Class / Patent application number | Description | Number of patent applications / Date published |
324659000 | With loss characteristic evaluation | 18 |
20100134123 | SENSOR SYSTEM HAVING A MAGNETOELASTIC DEFORMATION ELEMENT - A sensor system is provided having an at least partially magnetoelastic deformation element for measuring pressures, caused by a fluid, that are able to be applied to the magnetoelastic deformation element, having a magnetic circuit formed via a magnetic flux feedback and having a sensor unit and an evaluation unit. The sensor unit is positioned at the deformation element and the evaluation unit having an evaluation coil is structurally separated from, yet inductively coupled to the sensor unit. The sensor unit has a sensor coil positioned on the deformation element and the evaluation unit has the evaluation coil that is inductively coupled to the sensor coil, the sensor coil forms a resonant circuit, using its own parasitic capacitance or using an additional capacitance, which is able to be energized by the evaluation coil in free resonance with strong or weak inductive coupling by a magnetic circuit enclosing the two coils. Alternatively, the sensor unit and the evaluation unit may be coupled via a magnetic circuit having a flux feedback, and the evaluation coil may be wound around the fixed or mountable flux feedback, a permeability change effected by the application of pressure to the deformation element, and thus a change in the inductance of the evaluation coil being able to be determined. | 06-03-2010 |
20100176820 | SENSITIVITY ANALYSIS SYSTEM AND SENSITIVITY ANALYSIS PROGRAM - A sensitivity analysis system has a memory device in which an interconnect structure data indicating an interconnect structure included in a semiconductor device is stored. The interconnect structure has: a main interconnection; and a contact structure electrically connected to the main interconnection and extending toward a semiconductor substrate. Parameters contribute to parasitic capacitance of the interconnect structure, and variation of each parameter from a design value caused by manufacturing variability is represented within a predetermined range. The sensitivity analysis system further has: a parameter setting unit that sets the variation to a plurality of conditions within the predetermined range; a capacitance calculation unit that calculates the parasitic capacitance of the interconnect structure in each of the plurality of conditions; and a sensitivity analysis unit that analyzes, based on the calculated parasitic capacitance, response of the parasitic capacitance to variation of the each parameter. | 07-15-2010 |
20100194406 | HIGH-SPEED CAPACITOR LEAKAGE MEASUREMENT SYSTEMS AND METHODS - Systems and methods according to aspects of the present invention are described. The systems and methods enable charging, soaking, and measuring of capacitors to be conducted quickly. Charging and soaking typically occurs in parallel and certain embodiments facilitate the measuring of capacitor leakage by sequentially disconnecting each capacitor and measuring the time for voltage on the capacitor to reach a predetermined threshold. Further, all capacitors can be disconnected from a charging source simultaneously and voltages can be measured for each capacitor simultaneously. Monitoring can be periodic in nature. Substantial time savings in the calculation device of leakage values and parameters can be attained. | 08-05-2010 |
20100321040 | CAPACITOR CAPACITANCE DIAGNOSIS DEVICE AND ELECTRIC POWER APPARATUS EQUIPPED WITH CAPACITOR CAPACITANCE DIAGNOSIS DEVICE - A capacitor capacitance diagnosis device includes a power supply which is for charging a capacitor, a discharge circuit which is connected to the capacitor in parallel to discharge energy of the capacitor, a resistance dividing circuit which is for measuring voltage drop value during discharging, a measurement circuit which measures divided voltage, and a diagnosis circuit which determines adequacy of capacitor capacitance from a time change in voltage due to the discharge. This makes it possible to diagnose adequacy of capacitor capacitance of an electric power apparatus during operation. | 12-23-2010 |
20100327882 | CAPACITIVE SENSOR INTERFERENCE DETERMINATION - In a method of determining interference in a capacitance sensor, a signal is transmitted on a transmitter sensor channel of the capacitive sensor. The signal is received on a receiver sensor channel of the capacitive sensor, the receiver sensor channel being coupled with an amplifier. Behavior of the amplifier is examined for non-linearity to determine if a level of interference has been received by the receiver sensor channel in conjunction with receipt of the signal. | 12-30-2010 |
