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Instruments and devices for fault testing

Subclass of:

324 - Electricity: measuring and testing

324500000 - FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS

Patent class list (only not empty are listed)

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Class / Patent application numberDescriptionNumber of patent applications / Date published
324556000 Having a lamp or light indicator 3
20100253365FAULT DETECTION CIRCUIT - A fault detection circuit connects to and determines the occurrence of failure in an inverter circuit. The inverter circuit comprises three outputs to connect three groups of lamps respectively, and the fault detection circuit comprises a magnetic unit and a signal detection unit. The magnetic unit comprises first, second and third flux generating windings electrically connected to the three outputs of the inverter circuit, and a flux detection winding. If no fault occurs on the outputs of the inverter circuit, total flux generated by the flux generating windings is cancelled out. As long as any fault occurs on the outputs of the inverter circuit, flux generated by the flux generating windings cannot be canceled out, and the flux detection winding is electromagnetically coupled accordingly and driven by the generated flux to output a coupling signal, based on which the signal detection unit generates an alert signal accordingly.10-07-2010
20110101993SYSTEM FOR TESTING ELECTRONIC DEVICES - A system for testing an electronic device comprises a first output, a second output, and a third output connected to a positive input, an identification input, and a negative input of the electronic device, respectively. The system further comprises a switch comprising at least two dynamic contacts, each of which is connected to a resistor for the use of identification.05-05-2011
20130134987Apparatus and Method for Easy Diagnosis, Repair, and Maintenance of a Commercial Display Screen - One or more apparatuses and methods for enabling easy diagnosis, repair, and maintenance of a commercial display screen are disclosed. In one embodiment of the invention, this apparatus includes a removable commercial display kit box, a corresponding base plate interface unit attached to a rear panel of the commercial display screen, and a guiding mechanism for docking the removable commercial display kit box and the corresponding base plate interface unit. Furthermore, in one embodiment of the invention, the removable display kit box contains an analog-to-digital converter board, a power board, automatic-switching dual data ports, maintenance check visual indicators, and a removable fuse inlet. In case of a commercial display screen malfunction, the removable display kit box allows a quick inspection and a modular repair or replacement of a malfunctioning part, without requiring the entire commercial display screen to be dismounted from a wall or another attached structure.05-30-2013
Entries
DocumentTitleDate
20090219034Diagnostic Circuit and Method of Testing a Circuit - A diagnostic circuit is configured for connecting to a unit under test that has a load and a sinusoidal source. The diagnostic circuit includes a voltage sensing device that has an input for sensing a signal, a first terminal for connecting to the load, a second terminal for connecting to the sinusoidal source, and a relay connected between the first and second terminals for connecting the sinusoidal source to the load. Clamping diodes are provide for clamping a sinusoidal signal and include a first clamping diode connected between a D/C voltage source and the input and a second clamping diode connected between ground and the input. A resistor is connected between the D/C voltage source and the first terminal. The diagnostic circuit verifies the operational functionality of the load, related wiring and connections.09-03-2009
20130043882APPARATUS AND METHOD FOR TESTING ELECTRONIC EQUIPMENT - A thermal wrap for testing electronic components has a web having an inside and an outside surface and a first end and a second end and a thermal element incorporated in said web. An edge element incorporated substantially along at least one edge of said web promotes a thermal seal between said web and the electronic component being tested when the electronic component in installed in the wrap. A closure disposed on the ends may be reversibly closed sufficiently tightly to promote the thermal seal.02-21-2013
20130027057SWITCHING APPARATUS, SWITCHING APPARATUS MANUFACTURING METHOD, TRANSMISSION LINE SWITCHING APPARATUS, AND TEST APPARATUS - A package of a switching apparatus that houses an actuator having a movable contact point and in which a fixed contact point, which is electrically connected to or disconnected form the movable contact point, is accurately formed. Provided is a switching apparatus comprising a first substrate provided with a via that electrically connects a top surface thereof and a bottom surface thereof, while maintaining an air-tight state between the top surface and the bottom surface; a second substrate provided on the first substrate and in which is formed a through-hole that houses an actuator; and a third substrate provided on the second substrate and supporting the actuator, which has a moveable contact point.01-31-2013
20090302863Device for Simulating the Symmetrical and Asymmetrical Impedance of an Asynchronous Motor - The present invention relates to a device for simultaneous simulation of a symmetrical and an asymmetrical impedance of an asynchronous machine. The device has three subcircuits for simulating the three phases of the asynchronous machine. Each subcircuit preferably comprises a series connection of a main inductance, a leakage inductance and a resistor between the input terminal and the output terminal, which are connected in parallel to ground across a capacitor and a resistor in each case. A magnetic coupling is implemented or the effect of a magnetic coupling is simulated for the main inductances of the subcircuits. This device can be used to advantage instead of the asynchronous machine in calibration of EMC filters.12-10-2009
20130082718CIRCUIT TEST INTERFACE AND TEST METHOD THEREOF - A circuit test interface and a test method are disclosed. The circuit test interface may include a test voltage input pad, a test voltage output pad, and a plurality of input buffers. Each of the plurality of input buffers may have a first input terminal, a second input terminal, and an output terminal. The first input terminal of each respective input buffer may be coupled to one of a plurality of through-silicon vias (TSVs). The circuit test interface may further include a plurality of switch units. Each of the plurality of switch units may have a first terminal and a second terminal. The circuit test interface may further include a scan chain, coupled to both the output terminal of each of the plurality of input buffers and to the test voltage output pad.04-04-2013
20100109678Controlling Two JTAG TAP Controllers With One Set of JTAG Pins - Various apparatuses, methods and systems for dual JTAG controllers with shared pins disclosed herein. For example, some embodiments provide a boundary scan apparatus having a first boundary scan circuit with a first plurality of control inputs, a second boundary scan circuit with a second plurality of control inputs, and a plurality of boundary scan control signals connected to the first plurality of control inputs on the first boundary scan circuit and to the second plurality of control inputs on the second boundary scan circuit. At least two of the plurality of boundary scan control signals are connected between the first boundary scan circuit and the second boundary scan circuit in a crossover fashion.05-06-2010
20090045819TESTING DEVICE - A testing device (02-19-2009
20130069669ELECTROSTATIC SHIELDING TECHNIQUE ON HIGH VOLTAGE DIODES - A DC high potential testing meter comprises first and second probes. The first probe comprises an insulated shield supporting an electrode extending from a distal end of the shield. A high voltage resistor and a high voltage diode in the shield are connected in series with the electrode. A capacitance formed by a metallic collar across the high voltage diode provides uniform voltage distribution along the high voltage diode. The second probe comprises an insulated shield supporting an electrode. A high voltage resistor in the shield is connected in series with the electrode. A meter comprises a housing enclosing an electrical circuit for measuring voltage across the electrodes and provides an output representing measured voltage.03-21-2013
