuitry that applies an additional voltage drop to shield other vulnerable transistor devices from the higher input voltages. In addition, bypass circuitry is provided that is inactive at the highest input voltage levels, but actively bypasses at least some of the voltage protection circuitry at relatively low input voltage levels to apply a voltage drop that is sufficient to ensure proper operation of the vulnerable transistor devices at the low voltage levels. In one implementation, the vulnerable transistor devices are NFET devices in a programmable current minor of the reference-voltage generation circuit. In addition, a stiffened voltage divider helps to ensure sufficient voltage drop at the low voltage levels. The protection and bypass circuitry also enable hot-socketing operations. | 01-22-2015 |
20150028918 | ERROR RESILIENT PACKAGED COMPONENTS - A packaged component may include an interposer and integrated circuit dies mounted on the interposer. At least one of the dies may be a radiation-hardened integrated circuit die, whereas the remaining dies may be non-radiation-hardened dies. If desired, the interposer may be a radiation-hardened interposer whereas the integrated circuit dies may be non-radiation-hardened dies. The radiation-hardened die or the radiation-hardened interposer may include monitor circuitry that is used to test non-radiation-hardened circuitry of the packaged component. Test results may be stored in a database at the monitor circuitry or transmitted to external devices such as a server. The monitor circuitry may be used to reconfigure failed circuitry or may control multiplexing circuitry in the interposer to functionally replace the failed circuitry. If desired, the monitor circuitry may adjust power consumption of non-radiation-hardened circuitry based on the test results. | 01-29-2015 |
20150028919 | WAFER-LEVEL STACKED CHIP ASSEMBLY AND CHIP LAYER UTILIZED FOR THE ASSEMBLY - Disclosed is a wafer-level stacked chip assembly, comprising a plurality of chip layers vertically stacked together with vertically electrical interconnections between the adjacent chip layers realized by TSVs (Through Silicon Via). Each chip layer includes a switching mechanism for selectively bypassing chip coding sequence to deactivate failed IC area and its chip coding sequence, thereby the interconnection relationship among the chip layers can be re-defined and the function and chip code of the failed IC area can be deactivated. Accordingly, any known failed chip in the wafer-level stacking chip assembly can be controlled as a dummy chip to realize the wafer-level chip stacking of non-known good dices with exclusion of failed chip(s). | 01-29-2015 |
20150042376 | NONVOLATILE RESISTOR NETWORK ASSEMBLY AND NONVOLATILE LOGIC GATE WITH INCREASED FAULT TOLERANCE USING THE SAME - Provided is a nonvolatile resistor network assembly characterized by that: it comprises a first and a second resistor network which are each composed of a plurality of nonvolatile resistive elements connected together; it also comprises a write means for writing into the first and second resistor networks; and writing into the first and second resistor networks is performed by the use of the write means in a manner to make total resistances of respectively the first and second resistor networks different from each other. Further provided is a nonvolatile logic gate which performs logical operation using stored data determined by the total resistances of the respective nonvolatile resistor networks. | 02-12-2015 |
20150084671 | REPROGRAMMABLE LOGIC DEVICE RESISTANT TO RADIATIONS - The invention relates to a reprogrammable logic device comprising a plurality of elementary patches, each patch comprising: at least one logic block configurable by one or more volatile memory cells storing configuration data; and a memory comprising: a plurality of non-volatile memory cells storing refresh data, each non-volatile memory cell comprising first and second resistance-switching elements, each being programmable so as to have one of a first and of a second resistance value representative of the refresh data; and a read-write circuit adapted for periodically refreshing the configuration data on the basis of the refresh data. | 03-26-2015 |
20150091607 | SEQUENTIAL LOGIC CIRCUIT AND METHOD OF PROVIDING SETUP TIMING VIOLATION TOLERANCE THEREFOR - A sequential logic circuit comprising a first latch component comprising a data input arranged to receive an input signal, a data output arranged to output a current logical state of the first latch component and a clock input arranged to receive a clock signal; the first latch component being arranged to comprise a transparent state upon the clock signal received thereby comprising a first logical state, and to comprise a latched state upon the clock signal received thereby comprising a second logical state, and a second latch component comprising a data input arranged to receive an input signal, a data output operably coupled to an output of the sequential logic circuit and arranged to output a current state of the second latch component and a clock input arranged to receive a clock signal; the second latch component being arranged to comprise a transparent state upon the clock signal received thereby comprising a second logical state, and to comprise a latched state upon the clock signal received thereby comprising a first logical state. The sequential logic circuit is arranged to operate in at least a first operating mode in which the data input of the first latch component and the data input of the second latch component are operably coupled to a first input of the sequential logic circuit, and in which the clock signals provided to the first and second latch components are such that a transition of the second latch component from a transparent state to a latched state is delayed relative to a corresponding transition of the first latch component from a transparent state to a latched state for a time period for receiving late data. | 04-02-2015 |
20160049938 | SEMICONDUCTOR DEVICE - A semiconductor device includes a first block coupled between a first latch node and a second latch node, a second block suitable for generating common-mode noise between the first latch node and the second latch node, wherein the second block includes a first MOS transistor having a gate coupled with the first latch node, and one between a source and a drain of the first MOS transistor is coupled with the second latch node while the other between the source and the drain is floating. | 02-18-2016 |
20160049941 | PROGRAMMABLE CIRCUIT HAVING MULTIPLE SECTORS - Systems and methods relating to a programmable circuit. The programmable circuit includes multiple sectors. Each sector includes configurable functional blocks, configurable routing wires, configuration bits for storing configurations for the functional blocks and routing wires, and local control circuitry for interfacing with the configuration bits to configure the sector. The programmable circuit may include global control circuitry for interfacing with the local control circuitry to configure the sector. Each sector may be independently operable and/or operable in parallel with other sectors. Operating the programmable circuit may include using the local control circuitry to interface with the configurations bit and configure the sector. Additionally, operating the programmable circuit may include using the global control circuitry to interface with respective local control circuitry and configure the sector. | 02-18-2016 |
20160099713 | ADAPTIVE DYNAMIC KEEPER CIRCUIT - Aspects disclosed herein describe a keeper circuit that adapts to variations in the fabrication process used to manufacture a dynamic circuit. The different characteristics of the circuit elements may cause a keeper circuit to behave in an unintended manner. In one example, a logical state of the dynamic circuit may be erroneously changed because of a strong (i.e., leaky) NMOS transistor in a pull down or discharge path. An adaptive keeper circuit, however, is designed to prevent such unintended behavior regardless of any change in the characteristics of the circuit elements in the dynamic circuit. The adaptive keeper circuit matches the behavior of the pull down path and prevents the pull down path from erroneously changing the logical state stored by the dynamic circuit. | 04-07-2016 |