Class / Patent application number | Description | Number of patent applications / Date published |
250289000 | With evacuation or sealing means | 20 |
20090039254 | 3-DIMENSIONAL DIFFERENTIAL PUMPING SYSTEM AND METHOD THEREOF - A differential pumping system in which a vacuum chamber is manufactured to have a plurality of vacuum pumps and conductance limit plates between the vacuum pumps. The differential pumping system in which an ion is implanted from an ionization source, passes through the vacuum chamber and is detected by a detection unit includes a plurality of vacuum pumps in the vacuum chamber and one or more conductance limit plates between the vacuum pumps, and the conductance limit plates form an angle less than 90° with the transmission direction of the ion. According to such a constitution, higher degree of vacuum and the ion transmission efficiency are maintained without increasing the length of the vacuum chamber. Furthermore, it is possible to minimize the attenuation of an ion detection signal due to a collision with a neighboring neutral molecule, improving the sensitivity of an ion detection device. | 02-12-2009 |
20090206249 | Shutter and gate valve assemblies for vacuum systems - A shutter and gate valve assembly includes a valve housing that defines a passage therethrough, a valve member having a valve aperture, the valve member movable between a non-operating position that seals the passage and an operating position that aligns the valve aperture with the passage, and a shutter movable between a closed position that blocks the valve aperture and an open position that unblocks the valve aperture. The shutter member may be affixed to and movable with the valve member between the non-operating position and the operating position. The shutter may be provided with a shutter aperture that is aligned with the valve aperture in the open position. | 08-20-2009 |
20100148063 | Differential-Pressure Dual Ion Trap Mass Analyzer And Methods Of Use Thereof - A dual ion trap mass analyzer includes adjacently positioned first and second two-dimensional ion traps respectively maintained at relatively high and low pressures. Functions favoring high pressure (cooling and fragmentation) may be performed in the first trap, and functions favoring low pressure (isolation and analytical scanning) may be performed in the second trap. Ions may be transferred between the first and second trap through a plate lens having a small aperture that presents a pumping restriction and allows different pressures to be maintained in the two traps. The differential-pressure environment of the dual ion trap mass analyzer facilitates the use of high-resolution analytical scan modes without sacrificing ion capture and fragmentation efficiencies. | 06-17-2010 |
20100171035 | MASS SPECTROMETER - A radio-frequency ion guide ( | 07-08-2010 |
20100176294 | MASS SPECTROMETER ARRANGEMENT - The invention refers to a mass spectrometer arrangement ( | 07-15-2010 |
20100187415 | TURBOMOLECULAR PUMP - A turbomolecular pump ( | 07-29-2010 |
20100252732 | DEVICE AND METHOD FOR DIRECT MEASUREMENT OF ISOTOPES OF EXPIRED GASES - The invention provides a device including a chamber wherein the chamber including a rigid enclosure; a rigid lid for the enclosure; a gasket between the lid and the enclosure to allow for an airtight seal between the enclosure and the gasket upon closure of a latch connecting the enclosure and the lid; a port for airtight attachment of a syringe, and a port for airtight insertion of a gas sensor. The device can further include a gas sensor and one or more syringes for attachment to the device by a three-way stopcocks. The device is appropriately sized for use with the subject of interest. The invention also provides methods for use of the device. | 10-07-2010 |
20100288922 | MS/MS MASS SPECTROMETER - The gas conductance on the ion injection side of a collision cell is made larger than the gas conductance on the ion exit side by providing two ion injection apertures | 11-18-2010 |
20110012017 | Mass Spectrometer - One virtual rod electrode ( | 01-20-2011 |
20130134306 | VACUUM ANALYZER - A vacuum analyzer including a vacuum reaction chamber; a gas source; a flow rate-restricting resistance tube connected to the reaction chamber; a pressure detection device disposed upstream from the flow rate-restricting resistance tube; a flow rate adjustment for adjusting the amount of gas exiting the flow rate-restricting resistance tube so that the detected value from the pressure detection device reaches a prescribed value; a split flow path that is provided with a splitter resistance tube and divides the gas at a location between the flow rate adjustment and the pressure detection device; a passage open to the atmosphere which divides the gas flowing from upstream at a location between the flow rate adjustment and the pressure detection device and releases the divided gas to the atmosphere; and a valve provided in the passage open to the atmosphere. Therein, the split flow path is connected immediately downstream from the valve. | 05-30-2013 |
20130200260 | Capacitor Assembly For A Mass Spectrometer - A capacitor assembly ( | 08-08-2013 |
20130320208 | Inert Atmospheric Pressure Pre-Chill and Post-Heat - An ion implantation system provides ions to a workpiece positioned in a process environment of a process chamber on a sub-ambient temperature chuck. An intermediate chamber having an intermediate environment is in fluid communication with an external environment and has a cooling station and heating station for cooling and heating the workpiece. A load lock chamber is provided between the process chamber and intermediate chamber to isolate the process environment from the intermediate environment. A positive pressure source provides a dry gas within the intermediate chamber at dew point that is less than a dew point of the external environment to the intermediate chamber. The positive pressure source isolates the intermediate environment from the external environment via a flow of the dry gas from the intermediate chamber to the external environment. | 12-05-2013 |
