Entries |
Document | Title | Date |
20080197275 | ION SAMPLING APPARATUSES IN FAST POLARITY-SWITCHING ION SOURCES - The present invention provides ion sampling apparatuses that can be used in a fast polarity-switching electric field. In some embodiments, the ion sampling apparatus comprises a capillary made with an insulator, with a resistive inner or outer surface. Devices and systems comprising the ion sampling apparatuses, as well as methods of use thereof, are also provided. | 08-21-2008 |
20080197276 | MASS SPECTROMETER - An ion optical system to form a loop orbit is provided to sufficiently ensure required performance such as ion transmission efficiency while making it easy to design the system by alleviating a space-focusing condition. The loop orbit of the ion optical system is realized so as to satisfy (t|x)=(t|α)=(t|δ)=0 as the time-focusing condition and to satisfy −2<(x|x)+(α|α)<2, and −2<(y|y)+(β|β)<2 as the space-focusing condition. (x|x) and other similar terms are constants determined by the elements indicated in the parenthesis in a general expression format of the ion optical system. The conditions are substantially alleviated as opposed to the conventional space-focusing condition where each of (x|x), (α|α), (y|y) and (β|β) needs to be ±1. Thus, the parameters to decide the shape of electrodes by which the ion optical system is configured have higher degree of freedom. | 08-21-2008 |
20080210861 | METHODS AND APPARATUS OF ION MOBILITY SPECTROMETER - The present invention describes apparatuses and methods that provide energy to ions in a non-thermal manner. The elevated ion energy minimizes or eliminates interferences due to clustering with polar molecules, such as water. The energized ions are separated in an ion mobility spectrometer. During the ion transportation and separation process, the elevated energy level of ions prevents them from clustering with neutral molecule inside the spectrometer. The additional electric field component only causes ions to reach elevated energy level, whereby the spectrometer can preserve its normal performance, meanwhile avoiding interference from water and other neutral molecules. A RF electric field is applied to the ions in ionization, reaction and separation region of ion mobility spectrometers. | 09-04-2008 |
20080217528 | ION GUIDE CHAMBER - An ion guide chamber comprising a gas-tight elongate chamber, at least one first electrode for generating a field for transporting ions along the elongate chamber and at least one second electrode for generating a field for focusing ions within the elongate chamber. The elongate chamber, e. g. constituted by a glass tube, comprises a resistive structure extending substantially along a main axis of the chamber, whereas the first electrode is constituted by the resistive structure. Furthermore, the second electrode is arranged outside the elongate chamber. Having the RF electrodes arranged outside the vacuum chamber, provides a mechanically simple solution as well as insuring that contamination of the RF electrodes to the analyte gas cannot occur. This allows for a cost-saving design of the RF electrodes and with the corresponding voltages outside the chamber, preferably at atmospheric pressure or high vacuum, avoids discharges within the tube. | 09-11-2008 |
20080224033 | Mass Spectrometer - This invention relates to mass spectrometers comprising a reaction cell and where mass spectra are collected both from unreacted ions and also from reaction product ions. In particular, although not exclusively, this invention finds use in tandem mass spectrometry where mass spectra are collected from precursor and fragment ions. The present invention provides an arrangement where ions may be sent to a reaction cell for fragmentation or other processing before onward transport to a mass analyser. Alternatively, ions may be passed directly to a mass analyser along a bypass path. | 09-18-2008 |
20080245962 | Ion trap time-of-flight mass spectrometer - An ion trap time-of-flight mass spectrometer capable of obtaining highly-sensitive mass spectra even on the lower mass number side is realized. The ion trap time-of-flight mass spectrometer includes an ion source that operates at atmospheric pressure, an ion optical system for introducing the ions generated by the ion source into a vacuum chamber and converging the ions introduced into the vacuum chamber, an ion trap part for trapping ions in the vacuum chamber, a multipole part for converging the kinetic energy of the ions discharged from the ion trap, and a time-of-flight mass spectrometry part for measuring the ions discharged from the multipole part. The period of high-voltage pulses generated by an electrode provided in the time-of-flight mass spectrometry part can be changed depending on an ion content introduced into the multipole part. | 10-09-2008 |