20110012617METHODS AND SYSTEMS FOR TESTING DIGITAL-TO-ANALOG CONVERTER/AMPLIFIER CIRCUITS - A digital-to-analog converter (DAC)/amplifier testing system for use in an electron-beam (e-beam) mask writer, the e-beam mask writer including a plurality of DAC/amplifier circuits to output analog voltage signals, each DAC/amplifier circuit having a first output terminal and a second output terminal, the first output terminals of the plurality of DAC/amplifier circuits being respectively coupled to deflection plates of the e-beam mask writer to provide the output analog voltages as deflection voltages, is provided. The testing system including a summation circuit to sum voltage signals and to output a summation signal indicating the sum of the received analog voltage signals and an analyzer circuit to digitize the summation signal and to detect to compare the digitized summation signal with an error tolerance range to detect whether at least one of the DAC/amplifier circuits is experiencing an operating error.01-20-2011
20090237089APPARATUS FOR TRANSFERRING PACKAGED CHIPS, TEST HANDLER AND METHOD FOR MANUFACTURING PACKAGED CHIPS - An apparatus for transferring packaged chips, a test handler, and a method for manufacturing packaged chips are provided. The apparatus for transferring packaged chips may include a main frame having a coupling member coupled to a base plate and a supporting member coupled to the coupling member, a plurality of first pickers coupled to one side of the supporting member so as to be movable in a horizontal direction, a plurality of second pickers coupled to the other side of the supporting member so as to be movable in the horizontal direction, and a control unit to determine distances by which the first pickers and the second pickers move in the horizontal direction.09-24-2009
20120268138TEST APPARATUS - To detect whether energy accumulated in an inductive load section has been discharged. Provided is a test apparatus that tests a device under test, comprising a power supply section that generates a power supply voltage to be supplied to the device under test; an inductive load section that is provided in a path between the power supply section and the device under test; a housing section that houses a substrate that includes at least the inductive load section; and a lock maintaining section that keeps an opening/closing section, which allows an operator to access the substrate within the housing section, in a locked state when a voltage at a predetermined position on the substrate is greater than a set voltage.10-25-2012
20120092023METHOD AND CIRCUIT FOR TESTING A POWER PRODUCER OR A POWER CONSUMER WHICH CAN BE CONNECTED TO A POWER GRID - Described is a method for testing a power producer or a power consumer that can be connected to a power grid. The power producer or the power consumer is connected to a terminal point. A converter circuit is provided for influencing a voltage that is present at the terminal point. The converter circuit is connected via a transformer to the terminal point. In at least one embodiment, a series connection is configured with a choking coil and a first switch and connected to the terminal point. In a time coordinated manner, the first switch is initially closed and the converter circuit is influenced such that the voltage has the desired value at the terminal point, whereupon the second switch is then opened.04-19-2012
20090284268SLOT INTERPOSER PROBE - The slot interposer probe consists of a board with a male edge connector and a female edge connector connected to its opposed edges and circuitry electrically connecting the male edge connector to the female edge connector. The female edge connector may be a straddle-mount connector. The board may have an inner layer sandwiched between two outer layers. There may be a probe having a high-speed buffer connected to a plurality of capacitors, isolation resistors, and vias that intercepts signals carried by transmission lines on the inner layer. The vias may have a length equal to the inner layer's width. The high-speed buffer receives intercepted signals from the vias, copies and amplifies the signals, and drives them through coaxial cables to an acquisition module. The invention also includes a method of intercepting signals between a first electrical device and a second electrical device.11-19-2009
20130162264Modular Test Plug For Voltage, Current And Current Transformer Saturation Testing - A modular test plug for voltage, current and saturation testing has a housing having a handle portion, a plurality of jaw connections for injecting upstream toward the equipment to be tested, a plurality of blade connections for injecting downstream toward a transformer, a first plurality of binding posts on a top of the housing connected to the jaw connections, and a second plurality of binding posts also on a top of the housing connected to the blade connections. Also provided is a short-defeating insert for defeating a shorting mechanism in an FT switch. This insert has a thin flat extension member extending from the body to prevent a bottom cam on a shorting blade from making contact with a shorting spring that would otherwise short the circuit when the switch handle is moved from the open position to the closed position.06-27-2013
20090206843TEST APPARATUS HAVING BIDIRECTIONAL DIFFERENTIAL INTERFACE - First and second resistors are provided between a first input/output terminal and a power supply terminal, and between a second input/output terminal and the power supply terminal, respectively. Third and fourth resistors are connected to the second and first input/output terminals, respectively. First and second current-switching switches couple either the first input/output terminal side or the second input/output terminal side with a first current source and a second current source, respectively, according to the value of pattern data. A level shift circuit shifts the electric potentials at the second terminals of the third and forth resistors by a predetermined level. A comparator circuit compares the electric potentials at the second terminals of the third and fourth resistors level-shifted by the level shift circuit with those at the second terminals of the fourth and third resistors, respectively, and generates first and second comparison signals according to the comparison results.08-20-2009
20090322346MOTHERBOARD TEST SYSTEM AND TEST METHOD THEREOF - A motherboard test system for testing a motherboard includes a number of HDDs storing different operating systems, a number of HDD connectors corresponding to the HDDs, a number of electrical switches connecting power terminals of the HDD connectors to a power supply, a microcontroller controlling which electrical switch is turned on, and a computer. The motherboard is connected to signal terminals of the HDD connectors to read and implement the operating system of a powered HDD, and sends the operating result to the computer.12-31-2009
20110291667Modular Test Plug For Voltage, Current and Current Transformer Saturation Testing - A modular test plug for voltage, current and saturation testing has a housing having a handle portion, a plurality of jaw connections for injecting upstream toward the equipment to be tested, a plurality of blade connections for injecting downstream toward a transformer, a first plurality of binding posts on a top of the housing connected to the jaw connections, and a second plurality of binding posts also on a top of the housing connected to the blade connections. Also provided is a short-defeating insert for defeating a shorting mechanism in an FT switch. This insert has a thin flat extension member extending from the body to prevent a bottom cam on a shorting blade from making contact with a shorting spring that would otherwise short the circuit when the switch handle is moved from the open position to the closed position.12-01-2011
20100090709TEST APPARATUS AND TEST METHOD - Provided is a test apparatus that tests a device under test, comprising a pattern generating section that generates a test pattern determined according to a test signal to be supplied to the device under test; a timing signal generating section that generates a timing signal indicating a timing for supplying the test signal to the device under test; a digital filter that filters the test pattern to output a jitter control signal representing jitter corresponding to the test pattern; a jitter injecting section that injects the timing signal with jitter by delaying the timing signal according to the jitter control signal; and a waveform shaping section that generates the test signal formed according to the test pattern, with the timing signal into which the jitter is injected as a reference.04-15-2010
