Class / Patent application number | Description | Number of patent applications / Date published |
324615000 | Transfer function type characteristics | 63 |
20090085581 | MEASURING DEVICE, AND DETECTION DEVICE - A measuring apparatus that measures a characteristic of a device under measurement is provided. The measuring apparatus includes: a signal generating section that outputs a forward signal to the device under measurement through a device side terminal; a directional coupler that outputs a backward split signal obtained by splitting a part of a backward signal inputted from the device under measurement through the device side terminal; a backward mixer that outputs a backward detection signal obtained by multiplying a local signal having a predetermined frequency by the backward split signal; and an analysis section that analyzes a characteristic of the device under measurement based on the backward detection signal. The directional coupler is included in a multilayer substrate, and the backward mixer is included in a chip provided on a surface of the multilayer substrate. | 04-02-2009 |
20110163762 | OPEN LOOP LOAD PULL ARRANGEMENT WITH DETERMINATION OF INJECTIONS SIGNALS - Measurement arrangement and method for active load pull measurements of a device under test ( | 07-07-2011 |
20110199096 | CORRECTION OF NON-LINEARITIES IN ADCS - Techniques for calibrating non-linearities of ADCs are described, which can be applied whether or not the non-linearities change with frequency. When the non-linearities do not change (are static), the frequency of a calibrating signal is first estimated coarsely in a calibration mode, then a fine estimate is determined using the coarse estimate. These estimates are then used to predict the sinusoidal signal using a linear predictor. A Look Up Table (LUT) containing corrections to the ADC is derived from this result. The LUT is then used in a normal operating mode to correct the output of the ADC. In a case where the characteristics of the non-linearities of the input signal are dynamic and thus change with frequency, a frequency spectrum of interest is broken into several regions. In each of these regions, a frequency is identified and used as a calibrating signal to generate the corresponding LUT. During normal operation of the ADC, in a first method, the bin corresponding to dominant frequency of the signal is identified using a short-length FFT. This bin is used to select the appropriate LUT for operating on the output of the ADC to provide the calibrated output. In a second method used when dynamic input is expected, a single LUT is developed using the averages values from the LUTs determined from the various regions. | 08-18-2011 |
20110298475 | METHOD AND DEVICE FOR MONITORING A SHEATH VOLTAGE ARRESTER OF A CABLE SYSTEM - Method and device for monitoring the status of a sheath voltage arrester of a cable system, a verification signal being supplied to a measuring loop which comprises the sheath voltage arrester and a measurement signal which is subsequently produced in accordance with the frequency-dependent impedance of the sheath voltage arrester being measured at the measuring loop in order to establish the status of the sheath voltage arrester by evaluating the measurement signal. | 12-08-2011 |
20110298476 | APPLICATION OF OPEN AND/OR SHORT STRUCTURES TO BISECT DE-EMBEDDING - Application of open and short structures may result in improved accuracy in determination of ABCD parameters of a substantially symmetric THRU for purposes of bisect de-embedding. Either one or both of the open and/or short techniques may be used to improve results of an ABCD optimization algorithm. Bisect de-embedding may then be performed to determine the ABCD parameters of a device under test based on the ABCD parameters of the substantially symmetric THRU and measured s-parameters of the substantially symmetric THRU and the embedded device under test. | 12-08-2011 |
20120153967 | LEAD ADAPTER FOR TESTING PACING THRESHOLDS ACROSS MULTIPLE VECTORS AT IMPLANT - An adapter is used in conjunction with a testing device to test pacing thresholds of an implanted lead. A main body of the adapter includes a plurality of adapter contacts that are configured to electrically couple to the plurality of connector contacts. A connector module includes a first port configured to couple to a first testing device connector and a second port configured to couple to a second testing device connector. A switch assembly includes a plurality of actuatable elements each associated with one of the adapter contacts. The actuatable elements are each selectably actuatable between a first state that electrically couples the associated adapter contact to the first port, a second state that electrically couples the associated adapter contact to the second port, and a third state that electrically decouples the associated adapter contact from the first and second ports. | 06-21-2012 |
20120161785 | SYSTEM FOR TESTING MOTHERBOARD PERFORMANCE - A system for testing a motherboard performance includes a control device, a voltage processing circuit, a voltage regulating circuit and a voltage feedback circuit. The control device stores a plurality of predetermined voltage values and outputs control signals according to the plurality of predetermined voltage values. The voltage processing circuit receives the control signal and outputs a plurality of PWM signals according to the control signal. The voltage regulating circuit receives the plurality of PWM signal and outputs a plurality of DC voltage to a plurality of voltage input terminals of the motherboard. The voltage feedback circuit collects voltage signals at the plurality of voltage input terminals of the motherboard. | 06-28-2012 |
