| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 257109000 | Having only two terminals and no control electrode (gate), e.g., Shockley diode | 26 |
| 20100072512 | Silicon break over diode - A Break Over Diode (“BOD”) device is a gate-less two terminal high power semiconductor switch in which transitions from a blocking state to a conducting state are triggered by a dV/dt pulse to the anode. The BOD device can be thought of as two cross-coupled PNP and NPN transistors, and includes both anode and cathode shorts which reduce the gain of the NPN and PNP transistors by shunting some current away from their bases directly to their emitters, thereby improving blocking. Moreover, the anode and cathode shorts in conjunction with the device blocking junction form PN diodes which are distributed throughout the bulk of the material and function as anti-parallel diodes to the base-emitter junctions of the PNP and NPN transistors, which enables the BOD device to handle a larger current reversal for a longer period of time. The P base layer may be made thin to decrease the voltage fall time from full blocking to full conduction, and the cathode and anode shorts may be provided in a honeycomb pattern. | 03-25-2010 |
| 20100078673 | ACTIVE SEMICONDUCTOR COMPONENT WITH A REDUCED SURFACE AREA - A semiconductor component in which the active junctions extend perpendicularly to the surface of a semiconductor chip substantially across the entire thickness thereof. The contacts with the regions to be connected are provided by conductive fingers substantially crossing the entire region with which a contact is desired to be established. | 04-01-2010 |
| 20120217539 | Semiconductor Component with Improved Dynamic Behavior - Disclosed is a semiconductor component that includes a semiconductor body, a first emitter region of a first conductivity type in the semiconductor body, a second emitter region of a second conductivity type spaced apart from the first emitter region in a vertical direction of the semiconductor body, a base region of one conductivity type arranged between the first emitter region and the second emitter region, and at least two higher doped regions of the same conductivity type as the base region and arranged in the base region. The at least two higher doped regions are spaced apart from one another in a lateral direction of the semiconductor body and separated from one another only by sections of the base region. | 08-30-2012 |
| 20090236631 | Bidirectional PNPN silicon-controlled rectifier - The present invention discloses a bidirectional PNPN silicon-controlled rectifier comprising: a p-type substrate; a N-type epitaxial layer; a P-type well and two N-type wells all formed inside the N-type epitaxial layer with the two N-type wells respectively arranged at two sides of the P-type well; a first semiconductor area, a second semiconductor area and a third semiconductor area all formed inside the P-type well and all coupled to an anode, wherein the second semiconductor area and the third semiconductor area are respectively arranged at two sides of the first semiconductor area, and wherein the first semiconductor area is of first conduction type, and the second semiconductor area and the third semiconductor area are of second conduction type; and two P-type doped areas respectively formed inside the N-type wells, wherein each P-type doped area has a fourth semiconductor area neighboring the P-type well and a fifth semiconductor area, and wherein both the fourth semiconductor area and the fifth semiconductor area are coupled to a cathode, and wherein the fourth semiconductor area is of second conduction type, and the fifth semiconductor area is of first conduction type. | 09-24-2009 |
| 20100117116 | INTEGRATED CIRCUIT ARRANGEMENT WITH SHOCKLEY DIODE OR THYRISTOR AND METHOD FOR PRODUCTION AND USE OF A THYRISTOR - An integrated circuit arrangement includes a Shockley diode or a thyristor. An inner region of the diode or of the thyristor is completely or partially shielded during the implantation of a p-type well. This gives rise to a Shockley diode or a thyristor having improved electrical properties, in particular with regard to the use as an ESD protection element. | 05-13-2010 |
| 20110266592 | DEVICE AND METHOD FOR TRANSIENT VOLTAGE SUPPRESSOR - A transient voltage suppressor (TVS) device includes a semiconductor substrate of a first conductivity type, and a first and a second semiconductor regions of a second conductivity type overlying the semiconductor substrate. A semiconductor layer of the second conductivity type overlies the first and the second semiconductor regions. The TVS device has a first trench extending through the semiconductor layer and the first semiconductor region and into the semiconductor substrate, and a fill material of the second conductivity type disposed in the first trench. A clamping diode in the TVS device has a junction between an out-diffused region from the fill material and a portion of the semiconductor substrate. The TVS device also includes a first P-N diode formed in a first portion of the semiconductor layer, and a second P-N diode having a junction between the second semiconductor region and the semiconductor substrate. | 11-03-2011 |