20080272289 | LINEAR TOF GEOMETRY FOR HIGH SENSITIVITY AT HIGH MASS - The present invention provides a time-of-flight (TOF) mass analyzer. The system includes an analyzer vacuum housing isolated from the evacuated ion source vacuum housing by a gate valve maintained at ground potential. A pulsed ion source is located within the ion source housing, and the gate valve is located in a first field-free region at ground potential. A second field-free drift space within the analyzer housing is biased at high voltage with opposite polarity to the voltage applied to the pulsed ion source. Novel ion detectors are provided with input surfaces in electrical contact with the second field-free drift space with output connected to an external digitizer at ground potential. | 11-06-2008 |
20080272290 | Reflector TOF With High Resolution and Mass Accuracy for Peptides and Small Molecules - Many applications in the study of metabolics and proteomics require measurements on peptides and small molecules with high resolving power and mass accuracy. These are often present in complex mixtures and sensitivity over a relatively broad mass range, speed of analysis, reliability, and ease of use are very important. The present invention is a time-of-flight mass spectrometer providing optimum performance for these and similar applications. | 11-06-2008 |
20080272291 | TOF-TOF WITH HIGH RESOLUTION PRECURSOR SELECTION AND MULTIPLEXED MS-MS - The present invention comprises apparatus and methods for rapidly and accurately determining mass-to-charge ratios of molecular ions produced by a pulsed ionization source, and for fragmenting substantially all of the molecular ions produced while rapidly and accurately determining the intensities and mass-to-charge ratios of the fragments produced from each molecular ion. | 11-06-2008 |
20080277576 | TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETER - A time-of-flight secondary ion mass spectrometer comprises an ion source which generates cluster ions each comprised of two or more atoms, a pulsing mechanism which pulses the cluster ions, a selecting mechanism which selects ions having a specific mass number from the pulsed cluster ions and passes the selected ions in an ON state of the selecting mechanism, and, passes the pulsed cluster ions without the selecting in an OFF state of the selecting mechanism, and a time-of-flight mass spectrometric unit which measures a mass spectrum of secondary ions generated from a sample using a difference in time of flight when the sample is irradiated with the ions passed through the selecting mechanism. | 11-13-2008 |
20080277577 | Linear electronic field time-of-flight ion mass spectrometers - Time-of-flight mass spectrometer comprising a first drift region and a second drift region enclosed within an evacuation chamber; a means of introducing an analyte of interest into the first drift region; a pulsed ionization source which produces molecular ions from said analyte of interest; a first foil positioned between the first drift region and the second drift region, which dissociates said molecular ions into constituent atomic ions and emits secondary electrons; an electrode which produces secondary electrons upon contact with a constituent atomic ion in second drift region; a stop detector comprising a first ion detection region and a second ion detection region; and a timing means connected to the pulsed ionization source, to the first ion detection region, and to the second ion detection region. | 11-13-2008 |
20080290269 | Time-Of-Flight Mass Spectrometer - A time-of-flight mass spectrometer comprising an accelerating portion that includes a repeller electrode and an extractor electrode, in which an inner surface on the extractor electrode side of the repeller electrode has a curved shape, the extractor electrode is a flat plate with a hole in the center or a plate structure including a mesh structure, and the accelerating portion converges a distribution of times of flight accompanying deviations in the acceleration start position of ions and also performs trajectory control by correcting a distribution of the introduction energy of ions. In accordance with the above-described structure, it is possible to realize both functions of a conventional accelerating portion and ion lens system with only an accelerating portion and it is possible to simplify and reduce the size of the time-of-flight mass spectrometer. | 11-27-2008 |
20080296490 | TIME OF FLIGHT MASS SPECTROMETRY METHOD AND APPARATUS - A method and apparatus for performing time of flight mass spectrometry wherein the number of sums of transients taken for generating a given spectra is determined as a function of a characteristic of the incoming data for that spectrum. For instance, the number of transient measurements taken for a given spectrum output can be determined as a function of the abundance of ions in the sample or the abundance of ions corresponding to a base peak or another selected peak. In yet another embodiment, the collection of transients is terminated when a threshold signal to noise ratio is attained. | 12-04-2008 |