20120212237 | INTEGRATED SYSTEM INCLUDING SIGNAL ANALYSIS CIRCUIT - An integrated system is provided. The integrated system includes a control system and a signal analysis circuit configured to provide a test signal having a frequency to the control system, receive a feedback signal from the control system, and analyze the test signal and the feedback signal to generate a transfer function of the control system. | 08-23-2012 |
20130015861 | CONVERTER CIRCUIT AND METHOD OF DRIVING THE SAMEAANM CHOE; ANDREW KUNILAACI SeoulAACO KRAAGP CHOE; ANDREW KUNIL Seoul KR - Provided are a converter circuit and a method of driving the same. The converter circuit includes: an input unit receiving a conversion target signal; a detection unit receiving a conversion target signal for each interval from the input unit, sampling the conversion target signal for each interval according to a plurality of timings to calculate an average value for each interval, and outputting a comparison unit input signal by using the average value for each interval; and a comparison unit comparing the comparison unit input signal with a predetermined reference signal to output a comparison result value. | 01-17-2013 |
20130106437 | INSULATION RESISTANCE MONITORING FOR VEHICLES WITH HIGH-VOLTAGE POWER NET | 05-02-2013 |
20130127476 | SYSTEM, METHOD AND APPARATUS FOR DETECTING DC BIAS IN A PLASMA PROCESSING CHAMBER - A system and method of measuring a self bias DC voltage on a semiconductor wafer in a plasma chamber includes generating a plasma between a top electrode and a top surface of an electrostatic chuck in a plasma chamber including applying one or more RF signals to one or both of the top electrode and electrostatic chuck. The wafer is supported on the top surface of an electrostatic chuck. The self bias DC voltage is developed on the wafer. A vibrating electrode is oscillated to produce a variable capacitance, the vibrating electrode is located in the electrostatic chuck. An electrical current is developed in a sensor circuit. An output voltage is measured across a sampling resistor in the sensor circuit, a second DC potential is applied to the vibrating electrode to nullify the output voltage. The second DC potential is equal to the self bias DC voltage on the wafer. | 05-23-2013 |
20130141114 | NON-LINEAR KERF MONITOR AND DESIGN STRUCTURE THEREOF - A non-linear kerf monitor, methods of manufacture and design structures are provided. The structure includes a coplanar waveguide provided in a kerf of a wafer between a first chip and a second chip. The structure further includes a shunt switch and a series switch coupled to the coplanar waveguide. | 06-06-2013 |
20130241573 | SYSTEMS AND METHODS FOR OBTAINING AND USING INCIDENT FIELD TRANSFER FUNCTIONS OF ELECTRICAL STIMULATION SYSTEMS - A method of estimating response of a medical lead to an electromagnetic field includes providing a medical lead having a proximal end, a distal end, a plurality of electrodes disposed along the distal end, a plurality of terminals disposed along the proximal end, and a plurality of conductors extending along the medical lead and electrically coupling the electrodes to the terminals; individually applying a test field at each of a plurality of test positions along the medical lead using at least one excitation probe; for each application of the test field, determining a response to the application of the test field at one or more of the electrodes or terminals; generating a transfer function using a combination of the responses determined for the applications of the test field; and using the transfer function to estimate a response of the medical lead to an electromagnetic field. | 09-19-2013 |
20140043043 | METHOD OF ANALYZING PATCHING PANELS - A method of analyzing patching among a first port of a first panel and ports of one or more other panels, comprising obtaining with respect to the first port of the first panel an indication of multiple concurrent patchings between the first port and each of two or more different ports of other panels, the two or more different ports including at least a second port and a third port; injecting a scan signal between the first port and the second port and sensing for a corresponding returned signal between the second and the third ports; determining that an indication of a patching between the first port and the second port is false when a returned signal corresponding to the scan signal is detected between the second and the third ports. | 02-13-2014 |
20140118007 | CONTROLLER AND METHOD FOR COLLISION DETECTION - A method for detecting a signal activity on a bus comprises measuring a current on the bus, and determining a signal activity based on the measured current. | 05-01-2014 |
20140184242 | In-Line Transistor Bandwidth Measurement - A method and apparatus measure transistor bandwidth of a device under test in-line and on-wafer. The method includes disposing a measurement circuit on a chip within a wafer, the measurement circuit including a ring oscillator generating an oscillation frequency for transition through the device under test on the wafer, and obtaining an amplitude gain based on the measurement circuit for the corresponding frequency. | 07-03-2014 |
324616000 | Gain or attenuation | 6 |
20100066385 | Method for at least partly determining and/or adapting an attenuation map used for correcting attenuation of positron emission tomography image data sets in a combined magnetic resonance-positron emission tomography device - A method is disclosed for at least partly determining and/or adapting an attenuation map used for attenuation correction of Positron Emission Tomography image data sets in a combined Magnetic Resonance-Positron Emission Tomography device. In at least one embodiment of the method, at least one one-dimensional magnetic resonance data set of a patient is recorded along one imaging direction; the boundaries of at least one part of the body of the patient intersected by the imaging direction are determined from the one-dimensional magnetic resonance data set; and the attenuation map is determined and/or adapted at least partly as a function of the boundaries determined. | 03-18-2010 |