20090021266DEFECT DETECTION SYSTEM WITH MULTILEVEL OUTPUT CAPABILITY AND METHOD THEREOF - A defect detection system and related method take advantage of multilevel detection technique for detecting defects on an integrated circuit. The defect detection system utilizes an analog-to-digital converter for converting an analog sensing signal into an output code having a plurality of bits. The defect detection methods include an open test method and a short test method. The open and short test methods both include a calibrating method and a testing method individually. The calibrating method functions to determine a preset reference voltage for the analog-to-digital converter based on a predetermined code. The testing method makes use of the preset reference voltage and the predetermined code for generating the output code having a plurality of bits. The output code is then utilized to determine whether or not there are open or short defects on the integrated circuit and to classify the defects.01-22-2009
20090315568Manually Pre-Settable Proof of Flow Current Sensor Apparatus, System, and/or Method - The present invention relates to motor status monitoring and equipment protection applications for industrial automation, HVAC, and other implementations, and more particularly, to use of current sensors in detecting loss of flow conditions. Presently described embodiments can comprise simplified, compact current sensors devices that can be economical to build, inventory, distribute, and purchase, and can be easily manually configured prior to installation and automatically offer proof of flow detection once properly installed and energized.12-24-2009
20110133751SIGNAL GENERATING APPARATUS AND TEST APPARATUS - Provided is a signal generating apparatus comprising a DA converter that outputs an output signal corresponding to input data supplied thereto; a sample/hold unit that is provided between the DA converter and an output end of the signal generating apparatus, and that samples an output voltage of the DA converter and holds the sampled output voltage; a comparing section that compares (i) a level of a signal output from an analog circuit that propagates the output signal to output a signal corresponding to the input data to (ii) a level of the signal output by the DA converter; and a control section that, during a holding period, (iii) provides the DA converter with comparison data instead of the input data to cause the DA converter to output a comparison voltage corresponding to the comparison data, (iv) causes the comparing section to compare a voltage of the signal output by the analog circuit to the comparison voltage, and (v) adjusts the output voltage of the DA converter according to the input data based on a comparison result of the comparing section.06-09-2011
20110169501DELAY CIRCUIT - A sub-delay element has the same configuration as that of a main delay element, and applies a delay τ that corresponds to a bias voltage to a selected clock signal output from a first selector. A phase detectorgenerates a phase detection signal that corresponds to the phase difference between a selected clock signal that has propagated through the sub-delay element and a selected clock signal that has propagated through a bypass path. A counter performs a count operation according to the phase detection signal. A D/A converter supplies a bias voltage that corresponds to the count value of the counter to the main delay element and the sub-delay element. An initialization unit instructs a DLL circuit to actually operate, and sets the reference voltage to be supplied to the D/A converter based upon the fluctuation in the count value of the counter.07-14-2011
20090295404Test apparatus and test module - Provided is a test apparatus that tests a device under test, comprising a control apparatus that controls the test apparatus; a pattern generator that generates a plurality of test patterns to be provided to a plurality of input terminals of the device under test; a plurality of variable delay circuits that designate a timing for supplying each of the plurality of test patterns to a corresponding input terminal of the plurality of input terminals; and a plurality of micro-controllers that operate in parallel, according to instructions from the control apparatus, to each measure a delay amount of a variable delay circuit when the variable delay circuit is set with a prescribed delay setting value and store the delay setting value in association with the measured delay amount.12-03-2009
20090261843LOAD SIMULATOR - A load simulator includes an indicator, a first resistor, and a second resistor. A first terminal of the indicator is connected to a first pin of a charger, while a second terminal of the indicator is grounded. The indicator and the first resistor are connected in parallel. Two terminals of the second resistor are connected to a second pin of the charger and ground, respectively.10-22-2009
20090261842Docking Drive, Locking Element, Docking System - A docking drive for a testing head comprising a plurality of locking mechanisms (10-22-2009
20130099796Radiation-Tolerant Overcurrent Detection - Systems and methods for radiation-tolerant overcurrent detection are disclosed. In some embodiments, an integrated circuit may include a plurality of overcurrent detectors, each of the plurality of overcurrent detectors configured to detect a candidate overcurrent event. The integrated circuit may also include a voting circuit coupled to the overcurrent detectors, the voting circuit configured to indicate an overcurrent in response to receiving a selected number of candidate overcurrent events from the overcurrent detectors. At least one of the overcurrent detectors may be subject to detecting the candidate overcurrent in error, at least in part, due to exposure to ionizing radiation.04-25-2013
20090167319TEST APPARATUS FOR DETERMINING IF ADJACENT CONTACTS ARE SHORT-CIRCUITED AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICES THAT INCLUDE SUCH TEST APPARATUS - A test apparatus includes a plurality of pairs of test contacts on a semiconductor substrate; a first test structure which includes a plurality of first test interconnection layers and a first body interconnection layer that is electrically connected to the first test interconnection layers, each of the first test interconnection layers being electrically connected to at least one test contact; and a second test structure which includes a plurality of second test interconnection layers and a second body interconnection layer that is electrically connected to the second test interconnection layers, each of the second test interconnection layers being electrically connected to at least one test contact.07-02-2009
20090033337TEMPORARY CHIP ATTACH TEST CARRIER UTILIZING AN INTERPOSER - A testing substrate comprises internal circuitry connected to external contacts by wiring and meltable conductors are connected to the external contacts of the testing substrate. An interposer having substrate contacts on a first side is connected to the meltable conductors. The interposer is maintained apart from the testing substrate by the meltable conductors. The interposer comprises chip contacts on a second side opposite the first side. The chip contacts are adapted to temporarily connect to an integrated circuit chip being tested and burned-in. The chip contacts can have a different spacing than the substrate contacts. The interposer also includes conductive vias running from the first side to the second side and directly connecting the substrate contacts to the chip contacts.02-05-2009
20080265908SHIELDING APPARATUS - A shielding apparatus for electromagnetic testing includes a platform, a lid forming a cavity, a driving unit, and an elastic gasket attached to a bottom of the lid around a rim adjacent the cavity. The platform is for placing an electronic device to be tested. The lid is for covering the platform to define a closed space. The driving unit is for lifting and lowering the lid. The gasket is for being compressed and filling gaps between the lid and the platform when the platform covers the lid.10-30-2008
20110006783CARD FOR SIMULATING PERIPHERAL COMPONENT INTERCONNECT LOADS - A card for simulating peripheral component interconnect (PCI) loads of a computer motherboard uses a PCI interface to be inserted into a PCI slot of the computer motherboard to receive first to third voltage signals from the computer. First to third load modules of the card receive voltage signals from the computer via the PCI interface to simulating first to third power consumption of the computer.01-13-2011
20130120002TRANSMISSION LINE FOR DIELECTRIC MEASUREMENT AND DIELECTRIC MEASURING DEVICE HAVING THE TRANSMISSION LINE - A transmission line substrate includes at least an insulating layer of a predetermined thickness, a pair of conductor layers arranged in a state of being opposed to each other such that the insulating layer is interposed between the conductor layers, the pair of conductor layers functioning as a high-frequency transmission line, and a fault part formed so as to make the conductor layer on one side disconnected, into which a sample to be measured can be introduced.05-16-2013
