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With irradiation or heating of object or material

Subclass of:

250 - Radiant energy

250336100 - INVISIBLE RADIANT ENERGY RESPONSIVE ELECTRIC SIGNALLING

250338100 - Infrared responsive

250340000 - Methods

Patent class list (only not empty are listed)

Deeper subclasses:

Class / Patent application numberDescriptionNumber of patent applications / Date published
250341800 Measuring infrared radiation reflected from sample 35
250341600 Heating of object or material 11
250341300 Including polarizing means 5
20130026368Terahertz ellipsometer system, and method of use - A terahertz ellipsometer, the basic preferred embodiment being a sequential system having a backward wave oscillator (BWO); a first rotatable polarizer that includes a wire grid (WGP01-31-2013
20120097851Method and Device for Measuring the Thickness of a Fountain Solution Layer or Ink Emulsion Layer in Offset Printing - A method and a device for measuring the thickness of a fountain solution layer or ink emulsion layer on the surface of a cylinder bearing the print image of an offset printing machine is proposed, in which the absorption of reflected near infrared radiation is measured by the dampening water that is applied during print production. Interferences due to optical reflection are eliminated by means of a gloss trap. A position-controlled regulation of the dampening water allocation is reliably maintained by means of machine synchronization of the measuring unit and receiving unit.04-26-2012
20100219343METHODS AND APPARATUS FOR DETERMINING FIBRE ORIENTATION - Fibre distribution characteristics such as the bulk average orientation of fibres in composite fibrous materials can be evaluated based on the variation in the speed with which polarized electromagnetic signals propagate through the material as a function of angle. The electromagnetic radiation may comprise terahertz radiation. The composite fibrous materials may be wood-containing materials such as oriented strand board or particle board.09-02-2010
20120153159Method of Measuring Characteristics of Specimen and Flat-Plate Periodic Structure - A measuring method that includes holding a specimen to be measured on a flat-plate periodic structure, applying a linearly-polarized electromagnetic wave to the flat-plate periodic structure, detecting the electromagnetic wave scattered forward or backward by the flat-plate periodic structure, and measuring characteristics of the specimen on the basis of a phenomenon that a dip waveform appearing in a frequency characteristic of the forward-scattered electromagnetic wave or a peak waveform appearing in a frequency characteristic of the backward-scattered electromagnetic wave is changed with the presence of the specimen. The flat-plate periodic structure is a flat-plate structure in which at least two voids penetrating through the structure in a direction perpendicular to a principal surface thereof are periodically arrayed in at least one direction on the principal surface, and the electromagnetic wave is applied to the principal surface of the flat-plate periodic structure from the direction perpendicular to the principal surface.06-21-2012
20120248314SYSTEMS AND METHODS FOR DETECTING AND/OR IDENTIFYING MATERIALS BASED ON ELECTROMAGNETIC RADIATION - One embodiment of the invention includes a material detection and/or identification system. The system includes an electromagnetic (EM) sensor system configured to collect EM radiation from a region of interest. The collected EM radiation could comprise orthogonally-polarized EM radiation. The system also includes a processing unit configured to detect and identify a material of interest in the region of interest. As an example, the processing unit could measure reflectivity data associated with a material of interest based on the collected EM radiation and calculate a refractive index of a material of interest based on the measured reflectivity data, such that the material of interest is identified based on the refractive index. The processing unit can also be configured to calculate a surface roughness associated with the material, such that the refractive index can be calculated based on the surface roughness associated with the material.10-04-2012
250341700 With multiple sources 3
20130075615INFRARED SENSOR WITH MULTIPLE SOURCES FOR GAS MEASUREMENT - A closed path infrared sensor includes an enclosure, a first energy source within the enclosure, at least a second energy source within the enclosure, at least one detector system within the enclosure and a mirror system external to the enclosure and spaced from the enclosure. The mirror system reflects energy from the first energy source to the at least one detector system via a first analytical path and reflects energy from the second energy source to the at least one detector system via a second analytical path. Each of the first analytical path and the second analytical path are less than two feet in length.03-28-2013