20110285404 | PROXIMITY SENSOR WITH HEALTH MONITORING - A proximity sensor includes a relatively simple health monitoring circuit. The proximity sensor includes a variable gain oscillator, a feedback circuit, and a proximity determination circuit. The variable gain oscillator has a gain that varies with the proximity of a target to a sensor coil, generates an oscillating electrical signal having a substantially constant amplitude magnitude, and generates an energy signal representative of the electrical energy needed to sustain oscillations. The feedback circuit supplies feedback to the oscillator, and the proximity determination circuit, based on the energy signal, supplies a proximity signal representative of target proximity to the sensor coil. The health monitor circuit also receives the oscillating electrical signal and supplies a health status signal representative of proximity sensor health. | 11-24-2011 |
20130193985 | TEMPERATURE COMPENSATED PROXIMITY SENSOR - A proximity sensor includes a relatively simple temperature compensation circuit, and includes a variable gain oscillator, a temperature sensor circuit, and a proximity determination circuit. The variable gain oscillator has a gain that varies with the proximity of a target to a sensor coil, generates an oscillating electrical signal having a substantially constant amplitude magnitude, and generates an energy signal representative of the electrical energy needed to sustain oscillations. The temperature compensation circuit senses proximity sensor temperature and supplies a temperature signal representative thereof, and the proximity determination circuit, based on the energy signal, supplies a proximity signal representative of target proximity to the sensor coil. The proximity determination circuit includes a comparator and a fixed resistor network. The comparator circuit supplies the proximity signal. The fixed resistor network is coupled between the temperature sensor circuit and comparator circuit and supplies a temperature compensation signal to the comparator circuit. | 08-01-2013 |
20130320996 | PROXIMITY SENSOR WITH HEALTH MONITORING - A proximity sensor includes a relatively simple health monitoring circuit. The proximity sensor includes a variable gain oscillator, a feedback circuit, and a proximity determination circuit. The variable gain oscillator has a gain that varies with the proximity of a target to a sensor coil, generates an oscillating electrical signal having a substantially constant amplitude magnitude, and generates an energy signal representative of the electrical energy needed to sustain oscillations. The feedback circuit supplies feedback to the oscillator, and the proximity determination circuit, based on the energy signal, supplies a proximity signal representative of target proximity to the sensor coil. The health monitor circuit also receives the oscillating electrical signal and supplies a health status signal representative of proximity sensor health. | 12-05-2013 |
20140028328 | Method And Device for Measuring Corrosion Metal Loss - A method and system for detecting corrosion metal loss. One may provide a guided wave probe that includes an electromechanical device and a corrosion probe. This may be followed by measuring a baseline guided wave attenuation value of the corrosion probe with no corrosion. One may then periodically measure the guided wave attenuation of the corrosion probe and detect an increase in guided wave attenuation values and identify metal corrosion associated with the increase in guided wave attenuation values. This may then be followed by estimating the corrosion metal loss of the metallic component. | 01-30-2014 |
20150362540 | CIRCUIT AND METHOD FOR GAIN MEASUREMENT - A circuit for measuring a gain of an amplifier includes a first node coupled to an output of the amplifier, a second node, a first circuit coupled to an input and the output of the amplifier, and a second circuit coupled between the first circuit and the second node. The first circuit is configured to cause a first gain drop in a gain to be measured between the first node and the second node. The second circuit configured to cause a second gain drop in the gain to be measured between the first node and the second node. | 12-17-2015 |
324617000 | Response time or phase delay | 37 |
20080218179 | TEST APPARATUS AND TEST METHOD - A test apparatus for testing a device under test includes a first timing comparator obtaining a device output signal output from the device under test at a timing designated by a first strobe signal, a second timing comparator obtaining the device output signal at a timing designated by a second strobe signal supplied later than the first strobe signal, a preceding edge judging circuit, when rising and falling signals are input at the same timing as the device output signal, judging which one of the rising and falling signals arrives at the first and second timing comparators at an earlier timing, a preceding edge detecting circuit adjusting a timing at which the first strobe signal is supplied so that the first timing comparator obtains, at a timing of a rising or falling edge, one of the rising and falling signals which is judged to arrive earlier, and a following edge detecting circuit adjusting a timing at which the second strobe signal is supplied so that the second timing comparator obtains, at a timing of a rising or falling edge, one of the rising and falling signals which is judged to arrive later. | 09-11-2008 |