20110080180 | VARYING CAPACITANCE VOLTAGE CONTRAST STRUCTURES TO DETERMINE DEFECT RESISTANCE - A method for determining resistances of defects in a test structure, comprising: forming a first layer of the test structure having elements under test; generating a first e-beam image of the first layer, the first e-beam image graphically identifying defects detected at the first layer, each defect at the first layer having a corresponding grey scale level; adding capacitance to the structure by forming a metal layer of the structure; generating a second e-beam image of the metal layer, the second e-beam image graphically identifying defects detected at the metal layer, each defect at the metal layer having a corresponding grey scale level; generating a pattern of grey scale levels for each defect based on the corresponding grey scale level of each defect at each layer of the test structure; and determining a resistive range of each defect based on the pattern of grey scale levels generated for each defect. | 04-07-2011 |
20110156725 | Calculating A Parasitic Capacitance of an Oscillator Circuit - Described herein are techniques for determining a board parasitic capacitance of a crystal oscillator circuit. A crystal's frequency is measured under load condition off-circuit. After coupling the crystal to the oscillator circuit, external capacitors may be adjusted to produce frequencies approximating the off-circuit measurement with upper and lower margins. Calculation of the load capacitor values at the exact frequency measured off-circuit allows for derivation of the board parasitic capacitance by subtracting the calculated capacitor values from the original total load value used in the off-circuit measurement. | 06-30-2011 |
20110234243 | INTRODUCED IN MONITORING SYSTEM OF DIELECTRIC STATE OF HIGH VOLTAGE EQUIPMENTS WITH CAPACITIVE INSULATION, SUCH AS CONDENSIVE BUSHINGS, CURRENT TRANSFORMERS, POTENTIAL TRANSFORMERS AND SIMILAR - “Improvements Introduced in Monitoring System of Dielectric State of High Voltage Equipments with Capacitive Insulation, Such as Condensive Bushings, Current Transformers, Potential Transformers and Similar” allow to detect quick evolution insulation deteriorations and to emit correspondent alarms, being also able to verify their consistency in order to avoid false alarms as well as to automatically disconnect the equipment in case of a critical deterioration; it also allows to monitor in real time the BPDs quipped condensive bushings state as well as the bushings applied in HVDC high voltage direct current. | 09-29-2011 |
20110285407 | IMPEDANCE DETECTION CIRCUIT AND ADJUSTMENT METHOD OF IMPEDANCE DETECTION CIRCUIT - According to the present invention, a small impedance detection circuit capable of accurately detecting the impedance of an object to be measured and an adjustment method of an impedance detection circuit can be provided. In the impedance detection circuit according to the present invention, an AC signal generator outputs an AC signal. A detection circuit, which is connected to a circuit to be measured, applies an AC signal to the circuit to be measured. Further, the detection circuit outputs a first signal corresponding to the composite impedance of the impedance of the circuit to be measured and a parasitic impedance. A correction circuit outputs a second signal in synchronization with the first signal. A subtraction circuit outputs a detection signal obtained by subtracting the second signal from the first signal. | 11-24-2011 |
20120112771 | APPARATUS AND METHOD FOR DETECTION OF SOLENOID CURRENT - An apparatus for detecting leakage current through a solenoid coil that includes a capacitor connected to one end of the solenoid coil and a feedback circuit that monitors the rate of decay of the capacitor voltage to determine if an excessive leakage current is present. | 05-10-2012 |
20120112772 | CIRCUIT FOR DETECTING CAPACITANCE ATTENUATION OF RECTIFICATION/FILTER CAPACITOR AND METHOD THEREOF - The present invention discloses a circuit for detecting capacitance attenuation of a rectification/filter capacitor and a method thereof. A rectification circuit provides a capacitor with a rectified ripple voltage having a maximum lower than output voltage of a back-up power supply device. An isolation device isolates the rectified ripple voltage and let the back-up power supply device supply power to other power supply devices. The detection switch of an detection circuit is turned on to electrically connect the capacitor with a resistor, whereby the resistor conducts the rectified ripple voltage to charge and discharge the capacitor to obtain a peak-to-valley ratio and a discharging time. The capacitance is worked out from the peak-to-valley ratio, discharging time and resistance of the resistor. The deterioration extent of the capacitor is obtained from the variation of the capacitance. Therefore, the UPS system would not be shut off during detecting the capacitor. | 05-10-2012 |
