Class / Patent application number | Description | Number of patent applications / Date published |
257744000 | For compound semiconductor material | 19 |
20100013097 | SEMICONDUCTOR DEVICE HAVING CONTACT PLUG FORMED IN DOUBLE STRUCTURE BY USING EPITAXIAL STACK AND METAL LAYER AND METHOD FOR FABRICATING THE SAME - Disclosed are a contact plug of a semiconductor device and a method for fabricating the same. The semiconductor device includes: an epitaxial stack formed by inserting a heteroepitaxy layer between a pair of homoepitaxy layers; and a contact plug including a metal layer on the epitaxial stack. Accordingly, in accordance with the present invention, the contact plug is selectively doped in a high concentration, thereby reducing a contact resistance. Furthermore, the present invention also provides an effect of reducing degradation in a device property without decreasing yields of products by minimizing a thermal budget through using a SEG-silicon germanium layer capable of obtaining a high doping concentration and a high deposition speed. | 01-21-2010 |
20110001241 | COMPOUND SEMICONDUCTOR DEVICE AND CONNECTORS - A semiconductor device includes a semiconductor substrate formed from compound semiconductor material and multiple conductive connecting pads. The connecting pads are symmetrically arranged on a first surface of the semiconductor substrate in an interweaving pattern. Each cleavage plane extending across the first surface of the semiconductor substrate intersects a portion of at least one connecting pad of the plurality of connecting pads. | 01-06-2011 |
20130221525 | Semiconductor Package with Integrated Selectively Conductive Film Interposer - There are disclosed herein various implementations of semiconductor packages having a selectively conductive film interposer. In one such implementation, a semiconductor package includes a first active die having a first plurality of electrical connectors on a top surface of the first active die, a selectively conductive film interposer situated over the first active die, and a second active die having a second plurality of electrical connectors on a bottom surface of the second active die. The selectively conductive film interposer may be configured to serve as an interposer and to selectively couple at least one of the first plurality of electrical connectors to at least one of the second plurality of electrical connectors. | 08-29-2013 |
20130234331 | WIRING STRUCTURE, THIN FILM TRANSISTOR ARRAY SUBSTRATE INCLUDING THE SAME, AND DISPLAY DEVICE - In a wiring conversion part which connects a lower conductive film to a first conductive film each functioning as a wiring, a first transparent conductive film is formed into a pattern in which it covers an end surface of the first conductive film, and an angle formed at a corner part in a portion of the first transparent conductive film making contact with a lower first insulating film (outside a width of the first conductive film) is larger than 90 degrees and smaller than 270 degrees or the corner part has an arc shape. A second transparent conductive film is connected to the lower conductive film and the first transparent conductive film, and the first transparent conductive film is connected to the first conductive film, so that the lower conductive film and the first conductive film are electrically connected to each other. | 09-12-2013 |
20140061912 | Patterned Graphene Structures on Silicon Carbide - In a method for making graphitic ribbons in a face of a carbide crystal ( | 03-06-2014 |
20140353826 | Silicidation Blocking Process Using Optically Sensitive HSQ Resist and Organic Planarizing Layer - A silicidation blocking process is provided. In one aspect, a silicidation method is provided. The method includes the following steps. A wafer is provided having a semiconductor layer over an oxide layer. An organic planarizing layer (OPL)-blocking structure is formed on one or more regions of the semiconductor layer which will block the one or more regions of the semiconductor layer from silicidation. At least one silicide metal is deposited on the wafer. The wafer is annealed to react the at least one silicide metal with one or more exposed regions of the semiconductor layer. Unreacted silicide metal is removed. Any remaining portions of the OPL-blocking structure are removed. | 12-04-2014 |
20150048506 | MEMORY DEVICE AND MANUFACTURING METHOD OF THE SAME - A memory device and a manufacturing method of the same are provided. The memory device includes a substrate, a 3D memory array, a periphery circuit, and a conductive connection structure. The 3D memory array and the periphery circuit are stacked on the substrate. The periphery circuit includes a patterned metal layer and a contact structure electrically connected to the patterned metal layer. The conductive connection structure is electrically connected to the patterned metal layer. The 3D memory array is electrically connected to the periphery circuit via the conductive connection structure. | 02-19-2015 |
257745000 | Contact for III-V material | 12 |
20090020876 | HIGH TEMPERATURE PACKAGING FOR SEMICONDUCTOR DEVICES - A method of forming multiple bonds on an electronic device includes heating first bonding metals at a predetermined temperature to form a first bond comprising a first melting temperature above the predetermined temperature. The first bond and second bonding metals are then heated at the predetermined temperature to form a second bond comprising a second melting temperature above the predetermined temperature. | 01-22-2009 |
20090160054 | NITRIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME - A nitride semiconductor device is provided which reduces the contact resistance at the interface between a P-type electrode and a nitride semiconductor layer. A nitride semiconductor device includes a P-type nitride semiconductor layer and a P-type electrode formed on the P-type nitride semiconductor layer. The P-type electrode is formed by successive laminations of a metal layer of a metal having a work function of 5.1 eV or more, a Pd layer of palladium, and a Ta layer of tantalum on the P-type nitride semiconductor layer. | 06-25-2009 |
20090302470 | Electrode for semiconductor chip and semiconductor chip with the electrode - In an n-type semiconductor layer that contains gallium (Ga), contact resistance is to be suppressed at a low level. An n-side electrode is provided on a surface of the n-type semiconductor layer containing Ga. The electrode includes a metal layer having a Ga content of equal to or more than 1 at % and equal to or less than 25 at %. The metal layer is disposed in contact with the n-type semiconductor layer. | 12-10-2009 |
