Entries |
Document | Title | Date |
20080197859 | Module For Testing Electromagnetic Compatibility of a High-Speed Ethernet Interface Onboard an Aircraft - A module to test electromagnetic compatibility of at least one high speed Ethernet interface onboard an aircraft. The module includes a cable less than 1 meter long, the ends of which are fitted with two aircraft contacts, two standard connectors compatible with standard test equipment, and a mechanism simulating attenuation of a test cable. | 08-21-2008 |
20080218178 | TESTING APPARATUS, FIXTURE BOARD AND PIN ELECTRONICS CARD - There is provided a test apparatus for testing a device under test including a pre-emphasis circuit. The pre-emphasis circuit emphasizes a predetermined component of an output signal of the device under test and outputs the resulting output signal. Here, the test apparatus includes a filter that eliminates an emphasized component that is generated by the pre-emphasis circuit, from the output signal output from the device under test, and a testing section that measures the output signal output from the filter, and judges whether the device under test is acceptable based on a result of the measurement. The test apparatus can accurately test the pre-emphasis function of the device under test including the pre-emphasis circuit. | 09-11-2008 |
20090079440 | METHOD AND TESTER FOR VERIFYING THE ELECTRICAL CONNECTION INTEGRITY OF A COMPONENT TO A SUBSTRATE - A method for verifying the integrity of the electrical connection between at least one signal path of a substrate and at least one respective contact of a component mounted on the substrate is disclosed. The method includes generating a step signal on one of the at least one signal path connected to a respective contact, and capturing a capacitively coupled signal due to the step signal at the contact. The method further includes determining the integrity of the electrical connection from a characteristic of the capacitively coupled signal or a response signal obtained from the capacitively coupled signal. A tester in which the method is implemented is also disclosed. | 03-26-2009 |
20090096466 | Passive Intermodulation Test Apparatus - A portable test apparatus for conducting a plurality of tests on a communications device is provided. The unit | 04-16-2009 |
20090167321 | Method and Apparatus for Determining an Interfering Field Strength in an Aircraft - The disclosed embodiments relates to a method and an apparatus for determining the interfering field strength in an aircraft and the impairment of an electric system in the aircraft including cables between the outer shell and the interior paneling of the fuselage for transmitting signals within the aircraft. | 07-02-2009 |
20100033193 | OPERATING DEVICE AND METHOD FOR GENERATING OUTPUT SIGNALS THEREFROM - The invention relates to an operating device ( | 02-11-2010 |
20100090710 | IMPULSE IMMUNITY TEST APPARATUS - The application methods in the related art cannot apply a sufficient voltage with a rectangular wave having a short rise time to an electronic circuit. Furthermore, electrostatic discharge test can apply a sufficient voltage but can only apply an oscillating waveform. | 04-15-2010 |
20100156436 | INTEGRATED CIRCUIT AND NOISE MEASURING METHOD - An internal circuit generates a digital signal according to an electric signal received from outside, and outputs the digital signal to an output signal line. An output circuit sets a voltage value of the digital signal to a prescribed value. A drive signal input circuit inputs a drive signal received from outside through a drive signal input terminal to the output circuit, and drives the output circuit independent of the digital signal according to the drive signal. | 06-24-2010 |
20100201377 | Critical Path Redundant Logic for Mitigation of Hardware Across Chip Variation - Cross-die connection structure and method for a die or chip includes buffer elements having a buffer driver and bypass, and control lines coupled to the buffer elements in order to select one of the buffer driver and bypass for each respective buffer element. A logic network is arranged with the buffer elements to form functional paths, a test unit is structured and arranged to test the functional paths and to be coupled to the control lines, and a configuration storage register to set the selected one of the buffer driver and bypass for each passing functional path. | 08-12-2010 |
20100231232 | Systems and Methods to Stir an Electromagnetic (EM) Field - Systems and methods to stir an electromagnetic (EM) field of an EM reverberation chamber are disclosed. A particular system includes an EM reverberation chamber. The system also includes a transmit antenna and a receive antenna operable to generate an EM field within the EM reverberation chamber. The system further includes a variable charged particle source to stir the EM field by varying introduction of charged particles into the EM field. | 09-16-2010 |