20090027065 | Wordline-To-Bitline Output Timing Ring Oscillator Circuit for Evaluating Storage Array Performance - A wordline-to-bitline timing ring oscillator circuit for evaluating storage cell access time provides data on internal bitline access timing, and in particular the total wordline select-to-bitline read output timing. Columns of a storage array are connected in a ring, forming a ring oscillator. The bitline read circuit output of each column is connected to a wordline select input of a next column, with a net inversion around the ring, so that a ring oscillator is formed. The period of oscillation of the ring oscillator is determined by the total wordline select-to-bitline read circuit output timing for a first phase and the pre-charge interval time for the other phase, with the bitline read timing dominating. The circuit may be applied both to small-signal storage arrays, with the sense amplifier timing included within the ring oscillator period, or to large-signal storage arrays, with the read evaluate circuit timing included. | 01-29-2009 |
20090027066 | Method and system of real-time estimation of transmission line parameters in on-line power flow calculations - A system and method for estimating parameters of transmission lines employing phasor measurement units is provided, wherein measurements are provided from the phasor measurement units relating to a transmission line. These measurements are filtered to remove invalid measurements. Using the remaining valid measurements, resistance, reactance and grounding admittance are calculated and estimated and checked for errors. | 01-29-2009 |
20100052698 | Integrated circuit architecture for testing variable delay circuit - An integrated circuit is provided with first and second variable delay circuits, a test data feeding circuitry, a test control circuit, and a wire-connection line. The test data feeding circuitry feeds first and second test data signals to the first and second variable delay circuits, respectively. The first and second test data signals are complement to each other. The test control circuit feeds first and second drive capability control signals to the first and second variable delay circuits to control drive capabilities of the first and second variable delay circuits. The wire-connection line provides a wire-connection for outputs of the first and second variable delay circuits. | 03-04-2010 |
20110050247 | TEST CIRCUIT ALLOWING PRECISION ANALYSIS OF DELTA PERFORMANCE DEGRADATION BETWEEN TWO LOGIC CHAINS - A test circuit for measuring a gate delay as a function of stress is disclosed. The test circuit includes an oscillator, a reference gate chain, a test gate chain, and a counter. The counter measures the difference in propagation delay between the test chain and the reference chain in calibrated oscillator cycles. Differences in test gate delay as a function of applied stress may be measured within the calibration accuracy of the oscillator frequency. The use of the reference gate chain allows a simpler unipolar counter. | 03-03-2011 |
20110095768 | METHOD OF MEASURING DELAY IN AN INTEGRATED CIRCUIT - A method of measuring signal delay in a integrated circuit comprising applying a common clock signal at a circuit input and output, applying a test signal at the circuit input, detecting a corresponding output signal at the circuit output and detecting whether the test signal and output signal occur in a common part of the clock signal. | 04-28-2011 |
20110234239 | Two-Port De-Embedding Using Time Domain Substitution - A method is provided for de-embedding the S-parameter response of an electrical DUT embedded in an electrical network. The method comprises making first and second sets of S-parameter measurements in the frequency domain at a port or measurement reference plane to the network containing the DUT. For the second measurement, a known impedance condition is created at the embedded location of the DUT. The first and second sets of measurements are transformed to the time domain, and then gated to select portions of the time-domain-transformed responses that correspond to paths that include the DUT and known impedance condition, respectively. The gated time domain responses are then transformed back into the frequency domain, yielding first and second sets of selected S-parameter measurement responses. Reflection S-parameters for the DUT are then determined as a function of the first and second sets of selected S-parameter measurement responses and the known impedance condition. | 09-29-2011 |
20110241698 | Vessel Probe Connector with Solid Dielectric Therein - A modular TDR probe assembly is presented. The probe assembly includes a first section with a central conductor and an outer conductor having a first impedance, and a second section with a central conductor and an outer conductor having a second impedance. An impedance matching elbow joins the first section and the second section. The elbow contains a solid dielectric insert with a bore passing through it housing a terminal pin that conveys electrical signals between the center conductor of the first section and the center conductor of the second section. | 10-06-2011 |
20110254566 | METHOD FOR MONITORING A LINEAR GUIDE - A method for monitoring a linear guide with a carriage that can be displaced along a rail on a rolling contact formed from roller bodies rolling on running tracks using a sensor device for detecting a damage state of the rolling contact is provided. In order to provide a simple damage monitoring that can also be carried out for small computational units in short times and with very economical sensor devices, using the sensor device, an oscillation time signal is detected, an envelope curve demodulation of the oscillation time signal is carried out from the oscillation time signal, and a resulting magnitude is determined according to a constant-component determination as a characteristic value that increases with the damage state, and a damage state is recognized when the characteristic value exceeds a specified threshold value. | 10-20-2011 |