20080296491 | METHOD AND APPARATUS TO DETECT CHEMICAL VAPORS - Means and method of rapid detection of a compound of interest from an air sample is shown. An air sample is collected, and concentration of the compound of interest can be increased. A portable spectrometer, which preferably is a time-of-flight spectrometer, detects the presence of any of the compound. The system allows for rapid detection of the presence of a compound in an air sample in a field setting. | 12-04-2008 |
20080308724 | CALIBRATION CURVES FOR TIME-OF-FLIGHT MASS SPECTROMETERS - The invention relates to determining the masses from the time-of-flight values of ions in time-of-flight mass spectrometers where the accelerating voltage for the ions is not applied permanently, but is switched on at a certain time, resulting in a temporally changing acceleration for a short time after the voltage has been switched on. An aspect of the invention includes formally describing the effect of the temporally changing acceleration on the calibration curve—an effect which cannot be subjected to a strict mathematical-analytical calculation—by introducing a “reduced mass” m—m | 12-18-2008 |
20080315082 | Mass spectrometric analyzer - A tandem mass spectrometer comprising an ion source for ionizing a sample, an ion trap section for carrying out collision induced dissociation of the target ions thereby to produce fragment ions, a multi electrode collision section for conducting collision induced dissociation of fragment ions discharged from the ion trap section, a mass spectrometer section for conducting mass spectrometric analysis of the converged fragment ions. After the target ions selected by the ion trap section are subjected to collision induced dissociation, specific fragment ions among the fragment ions are selected and transferred to the multi electrode collision section thereby to carry out collision induced dissociation therein. | 12-25-2008 |
20090008545 | FAST TIME-OF-FLIGHT MASS SPECTROMETER WITH IMPROVED DYNAMIC RANGE - Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed. | 01-08-2009 |
20090014643 | Data Acquisition System for a Spectrometer that Generates Stick Spectra - A data acquisition system and method are described that may be used with various spectrometers. The data acquisition system may include an ion detector and a processing circuit. The processing circuit may include an initial processing module and a spectra processing module. According to one embodiment, the spectra processing module generates stick spectra and supplies the stick spectra to an external processor. The stick spectra comprise a peak intensity, resolution, and a location in the spectra for each detected peak. The stick spectra may be generated in real time. | 01-15-2009 |
20090020695 | MASS SPECTROMETER - A mass spectrometer includes a linear multipole electrode, an auxiliary electrode that applies a DC potential on the center axis of the linear multipole electrode, and a DC power supply that supplies a DC power to the auxiliary electrode. The DC potential slope formed on the center axis of the multipole electrode is changed according to the measuring condition. The ejection time of ions can be adjusted optimally by adjusting the potential slope so as to satisfy the measuring condition. If the ejection time of ions is shortened, confusion of different ion information items that might otherwise occur on a spectrum can be avoided. If the ejection time of ions is lengthened, detection limit exceeding can be avoided and ions can be measured efficiently, thereby highly efficient ion measurements are always assured. | 01-22-2009 |
20090026365 | Instrument and Method for Tandem Time-of-Flight Mass Spectrometry - A novel instrument and method for TOF/TOF mass spectrometry is offered. A spiral trajectory time-of-flight mass spectrometer satisfies the spatial focusing conditions for the direction of flight and a direction orthogonal to the direction of flight whenever ions make a turn in the spiral trajectory. An ion gate for selecting precursor ions is placed in the spiral trajectory of the spiral trajectory time-of-flight mass spectrometer. Electric sectors are placed downstream of the ion gate. | 01-29-2009 |
20090039249 | SIZE SEGREGATED AEROSOL MASS CONCENTRATION MEASUREMENT DEVICE - An apparatus and method for estimating size segregated aerosol mass concentration in real time and using a single detector. A beam of electromagnetic radiation is passed through a particle stream made of a test or field aerosol. The single detector outputs an electrical signal proportional to the electromagnetic radiation scattered thereupon. The electrical signal may be conditioned to produce an integrated signal for measuring radiation scattered from all the particles in the interrogation volume, a pulse height from an individual particle within the volume, and/or a time-of-flight measurement from the individual particle. The integrated signal can be correlated to particle mass concentration. The pulse height signal and the time-of-flight signal may be converted to infer the size of the individual particle. Attendant size distributions for the particle sizes may also be obtained. Using known or assumed particle properties, the mass concentration may be estimated from the size distribution. | 02-12-2009 |