20100102234PAPER-SHEET RECOGNITION APPARATUS, PAPER-SHEET PROCESSING APPARATUS, AND PAPER-SHEET RECOGNITION METHOD - A paper-sheet recognition apparatus that acquires information from a paper sheet and recognizes the paper sheet based on the information. The apparatus includes one or more light emitting units that output first to n-th lights (n>2) of different wavelengths; an emission controller that performs emission control of the light emitting units; a light receiving unit that receive a component of a light, which has been emitted from the light emitting unit and then reflected from and/or transmitted through the paper sheet; and a paper-sheet recognition processor that recognizes the paper sheet by using an optical signal received by the light receiving unit. The emission controller performs the emission control of the light emitting units such that the number of light emissions per one emission cycle with respect each of to the first to n-th lights differs depending on information desired to be used in recognizing the paper sheet.04-29-2010
20120091346NDIR-two Beam Gas Analyser And Method For Determining The Concentration Of A Measuring Gas Component in a Gas Mixture by means of Said type of Gas Analyser - The invention relates to a NDIR two beam gas analyser in which infrared radiation is guided by modulation in an alternating manner through a measuring chamber and a reference chamber and is subsequently detected, a measurement signal being produced due to the analysis which determines the concentration of a measurement gas component present in the measurement chamber. The detection and compensation of error effects, in particular modifications on the infrared radiation source or detector arrangement, is simplified as a phase imbalance is produced in the switching of the radiation between the chambers, and the measurement signal is detected in a phase-sensitive manner for modulating the radiation, a measurement signal vector (SF) comprising amplitude information and phase information (Φ04-19-2012
250341500 With calibration 3
20100108890METHODS OF CHARACTERIZING AND MEASURING PARTICULATE FILTER ACCUMULATION - Methods of characterizing and measuring particulate accumulation in a family of particulate filters (05-06-2010
20100133438Method for Maintenance of an Array of Bolometer-Type Detectors - A method for maintenance of an array of bolometer-type detectors comprises heating of certain detectors to a threshold temperature. The heating is performed by supplying resistive detection elements with electric currents, and the threshold temperature is determined for each detector as a function of a measurement made previously on said detector. Such method makes it possible to eliminate persistent images caused by radiation overexposure, or by damage to the thermoelectric properties of certain pixels appearing during the manufacture or ageing thereof. The method does not require the use of an oven or Peltier element, thus avoiding the risk for such heating component to damage irreversibly the reading and CMOS addressing circuits on which the detectors are hybridised or deposited.06-03-2010
20100123079Measurement of Moisture in Composite Materials with Near-IR and MID-IR Spectroscopy - A method of determining moisture content of a composite material includes providing composite material standards with moisture content, collecting infrared spectra on the composite material standards, calibrating the infrared spectra to the moisture content, providing a composite material and predicting moisture content of the composite material based on the infrared spectra and the composite material standards.05-20-2010
250341400 With semiconductor sample 1
20130043393NON-CONTACT MEASUREMENT OF THE DOPANT CONTENT OF SEMICONDUCTOR LAYERS - A system and method of non-contact measurement of the dopant content of semiconductor material by reflecting infrared (IR) radiation off of the material and splitting the radiation into two beams, passing each beam through pass band filters of differing wavelength ranges, comparing the level of energy passed through each filter and calculating the dopant content by referencing a correlation curve made up of known wafer dopant content for that system.02-21-2013
Entries
DocumentTitleDate
20130043392Mid to far infrared diamond raman laser systems and methods - A mid- to far-infrared solid state Raman laser system comprising a resonator cavity comprising: an input reflector adapted to be highly transmissive for light with a first wavelength in the range of about 3 to about 7.5 micrometers for admitting the first beam to the resonator cavity; and an output reflector adapted to be partially transmissive for light with a second wave-length greater than about 5.5 micrometers for resonating the second wavelength in the resonator and for outputting an output beam, the input reflector further being adapted to be highly reflective at the second wavelength for resonating the second wave-length in the resonator; and a solid state diamond Raman material located in the resonator cavity for Raman shifting the pump beam and generating the second wavelength.02-21-2013