20110309845 | Elastomeric Conductor and Shield Fault Detection - The systems and methods described herein provide for the early detection of wire/cable faults. For example, a system may detect electrical/electronic faults with power lines, data lines, communication lines, coaxial cables, and the like (generally referred to herein as “lines”, “wires”, and “cables”) by providing sacrificial materials including a conductive material external to the lines. A processor may be coupled to the conductive material to transmit a control signal along the conductive material of the line to determine whether the line is degrading. That is, when the sacrificial material wears away and exposes the conductive sacrificial material in the line, that conductive material may begin to experience faults. The faults in the external conductive material may serve as precursors to the overall degradation of the line. Thus, the line may be repaired or replaced prior to the degradation of the line itself. | 12-22-2011 |
20110316560 | REMOTE SENSOR DEVICE - A self-oscillating remote sensor device includes a delay-line sensor system having at least one delay-line and at least one sensor element. The device also includes an oscillator control circuitry, and a frequency selection impedance connecting the delay-line sensor system and the oscillator control circuitry and presenting an impedance to the delay-line sensor system. The oscillator control circuitry includes an amplifier, a non linear amplitude control element (N-LACE) such as an active device with a negative differential conductance that provides an output whose amplitude has a negative second derivative with respect to an input signal, and a driver. Such a device permits successful interaction between electrical sensors and controlling (driving) electronics over long distances without the problems normally encountered when a delay-line is presented between an electrical sensor and its driver electronics. | 12-29-2011 |
20120019262 | TIME DIFFERENCE MEASUREMENT APPARATUS - A time difference measurement apparatus for measuring a time difference between transmission delay times of signals transmitted on two signal lines, includes: a selector for outputting one of the signals transmitted on the signal lines in accordance with a selection signal; a switch for outputting the selection signal in accordance with an output signal of the selector, the output signal being delayed for a predetermined time; a feedback loop for connecting the output of the selector to the input ends of the two signal lines; and a controller for calculating a time difference between transmission delay times of the signals transmitted on the two signal lines on the basis of self-oscillation cycles of signals transmitted through the feedback loop, the self-oscillation cycles changing in accordance with a logical value of the selection signal. | 01-26-2012 |
20120038369 | TIME-DOMAIN MEASUREMENTS IN A TEST AND MEASUREMENT INSTRUMENT - A test and measurement instrument and method for receiving a radio frequency (RF) signal, digitizing the RF signal using an analog-to-digital converter, downconverting the digitized signal to produce I (in-phase) and Q (quadrature) baseband component information, generating one or more IQ-based time-domain traces using the I and Q baseband component information, and measuring and displaying a variety of measurement values of the IQ-based time-domain traces. The IQ-based time-domain measurement values can be automatically generated and displayed, and/or transmitted to an external device. | 02-16-2012 |
20120119758 | METHOD FOR DETERMINING AND/OR MONITORING AT LEAST ONE PHYSICAL, PROCESS VARIABLE OF A MEDIUM - A method for determining and/or monitoring at least one physical, process variable of a medium with an oscillatable unit, wherein the oscillatable unit is excited by means of a frequency search sweep within a predetermined frequency band in the working range of the oscillatable unit in the form of transmitted signals successively to oscillate with discrete exciter frequencies wherein the corresponding oscillations of the oscillatable unit are received in the form of received signals, wherein, via the frequency search sweep, the exciter frequency is ascertained, in the case of which the oscillatable unit oscillates with an oscillation frequency, which has a predetermined phase shift between the transmitted signal and the received signal. The transmitting/receiving unit excites the oscillatable unit to oscillate with the ascertained oscillation frequency. The selected points in time depend on the predetermined phase shift between transmitted signal and received signal and that the voltage values sampled at the discrete exciter frequencies of the received signal are evaluated with reference to their amplitude. | 05-17-2012 |
20120176144 | AT-SPEED SCAN ENABLE SWITCHING CIRCUIT - A circuit for providing a local scan enable signal includes a first transistor having a first gate coupled to a general scan enable signal, a first source and a first drain and a second transistor having a second gate coupled to a scan clock, a second source coupled to the first drain and a second drain. The circuit also includes a third transistor having a third gate coupled to the general scan enable signal, a third drain coupled to the second drain and a third source and an output stabilizer coupled to the second drain, the output stabilizer including a first inverter and a second inverter coupled together in opposite orientations. | 07-12-2012 |
20120212238 | ON-CHIP MEASUREMENT OF AC VARIABILITY IN INDIVIDUAL TRANSISTOR DEVICES - An apparatus for determining alternating current (AC) delay variation of a transistor device under test includes a ring oscillator, the ring oscillator having the transistor device under test configured within a feedback path of the ring oscillator; and circuitry configured to measure a difference between a first signal delay path and a second signal delay path, the first signal delay path being between a gate terminal and a drain terminal of the transistor device under test, and the second signal delay path being between a source terminal and the drain terminal of the transistor device under test. | 08-23-2012 |