| 20090321783 | Semiconductor Device - A semiconductor device which includes a semiconductor chip; an electrically conductive base electrode bonded to the lower surface of the semiconductor chip by a first bonding member; an electrically conductive lead electrode bonded to the upper surface of the semiconductor chip by a second bonding member; and a first stress relief member for reducing stress developed in the first bonding member due to the difference in thermal expansion between the semiconductor chip and the base electrode, wherein both the base electrode and the first stress relief member are in direct contact with the lower surface of the first bonding member. | 12-31-2009 |
| 20120104456 | Fast Recovery Reduced P-N Junction Rectifier - A fast recovery rectifier structure with the combination of Schottky structure to relieve the minority carriers during the forward bias condition for the further reduction of the reverse recovery time during switching in addition to the lifetime killer such as Pt, Au, and/or irradiation. This fast recovery rectifier uses unpolished substrates and thick impurity diffusion for low cost production. A reduced p-n junction structure with a heavily p-type doped thin film is provided to terminate and shorten the p-n junction space charge region. This reduced p-n junction with less total charge in the p-n junction to further improve the reverse recovery time. This reduced p-n junction can be used alone, with the traditional lifetime killer method, with the Schottky structure and/or with the epitaxial substrate. | 05-03-2012 |
| 20100301384 | DIODE - A diode for fast switching applications includes a base layer of a first conductivity type with a first main side and a second main side opposite the first main side, an anode layer of a second conductivity type, which is arranged on the second main side, a plurality of first zones of the first conductivity type with a higher doping concentration than the base layer, and a plurality of second zones of the second conductivity type. The first and second zones are arranged alternately on the first main side. A cathode electrode is arranged on top of the first and second zones on the side of the zones which lies opposite the base layer, and a anode electrode is arranged on top of the anode layer on the side of the anode layer which lies opposite the base layer. The base layer includes a first sublayer, which is formed by the second main sided part of the base layer, and a second sublayer, which is formed by the first main sided part of the base layer. A third layer of the first conductivity type is arranged between the first and second sublayers. The third layer has a higher doping concentration than the base layer and a lower doping concentration than the first zones. | 12-02-2010 |
| 20100127304 | BIPOLAR SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD - A bipolar semiconductor device and manufacturing method. One embodiment provides a diode structure including a structured emitter coupled to a first metallization is provided. The structured emitter includes a first weakly doped semiconductor region of a first conductivity type which forms a pn-load junction with a weakly doped second semiconductor region of the diode structure. The structured emitter includes at least a highly doped first semiconductor island of the first conductivity type which at least partially surrounds a highly doped second semiconductor island of the second conductivity type. | 05-27-2010 |
| 20110024791 | BIPOLAR SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD - A bipolar semiconductor device and method are provided. One embodiment provides a bipolar semiconductor device including a first semiconductor region of a first conductivity type having a first doping concentration, a second semiconductor region of a second conductivity type forming a pn-junction with the first semiconductor region, and a plurality of third semiconductor regions of the first conductivity type at least partially arranged in the first semiconductor region and having a doping concentration which is higher than the first doping concentration. Each of the third semiconductor regions is provided with at least one respective junction termination structure. | 02-03-2011 |