20130043391Non-Dispersive Infrared (NDIR) Dual Trace Gas Analyzer and Method for Determining a Concentration of a Measurement Gas Component in a Gas Mixture by the Gas Analyzer - A modulator wheel of a gas analyzer which contains an opening in the shadowing part thereof, where the opening generates in the measurement signal of the gas analyzer, in addition to a signal component at a modulation frequency generated by alternating shadowing and passing-through of the radiation, a further signal component having twice the modulation frequency that is used for detecting changes to the infrared radiation source or detector arrangement due to contamination, aging, or temperature, and compensating for the effects thereof on the measurement result.02-21-2013
20130037720DEVICE FOR THE CONTACTLESS AND NONDESTRUCTIVE TESTING OF SURFACES - A device for the contactless and nondestructive testing of a surface by measuring the infrared radiation thereof has one or more incoherent electromagnetic radiation sources (02-14-2013
20100102233Method of Local Electro-Magnetic Field Enhancement of Terahertz (THz) Radiation in Sub Wavelength Regions and Improved Coupling of Radiation to Materials through the Use of the Discontinuity Edge Effect - A method and apparatus for enhanced THz radiation coupling to molecules, includes the steps of depositing a test material near the discontinuity edges of a slotted member, and enhancing the THz radiation by transmitting THz radiation through the slots. The molecules of the test material are illuminated by the enhanced THz radiation that has been transmitted through the slots, thereby producing an increased coupling of EM radiation in the THz spectral range to said material. The molecules can be bio-molecules, explosive materials, or species of organisms. The slotted member can be a semiconductor film, a metallic film, in particular InSb, or layers thereof. THz detectors sense near field THz radiation that has been transmitted through said slots and the test material.04-29-2010
20100108889METHOD AND APPARATUS FOR IMAGING AN LCD USING TERAHERTZ TIME DOMAIN SPECTROSCOPY - A method configured to investigate an LCD structure, the method comprising: irradiating an LCD structure with pulsed radiation having at least one frequency in the range from 40G Hz to 100 THz; detecting radiation which has been transmitted through or reflected by the structure; determining information about the structure by measuring a quantity at least related to the amplitude of the detected radiation.05-06-2010
20090101823SYSTEM AND METHOD OF MONITORING WITH TEMPERATURE STABILIZATION - A system and method of monitoring with temperature stabilization. The system can include a housing operably connected to a fiber optic cable that provides a light wave thereto, a relay optic for receiving the light wave and being positioned in the housing, a radiation device for processing or producing radiation in the frequency range of 10 GHz to 100 THz from the light wave and being positioned in the housing, a temperature sensor in thermal communication with the housing, and a thermal management device in thermal communication with the housing where the thermal management device adjusts a temperature within the housing based on temperature conditions measured by the temperature sensor. Other embodiments are disclosed.04-23-2009
20120235043MEASUREMENT APPARATUS AND MEASUREMENT METHOD - There is provided a measuring apparatus including a space arrangement structure that includes space regions surrounded by conductors in a plane, an electromagnetic wave emitter that emits electromagnetic waves towards an object held by the space arrangement structure, and an electromagnetic wave detector that measures the electromagnetic waves that have passed through the space arrangement structure. Here, characteristics of the object are measured by measuring the electromagnetic waves that have passed through the space arrangement structure. The electromagnetic waves emitted from the electromagnetic wave emitter towards the space arrangement structure are incident on the plane containing the space regions at an angle, and the electromagnetic waves that have passed through the space arrangement structure are measured.09-20-2012