20100025850 | OHMIC ELECTRODE STRUCTURE AND SEMICONDUCTOR ELEMENT - The present invention includes an AuGeNi alloy layer ( | 02-04-2010 |
20100164103 | SEMICONDUCTOR DEVICE - A semiconductor device includes: a semiconductor layer composed of one of GaAs based semiconductor, InP-based semiconductor, and GaN-based semiconductor; a first silicon nitride film that is provided on the semiconductor layer, and of which an end portion is in contact with a surface of the semiconductor layer; a protective film that is composed of one of polyimide and benzocyclobutene, and is provided on the semiconductor layer and the first silicon nitride film, the protective film covering the end portion of the first silicon nitride film; and a first metallic layer that is composed of one of titanium, tantalum and platinum, and is continuously provided from a first portion located between the semiconductor layer and the protective film to a second portion located between the end portion of the first silicon nitride film and the protective film, the first metallic layer being in contact with the surface of the semiconductor layer and a surface of the end portion of the first silicon nitride film. | 07-01-2010 |
20100283153 | Ohmic Contact Having Silver Material - An ohmic contact is fabricated. The ohmic contact has low electric resistivity and high thermal conductivity. The materials for fabricating the ohmic contact include silver. Thus, equipments for fabricating the ohmic contact are compatible to modern generally used equipments. | 11-11-2010 |
20110266674 | Laser Etch Via Formation - The present disclosure provides methods for forming semiconductor devices with laser-etched vias and apparatus including the same. In one embodiment, a method of fabricating a semiconductor device includes providing a substrate having a frontside and a backside, and providing a layer above the frontside of the substrate, the layer having a different composition from the substrate. The method further includes controlling a laser power and a laser pulse number to laser etch an opening through the layer and at least a portion of the frontside of the substrate, filling the opening with a conductive material to form a via, removing a portion of the backside of the substrate to expose the via, and electrically coupling a first element to a second element with the via. A semiconductor device fabricated by such a method is also disclosed. | 11-03-2011 |
20120098132 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME - A semiconductor device with a stable structure having high capacitance by changing the pillar type storage node structure and a method of manufacturing the same are provided. The method includes forming a sacrificial layer on a semiconductor substrate including a storage node contact plug, etching the sacrificial layer to form a region exposing the storage node contact plug, forming a first conductive material within an inner side of the region, burying a second conductive material within the region in which the first conductive material is formed, and removing the sacrificial layer to form a pillar type storage node. | 04-26-2012 |
20120211888 | APPARATUS AND METHODS FOR UNIFORM METAL PLATING - Apparatus and methods for uniform metal plating onto a semiconductor wafer, such as GaAs wafer, are disclosed. One such apparatus can include an anode and a showerhead body. The anode can include an anode post and a showerhead anode plate. The showerhead anode plate can include holes sized to dispense a particular plating solution, such as plating solution that includes gold, onto a wafer. The showerhead body can be coupled to the anode post and the showerhead anode plate. The showerhead body can be configured to create a seal sufficient to substantially prevent a reduction of pressure in the plating solution flowing from the anode post to holes of the showerhead anode plate. | 08-23-2012 |
20120217639 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE - A manufacturing method of a semiconductor device including an electrode having low contact resistivity to a nitride semiconductor is provided. The manufacturing method includes a carbon containing layer forming step of forming a carbon containing layer containing carbon on a nitride semiconductor layer, and a titanium containing layer forming step of forming a titanium containing layer containing titanium on the carbon containing layer. A complete solid solution Ti (C, N) layer of TiN and TiC is formed between the titanium containing layer and the nitride semiconductor layer. As a result, the titanium containing layer comes to be in ohmic contact with the nitride semiconductor layer throughout the border therebetween. | 08-30-2012 |
20130207266 | Copper Interconnect for III-V Compound Semiconductor Devices - The present invention provides a copper interconnect for III-V compound semiconductor devices, which comprises a metal contact layer and a copper-containing metal layer, in which the metal contact layer is formed of a material selected from a group consisting of Ti/Pd/Cu, Ti/NiV/Cu, TiW/TiWN/TiW/Cu, TiW/TiWN/TiW/Au, TiW/Cu, and TiW/Au, and the copper-containing metal layer comprises a copper layer. The copper-containing metal layer further includes a metal protection layer covering on the copper layer to prevent the copper layer from oxidation. The metal protection layer is formed of Ni/Au, Ni/Pd/Au, NiV/Au, or solder. | 08-15-2013 |
20150102490 | SEMICONDUCTOR DEVICE HAVING AN AIRBRIDGE AND METHOD OF FABRICATING THE SAME - A semiconductor device and a method of forming an airbridge extending from a conductive area of the semiconductor device are provided. The semiconductor device includes a device pattern formed on a semiconductor substrate, a seed layer formed on the device pattern, and an airbridge formed on the seed layer, where the airbridge includes a plated conductive material and defines an opening exposing a portion of the device pattern. The semiconductor device further includes an adhesion layer formed on the airbridge layer and extending over at least a portion of sidewalls of the opening defined by the airbridge, and an insulating layer formed on the adhesion layer, where the adhesion layer enhances adhesion of the insulating layer to the plated conductive material of the airbridge. | 04-16-2015 |