20140353496 | GAS DIFFUSER ION INLET - In some embodiments, a gas diffuser for use in a mass spectrometer is disclosed that can provide a controlled expansion of an ion-containing gas so as to reduce gas velocity for entry into subsequent stages of the mass spectrometer, e.g., a mass analyzer. In some embodiments, the controlled expansion of the gas is provided by flowing the gas through a channel whose cross-sectional area change, e.g. progressively increases, in the direction of the gas flow so as to provide controlled expansion of the gas. | 12-04-2014 |
20150340218 | IMPROVEMENTS IN AND RELATING TO THE CONTROL OF IONS - A guide apparatus includes a vacuum compartment provided at a background pressure and having a gas inlet opening arranged for jetting a gas in the form of a free jet stream containing entrained ions into a vacuum chamber along a predetermined jetting axis. At least one duct housed within the vacuum chamber has a guide bore positioned coaxially with the jetting axis for receiving the free jet stream such that a supersonic free jet is formed in the duct with a jet pressure ratio P | 11-26-2015 |
20150348766 | ELECTRICAL VACUUM-COMPATIBLE FEEDTHROUGH STRUCTURE AND DETECTOR ASSEMBLY USING SUCH FEEDTHROUGH STRUCTURE - An ultra-high vacuum (UHV) compatible feedthrough structure and a detector assembly using such feedthrough structure, the feedthrough structure comprising a printed circuit board (PCB) for carrying one or more detectors, wherein said PCB comprises a top surface covered with a first UHV sealing layer and one or more first electrical electrodes and at least a first thermally conductive layer extending at least partly over said top surface; and, a back surface comprising one or more second electrodes and at least a second thermally conductive layer extending at least partly over said back surface, wherein one or more conductive wires are embedded in said PCB for electrically connecting said one or more first electrodes with said one or more second electrodes respectively; and, wherein one or more thermally conductive vias are embedded in said PCB for thermally connecting said at least first thermally conductive layer with said second thermally conductive layer. | 12-03-2015 |
20150371839 | ION TRANSPORT DEVICE AND MASS ANALYSIS DEVICE - A first ion transport unit with an ion funnel structure having high acceptance is arranged in the front half and a second ion transport unit with a Q-array structure having low emittance and high gas conductance is arranged in the rear half, and an aperture electrode to which only direct current voltage is applied is provided between them. The inside diameter of the opening of the aperture electrode is made larger than the inside diameter of the opening of the ring electrode at the last stage of the first ion transport unit, and the inscribed circle diameter of the first stage electrode plate of the second ion transport unit is made larger still. As a result, interference of high frequency electric fields between the first ion transport unit and the second ion transport unit | 12-24-2015 |
20160005586 | DIFFERENTIALLY PUMPED DUAL LINEAR QUADRUPOLE ION TRAP MASS SPECTROMETER - The present disclosure provides a new tandem mass spectrometer and methods of using the same for analyzing charged particles. The differentially pumped dual linear quadrupole ion trap mass spectrometer of the present disclose includes a combination of two linear quadrupole (LQIT) mass spectrometers with differentially pumped vacuum chambers. | 01-07-2016 |
20160086786 | ISOLATION OF CHARGED PARTICLE OPTICS FROM VACUUM CHAMBER DEFORMATIONS - A charged particle processing apparatus includes a vacuum chamber, an optics plate, charged particle optics mounted to the optics plate, and mounting members coupled between the optics plate and a chamber wall. The mounting members are configured for isolating the optics plate from deformation of the chamber wall, as may occur due to a pressure differential between the chamber interior and the environment outside the chamber. The isolation may prevent deformation from affecting the alignment and positioning of the charged particle optics. The charged particles may, for example, be ions or electrons. Thus, the apparatus may be utilized, for example, in analytical instruments such as for mass spectrometry, or inspection instruments such as for electron microscopy. | 03-24-2016 |
20160163528 | INTERFACE FOR AN ATMOSPHERIC PRESSURE ION SOURCE IN A MASS SPECTROMETER - The invention relates to a mass spectrometer having an ion source region at substantially atmospheric pressure in which ions are formed from a liquid sample. The mass spectrometer further has an interface for transmitting the formed ions from the ion source region into a vacuum region which is held at a pressure level substantially below the atmospheric pressure and where the formed ions are further processed. The interface comprises a wall dividing the ion source region and the vacuum region and has a central orifice formed therein for letting pass gaseous and particulate matter from the ion source region into the vacuum region following the pressure gradient, wherein the central orifice is surrounded at least section-wise by a plurality of lateral orifices. | 06-09-2016 |
20160172179 | Vacuum System | 06-16-2016 |