20120212239 | SYSTEM AND METHOD FOR ANALYZING TIMING OF SEMICONDUCTOR CHIP - Example embodiments relate to a method performed by an apparatus for analyzing time of a semiconductor chip. The method may include defining a netlist, defining time delays of devices defined in the netlist, performing a normality test using the time delays, judging a p-value based on the normality test, and determining a time delay of the semiconductor chip. | 08-23-2012 |
20120229146 | High Speed Test Circuit and Method - A high speed test circuit receives a tester clock from a tester and it conducts a test on a circuit under test. The high speed test circuit generates a high frequency clock according to the tester clock, so it is capable of operating in two frequencies. The high speed test circuit tests the circuit under test according to the high frequency clock, and it performs a low speed operation according to a low frequency clock, which is for example the tester clock. | 09-13-2012 |
20120262187 | TEST CIRCUIT FOR BIAS TEMPERATURE INSTABILITY RECOVERY MEASUREMENTS - A method and test circuit provide measurements to accurately characterize threshold voltage changes due to negative bias temperature instability (NBTI) and positive bias temperature instability (PBTI). Both the bias temperature instability recovery profile and/or the bias temperature shifts due to rapid repetitions of stress application can be studied. In order to provide accurate measurements when stresses are applied at intervals on the order of tens of nanoseconds while avoiding unwanted recovery, and/or to achieve recovery profile sampling resolutions in the nanosecond range, multiple delay or ring oscillator frequency measurements are made using a delay line that is formed from delay elements that have delay variation substantially caused only by NBTI or PBTI effects. Devices in the delay elements are stressed, and then the delay line/ring oscillator is operated to measure a threshold voltage change for one or more measurement periods on the order of nanoseconds. | 10-18-2012 |
20120268141 | METHOD AND ARRANGEMENT FOR MEASURING THE SIGNAL DELAY BETWEEN A TRANSMITTER AND A RECEIVER - A method for determining a delay τ of a signal between a UWB transmit unit and a FSCW receiver unit includes: generating a pulsed transmit signal S | 10-25-2012 |
20120274338 | HIGH PERFORMANCE TIME DOMAIN REFLECTOMETRY - Methods and systems for high-bandwidth time domain reflectometry include a printed circuit board (PCB) and a probe. The PCB includes at least one signal terminal connected to at least one signal via at least three guide terminals arranged around the at least one high-frequency signal terminal. At least one of the guide terminals is connected to at least one ground via. The probe includes at least one biased pin to contact the at least one signal terminal and at least three fixed guide pins arranged about the at least one biased pin to facilitate alignment of said at least one biased pin by first engaging at least one guide terminal area, such that the at least one mechanically biased pin is guided to the at least one contact point. | 11-01-2012 |
20120319700 | SOLENOID-OPERATED VALVE AND METHOD OF MONITORING SAME - A method for monitoring operation of a solenoid valve having an armature and a poppet coupled to the armature includes the steps of energizing a coil in the valve to generate a current signature reflecting current vs. time, detecting a first inflection point in the current signature, wherein the first inflection point occurs when the armature starts to move from one of the open and closed positions toward the other of the open and closed positions, and detecting a second inflection point in the current signature. The second inflection point occurs when the armature moves completely to the other of the open and closed positions. In one embodiment, the first inflection point indicates when the valve begins to open, making it possible to accurately determine the elapsed opening time of the valve. | 12-20-2012 |
20120326728 | ON-CHIP MEASUREMENT OF AC VARIABILITY IN INDIVIDUAL TRANSISTOR DEVICES - An apparatus for determining alternating current (AC) delay variation of a transistor device under test includes a ring oscillator, the ring oscillator having the transistor device under test configured within a feedback path of the ring oscillator; and circuitry configured to measure a difference between a first signal delay path and a second signal delay path, the first signal delay path being between a gate terminal and a drain terminal of the transistor device under test, and the second signal delay path being between a source terminal and the drain terminal of the transistor device under test. | 12-27-2012 |
20130106438 | SYSTEM AND METHOD FOR EXAMINING ASYMETRIC OPERATIONS | 05-02-2013 |
20130106439 | DIGITAL DELAY MEASUREMENT | 05-02-2013 |
20130154667 | DETECTION OF CHARGING CABLE - A method is provided for detecting a state of a connection between an electrically driven motor vehicle ( | 06-20-2013 |
20130169293 | Carbon Nanotube High Temperature Length Sensor - A sensor assembly includes a carbon nanotube bundle and a controller. The carbon nanotube bundle is integrated into a host material and extends along a predetermined dimension of the host material. The controller is configured to control transmission of radio frequency energy through the carbon nanotube bundle to determine a round trip time between transmission and reception of the radio frequency energy at a proximal end of the carbon nanotube bundle responsive to reflection of the radio frequency energy at a distal end of the carbon nanotube bundle. | 07-04-2013 |