20100271046IMPLEMENTING AT-SPEED WAFER FINAL TEST (WFT) WITH COMPLETE CHIP COVERAGE - A method, an apparatus and a computer program product are provided for implementing At-Speed Wafer Final Test (WFT) with total integrated circuit chip coverage including high speed off-chip receiver and driver input/output (I/O) circuits. An integrated circuit (IC) chip includes off-chip Controlled Collapse Chip Connection (C4) nodes and a driver and a receiver of the off-chip receiver and driver input/output (I/O) circuits connected to respective off-chip C4 nodes. Through Silicon Vias (TSVs) are added to the connections of the driver and the receiver and the respective off-chip C4 nodes to a backside of the IC chip. A metal wire is added to the IC chip backside connecting the TSVs and creating a connection path between the driver and the receiver that is used for the at-speed WFT testing of the I/O circuits.10-28-2010
20090128163SIMULATED BATTERY LOGIC TESTING DEVICE - A simulated battery test device and method that is capable of testing a battery charging circuit and logic circuit to determine proper operation. An operational amplifier is used that can both source and sink current to simulate the operation of the battery. A battery low signal can be generated using the simulated battery test device to test a battery charging circuit and logic circuit in a battery low condition. In addition, a battery open signal can be generated to test the battery charging and logic circuit in a battery open condition. Charging currents are detected to determine if currents fall within an acceptable range.05-21-2009
20090184720ATTACHMENT APPARATUS, TEST HEAD, AND ELECTRONIC DEVICE TEST SYSTEM - An apparatus comprises: an engagement shaft able to engage with a bottom surface of a DSA and held linear-movably; an air cylinder supplying a drive force for linearly moving the engagement shaft; and a link mechanism interposed between the air cylinder and the engagement shaft and transmitting the drive force input from the actuator to the engagement shaft, and the link mechanism transmits the drive force input from the air cylinder by rotary motion.07-23-2009
20090051368LOAD TESTING CIRCUIT - A load testing circuit a circuit tests the load impedance of a load connected to an amplifier. The load impedance includes a first terminal and a second terminal, the load testing circuit comprising a signal generator providing a test signal of a defined bandwidth to the first terminal of the load impedance, an energy-storing element being connected to the second terminal of the load impedance and providing an output signal, and a measuring unit that measures the output signal or compares the output signal with a reference.02-26-2009
20090085579ATTENUATION APPARATUS AND TEST APPARATUS - There is provided an attenuation apparatus for attenuating a signal received via a first terminal thereof and outputting the attenuated signal via a second terminal thereof. The attenuation apparatus includes a first transmission path and a second transmission path which respectively have different attenuation amounts for the signal, a connection switching section that switches, between the first and second transmission paths, a transmission path connected to the first and second terminals so as to be positioned therebetween, and a first ground connection switching section that connects, to a reference potential, respective ends of the first transmission path and a contact point positioned on a path between the respective ends of the first transmission path, when the second transmission path is electrically connected to the first and second terminals so as to be positioned therebetween.04-02-2009
20090085580Apparatus for testing catalysis electrode of fuel cell - An apparatus is disclosed for testing a catalysis electrode of a fuel cell. The apparatus includes a driving module, a loading module, a containing module and an analyzing unit. The containing module includes a hollow threaded bolt, a sleeve and a contact plate. The hollow threaded bolt is operatively connected to driving module. The sleeve receives and is operatively connected to the hollow threaded bolt. The contact plate is located below the hollow threaded bolt in the sleeve. The analyzing unit includes a working electrode, an auxiliary electrode and a reference electrode. The working electrode is connected to the contact plate. The auxiliary electrode includes an end located below the containing module in the loading module. The reference electrode is connected to the loading module.04-02-2009
20090201029Electronic component device testing apparatus - An electronic component device testing apparatus includes first contacts arrayed so that first ends of the first contacts positionally correspond to electrode pads arrayed on a surface of an electronic component device; base electrodes in contact with second ends of the first contacts; and one or more second contacts each being in contact with one of the first contacts at a position which is between the first end and the second end of the one of the first contacts and closer to the first end of the one of the first contacts.08-13-2009
20090195257Method and device for monitoring a first voltage value - A method for monitoring a first voltage value of a signal voltage that resides within a signal voltage range, is outputtable by an electronic component, and is recordable by a measuring device having an input voltage range that is smaller than the signal voltage range, a voltage divider transforming the signal voltage range into the input voltage range, a first voltage value being initially measured by the measuring device, a component having an electrical resistance being at least partially connected in parallel to the voltage divider; a second voltage value being subsequently measured by the measuring device, and the result of the monitoring being derived from the comparison of the first and second voltage values. In addition, a device having a voltage divider, switch means and a component having an electrical resistance, the component having an electrical resistance being connectable at least partially in parallel via the switch to the voltage divider.08-06-2009
20090001995Circuit for detecting connection failure between printed circuit boards - A connection failure detection circuit that detects incomplete connection between printed circuit boards. A supervisory signal source is mounted on a first printed circuit board to produce a supervisory signal. A supervisory signal receiver is mounted on the first or second printed circuit board to receive the produced supervisory signal and determine whether the received supervisory signal carries expected logical values. Wiring lines are arranged so as to form a signal path that crosses connectors between the first and second printed circuit boards at at least one point.01-01-2009
20090167318VOLTAGE VARIANCE TESTER - An exemplary voltage variance tester includes a first to a third testing circuits each comprising an adjustable power source and an electrical switch; a first to a third signal generators providing a first to a third signals respectively; a connector having a first to a third terminals connected to the first to the third testing circuits respectively for receiving the adjustable power sources, a fourth to a sixth terminals connected to the first to the third signal generators for receiving the first to the third signals, and a seventh terminal; and a control circuit connected to the seventh terminal of the connector for receiving a power on signal to turn on the first to third electrical switch, wherein, voltage variances of the motherboard are tested by adjusting the first to the third adjustable power sources.07-02-2009
20090230978SWITCH CIRCUIT, FILTER CIRCUIT AND TEST APPARATUS - There is provided a switch circuit for switching whether to output an input signal, including: a transmission path that transmits the input signal from an input end to an output end of the switch circuit; a first semiconductor switch that is provided on the transmission path and switches whether to transmit the input signal; a second semiconductor switch that is opened when the first semiconductor switch is short-circuited, and that is short-circuited when the first semiconductor switch is opened, thereby grounding, to a ground potential, a high-frequency signal leaked to the transmission path between the first semiconductor switch and the output end; and a voltage controller that causes a potential difference on both ends of the second semiconductor switch when the second semiconductor switch is opened.09-17-2009