20090050800 | ELECTRONIC TIME-OF-FLIGHT MASS SELECTOR - A method of selecting ions includes generating a group of ions, accelerating the group of ions through a flight region towards an electronic mass selector grid, and selectively varying a voltage applied to the electronic mass selector grid, such that only a selected subset of the group of ions passes through the grid. An apparatus for selecting ions includes an ion generator, an ion accelerator for accelerating ions into a flight region, and an electronic mass selector grid responsive to an applied voltage to pass a subset of the ions from the flight region. An apparatus for detecting a threat molecule includes an ion generator for generating ions from a mixed gas stream, an ion accelerator for accelerating the ions into a flight region, and an electronic mass selector grid. The grid passes only a subset of the ions, such as ions and/or ionized fragments of the threat molecule. | 02-26-2009 |
20090090861 | DATA ACQUISITION SYSTEM FOR A SPECTROMETER - A data acquisition system and method are described that may be used with various spectrometers. The data acquisition system may include an ion detector, an initial/transient processing module, and a spectra processing module. The initial/transient processing module is provided for processing the ion detection signals and for supplying processed signals to the spectra processing module. The transient processing module may contiguously sample the ion detection signals at a rate of at least 1.5 GHz. The spectra processing module may generate spectra from the transients at a rate of at least 50 spectra per second. The initial processing module may be configured to have a sensitivity that is sufficient to detect a single ion received within one of over at least 100 transients and to detect and quantify a number of ions simultaneously striking said ion detector up to at least 10 simultaneously striking ions. | 04-09-2009 |
20090095902 | CHEMICAL IONIZATION REACTION OR PROTON TRANSFER REACTION MASS SPECTROMETRY WITH A TIME-OF-FLIGHT MASS SPECTROMETER - A system, components thereof, and methods are described for time-of-flight mass spectrometry. A microwave or high-frequency RF energy source is used to ionize a reagent vapor to form reagent ions. The reagent ions enter a chamber and interact with a fluid sample to form product ions. The reagent ions and product ions are directed to a time-of-flight mass spectrometer module for detection and determination of a mass value for the ions. The time-of-flight mass spectrometer module can include an optical system and an ion beam adjuster for focusing, interrupting, or altering a flow of reagent and product ions according to a specified pattern. The time-of-flight mass spectrometer module can include signal processing techniques to collect and analyze an acquired signal, for example, using statistical signal processing, such as maximum likelihood signal processing. | 04-16-2009 |
20090095903 | CLEANED DAUGHTER ION SPECTRA FROM MALDI IONIZATION - In a mass spectrometer having an ion source in which analyte substances are ionized by matrix assisted laser desorption and form an ion beam that travels to a parent ion selector for selecting ions to form daughter ions, the ion beam is reflected in at least one reflector prior to the parent ion selector so that only ions that have both the mass of the parent ions and their kinetic energy are allowed to pass to the parent ion selector. By taking this measure, the mass resolution in the daughter ion spectra is also increased; the improved mass resolution and improved signal-to-noise ratio produce higher sensitivity, even though fewer ions are admitted for analysis in the daughter ion spectrum. | 04-16-2009 |
20090101813 | MULTIPLEXING DAUGHTER ION SPECTRUM ACQUISITION FROM MALDI IONIZATION - The invention relates to the measurement of daughter ion spectra of analyte substances that are ionized by means of matrix-assisted laser desorption. The invention shows how to record several daughter ion spectra from several parent ions per single pulse of laser light, that is per desorption event, by spatially splitting the ion beams or by temporally sequencing the spectral measurement; the various parent ions are selected one after another by switching the parent ion selector several times. Summing up corresponding individual daughter ion spectra from many pulses of laser light leads to several sum spectra being recorded practically synchronously with the same series of laser light pulses, with correspondingly reduced sample consumption and shortened data acquisition time. | 04-23-2009 |