20130193986 | DELAY LINE SCHEME WITH NO EXIT TREE - A measure initialization path for a delay line structure includes: a forward path, comprising a plurality of delay stages coupled in series; a first output path coupled to at least an output of a delay stage of the forward path, where at least an output of a delay stage is fed forward to the forward path; and a second output path coupled to at least an output of a delay stage of the forward path, where at least an output of a delay stage is fed forward to the forward path. When a signal is propagated through the measure initialization path, the signal successively propagates through a delay stage of the forward path, a delay stage of the first output path and a delay stage of the second output path for performing measure initialization. | 08-01-2013 |
20130214796 | DETERIORATION DETECTION CIRCUIT, SEMICONDUCTOR INTEGRATED DEVICE, AND DETERIORATION DETECTION METHOD - A deterioration detection circuit according to the present invention includes a deterioration sensor measuring a deterioration amount of a semiconductor integrated circuit, a differentiator calculating a time differential value of the deterioration amount measured by the deterioration sensor; and a first notification circuit comparing the time differential value with a first threshold value and outputting a first alarm depending on the result of the comparison. | 08-22-2013 |
20130234727 | RESISTIVE MEMORY ELEMENT SENSING USING AVERAGING - A system for determining the logic state of a resistive memory cell element, for example an MRAM resistive cell element. The system includes a controlled voltage supply, an electronic charge reservoir, a current source, and a pulse counter. The controlled voltage supply is connected to the resistive memory cell element to maintain a constant voltage across the resistive element. The charge reservoir is connected to the voltage supply to provide a current through the resistive element. The current source is connected to the charge reservoir to repeatedly supply a pulse of current to recharge the reservoir upon depletion of electronic charge from the reservoir, and the pulse counter provides a count of the number of pulses supplied by the current source over a predetermined time. The count represents a logic state of the memory cell element. | 09-12-2013 |
20140091812 | METHOD OF INTEGRATED CIRCUIT SCAN CLOCK DOMAIN ALLOCATION AND MACHINE READABLE MEDIA THEREOF - A method for deciding a scan clock domain allocation of an integrated circuit includes: utilizing a circuit netlist file and a timing constraints file of the integrated circuit to find out the amount of crossing paths between any two function clock domains of a plurality of function clock domains, and generate a clock domain report file; and grouping the plurality of function clock domains and allocating the plurality of function clock domains after being grouped into a plurality of scan clock domains according to the clock domain report file. | 04-03-2014 |
20140097856 | CIRCUIT AGING SENSOR - An integrated circuit includes a circuit aging sensor that provides information regarding operational degradation of the integrated circuit due to aging. The aging sensor includes a ring oscillator that includes inverting drivers and tuning circuits. The drivers are sequentially coupled to form a ring. An output of each of the drivers is coupled to an input of one of the tuning circuits, and an input of each of the drivers is coupled to an output of one of the tuning circuits. Each of the tuning circuits includes a first signal path and a second signal path. The first signal path selectably applies a tuning delay to an input signal received from one of the drivers for provision to an input of a successive one of the drivers. The second signal path selectably routes the signal received around the tuning delay to the input of the successive one of the drivers. | 04-10-2014 |
20140197847 | RESISTIVE MEMORY ELEMENT SENSING USING AVERAGING - A system for determining the logic state of a resistive memory cell element, for example an MRAM resistive cell element. The system includes a controlled voltage supply, an electronic charge reservoir, a current source, and a pulse counter. The controlled voltage supply is connected to the resistive memory cell element to maintain a constant voltage across the resistive element. The charge reservoir is connected to the voltage supply to provide a current through the resistive element. The current source is connected to the charge reservoir to repeatedly supply a pulse of current to recharge the reservoir upon depletion of electronic charge from the reservoir, and the pulse counter provides a count of the number of pulses supplied by the current source over a predetermined time. The count represents a logic state of the memory cell element. | 07-17-2014 |
20150015274 | DIRECT MEMORY BASED RING OSCILLATOR (DMRO) FOR ON-CHIP EVALUATION OF SRAM CELL DELAY AND STABILITY - A novel and useful direct memory based ring oscillator (DMRO) circuit and related method for on-chip evaluation of SRAM delay and stability. The DMRO circuit uses an un-modified SRAM cell in each delay stage of the oscillator. A small amount of external circuitry is added to allow the ring to oscillate and detect read instability errors. An external frequency counter is the only equipment that is required, as there is no need to obtain an exact delay measurement and use a precise waveform generator. The DMRO circuit monitors the delay and stability of an SRAM cell within its real on-chip operating neighborhood. The advantage provided by the circuit is derived from the fact that measuring the frequency of a ring oscillator is easier than measuring the phase difference of signals or generating signals with precise phase, and delivering such signals to/from the chip. In addition, the DMRO enables monitoring of read stability failures. | 01-15-2015 |
20150077136 | CIRCUIT AND METHOD FOR DELAY DIFFERENCE MEASUREMENT - A circuit includes a signal generator, a delay pulse generator and a time-to-current converter. The signal generator is configured to generate a first signal including information on a rise delay and a second signal including information on a fall delay. A delay difference exists between the rise delay and the fall delay. The delay pulse generator is configured to provide an additional delay to one of the first and second signals. The time-to-current converter is configured to extract the delay difference. | 03-19-2015 |