20100321034 | SYSTEM AND METHOD FOR DETECTING INTERFERNCE IN A SENSOR DEVICE USING PHASE SHIFTING - A capacitive sensor device and method is configured to respond a stimulus provided in a sensing region with an output signal. A signal generator is configured to apply a carrier signal to the capacitive sensor device. The carrier signal is switched between a plurality of phases at a switching rate, where the switching rate is less than a demodulation filter bandwidth. The result of the carrier phase shifting is that effects of interference in the output signal are frequency shifted away from the effects of user applied stimulus. An interference detection filter is configured to filter from the sensor outputs at least one effect produced by the stimulus. An interference measuring device is configured to determine a level of interference in the at least one interference output. Thus, the system can detect interference in the output of the capacitive sensor device. | 12-23-2010 |
20110018553 | Electromagnetic Compatibility Multi-Carrier Immunity Testing System and Method - Provided for in some embodiments is, a method of electromagnetic compatibility multi-carrier immunity testing. The method includes generating a first carrier frequency set including a first plurality of carrier frequencies simultaneously such that a device under test is subjected to the first plurality of carrier frequencies simultaneously. One or more of the first plurality of carrier frequencies is substantially different from other ones of the first plurality of carrier frequencies such that the first plurality of carrier frequencies do not interfere with one another when they are generated simultaneously, and intermodulation products of the first plurality of carrier frequencies are not significant relative to the first plurality of carrier frequencies when the first plurality of carrier frequencies are generated simultaneously. | 01-27-2011 |
20110187387 | METHOD OF GENERATING A SCENARIO OF ELECTROMAGNETIC NOISE - Method of generating a scenario of electromagnetic noise for monitoring the reliability of a sensitive apparatus, characterized in that it includes the steps consisting in: defining environmental electromagnetic conditions relating to the environment of the sensitive apparatus, determining a positioning of the sensitive apparatus in the environment, and generating, on the basis of the environmental electromagnetic conditions and of the positioning of the sensitive apparatus, a scenario of electromagnetic noise including a set of permanent noises and a set of transient noises. | 08-04-2011 |
20110316559 | METHOD FOR TESTING A POWER DISTRIBUTION SYSTEM AND A POWER DISTRIBUTION SYSTEM ANALYZER DEVICE - A method and analyzer device are provided for testing a power distribution system of a power supply network. A first electrical signal is transmitted into the power distribution system to be tested, the first electrical signal is propagated along the power distribution system to be tested, and a second electrical signal, which is a portion of the first electrical signal reflected within the power distribution system, is received. A signal variation parameter is measured between the first electrical signal and the second electrical signal, and a location of a critical conducting section within the power supply network is obtained from the measured signal variation parameter. A maximum load rating of the critical conducting section is determined, and a control signal for controlling the power supply network such that the power transferred on the critical conducting section does not exceed the maximum load rating. | 12-29-2011 |
20120007605 | HIGH FREQUENCY MEASUREMENT SYSTEM - The invention concerns a high frequency non-linear measurement system for analysing the behaviour of a high frequency device, for example a device for use in a high power, high frequency amplifier, such as an amplifier for use in a mobile telephone network or other telecommunications-related base-station. An embodiment of the invention provides a high frequency non-linear measurement system including one or more multiplexer circuits. Each multiplexer circuit comprises a first signal-combining circuit and a second signal-combining circuit. Each signal-combining circuit comprises a pair of directional couplers connected via a pair of signal filters arranged in parallel. | 01-12-2012 |