20090114822TERAHERTZ DISPERSIVE SPECTROMETER SYSTEM - A spectrometer system for providing information about a target with terahertz radiation. The system may receive incident radiation from the target through fore optics, a slit aperture, secondary optics and a dispersive element which images a slit on an array of terahertz sensitive detectors. The detectors may include uncooled sensors. Each sensor may be connected to its own micro antenna. The array of detectors may be situated proximate to the dispersive element so that radiation from the element may be dispersed according to wavelength to the respective detectors optimally sensitive to the various respective wavelengths. Detector signals indicating the impingement of terahertz radiation may provide information for identifying a material of the target.05-07-2009
20110031404APPARATUS AND METHOD FOR SIMULTANEOUSLY GENERATING TERAHERTZ WAVE AND SUPERCONTINUUM, AND SPECTROSCOPY METHOD USING THE SAME - The present invention relates to an apparatus and method for simultaneously generating terahertz wave and supercontinuum, and a spectroscopy method using the apparatus and method, in which terahertz wave and supercontinuum can be efficiently and simultaneously generated by a single device after taking into consideration the problems of conventional methods in which terahertz wave and supercontinuum were generated by separate devices. The apparatus for simultaneously generating terahertz wave and supercontinuum, includes a terahertz wave generation unit for generating a terahertz wave, and a supercontinuum generation unit for generating a supercontinuum based on nonlinear effect, wherein the terahertz wave and the supercontinuum are simultaneously generated using a single input light signal.02-10-2011
20120193536THERMALLY EXCITED NEAR-FIELD SOURCE - A high resolution material observation system includes an object having at least one spatial dimension sufficient to support production of near-field infrared emissions, a holder adapted to receive a sample to be observed, the holder further adapted to position the sample in the near-field infrared emissions, and a thermal excitation unit, adapted to be thermally coupled to at least one of the object and the sample. The thermal excitation unit is further adapted to causing black body radiation in either the object or the sample within the infrared spectrum.08-02-2012
20090314943SYSTEM AND METHOD FOR TERAHERTZ IMAGING - A security inspection system is provided. The security inspection system includes a source configured to transmit a beam of radiation comprising a frequency of at least about 10 GHz. The system also includes an optical system configured to focus the beam of radiation on a sample. The system further includes at least one detector configured to detect one or more reflected beams from different locations of the sample in a focal plane of the optical system and generate a corresponding output signal. The system also includes a processor coupled to the at least one detector and configured to reconstruct a three dimensional image of the sample based upon the output signal.12-24-2009
20090072147Detector Arrangement for Electromagnetic Radiation and Method for Measuring Electromagnetic Radiation - A detector arrangement for electromagnetic radiation has at least an absorbing element and a cantilever sensor which are in operational connection with each other, so that the sensor is bendable in response to electromagnetic radiation absorbed by the absorbing element. The arrangement further includes an interferometer for measuring bending of the cantilever sensor. In a method for measuring electromagnetic radiation, electromagnetic radiation is directed on to the absorbing element and thereby bending of the cantilever sensor is caused. Bending of the cantilever sensor is measured with an interferometer. The cantilever sensor can be a door-like flap made of silicon, attached to one side of a frame of silicon.03-19-2009
20100237249ILLUMINATING SYSTEM FOR IN-FLIGHT REFUELLING OPERATIONS - The invention relates to a system for illuminating an in-flight refueling operation involving a tanker aircraft (09-23-2010
20120193535PLASMA DIAGNOSTIC METHOD USING TERAHERTZ-WAVE-ENHANCED FLUORESCENCE - Methods and systems for characterizing a plasma with radiation, particularly, terahertz (THz) radiation, are disclosed. The disclosed method of characterizing a plasma includes directing THz radiation into the plasma; and detecting an emission due to interaction of the THz radiation with the plasma to characterize the plasma. A disclosed plasma characterizing device includes a means for directing THz radiation into a plasma; and a detector adapted to detect an emission emitted by the plasma due to interaction of the THz radiation with the plasma to characterize the plasma. A plasma characterizing system is also disclosed. The emission detected may be a fluorescence, a variation in fluorescence and/or an acoustic emission.08-02-2012