20160124045 | MEASUREMENTS CIRCUITRY AND METHOD FOR GENERATING AN OSCILLATING OUTPUT SIGNAL USED TO DERIVE TIMING INFORMATION - A measurement circuit and method is provided for generating an oscillating output signal used to derive timing information. The measurement circuit includes a ring oscillator having a plurality of unit cells, where each unit cell comprises at least a storage element whose output signal is used to determine a clock input signal for an adjacent unit cell within the ring oscillator. Control circuitry performs a control operation to control either a set function or a reset function of the storage element in each of the unit cells, in dependence on set or reset signals input to the control circuitry. Oscillation initiation circuitry is used to assert a clock input signal to the storage element in a first unit cell in order to initiate generation of the oscillating output signal, and the control circuitry then performs the control operation in order to control a value of the output signal of the storage element in each unit cell so as to cause the oscillating output signal to be maintained. Such an approach provides a particularly simple and efficient mechanism for deriving timing information for various circuit blocks that include a storage element. | 05-05-2016 |
20160161551 | AUTOMATED METHOD FOR ANALYZING A BOARD HAVING A PLURALITY OF FPGA COMPONENTS - The disclosed technology relates to analyzing an electronic board having a plurality of FPGAs that are interconnected and programmed to implement a logic design. One example method comprises: setting up a graph representing the board; determining, for each FPGA, by means of an FPGA-specific static temporal analysis tool, the time for travelling over each path portion that passes through said FPGA, each travel time corresponding to the sum of the times for carrying out the logical operations applied to the signal in the FPGA; determining the inter-FPGA time for travelling over each inter-FPGA portion represented by a link in the graph; and determining the time for travelling over each path of the board by summing the intra-FPGA travel times and the inter-FPGA travel times associated with each link of the graph. | 06-09-2016 |
324618000 | Transient response or transient recovery time (e.g., damping) | 1 |
20130076374 | CHARGED BODY SENSING SYSTEM - A charged body sensing electrode is provided which includes a signal generator, a filter and a detector. The signal generator generates an excitation signal, and the filter is coupled to the signal generator and receives the excitation signal from the signal generator. The filter includes at least one charged body sensing unit. The detector is coupled to the filter and detects an output signal corresponding to the filter. Accordingly, when the charged body neared or touched the charged body sensing electrode, the output signal of the filter will be changed. The trajectory, the velocity or the location of the charged body, or the impedance variation of the charged body sensing unit can be obtained by the change of the output signal of the filter which is detected by the detector. | 03-28-2013 |
324619000 | Selective type characteristics | 3 |
20120235688 | APPARATUS FOR DETECTING PARTIAL DISCHARGE SIGNAL AND METHOD THEREOF - An apparatus for detecting a partial discharge (PD) signal capable of detecting a PD signal of a power device includes: a partial discharge (PD) coupler connected to a ground side of a power device and configured to cancel a low frequency noise component including a commercial frequency from an AC component flowing through the ground side of the power device when a partial PD signal is generated from the power device, and to allow a high frequency component including a PD signal included in the AC component to pass therethrough to generate a PD analog signal; and a PD detection unit configured to cancel a noise signal from the PD analog signal generated by the PD coupler to detect only the PD signal. | 09-20-2012 |
20130257454 | Methods for Characterizing Tunable Radio-Frequency Elements in Wireless Electronic Devices - A wireless electronic device may contain an antenna tuning element for tuning the device's operating frequency range. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, etc. A test system may be used to measure the radio-frequency characteristics associated with the tuning element assembled with an electronic device. The test system may include a test host, a test chamber, a signal generator, power meters, and radio-frequency testers. The electronic device under test (DUT) may be placed in the test chamber. The signal generator may generate radio-frequency test signals for energizing the antenna tuning element. The power meters and radio-frequency testers may be used to measure conducted and radiated signals emitted from the DUT while the DUT is placed in different desired orientations. A phantom object is optionally placed in the vicinity of the DUT to simulate actual user scenario. | 10-03-2013 |
20140239978 | MINIMUM-TIME SIGNAL LEAKAGE DETECTOR - A device can include a radio frequency (RF) signal input, a local oscillator (LO) signal input, a mixer to receive the RF signal and LO signal and translate a frequency of the RF signal based on the LO signal, a strobe pulsing component to provide a timed strobe pulse, and a second mixer to receive a leakage signal, LO signal, and timed strobe pulse, and also to translate a frequency of the leakage signal to baseband. The device can also include a coupling component configured to allow the leakage signal to pass between the mixers. An output signal output can provide a measured value of the leakage signal. | 08-28-2014 |