20120025847 | METHOD AND SYTEM FOR MEASURING A TIME CONSTANT OF AN INTEGRATED CIRCUIT, AND INTEGRATED CIRCUIT PROVIDED WITH SUCH A SYSTEM - A method and system for measuring a time constant RC of an integrated electronic circuit is provided. This integrated circuit may be made up of a first hardware component and of a second hardware component wherein one of the hardware components is a resistive element and the other is a capacitive element. The first and the second hardware components are connected to an inverting input of an operational amplifier of an integrator of a delta-sigma modulator. A DC voltage is applied to the modulator input. The output signal Q | 02-02-2012 |
20120032687 | DETECTION APPARATUS FOR DETECTING ELECTRIC FIELD DISTRIBUTION OR CARRIER DISTRIBUTION BASED ON THE INTENSITY OF HIGH-ORDER HARMONICS - A detection apparatus having means for evaluating generation and disappearance of a carrier is provided. A detection apparatus detects, on the basis of high-order harmonics, an electric field distribution or a carrier distribution between electrodes arranged on an object to be observed. The detection apparatus includes an emission unit for emitting a fundamental wave to the object, a detection unit for detecting the high-order harmonics generated according to the electric field distribution or the carrier distribution in the object when a voltage is applied to the object, an excitation emission unit for emitting an excitation light for generating a carrier in the object, and a control signal output unit for outputting a second signal to cause the excitation emission unit to emit the fundamental wave to the object on the basis of a first signal of the excitation emission unit, and outputting a third signal to cause the detection unit to detect the high-order harmonics, wherein the control signal output unit is configured to change a time interval from when the first signal is output to when the second and third signals are output. | 02-09-2012 |
20120032688 | CROSSTALK COMPENSATION IN ANALYSIS OF ENERGY STORAGE DEVICES - Estimating impedance of energy storage devices includes generating input signals at various frequencies with a frequency step factor therebetween. An excitation time record (ETR) is generated to include a summation of the input signals and a deviation matrix of coefficients is generated relative to the excitation time record to determine crosstalk between the input signals. An energy storage device is stimulated with the ETR and simultaneously a response time record (RTR) is captured that is indicative of a response of the energy storage device to the ETR. The deviation matrix is applied to the RTR to determine an in-phase component and a quadrature component of an impedance of the energy storage device at each of the different frequencies with the crosstalk between the input signals substantially removed. This approach enables rapid impedance spectra measurements that can be completed within one period of the lowest frequency or less. | 02-09-2012 |
20120074956 | METHOD AND SYSTEM FOR DELTA DOUBLE SAMPLING - An array of sensors arranged in matched pairs of transistors with an output formed on a first transistor and a sensor formed on the second transistor of the matched pair. The matched pairs are arranged such that the second transistor in the matched pair is read through the output of the first transistor in the matched pair. The first transistor in the matched pair is forced into the saturation (active) region to prevent interference from the second transistor on the output of the first transistor. A sample is taken of the output. The first transistor is then placed into the linear region allowing the sensor formed on the second transistor to be read through the output of the first transistor. A sample is taken from the output of the sensor reading of the second transistor. A difference is formed of the two samples. | 03-29-2012 |
20120081129 | TEST APPARATUS - Delay circuits apply a delay to set and reset pulses, respectively. An RS flip-flop is set according to the set pulse that has passed through the set delay circuit, and is reset according to the reset pulse received from the reset delay circuit. A demultiplexer receives the reset pulse that has passed through the reset delay circuit. In a first state, the demultiplexer outputs the reset pulse to the reset terminal of the RS flip-flop. In a second state, the demultiplexer outputs the reset pulse signal to the reset delay circuit again, thereby forming a closed loop. A loop control unit counts the number of times a pulse is passed through the loop. When the number of passes through the closed loop reaches a predetermined value, the demultiplexer is set to the first state. | 04-05-2012 |