20100033192METHOD FOR TESTING THE FUNCTIONALITY OF A FIELD DEVICE FOR AN INDUSTRIAL PROCESS AND FIELD DEVICE FOR AN INDUSTRIAL PROCESS - In a method for testing functionality of a field device or a field device for sending a control signal to a final controlling device of an industrial processing plant, the final controlling device is operated by a secondary power. With the method, a current/secondary power converter is provided for generating a predetermined secondary power safety control signal to bring the final controlling device into a predetermined safe position. An electronic safety circuit is provided connected to the current/secondary power converter which, depending on an electrical control signal received by the field device, is switched from a passive state into an active state in which the electronic safety circuit causes the current/secondary power converter to output the secondary output power safety control signal. The safety circuit automatically adopts the active state if the electrical control signal falls below or exceeds at least one of a current and a voltage threshold value specific to the safety circuit. At least one of an input current and an input voltage of the electrical control signal is modified in a manner specific to the field device such that a test signal specific to the safety circuit is generated and transmitted to the safety circuit in order to test its functionality.02-11-2010
20090128162CALIBRATING AUTOMATIC TEST EQUIPMENT - A method for use with automatic test equipment (ATE) includes programming the ATE to generate bursts, each of which corresponds to a signal characteristic produced by the ATE, obtaining power levels for the bursts, and determining if the power levels for the bursts correspond to expected power levels for signal characteristics corresponding to the bursts.05-21-2009
20100182013PROBING APPARATUS WITH TEMPERATURE-ADJUSTING MODULES FOR TESTING SEMICONDUCTOR DEVICES - A probing apparatus for testing semiconductor devices comprises an upper guiding plate having a plurality of upper guiding holes, a bottom guiding plate having a plurality of bottom guiding holes, a plurality of vertical probes disposed between the upper guiding holes of the upper guiding plate and the bottom guiding holes of the bottom guiding plate, and a temperature-adjusting module including at least one flow line configured to direct a fluid into a space between the upper guiding plate and the bottom guiding plate.07-22-2010
20100194404POWER SOURCE STABILIZATION CIRCUIT, ELECTRONIC DEVICE AND TESTING APPARATUS - A power source stabilization circuit provided within a chip of an electronic device is provided. The power source stabilization circuit stabilizes a power source voltage supplied to an operational circuit of the electronic device. The power source stabilization circuit includes an amplifier that detects a fluctuation component in the power source voltage occurring in a main power source wiring used to supply the power source voltage to the operational circuit, amplifies the detected fluctuation component, and outputs the amplified fluctuation component, and a stabilization capacitor that is provided between an output end of the amplifier and the main power source wiring and supplies to the main power source wiring a current to reduce fluctuation in the power source voltage occurring in the main power source wiring, in accordance with the output from the amplifier.08-05-2010
20100013496Branch circuit black box - A branch circuit black box for use in a building electrical system having service entrance, current protection switches (circuit breakers or fuses), and a power distribution system includes a plurality of sensors positioned adjacent to the distribution wires, wherein the sensor data is collected, analyzed and stored by a robust non volatile memory for the purpose of recovering state and operational characteristics of branch circuits after the incident has occurred in a building.01-21-2010
20110109321TEST APPARATUS AND ELECTRICAL DEVICE - Provided is a test apparatus that tests a device under test, comprising a digital signal generator that outputs in parallel one or more n-bit digital test signals, where n is an integer greater than or equal to 1; a plurality of driver circuits that are connected respectively to a plurality of digital terminals of the device under test; and an analog signal generator that generates an analog test signal by converting, into an analog signal, an n×m-bit digital multi-bit signal based on the one or more digital test signals output by the digital signal generator to the plurality of driver circuits, where m is an integer greater than or equal to 2.05-12-2011
20100207641System and Method for Evaluating the Electromagnetic Compatibility of Integrated Circuits in an In-Situ Environment - A device is configured to evaluate electromagnetic characteristics of an integrated circuit. The device includes a fluid chamber, a first impeller, a second impeller, and a radio frequency measurement antenna. The fluid chamber is configured to receive the integrated circuit and to cool the integrated circuit. The first impeller is disposed within the fluid chamber and configured to distribute a first electromagnetic field produced by the integrated circuit within the fluid chamber along a first axis. The second impeller is within the fluid chamber and configured to distribute the first electromagnetic field produced by the integrated circuit within the fluid chamber along a second axis. The radio frequency measurement antenna is disposed proximate the fluid chamber and configured to measure an electric field and a magnetic field of the first electromagnetic field.08-19-2010
20100079151AUTOMATIC TEST EQUIPMENT SELF TEST - A self test adapter (STA) for automatic test equipment (ATE) is provided. The STA includes an enclosure. A backplane is housed by the enclosure. A dual data bus is integrated into the backplane. At least one STA card module is inserted into the backplane. The at least one STA card module has a port for interconnection with an ATE station receiver. The at least one STA card module includes a generic region adapted for interfacing with an additional STA card module over the dual data bus, and a resource specific region adapted for self test of at least one ATE station resource.04-01-2010
20080315894Testing Adapter - The invention relates to a testing adapter suitable for testing a wireless telecommunication device. The testing adapter comprises a first contact member and a second contact member, the first contact member and the second contact member having at least one degree of freedom relative to each other and arranged to provide an attachable and detachable mechanical coupling with a surface of a component recess of the wireless telecommunication device on the basis of the at least one degree of freedom.12-25-2008
20090256577Delay Lock Loop Circuit, Timing Generator, Semiconductor Test Device, Semiconductor Integrated Circuit, and Delay Amount Calibration Method - A method replaces a delay amount measurement in which an initially set value of a counter is determined by a technique which replaces measurement of a delay amount, whereby a time required for calibration of a delay circuit can be reduced. One counter set value of a plurality of counter set values is loaded, a delay lock loop circuit is switched to a lock mode, and a sequence circuit of a cycle slip detection circuit is reset. Thereafter, a cycle slip detection signal output from the sequence circuit is read, and on the basis of this cycle slip detection signal, it is judged whether or not an output signal of a delay circuit causes cycle slip. If the cycle slip is caused, the counter set value is switched. On the other hand, if any cycle slip is not caused, the counter set value is locked, thereby terminating the process.10-15-2009
20090108851TEST BOARD FOR TESTING PCBS - A test board for testing PCBs includes a plurality of signal input terminals, a plurality of signal output terminals connected to the signal input terminals respectively, a standby signal output terminal, and a plurality of switches. The standby signal output terminal is connected to the signal input terminals via the switches respectively.04-30-2009
20110018552COUPON BOARD AND MANUFACTURING METHOD OF PRINTED BOARD - A coupon board is cut out together with a printed wiring board from a sheet material in which a solder resist film is formed on a surface of a glass cloth fiber. The coupon board is for evaluating characteristics of the printed wiring board. The coupon board includes a region on which the solder resist film is not formed, and which extends parallel with one side of the printed wiring board.01-27-2011
20110109322Testing System and Adapter Thereof Utilizing a Common Power Supply and Display Device to Test Different Main Board Circuits - A testing system utilizing a common power supply and a display device to test different types of a main board circuit is disclosed. The testing system includes a power supply device for outputting a predetermined power; a liquid crystal display for receiving a control signal from the main board circuit to perform a testing procedure; and an adapter. The adapter includes a first circuit coupled electrically between the power supply device and the main board circuit for converting the predetermined power into a power needed by the main board circuit, and a second circuit coupled electrically between the main board circuit and the liquid crystal display for converting a control signal generated by the main board circuit into a signal format required to perform the testing procedure on the liquid crystal display.05-12-2011