20120241624Tailgate Detection Using Infra-Red Beams - A system, for calculating an object location within a portal, includes a portal map formed by a plurality of infra-red beams. The system further includes a broken beam detector for detecting and recording, in response to an object moving through the portal map, data indicative of one or more broken beams of the plurality of infra-red beams. The data includes first data indicative of an initial position of the object within the portal, second data indicative of a subsequent position of the object within the portal, and third data including one or more time records. The system also includes at least one broken beam analyzer for obtaining the data from the broken beam detector, the broken beam analyzer calculating the object location based on at least one of the first data, the second data, and the third data.09-27-2012
20080283757Method and system for measuring optical properties of scattering and absorbing materials - A system and method for determining a level of effective residual ink concentration (ERIC) in a piece of recycled paper. The piece of paper is illuminated with a beam of radiation and an amount of the beam of radiation reflected and transmitted by the piece of paper is measured. The level of ERIC is determined as a function of the reflected and transmitted radiation.11-20-2008
20100301218SYSTEMS AND METHODS FOR THERMAL SPECTRAL GENERATION, PROJECTION AND CORRELATION - Systems and methods for generating, projecting or correlating thermal spectra use digital micro-mirror devices (DMDs) to controllably modulate input radiation such as long wave infrared light. An optical system for creating an output spectrum based upon an input light suitably includes a grating configured receive the input light and to spread the input light by wavelength into an input spectrum. A digital micro-mirror device (DMD) is configured to receive the input spectrum and to controllably activate mirrors in the DMD corresponding to selected wavelengths of the input light. Portions of the input light having selected wavelengths can be extracted from remaining portions of the input light for the output spectrum. By selecting and activating only certain mirrors on the DMD, particular wavelengths of light in infrared or other spectra can be optically switched for any number of subsequent applications, including spectral projection, simulation of solar or other spectra, detection of chemical substances, or the like.12-02-2010
20120032082Terahertz Imaging Device With Improved Thermal Converter - The present invention relates to a terahertz imaging device comprising a terahertz source, a converter for converting terahertz radiation into thermal radiation, and a thermal detector. The converter has at least one zone sensitive to terahertz radiation, designed to absorb the terahertz radiation and vconvert the absorbed radiation into heat. This sensitive zone is close to a reference zone, of known absorption capacity, and the thermal detector is designed to measure the heat generated by the sensitive zone relative to the heat generated by the reference zone.02-09-2012
20100051814STIMULATED EMISSION AND ENHANCED DETECTION OF CHEMICALS AND CHEMICAL COMPOUNDS - A method and apparatus for remotely detecting, locating, and identifying chemicals and chemical compounds through optically opaque materials. Electromagnetic radiation in the Terahertz range emitted from an antenna array is modulated to excite target molecules. The apparatus then stops the excitation energy and the molecules emit an electromagnetic signature detectable by the device at standoff distances.03-04-2010
20080265165Phase-matched terahertz emitter - Methods and apparatus are disclosed for directing optical radiation to make multiple passes across an extended region of an electro-optic material, where during each pass the electro-optic material converts a portion of the optical radiation into terahertz radiation, and where the optical radiation is directed into the electro-optic material to cause an amplitude of the terahertz radiation generated from one or more earlier passes of the optical radiation to be constructively enhanced by the terahertz radiation generated from a later pass of the optical radiation.10-30-2008
20130168553Thermally-Sensitive Optocoupler - Various embodiments of methods and devices are provided for a thermally-sensitive optocoupler package. A layer in the optocoupler package has an upper surface and a lower surface, and comprises a thermally-sensitive material. In the package, an LED emits infrared or near-infrared light and a photodetector receives at least a portion of such emitted light and in response provides isolated output signals therefrom. The LED is located above the upper surface, and the photodetector is located beneath the lower surface. The thermally-sensitive material is configured such that an amount of light emitted by the LED, incident on the material and the layer, and transmitted through the material and the layer, changes in accordance with changes in ambient temperature or local thermal conditions.07-04-2013