20120086463 | Metamaterial Particles for Near-Field Sensing Applications - A method and structure for designing near-field probes with high sensitivity used in detecting a wide variety of materials and objects such as biological anomalies in tissues, cracks on metallic surfaces, location of buried objects, or composition of material such as permittivity and permeability . . . etc., is disclosed. The present invention includes using single or multiple metamaterial unit cells or metamaterial particles as near-field sensors. Metamaterial unit cells are defined as the building blocks used for fabricating metamaterials that provide electrical or magnetic properties not found in naturally occurring media. Metamaterial unit cells or particles include split-ring resonators, complementary split-ring resonators, or a variety of other electrically-small resonators made of conducting wires or conducting flat surfaces. Metamaterial unit cells are excited by appropriate excitations such as small loops, microstriplines, etc. depending on the electromagnetic properties of the metamaterial unit cell. Once the metamaterial unit cell is excited, the reflection and transmission coefficients from the excitation mechanism can be measured. | 04-12-2012 |
20120161784 | HIGH FREQUENCY MEASUREMENT APPARATUS AND METHOD WITH LOAD PULL - The present invention relates to a measurement system and method for analysing, and characterising, the behaviour of a high frequency device, commonly referred to in the art as a device under test (or DUT) at relatively high power levels. Such devices may for example need to be analysed when designing devices or designing circuits utilising such devices, for use in high power (large signal) high frequency amplifiers, such as an amplifier for use in a mobile telephone network or other telecommunications-related base-station. The measurement apparatus for measuring the response of an electronic device to a high frequency input signal includes an active load-pull circuit connectable in use to an electronic device to be measured. The active load-pull circuit includes a passive load-pull device. | 06-28-2012 |
20120217979 | ELECTROMAGNETIC GENERATING DEVICE FOR TESTING ELECTROMAGNETIC COMPATIBILITY - An electromagnetic generating device is used for testing an electromagnetic interference of electronic elements of an electronic device. The electromagnetic generating device includes a power source and a detector. The power source includes a power output. The detector includes a first magnetic guiding portion, a second guiding portion, and an electronic coil. The first magnetic guiding portion is connected to the second magnetic guiding portion. The electronic coil surrounds the second magnetic guiding portion. The electronic coil includes an input coupled to the power output of the power source, and an output being grounded. | 08-30-2012 |
20120286801 | MANUFACTURING METHOD, SWITCHING APPARATUS, TRANSMISSION LINE SWITCHING APPARATUS, AND TEST APPARATUS - An actuator is manufactured that includes piezoelectric film that does not suffer physical damage. Provided is a manufacturing method comprising first insulating layer deposition of depositing a first insulating layer on a substrate using an insulating material; first annealing of annealing the first insulating layer; first electrode layer deposition of depositing a first electrode layer on the first insulating layer using a conductive material; first piezoelectric film deposition of depositing a first piezoelectric film on the first electrode layer by applying a sol-gel material on the first electrode layer and annealing the sol-gel material; second electrode layer deposition of depositing a second electrode layer on the first piezoelectric film using a conductive material; second insulating layer deposition of depositing a second insulating layer on the second electrode layer using an insulating material; and second annealing of annealing the second insulating layer. | 11-15-2012 |
20120293184 | HIGH FREQUENCY CHARACTERISTIC MEASURING DEVICE - A high frequency characteristic measuring device for measuring high frequency characteristics of a high frequency device to be measured by contacting probe needles with the high frequency device to be measured, before mounting of the high frequency device to be measured. The high frequency characteristic measuring device includes an input matching circuit substrate with an input matching circuit thereon, a first coaxial connector electrically connected to the input matching circuit substrate, and first probe needles electrically connected to the input matching circuit substrate. The high frequency characteristic measuring device further includes an output matching circuit substrate with an output matching circuit thereon, a second coaxial connector electrically connected to the output matching circuit substrate, and second probe needles electrically connected to the output matching circuit substrate. | 11-22-2012 |