20110025344HOLDING MEMBER FOR USE IN TEST AND METHOD FOR MANUFACTURING SAME - A holding member for use in a test includes a base made of silicon or glass and chips in which devices are formed is mountable thereon. Positioning members made of resist sheets are formed on the top surface of the base. A resist film is formed on the bottom surface of the base, and suction grooves (intersection portions, connection portions) and support members are formed in the resist film. Suction holes are formed in regions of the top surface of the base where the chips are mounted, wherein the suction holes are formed through the base and communicate with the suction groove.02-03-2011
20100171512Self-Testing, Monitoring and Diagnostics in Grouped Circuitry Modules - An electrical test system for providing a power source to each of a plurality of electrical components under electrical test includes a grouped circuitry module. The grouped circuitry module includes a plurality of individually-programmable power sources, each coupled to an output channel, a controller configured to program each of the power sources to a respective stimulus output value and to read a measured value at each corresponding output channel and random access, non-volatile, memory for storing information and for providing read/write capability for the controller. A host computer is in communication with the controller for running a self test program that sequentially programs each of the power sources to its respective stimulus output value and reads the measured value at each corresponding output channel using the controller to determine if the tested complete subsystem is operating properly.07-08-2010
20100164510LIQUID TIM DISPENSE AND REMOVAL METHOD AND ASSEMBLY - In some embodiments, a liquid TIM dispense and removal method and assembly is presented. In this regard, a method is introduced including loading an absorbent material of a thermal control unit with a liquid thermal interface material (TIM), pressing the absorbent material against an integrated circuit device causing the liquid TIM to be released, testing the integrated circuit device, and removing the absorbent material from against the integrated circuit device causing the liquid TIM to be reabsorbed. Other embodiments are also disclosed and claimed.07-01-2010
20090096465TEST EQUIPMENT - A test apparatus for a DUT having a bidirectional differential interface is provided.04-16-2009
20090219035METHOD AND SYSTEM FOR IMPROVED TESTING OF TRANSISTOR ARRAYS - An electronic test system to evaluate the pixel and array properties of active-matrix displays that use charge or current sensitive circuits attached to the array data lines is described. Leakage-current, charging time, and other metrics can be measured for all pixels in the array without electrical or optical connection to the interior of the array. In accordance with the presently described embodiments, charge or current sensitive amplifiers and selected voltage drivers may be used in conjunction with variable timing and voltages to determine individual transistor properties over an entire array in just a few seconds. Signals to be measured may be injected in several ways: first, a capacitive elastomer laminate (or plate) may be applied to the surface of the array, making a capacitance with the pixel pad; second, gate lines may be used to inject charge into pixels that connect to more than one gate line; third, digital or analog drivers connected to the data lines may be used to charge the pixel to varying states; fourth, the dc-bias level of the charge or current sensitive readout electronics may be shifted relative to the gate voltages to charge the pixel. Connection in the system between components is achieved through flex connectors or other appropriate means. Ultimately, an output signal for each pixel is measured. Thus, based on the output signal, the charging time or current, the leakage time or current, and other pixel or transistor parameters may be characterized for the entire array.09-03-2009
20100033191INSPECTION JIG FOR DISPLAY PANEL, INSPECTION SYSTEM USING THE SAME, AND METHOD FOR INSPECTING THE DISPLAY PANEL USING THE SAME - An inspection jig for a display panel, used in an inspection system for the display panel and in a method for inspecting the display panel, includes a plate, a ground plate and at least one side holder. The ground plate is disposed on the plate and receives the display panel. The at least one side holder is disposed at a side surface of the plate to control the angle of the plate.02-11-2010
20100013495TESTING CARD FOR PERIPHERAL COMPONENT INTERCONNECT INTERFACES - A testing card for peripheral component interconnection (PCI) interface includes a body, a plurality of PCI pins, a PCI interface chip, and a plurality of PCI testing pins. The PCI pins are mounted to the body. The PCI interface chip is mounted to the body and connected to the PCI pins. The PCI testing pins are mounted to the body and electrically connected to the pins of the PCI interface chip. When the PCI pins are connected to a PCI slot of a motherboard, the PCI interface chip is configured to communicate with the motherboard.01-21-2010
20090033338SYSTEMS AND METHODS FOR FACILITATING USE OF A UNIVERSAL TEST CONNECTION FOR A PLURALITY OF DIFFERENT DEVICES - A module is used for interfacing between a particular device to be tested (DUT) and a test station having a universal set of connections. The module is adapted for bridging both the physical and electrical differences between connection points available on the DUT and the universal test connections. The module contains information (personality data) unique to the particular DUT and is designed to mount in a tray in which the DUT is positioned. The personality module resides partially within an environmentally controlled area and an area outside of the environmentally controlled area and is adapted to seal the environmentally controlled area so as to maintain testing integrity therein. In one embodiment, the connections between the module and the test station occur outside of the environmentally controlled area.02-05-2009
20110163760TEST CIRCUIT AND SYSTEM - A test circuit and system for testing one or more electrical properties of an electronic circuit or other device under test (DUT) by applying and monitoring test signals to the DUT is disclosed. The test circuit can utilize a plurality of universal interface channel circuits in a single automated test system to provide a unique and flexible approach for testing electronic circuits or devices that has many advantages. A single data acquisition circuit can coupled to one or more universal interface channel circuits. Each of the universal interface channel circuits can be independently commanded by the data acquisition circuit to provide one of a variety of test signals to a DUT as desired.07-07-2011
20110133754TEST ARRANGEMENT FOR IMPULSE VOLTAGE TESTING OF ELECTRICAL HIGH-VOLTAGE COMPONENTS - Exemplary embodiments are directed to a test arrangement for testing surge voltage in electrical high voltage components with a surge voltage generator and a voltage distributor. The surge voltage generator and voltage distributor have a tower-like structure with a first and a second structure end. A rectangular container is connected to the first and second structure and includes a first and a second container end. At least one of the surge voltage generator and the voltage distributor are movable between a first substantially horizontal position inside the container and a substantially vertical position relative to the container. Each movement between the two positions involves a pivot motion about a rotational axis perpendicular to the longitudinal direction of the surge voltage generator.06-09-2011
20100001739TEST TRAY FOR TEST HANDLER - A test tray for a test handler is disclosed that is loaded with semiconductor devices and then carries them along a predetermined circulation route. The test tray allows one fixing unit to fix a plurality of adjacent insert modules to the receiving spaces of the frame, thereby efficiently using the space of the frame and allowing a relatively large number of insert modules to be installed in the same area, in comparison to the conventional test tray.01-07-2010
20100060294Timing generator and semiconductor test apparatus - A variable delay circuit has a simple configuration for being incorporated in a timing generator to control a delay time in real time and assure a timing margin. The variable delay circuit of the timing generator includes a delay circuit having a plurality of cascaded clock buffers; a plurality of cascaded data buffers; and data holding circuits for outputting data to the data buffers in accordance with the clock from the delay circuit. The delay amount added to the data by the data buffers is made identical to the delay amount added to the clock by the clock buffers.03-11-2010