20080203306METHOD AND SYSTEM FOR PLASMA-INDUCED TERAHERTZ SPECTROSCOPY - A method of analyzing a remotely-located object includes the step of illuminating at least a portion of a targeted object with electromagnetic radiation to induce a phase transformation in the targeted object, wherein the phase transformation produces an emitter plasma, which emits terahertz radiation. The method also includes the step of ionizing a volume of an ambient gas to produce a sensor plasma by focusing an optical probe beam in the volume and the step of detecting an optical component of resultant radiation produced from an interaction of the focused optical probe beam and the terahertz radiation in the sensor plasma. Detecting an optical component of the resultant radiation emitted by the sensor plasma facilitates detection of a characteristic fingerprint of the targeted object imposed onto the terahertz radiation produced as a result of the induced phase transformation.08-28-2008
20110163234APPARATUS AND METHOD FOR INVESTIGATING A SAMPLE - An apparatus for investigating a sample comprising: a source of beam radiation; a detector for detecting a beam of radiation reflected by the sample and an optical subsystem for manipulating the beam between source and detector wherein the optical subsystem comprises a first optical element arranged in use to angularly deflect the source beam within a given solid angle and a second optical element arranged to focus the beam from the first optical element onto a substantially flat image plane and wherein radiation reflected by the sample passes back through the first and second optical elements to the detector.07-07-2011
20100025586MEASUREMENT APPARATUS AND MEASUREMENT METHOD - There is provided a measuring apparatus including a space arrangement structure that includes space regions surrounded by conductors in a plane, an electromagnetic wave emitter that emits electromagnetic waves towards an object held by the space arrangement structure, and an electromagnetic wave detector that measures the electromagnetic waves that have passed through the space arrangement structure. Here, characteristics of the object are measured by measuring the electromagnetic waves that have passed through the space arrangement structure. The electromagnetic waves emitted from the electromagnetic wave emitter towards the space arrangement structure are incident on the plane containing the space regions at an angle, and the electromagnetic waves that have passed through the space arrangement structure are measured.02-04-2010
20120037804METHODS AND APPARATUS FOR THE NON-DESTRUCTIVE MEASUREMENT OF DIFFUSION IN NON-UNIFORM SUBSTRATES - Non-invasive THz spectroscopic apparatus and methods are provided for measuring the average diffusion coefficients for a structure such as cork. The methods may be used to image the localized presence of water in the structure to produce time-dependent images of liquid propagation in the structure.02-16-2012
20090206263Terahertz time domain and frequency domain spectroscopy - A terahertz spectrometer having a wider range of terahertz radiation source, high temporal resolution of scanning (<0.0.099 μm or ˜0.3 pico second) over a wider range of scanning (up to ˜100 pico seconds). Also disclosed are exemplary applications of the spectrometer in biomedical, biological, pharmaceutical, and security areas.08-20-2009
20120305774Measuring Device and Measuring Method That Use Pulsed Electromagnetic Wave - Provided are a measuring device and a measuring method that use terahertz light, by which a substance to be detected can be detected with high sensitivity and high accuracy. A measuring device using a pulsed electromagnetic wave is provided with a substance detection plate, a means for generating the pulsed electromagnetic wave having amplitude intensity dependent on the amount of a substance to be detected at an irradiation position by irradiating the substance detection plate with a pulsed laser beam, and a detection means for detecting the amplitude intensity of the pulsed electromagnetic wave, and measures the change of the state of a solution containing the substance to be detected on the basis of the amplitude intensity. Said measuring device is provided with a first beam splitter which divides the pulsed laser beam into two, a detection region part into which the solution containing the substance to be detected can be introduced, and a reference region part into which a reference solution can be introduced, irradiates a semiconductor corresponding to the detection region part and a semiconductor corresponding to the reference region respectively with the two divided pulsed laser beams, collects pulsed electromagnetic waves generated from the semiconductors corresponding to the detection region part and the reference region part, and detects the collected pulsed electromagnetic waves by said one detection means.12-06-2012