20120313647 | INFRASTRUCTURE FOR PERFORMANCE BASED CHIP-TO-CHIP STACKING - A method and system for an infrastructure for performance-based chip-to-chip stacking are provided in the illustrative embodiments. A critical path monitor circuit (infrastructure) is configured to launch a signal from a launch point in a first layer, the first layer being a first circuit. The infrastructure is further configured to create an electrical path to a capture point. The signal is launched from the launch point in the first layer. A performance characteristic of the electrical path is measured, resulting in a measurement, wherein the measurement is indicative of a performance of the first layer when stacked with a second layer in a 3D stack without actually stacking the first and the second layers in the 3D stack, the second layer being a second circuit. | 12-13-2012 |
20130106434 | ELECTROSTATIC FIELD INTERFERENCE TESTING APPARATUS AND METHOD USING THE SAME | 05-02-2013 |
20130106435 | PINCH DETECTION DEVICE AT OPENING/CLOSING SECTION, VEHICLE HAVING THE DEVICE, AND METHOD FOR DETECTING PINCH AT THE OPENING/CLOSING SECTION | 05-02-2013 |
20130193983 | JIG FOR MEASURING EMC OF SEMICONDUCTOR CHIP AND METHOD FOR MEASURING EMC OF SEMICONDUCTOR CHIP USING THE SAME - Disclosed are a jig for measuring EMC of a semiconductor chip and a method for measuring EMC that can accurately measure the EMC at a semiconductor chip level. The jig for measuring EMC of a semiconductor chip according to the exemplary embodiment of the present disclosure includes: a chip mount unit on which the semiconductor chip for which the EMC is to be measured is mounted; a memory unit configured to store EMC information of components in a system in which the semiconductor chip is used; and a measurement control unit configured to extract the EMC information stored in the memory unit and provide the extracted EMC information to the chip mount unit at the time of measuring the EMC of the semiconductor chip. | 08-01-2013 |
20130241572 | SHIELD INSPECTION DEVICE AND SHIELD INSPECTION METHOD - A grouping unit groups closely arranged wirings to be protected from among a plurality of wirings to be protected by means of a shield and arranged on a circuit board. A division unit divides, for each of the grouped groups, a region around the group on the circuit board into a plurality of divided regions. A determination unit determines the existence of a shield for each of the divided regions. | 09-19-2013 |
20130257453 | RF ESD Device Level Differential Voltage Measurement - A method of measuring, recording, and calculating high speed differential voltage measurements across a device-under-test during electrostatic discharge testing of for discrete devices and silicon wafer probing uses high frequency components and a combination of high impedance resistors and attenuators to allow differential voltage measurements of stress signals including IED 61000-4-2, HMM, HBM, and MM with voltages in excess of +/−12000V. | 10-03-2013 |
20130307561 | Test Signal Supplying Device and Semiconductor Integrated Circuit - A test signal supplying device includes a first external terminal, a second external terminal being applied with a predetermined electric potential, an internal load, a first terminal that is connected to the first external terminal through the internal load, a second terminal that is connected to the first external terminal without passing through the internal load, a test signal generating section that generates a test signal and supplies the test signal to the second terminal, a detecting section that detects an amplitude of the test signal, and a controlling section that measures an impedance of an external load connected to the first and second external terminals based on the detected amplitude of the test signal. | 11-21-2013 |
20130314102 | DELAY FAULT TESTING FOR CHIP I/O - An integrated circuit (IC) chip is provided. The IC chip includes a signal output via which an outgoing signal is transmitted, and a signal input via which an incoming data signal is received. Also included on the IC ship is a pass circuit to couple the signal output to the signal input during testing of the IC chip. Furthermore, a delay circuit produces a first timing signal and a second timing signal during testing of the IC chip. The second timing signal is delayed from the first timing signal according to a test parameter. The first timing signal triggers transmission of a test signal via the signal output, and the second timing signal triggers sampling of the received test signal via the signal input. | 11-28-2013 |