20120139560 | TOUCH APPARATUS - A touch apparatus includes a touch unit, a detecting unit, and a compensation unit. The touch unit has a touch substrate and at least one conductive layer. The conductive layer is disposed on the touch substrate. The detecting unit is electrically connected with the conductive layer of the touch unit and outputs a driving signal to the conductive layer. A first parasitic capacitance is formed between the detecting unit and a ground. The compensation unit is electrically connected with the detecting unit and the touch unit and outputs a compensation signal to the first parasitic capacitance. Hence, the touch apparatus can eliminate the parasitic capacitance effect. | 06-07-2012 |
20120280699 | PARTIAL DISCHARGE ANALYSIS COUPLING DEVICE - A partial discharge analysis (PDA) coupling device is provided. In one embodiment, a device includes: a connector electrically connecting a first coupling capacitor and a second coupling capacitor; a first conductive rod for electrically connecting the first coupling capacitor to a high voltage input; a second conductive rod for electrically connecting the second coupling capacitor to ground; a current transformer substantially surrounding a portion of the second conductive rod, the current transformer configured to generate a pulse signal; and a reference signal generator adjacent to the current transformer configured to generate a reference signal in phase with the pulse signal. | 11-08-2012 |
20120293190 | CAPACITIVE SENSOR INTERFERENCE DETERMINATION - A processing system for a capacitive input device is described. The capacitive input device includes a plurality of sensor electrodes configured to detect input objects in a sensing region. The processing system configured to transmit a signal on a transmitter sensor channel of the capacitive input device. The processing system is also configured to receive the signal on a receiver sensor channel of the capacitive input device, wherein the receiver sensor channel is coupled with an amplifier. The processing system is also configured to determine if a level of interference has been received by the receiver sensor channel in conjunction with receipt of the signal. | 11-22-2012 |
20130043889 | CAPACITANCE EVALUATION APPARATUSES AND METHODS - Apparatus and methods for evaluating leakage currents of capacitances are described. Capacitances having excessive leakage currents may be disabled from use. An example apparatus includes a leakage detection circuit configured to be coupled to a capacitance block. The leakage detection circuit is configured to determine whether a leakage current of a capacitance of the capacitance block exceeds a current limit and is further configured to provide an output indicative of a status of the capacitance. A detection controller is coupled to the leakage detection circuit and a register, and the detection controller is configured to store data in the register indicative of the status of the capacitance based at least in part on the signal from the leakage detection circuit. | 02-21-2013 |
20130106442 | APPARATUS AND METHOD FOR MEASURING THE DISSIPATION FACTOR OF AN INSULATOR | 05-02-2013 |
20140285220 | PARASITIC CAPACITANCE CANCELLATION IN CAPACITIVE MEASUREMENT - An integrated circuit compensates for parasitic capacitance in a capacitive measuring apparatus wherein a capacitance measurement is done by repeatedly transferring charge from a capacitor to be measured to a reference capacitor. | 09-25-2014 |
20150316596 | CIRCUIT ASSEMBLY, METHOD FOR PRODUCING A TEST VOLTAGE, AND TESTING DEVICE FOR DETERMINING A LOSS FACTOR, WHICH TESTING DEVICE CONTAINS SAID CIRCUIT ASSEMBLY - A circuit assembly is provided for producing a test voltage for testing a test object, comprising two high voltage sources for producing a positive and negative high voltage of variable amplitude at respective outputs thereof and a high voltage switch assembly, which is arranged between the outputs of the two high voltage sources and the test object and which can be switched suitably in order to successively charge and discharge the test object, wherein furthermore a closed-loop controller is provided, which measures the present test voltage on the test object and acts on the high-voltage switch assembly in order to charge and discharge the test object in a defined manner in dependence on the measured test voltage. | 11-05-2015 |