| 20120061719 | SHOCKLEY DIODE HAVING A LOW TURN-ON VOLTAGE - A Shockley diode including: a vertical stack of first to fourth layers of alternated conductivity types between first and second electrodes; a recess formed in the fourth layer and extending vertically to penetrate into the second layer; a first region of same conductivity type as the second layer but of greater doping level, extending at the bottom of the recess in the second layer; and a second region of same conductivity type as the third layer but of greater doping level, extending along the lateral walls of the recess and connecting the first region to the fourth layer. | 03-15-2012 |
| 20120018775 | ELECTROSTATIC DISCHARGE PROTECTION DEVICE AND METHOD FOR FABRICATING THE SAME - The present invention provides an ESD protection device comprising a SCR structure that is a transverse PNPN structure formed by performing a P-type implantation and an N-type implantation in an N-well and a P-well on a silicon substrate, respectively, wherein a P-type doped region in the N-well is used as an anode, and N-type doped region in the P-well is used as a cathode, characterized in that, N-type dopants are implanted into the N-well to form one lead-out terminal of a resistor, P-type dopants are implanted into the P-well to form another lead-out terminal for the resistor, and the two leading-out terminals are connected by the resistor. | 01-26-2012 |
| 20120161199 | MESA-TYPE BIDIRECTIONAL SHOCKLEY DIODE - A mesa-type bidirectional Shockley diode delimited on its two surfaces by a peripheral groove filled with a glassivation including a substrate of a first conductivity type; a layer of the second conductivity type on each side of the substrate; a region of the first conductivity type in each of the layers of the second conductivity type; a buried region of the first conductivity type under each of the regions of the first conductivity type, at the interface between the substrate and the corresponding layer of the second conductivity type, each buried region being complementary in projection with the other; and a peripheral ring under the external periphery of each of the glassivations, of same doping profile as the buried regions. | 06-28-2012 |
| 20120161198 | BIDIRECTIONAL SHOCKLEY DIODE WITH EXTENDED MESA - A mesa-type bidirectional Shockley diode including a substrate of a first conductivity type; a layer of the second conductivity type on each side of the substrate; a region of the first conductivity type in each of the layers of the second conductivity type; a buried region of the first conductivity type under each of said regions of the first conductivity type, each buried region being complementary in projection with the other; and a groove arranged in the vicinity of the periphery of the component on each of its surfaces, the component portion external to the groove comprising, under the external portion of the upper and lower regions of the second conductivity type, regions of the first conductivity type of same doping profile as said buried regions. | 06-28-2012 |
| 20120161200 | DOUBLE-GROOVE BIDIRECTIONAL VERTICAL COMPONENT - A mesa-type bidirectional vertical power component, including a substrate of a first conductivity type; a layer of the second conductivity type on each side of the substrate; first regions of the first conductivity type in each of the layers of the second conductivity type; and, at the periphery of each of its surfaces, two successive grooves, the internal groove crossing the layers of the second conductivity type, second doped regions of the first conductivity type being formed under the surface of the external grooves and having the same doping profile as the first regions. | 06-28-2012 |
| 20090309128 | Low Leakage Protection Device - A high-voltage, low-leakage, bidirectional electrostatic discharge (ESD, or other electrical overstress) protection device includes a doped well disposed between the terminal regions and the substrate. The device includes an embedded diode for conducting current in one direction, and a transistor feedback circuit for conducting current in the other direction. Variations in the dimensions and doping of the doped well, as well as external passive reference via resistor connections, allow the circuit designer to flexibly adjust the operating characteristics of the device, such as trigger voltage and turn-on speed, to suit the required mixed-signal operating conditions. | 12-17-2009 |
| 20110121359 | Multi-Layer Reconfigurable Switches - Embodiments of the present invention are directed to reconfigurable two-terminal electronic switch devices ( | 05-26-2011 |
| 20120267679 | STARTING STRUCTURE AND PROTECTION COMPONENT COMPRISING SUCH A STARTING STRUCTURE - A structure for starting a semiconductor component including a porous silicon layer in the upper surface of a semiconductor substrate. This porous silicon layer is contacted, on its upper surface side, by a metallization and, on its lower surface side, by a heavily-doped semiconductor region. | 10-25-2012 |