20080218177CONTACT INSERT FOR A MICROCIRCUIT TEST SOCKET - A system for testing a microcircuit having a center ground (CG) terminal has an insert for electrically connecting the CG terminal to a ground contact on a load board. The insert is held within a housing by compression and frictional interaction between a resilient projection carried by the insert and a slot in a wall of an aperture holding the insert.09-11-2008
20110133753ELECTRONIC DEVICE AND METHOD FOR TESTING A CIRCUIT BOARD - An electronic device, and associated method, provided with a circuit board (06-09-2011
20110187386METHOD OF DETECTING MEM DEVICE FAULTS WITH SINGLE CURRENT PULSE - A method of detecting a fault within a micro electro-mechanical device is provided. The micro electro-mechanical device has a support structure and an actuating arm that is movable relative to the support structure because of thermal expansion of at least part of the actuating arm caused by heat inducing current flow through at least that part. The method comprises the steps of passing a first current pulse having a predetermined duration t08-04-2011
20110148433HIGH-VOLTAGE TRANSFORMER - A high-voltage transformer for providing an alternating voltage in the kV range, comprising at least one secondary winding wound on a coil carrying body surrounding a transformer core, and an insulation housing encapsulating the secondary winding is provided to electrically insulate the secondary winding. Said insulation housing is walled by the coil carrying body carrying the secondary winding and by an enveloping body made of plastic and enveloping the secondary winding so that an annular gap is formed, wherein the annular gap between the secondary winding and the enveloping body is filled with an insulating fluid. The annular gap has a gap width of less than or equal to 20 mm viewed in the cross-section, and the enveloping body has a wall thickness of less than or equal to 20 mm, wherein the plastic is polypropylene, and a separate expansion volume is not provided for the insulating fluid.06-23-2011
20100039120Hardware in the loop motor simulation - A simulator system is connected to simulate the connection of a mechanically loaded motor to a motor controller/driver. The simulator system includes a current transformer circuit for monitoring AC output currents provided by the motor controller/driver. A simulation controller calculates, based on the monitored AC output currents, dynamic load voltages that simulate the response that would be generated by a mechanically loaded motor based on the AC output currents provided by the motor controller/driver. A number of power supplies amplify the dynamic loading calculated by the simulation controller to generate a dynamic loading that opposes the AC output currents provided by the motor controller/driver.02-18-2010
20100026314SYSTEM AND METHOD FOR ON-CHIP JITTER INJECTION - High Speed I/O interfaces (02-04-2010
20090289636ELECTRICAL OVERSTRESS AND TRANSIENT LATCH-UP PULSE GENERATION SYSTEM, CIRCUIT, AND METHOD - A circuit arrangement, system, and method to test a device with a plurality of pins for electric overstress and transient induced latch-up characteristics. The circuit arrangement includes an inverting operational amplifier with a unity gain to receive a triggering signal and supply an inverted signal to a power amplifier. The power amplifier transforms the inverted signal into a test signal, which is received by a ratio circuit. The test signal is further operable to test the electric overstress and transient induced latch-up characteristics of the device. The ratio circuit transforms the test signal into a ratio signal. The ratio signal has a voltage magnitude that corresponds to the current magnitude of the test signal. The test signal and ratio signal are measured to determine if, during testing, the device or a component of the device has failed.11-26-2009
20120306511PARTIAL DISCHARGE EXPERIMENT POWER SUPPLY SYSTEM FOR EXTRA-HIGH VOLTAGE TRANSFORMER AND METHOD THEREOF - A partial discharge test power supply system for an extra high voltage transformer comprises: an electric motor (12-06-2012
20110304344Support Structure For Installation Of A Component Assembly Housed In A Rotating, Translating Carriage Chassis - A support structure for installation of a component assembly housed in a rotating, translating carriage chassis, the support structure including: a stationary rail that includes a shaft extruding perpendicular to the stationary rail; a rotating rail adapted to receive a carriage chassis rail, the rotating rail parallel to the stationary rail when the rotating rail is in a non-rotated position, the rotating rail including a shaft receptacle that receives the shaft, the rotating rail configured to rotate about the shaft and relative to the stationary rail; and a translation mechanism attached to the rotating rail, the translation mechanism enabling the carriage chassis rail to translate parallel to and along the rotating rail.12-15-2011
20100097075TEST HANDLER FOR ELECTRONIC DEVICES - A test handler comprises a package support for holding an electronic device in a certain orientation and for transporting the electronic device to a testing station for testing the electronic device. An orientation correction device is actuable and operative to engage the package support and to rotate the package support so as to change the orientation of the electronic device.04-22-2010
20100097074CONTINUOUS SERIES ARC GENERATOR - An arc fault demonstrator device for testing the efficacy of an arc fault interrupter (AFI) circuit breaker. The device includes a motor that moves a movable electrode relative to a stationary electrode under microprocessor control. A relay switches the electrodes connection between an arc voltage measurement circuit and an electrode close circuit. When current is applied to the electrodes, the measurement circuit provides voltage measurements to the microprocessor, which instructs the motor to move the electrodes closer or apart. When the arc voltage is below a low threshold, the electrodes are moved apart until the arc voltage exceeds a medium threshold. When the arc voltage exceeds a high threshold, the electrodes are moved closer until the arc voltage falls below the medium threshold. A switch switches between the AFI circuit breaker or a conventional circuit breaker to confirm that the AFI breaker will trip upon detection of the arc whereas the conventional breaker will not.04-22-2010
20100244854SEMICONDUCTOR DEVICE AND INTERFACE BOARD FOR TESTING THE SAME - A semiconductor device includes a common probing pad; an internal voltage generation unit having a plurality of internal voltage generation blocks configured to generate a plurality of internal voltages; and a probing voltage selection unit configured to transfer an internal voltage selected from the internal voltages to the common probing pad in response to a plurality of voltage selection signals.09-30-2010
20120126823UNIVERSAL MATE-IN CABLE INTERFACE SYSTEM - The present document describes an assembly for connecting a test unit to a wiring harness or equipment to be tested, and a method for testing using the assembly. The assembly may comprise a test box unit, a generic mate-in interface, and at least one specific mate-in interface. The generic mate-in interface is for connection to the test box unit on one end, and to the at least one specific mate-in interfaces at the other end. The mate-in interfaces are for testing different existing wiring harnesses or equipment. Each one of the generic and specific mate-in interfaces has a specific ID. Information relating to the IDs of the connectors and the contact configuration of each mate-in interface is stored in a database of the test unit for identifying the appropriate test contacts that should be used for testing.05-24-2012
20120212236TESTING DEVICE FOR COMPUTER CONNECTOR - A testing device is used to test the life of a connector of an electronic device. An external connector is plugged into the connector. The testing device includes a base, a fixing assembly for fixing the electronic device on the base, a driver, a pressing head driven by the driver and an adjusting assembly. The adjusting assembly is configured to adjust the position of the driver and the pressing head to align the pressing head with the external connector.08-23-2012
