Class / Patent application number | Description | Number of patent applications / Date published |
324756000 | Contact confirmation | 12 |
20080231298 | INSPECTION APPARATUS AND METHOD - An inspection apparatus for inspecting electrical characteristics of an inspection target object includes a movable mounting table for mounting the inspection target object thereon, a probe card disposed above the mounting table, and one or more displacement sensors, provided at one or more location of the mounting table, each of the sensors measuring a distance between the mounting table and the probe card or a vicinity thereof. The inspection target object is brought into electrical contact with the probe card by overdriving the mounting table. | 09-25-2008 |
20080238459 | Testing apparatus and method - A testing apparatus includes a circuit board and a first probe. The circuit board has a first testing point and a second testing point. The first testing point is electrically connected to an integrated circuit, and the second testing point is electrically connected to the first testing point. The first probe is used for electrically contacting with the first testing point and transmitting a signal to the integrated circuit through the first testing point. The second testing point is used for detecting if the first probe electrically contacts with the first measuring point. A testing method is also disclosed herein. | 10-02-2008 |
20090134894 | INSPECTION APPARATUS - An inspection apparatus includes a movable mounting table for mounting thereon a target object, a probe card disposed above the mounting table and a control unit for controlling the mounting table. The target object is inspected by bringing a plurality of electrode pads of the target object mounted on the mounting table into contact with a plurality of probes of the probe card with a predetermined contact load by overdriving the mounting table. Further, the mounting table includes a mounting body whose temperature is controllable, a support body for supporting the mounting body, an elevation driving mechanism provided in the support body and pressure sensors provided between the mounting body and the support body to thereby detect the contact load. The control unit controls the elevation driving mechanism in accordance with detection signals from the pressure sensors. | 05-28-2009 |
20090189626 | APPARATUS AND METHOD FOR DETECTING ELECTRONIC DEVICE TESTING SOCKET - An apparatus for detecting an electronic device testing socket including a testing base, a detecting circuit board, a depth gauge, and a conductive pressing block is provided. The detecting circuit board disposed on the testing base has a carrying surface for carrying an electronic device testing socket. The electronic device testing socket includes a plurality of pin units, and each of the pin units includes an S-shaped pin and a pair of elastic rods accommodated within recesses thereof. The depth gauge disposed on the testing base presses against a top surface of the conductive pressing block, and presses with a bottom surface thereof against the electronic device testing socket. The depth gauge is adapted to adjust a distance between the top surface of the conductive pressing block and the carrying surface. The detecting circuit board is electrically connected to the pin units for detecting the status of the pin units. | 07-30-2009 |
20090206859 | PROBE DEVICE HAVING A LIGHT SOURCE THEREON - A probe device is provided that has light source thereon that can be activated and deactivated. In accordance with an embodiment, the light source operates as a visual indicator to provide a visual indication of whether a good connection exists between the tips of the probe device and the intended contact points on the DUT. In accordance with another embodiment, the light source operates as a source of illumination to illuminate the probe tips and the contact pads on the DUT as the user is attempting to place the probe tips in contact with the contact pads on the DUT. In accordance with yet another embodiment, the light source performs the dual functions of providing a visual indication of connection status and of illuminating the probe device tips and the intended contact points on the DUT. | 08-20-2009 |
20090243642 | Electronic Device Testing System and Method - The invention provides a testing system and method suitable for determining whether the pins of the socket are properly connected to a printed circuit board. The testing system includes a testing signal source, a socket, a signal sensing unit, a fixing element, and an analysis unit. The signal sensing unit comprises a sensor board, a probe, and an operation amplifier. The sensor board is electrically coupled to the socket, and the sensor board has a probing point. The probe is selectively contacted with the probing point of the sensor board for receiving and outputting a sensing signal. The operation amplifier is electrically connected to the probe for receiving, amplifying and outputting the sensing signal. The fixing element is used for fixing the sensor board between the socket and the fixing element. | 10-01-2009 |
20090243643 | TESTING SYSTEM MODULE - A testing system module for testing printed circuit board (PCB) includes at least one robot having a pogo pin for moving to a testing point of the PCB; a pressure detecting unit for detecting a current pressure value on the printed circuit board; and a control system for keeping the pogo pin to contact with the PCB with constant pressure. | 10-01-2009 |
20100123475 | RF CHIP TEST METHOD - An RF chip test method is disclosed. The RF chip test method includes disposing an RF chip within a chip socket, with the RF chip having at least one RF pin and at least one non-RF pin, the chip socket having conductive elements, and the conductive elements contacting the RF pin and the non-RF pin; connecting the non-RF pin to a ground end and connecting the RF pin to an RF measuring instrument; measuring a S11 parameter of the RF pin using the RF measuring instrument; and comparing the S11 parameter with an allowable range so as to judge the contact condition between the RF pin and the conductive element. | 05-20-2010 |
20100156448 | FLASH STORAGE DEVICE AND METHOD AND SYSTEM FOR TESTING THE SAME - A flash storage device and a testing method and a testing system for the flash storage device are provided. The testing system includes a testing apparatus and the flash storage device. The flash storage device includes a controller, a flash memory module, a plurality of peripheral pins and at least one test pin. The flash storage device receives an enable signal transmitted from the testing apparatus through the test pin. Subsequently, the controller outputs a signal to the testing apparatus through each peripheral pin based to the enable signal. Finally, the testing apparatus verifies the signal outputted by each peripheral pin. | 06-24-2010 |
20100164523 | SYSTEM FOR TESTING CONNECTIONS OF TWO CONNECTORS - A system for testing connections of two connectors, each of which includes a pair of verification pins and a number of signal pins, includes a verification testing module, a controlling module, a signal testing module, and a reporting module. The verification testing module is configured for detecting whether each pair of verification pins are electrically connected. The controlling module is configured for allowing communication between each pair of signal pins if the pair of verification pins is detected to be electrically connected. The signal testing module is configured for testing whether each pair of signal pins are electrically connected. The reporting module is configured for reporting the results of the verification testing module and the signal testing module. | 07-01-2010 |
20100213961 | Multi-Position Probe Circuit Tester - A circuit tester having a multi-position probe is provided. The circuit tester includes a handle with a detent assembly that allows for positioning the probe at various angles for testing a device. Once a good connection is made with the device under test, an indicator such as a light is lit or a sound is emanated. The probe may be folded into a compartment within the handle once the testing is completed. | 08-26-2010 |
20100277194 | CHIP PIN TEST APPARATUS - A test apparatus includes a printed circuit board, a chip carrier socket, and a display circuit. The chip carrier socket includes a space to receive a chip including a plurality of pins, a plurality of contact terminals, and a grounded ground portion. The display circuit includes a power supply and a plurality of light-emitting elements. When the chip is received in the space, the ground portion contacts a middle portion of each pin. When a pin of the chip is normal, a distal end of the normal pin contacts a corresponding contact terminal to connect a corresponding light-emitting element to the ground portion, causing the light-emitting element to light up. When a pin of the chip is askew, a distal end of the askew pin cannot contact a corresponding contact terminal, the corresponding light-emitting element will not light up. | 11-04-2010 |