20120126123Method of Measuring Characteristics of Specimen, Measuring Device, and Filter Device - A method of measuring specimen characteristics that includes holding a specimen on a gap array structure that includes gaps regularly arrayed in at least one array direction, applying a linearly-polarized electromagnetic wave to the gap array structure on which the specimen is held, detecting the electromagnetic wave scattered by the gap array structure, and measuring characteristics of the specimen based on a frequency characteristic of the detected scattered electromagnetic wave, wherein a polarizing direction of the linearly-polarized electromagnetic wave and a principal surface of the gap array structure are not parallel to each other.05-24-2012
20120211659Terahertz Wave Characteristic Measurement Method, Material Detection Method, Measurement Instrument, Terahertz Wave Characteristic Measurement Device and Material Detection Device - A terahertz wave characteristic measurement method comprises irradiating terahertz waves at a region in which a thickness of a solution is in the range from 10 μm to 100 μm such that a propagation direction of the terahertz waves is in a thickness direction of the solution, the solution containing at least one type of target material to be measured, and measuring at least one of a spectral characteristic and an intensity at a particular frequency or a particular wavelength of the terahertz waves that are one of transmitted through the region and reflected from the region.08-23-2012
20130181133Method and System for Evaluating the Distribution of an Absorbent Material in an Absorbent Article - A system for imaging a distribution of an absorbent material within an absorbent article. The system includes a radiation source and a detector positioned such that the absorbent article is situated between the radiation source and the detector. The absorbent article includes an absorbent material having a spatial distribution within the absorbent article. Infrared radiation within a particular wavelength range (e.g., 3 μm to 3.2 μm) is more likely to be absorbed by the absorbent material than by other materials within the absorbent article. The radiation source is configured to generate infrared radiation incident on the absorbent article. The detector is configured to detect a quantity of the infrared radiation within the particular wavelength range that was transmitted through the absorbent article. The radiation source is further configured to generate data indicative of the spatial distribution of the absorbent material based on the detected quantity of the infrared radiation.07-18-2013
20110226954PRINTED SECURITY MARK - Embodiments of a printed security mark and a process are disclosed.09-22-2011
20080197286DEFLECTION DEVICE AND IMAGING APPARATUS - A deflection device includes a tabular object for transmitting or reflecting an electromagnetic wave, a drive unit for driving the tabular object so as to rotate or perform a translation motion, and an electromagnetic wave irradiation unit for irradiating the tabular object with an electromagnetic wave so that an irradiation area extending in a direction intersecting a direction of the rotation or translation motion of the tabular object is formed. The deflection device is characterized in that, in order to change a direction of transmission or reflection of an electromagnetic wave radiated on the irradiation area by the rotation or translation motion of the tabular object, a plurality of grooves extending in an in-plane direction of the tabular object is provided in a section of the tabular object along a longitudinal direction of the irradiation area, and the plurality of grooves is formed so that intervals of the plurality of grooves which passes through the irradiation area are changed by the rotation or translation motion of the tabular object.08-21-2008
20110309249METHODS AND DEVICES FOR IN SITU DETERMINATION OF A VITAMIN-D SYNTHESIZING AMOUNT OF NATURAL AND ARTIFICIAL UV IRRADIATION - A matrix with a biologically active substance is exposed to UV radiation. The biologically active substance is selected to initiate photoconversions originating vitamin D synthesis. An optical parameter of the biologically active substance is being changed under UV irradiation. Change of the optical parameter is measured, thus measuring the amount of UV radiation that has caused the vitamin D synthesis occurred through photoconversion. Measuring occurs by way of a dosimeter.12-22-2011

Patent applications in class With irradiation or heating of object or material

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