20140043042 | Snoop Detection on Calibrated Bus - An electronic system having a high speed signaling bus requiring training (calibration) of a calibrated item in a driver circuitry or a receiver circuitry for reliable operation. At manufacturing or in a secure location, secure calibration coefficients are determined for the electronic system and are stored in a non-volatile storage. During operation, the high speed signaling bus may be re-calibrated, resulting in a new currently active calibration coefficient for the calibrated item. A coefficient watchdog checks a new coefficient value selected by the re-calibration at present environmental conditions such as voltage and temperature against the secure calibration coefficients. If the new calibration coefficient value is the same as a calibration coefficient value in an acceptably close secure calibration coefficient, the new calibration coefficient is accepted; if not, a potentially probed warning is created by the coefficient watchdog. | 02-13-2014 |
20140145729 | LOW FREQUENCY IMPEDANCE MEASUREMENT WITH SOURCE MEASURE UNITS - A method for measuring the impedance of a DUT having a capacitance of less than 1 pF includes applying a voltage or current signal to the DUT, the voltage or current signal including an AC component having a non-zero frequency of less than 1 kHz; monitoring a current or voltage signal, respectively, through the DUT in response to the voltage or current signal; digitizing the voltage signal and the current signal synchronously; and calculating the impedance from the digitized voltage and current signals. | 05-29-2014 |
20140203820 | TESTING APPARATUS FOR A HIGH SPEED CROSS OVER COMMUNICATIONS JACK AND METHODS OF OPERATING THE SAME - A testing unit including a substrate, a plurality of vias located in the substrate, a plurality of pin traces having a height and a width and each extending from a respective via towards an edge of the substrate and terminating at an end point, a plurality of termination points adjacent to the end points of the pin traces, a plurality of end traces having a height and a width with each end trace extending from an end point of a respective pin trace towards to a corresponding termination point near to the pin trace, a plurality of traces extending from the end of a respective end point or termination point to the edge of the substrate, where the end points of each pin trace are adjacent to each other and the termination points are adjacent to one another such that the pair of adjacent end traces and the pair of adjacent termination points are each adjacent to different traces. | 07-24-2014 |
20140210486 | ANTENNA SYSTEM - Broadband antenna system comprising a plurality of antenna elements and a plurality of amplifiers; wherein every antenna element of said plurality of antenna elements is configured for operating in a predetermined frequency range and is associated with an amplifier of said plurality of amplifiers which is configured for said predetermined frequency range; said plurality of antenna elements covering a broadband range. | 07-31-2014 |
20150061698 | ELECTROMAGNETIC INTERFERENCE (EMI) TEST APPARATUS - A radio-frequency (RF) energy coupling apparatus for electromagnetic interference (EMI) susceptibility testing of a device. The apparatus includes a ground-plane, a micro-strip, a first dielectric layer, a coupling-strip, and a second dielectric layer. The micro-strip overlies the ground-plane. The first dielectric layer is interposed between the ground-plane and the micro-strip. The combination of the ground-plane, the micro-strip, and the first dielectric layer cooperate to form a micro-strip transmission line configured to propagate RF energy from a RF generator to a termination load. The coupling-strip overlies the micro-strip opposite the first dielectric layer. The coupling-strip is configured to couple RF energy from the micro-strip to a harness wire connected to the device. The second dielectric layer is interposed between the coupling-strip and the micro-strip. | 03-05-2015 |
20150377942 | ELECTRONIC DEVICE AND TESTING SYSTEM - An electronic device is provided. The electronic device includes a printed circuit board (PCB), an antenna structure, a radio frequency signal transceiving circuit and a testing structure. The antenna structure is disposed on the PCB. The radio frequency signal transceiving circuit is disposed on the PCB, and is connected to the antenna structure through a conductive line. The testing structure includes a testing point and a grounding structure. The testing point is disposed on the conductive line, and the grounding structure is disposed on the PCB. | 12-31-2015 |
20160025787 | SENSOR AND METHOD FOR DETERMINING A DIELECTRIC PROPERTY OF A MEDIUM - The invention relates to a sensor ( | 01-28-2016 |
20160252554 | TEST CHAMBER FOR ELECTROMAGNETIC COMPATIBILITY MEASUREMENT | 09-01-2016 |