| 20120091501 | Low triggering voltage DIAC structure - In a DIAC-like device that includes an n+ and a p+ region connected to the high voltage node, and an n+ and a p+ region connected to the low voltage node, at least two MOS devices are formed between the n+ and p+ region connected to the high voltage node, and the n+ and p+ region connected to the low voltage node. | 04-19-2012 |
| 257110000 | More than four semiconductor layers of alternating conductivity types (e.g., pnpnpn structure, 5 layer bidirectional diacs, etc.) | 1 |
| 20090032837 | ASYMMETRIC BIDIRECTIONAL SILICON-CONTROLLED RECTIFIER - The present invention discloses an asymmetric bidirectional silicon-controlled rectifier, which comprises: a second conduction type substrate; a first conduction type undoped epitaxial layer formed on the substrate; a first well and a second well both formed inside the undoped epitaxial layer and separated by a portion of the undoped epitaxial layer; a first buried layer formed in a junction between the first well and the substrate; a second buried layer formed in a junction between the second well and the substrate; a first and a second semiconductor area with opposite conduction type both formed inside the first well; a third and a fourth semiconductor area with opposite conduction type both formed inside the second well, wherein the first and second semiconductor areas are connected to the anode of the silicon-controlled rectifier, and the third and fourth semiconductor areas are connected to the cathode of the silicon-controlled rectifier. | 02-05-2009 |
| 257111000 | Triggered by V BO overvoltage means | 2 |
| 20100127305 | ESD PROTECTION DEVICE AND METHOD OF FORMING AN ESD PROTECTION DEVICE - An ESD protection device, which is arranged to be active at a triggering voltage (Vt | 05-27-2010 |
| 20100244089 | LATERAL SCHOTTKY DIODE - High-side and low-side surface voltage sustaining regions is produced by utilizing optimum surface variation lateral doping. Schottky junctions are formed by depositing metal M on an n-type region having the lowest potential, taking M as the anode A | 09-30-2010 |
| 257112000 | With highly-doped breakdown diode trigger | 3 |
| 20100065884 | Electrostatic Discharge Diode - The present invention relates to an electrostatic discharge diode. The electrostatic discharge diode according to exemplary embodiment of the present invention includes: an N-type well formed on a substrate; an n− region formed on the N-type well; a plurality of p− regions penetrated and formed in the n− region; a plurality of n+ regions penetrated and formed in a first layer in which the n− region and a plurality of the p− regions are formed; a plurality of n+ regions penetrated and formed in a first layer in which the n− region and a plurality of the p− regions are formed; and a plurality of p+ regions penetrated and formed in the first layer, wherein a first n+ region among a plurality of the n+ regions and a first p+ region corresponding to the first n+ region are penetrated and formed in each other region of the corresponding first p− region among a plurality of the p− regions. | 03-18-2010 |
| 20120175672 | ESD PROTECTION CIRCUIT - An integrated circuit device provides electrostatic discharge (ESD) protection. In connection with various example embodiments, an ESD protection circuit includes a diode-type circuit having a p-n junction that exhibits a low breakdown voltage. Connected in series with the diode between an internal node susceptible to an ESD pulse and ground, are regions of opposite polarity having junctions therebetween for mitigating the passage of leakage current via voltage sharing with the diode's junction. Upon reaching the breakdown voltage, the diode shunts current to ground via another substrate region, bypassing one or more junctions of the regions of opposite polarity and facilitating a low clamping voltage. | 07-12-2012 |
| 20100244090 | TVS with low capacitance & Forward voltage drop with depleted SCR as steering diode - A transient-voltage suppressing (TVS) device disposed on a semiconductor substrate of a first conductivity type. The TVS includes a buried dopant region of a second conductivity type disposed and encompassed in an epitaxial layer of the first conductivity type wherein the buried dopant region extends laterally and has an extended bottom junction area interfacing with the underlying portion of the epitaxial layer thus constituting a Zener diode for the TVS device. The TVS device further includes a region above the buried dopant region further comprising a top dopant layer of a second conductivity type and a top contact region of a second conductivity type which act in combination with the epitaxial layer and the buried dopant region to form a plurality of interfacing PN junctions constituting a SCR acting as a steering diode to function with the Zener diode for suppressing a transient voltage. | 09-30-2010 |