20120176143SAMPLING APPARATUS AND TEST APPARATUS - A sampling apparatus that converts an analog target signal in which the same waveform repeats into a digital value by sampling the target signal at each of a plurality of phases, and outputs the digital value. The sampling apparatus comprises a designating section that sequentially designates bits in the digital value as target bits, beginning with the most significant bits; a generating section that, for each designated target bit, generates a threshold value for determining a value of the target bit based on a determined value of a bit that is higher-order than the target bit in the digital value at each of the phases; and a converting section that, for each designated target bit, determines the value of the target bit in the digital value at each phase by comparing the target signal to an analog comparison signal corresponding to the threshold value at each phase.07-12-2012
20120176142TEST CIRCUIT FOR RESISTOR CAPACITOR CIRCUITS - An RC test circuit includes an RC circuit, a digital rheostat, a control chip, and an oscillograph. The RC circuit includes a plurality of positive terminals and a plurality of negative terminals. The digital rheostat includes a plurality of rheostats each including a sliding terminal and a fixed terminal. The sliding terminals are correspondingly connected to the positive terminals while the fixed terminals are correspondingly connected to the negative terminals. The control chip is connected to the digital rheostat, and configured for controlling the digital rheostat to change the resistance of each rheostat. The oscillograph is connected to the RC circuit for displaying a waveform of the RC circuit.07-12-2012
20080284450Arc wave generator for testing an arc-fault circuit interrupter - Provided is an arc wave generator for testing an arc fault circuit interrupter (AFCI) for use in a test system for testing whether or not an arc fault circuit interrupter (AFCI) is operating normally, in which a false arc is generated for use in testing the arc fault circuit interrupter (AFCI). The arc wave generator includes a rectifier which receives a commercial power source as an input source and rectifies alternating-current voltage of the commercial power source to generate a rectified signal. A drop resistor drops the voltage of the rectified signal to generate a voltage-dropped signal. A mono-stable multivibrator adjusts a voltage level and a pulse width of the voltage-dropped signal and generates a pulse signal which is used to generate a false arc for testing the arc fault circuit interrupter (AFCI). Thus, a false arc is generated with a simple circuit to accurately test the actions of the arc fault circuit interrupter (AFCI).11-20-2008
20120326727COMPOUND TEST METHOD OF HIGH VOLTAGE DIRECT CURRENT TRANSMISSION CONVERTER VALVE - The present provided a compound test method of high voltage direct current transmission converter valve. The invention method adopted two independent high voltage sources to supply forward and reverse high voltage in blocking interval. It causes that the test voltage of the test valve is more close to that of the real operation. The experiment equivalence is better. Moreover, by controlling the scheduling of two high voltage sources, it can produce more waveforms, can choose different combination according to program requirements and design character; this method has large choice room and flexibility.12-27-2012
20100148797ESD DETECTION CIRCUIT AND RELATED METHOD THEREOF - An electro-static discharge (ESD) detection circuit is provided. The ESD detection circuit includes: a first power pad for receiving a first supply voltage; a second power pad for receiving a second supply voltage; an RC circuit having an impedance component coupled between the first power pad and a first terminal and having an capacitive component coupled between the first terminal and a second terminal, wherein the second terminal is not directly connected to the second supply voltage; a trigger circuit couples to the first power pad, the second power pad, and the RC circuit, for generating an ESD trigger signal according to a voltage level at the first terminal and a voltage level at the second terminal, and a bias circuit coupled between the first power pad and the second power pad for providing a bias voltage to the second terminal.06-17-2010
20110133752ELECTRONIC DEVICE AND METHOD FOR TESTING A CIRCUIT BOARD - An electronic device, and associated method, provided with a circuit board (06-09-2011
20110273186CIRCUIT FOR CONTROLLING TEMPERATURE AND ENABLING TESTING OF A SEMICONDUCTOR CHIP - A circuit for controlling temperature of a semiconductor chip includes a first heating element that is built into the semiconductor chip. The first heating element generates heat to increase the temperature of the semiconductor chip. The chip also includes a temperature controller that is coupled to the first heating element and built into the semiconductor chip. The temperature controller controls the temperature to enable testing of the semiconductor chip at a desired temperature.11-10-2011
20130113498TEST DEVICE WITH UNINTERRUPTIBLE POWER SUPPLY - A test device with uninterruptible power supply supplies external power to a product under test (PUT) and performing electric power tests thereon. The PUT has a processing unit, a power input end, a battery connection end, and a charging and discharging circuit. The device includes a first test port, a second test port, and a power-storing unit. The PUT is electrically connected to the first and second test ports to receive the external power through the first test port and be switchable to the second test port to selectively receive power from the power-storing unit, thereby preventing interruption of operation of the PUT. A charging voltage from the charging and discharging circuit is applied to the power-storing unit via the second test port to charge the power-storing unit. An operation-required power level of the PUT can be maintained, even if the test device receives no power.05-09-2013
20080197857MULTI-MEA TEST STATION AND MULTI-MEA TEST METHOD USING THE SAME - Disclosed is a multi-MEA test station capable of simultaneously testing and activating a plurality of MEAs and a multi-MEA test method using the same. The multi-MEA test station includes a chamber capable of receiving a plurality of MEAs; a first multi cell body including a first channel for supplying an oxidant to a cathode electrode of the MEA, and a second multi cell body including a second channel for supplying fuel to an anode electrode of the MEA; a pressing means closely adhering the first multi cell body, the second multi cell body and the MEA positioned therebetween by applying force in a direction that the first multi cell body and the second multi cell body are opposed to each other; a reactant supply means for supplying the oxidant to the first channel and supplying the fuel to the second channel; and a multi-loader controlling the environment of a test and activation on the plurality of MEAs and performing the test and the activation.08-21-2008
20100283480TEST APPARATUS, TEST METHOD, AND DEVICE - Provided is a test apparatus that tests a device under test, wherein the device under test includes an internal circuit that generates a plurality of internal clocks having different phases based on a reference clock provided thereto, selects from among the internal clocks an internal clock having a predetermined relative phase with respect to an input signal having a frequency substantially equal to that of the internal clocks, and samples the input signal according to the selected internal clock. The test apparatus comprises a selection control section that fixes the internal clock selected by the internal circuit; a phase control section that, with the selection of the internal clock being fixed by the selection control section, sequentially shifts the phase of the internal clock by inputting the reference clock to the device under test while sequentially shifting the phase of the reference clock outside of the device under test; and a measuring section that measures a characteristic of at least one of the input signal and the internal circuit, based on the sampling result of the internal circuit.11-11-2010
20120013348TEST FIXTURE FOR TESTING SEMICONDUCTOR DIE WITH ITS LOADING MEMBER MAINTAINED FLAT THROUGHOUT THE TEST - A test fixture for testing a semiconductor die with its loading member maintained flat throughout the test is disclosed. The test fixture includes a loading member and a frame. The loading member includes a base film having a melting point higher than a thermal equilibrium temperature thereof, wherein the thermal equilibrium temperature is achieved due to heat transfer from the semiconductor die under test to the base film via the adhesive layer. The loading member further includes an adhesive layer made of electrically conductive adhesive material. The loading member is adapted for securing diced LED dies in position and maintained flat throughout the die testing process, thereby ensuring the accuracy of testing for optical and electrical properties of the dies.01-19-2012

Patent applications in class Instruments and devices for fault testing

Patent applications in all subclasses Instruments and devices for fault testing