20090108196 | ION OPTICS SYSTEMS - In various embodiments, provided are ion optics systems comprising an even number of ion mirrors arranged in pairs such that a trajectory of an ion exiting the ion optics system can be provided that intersects a surface substantially parallel to an image focal surface of the ion optics system at a position that is substantially independent of the kinetic energy the ion had on entering the ion optics system. In various embodiments, provided are ion optics systems comprising an even number of ion mirrors arranged in pairs where the first member and second member of each pair are disposed on opposite sides of a first plane such that the first member of the pair has a position that is substantially mirror-symmetric about the first plane relative to the position of the second member of the pair. | 04-30-2009 |
20090108197 | Ion implanters - The present invention relates to components in ion implanters having surfaces, such as graphite surfaces, adjacent to the path of the ion beam through the ion implanter. Such surfaces will be prone to sputtering, and sputtered material may become entrained in the ion beam. The present invention sees the use of surfaces that are formed so as to present a series of angled faces that meet at sharp intersections. In this way, any material will be sputtered away from the ion beam. | 04-30-2009 |
20090114813 | MEASURING ENERGY CONTAMINATION USING TIME-OF-FLIGHT TECHNIQUES - Techniques for measuring energy contamination using time-of-flight (TOF) sensor are disclosed. In one particular exemplary embodiment, the techniques may be realized as a method for detecting energy contamination in an ion beam using time-of-flight comprising directing an ion beam towards an entrance of a sensor, wherein the ion beam may include charged particles and neutral particles, blocking the ion beam periodically from entering the sensor and allowing a pulse of the ion beam to enter the sensor periodically using a gate mechanism, separating the charged particles and the neutral particles of the ion beam pulse based at least in part upon different transit times over a distance caused by variations in at least one of mass and energy associated with the charged particles and the neutral particles, and detecting at least one of the charged particles and the neutral particles separately at a detector based at least in part upon the different transit times. | 05-07-2009 |
20090121129 | PULSE HEATING-TIME OF FLIGHT MASS SPECTROMETRIC GAS ELEMENTS ANALYZER - A pulse heating—time of flight mass spectrometric gas elements analyzer, which involves the chemical analysis field of inorganic materials, and comprises of a pulse heating electrode furnace, a sample charging system, a purification device, a time-of-flight mass spectrometer, a signal acquisition and data processing system, and an automatic control system. Said electrode furnace and sample charging system are united as one via upper/lower electrodes and pneumatic cylinders, to form a closed hearth. Said electrode furnace, purification device and time-of-flight mass spectrometer are interconnected through the gas pipelines: the purified inert carrier gas comes into the hearth from its top, carrying out the gas components released from sample fusion, and upon re-purification, comes into the time-of-flight mass spectrometer; said signal acquisition and data processing system is connected to the detector of the said mass spectrometer via signal cables, and on the basis of computation by the data processing module of the relevant computer software, outputs the mass percentages of O, N, H and Ar in the sample. The lower limit of detection can be below 0.01 ppm to 0.1 ppm, and no less than three elements can be measured simultaneously in one analysis cycle. | 05-14-2009 |
20090121130 | Orthogonal Acceleration Time-of-Flight Mass Spectrometer - An orthogonal acceleration time-of-flight mass spectrometer has: an ion source for ionizing a sample; a conductive box into which the ions are introduced; ion acceleration device causing the ions to be accelerated in a pulsed manner in synchronism with a signal giving a starting point of measurement; and ion detector for detecting the ions in synchronism with the acceleration of the ions. The conductive box is provided with an ion injection port and an ion exit port. A lift voltage is applied to the conductive box. This voltage is switched in synchronism with the signal giving the starting point of the measurement. | 05-14-2009 |
20090140140 | MULTI-BEAM ION MOBILITY TIME-OF-FLIGHT MASS SPECTROMETRY WITH MULTI-CHANNEL DATA RECORDING - The content of the invention comprises a concept of multi-beam ion pre-selection from a single sample, coordinated mobility (against the gas flow) separation, cooling ions in supersonic gas flow and mass separation of thus low divergent ions by single or plural compact high-resolution orthogonal time-of-flight mass spectrometers both linear or reflectron type with controlled collision-induced dissociation (CID) and multi-channel data recording for the optimization of sample use in the analysis, and obtaining as much useful information about the sample as possible in a reasonably short time. | 06-04-2009 |
20090189072 | TIME-OF-FLIGHT MASS SPECTROMETRY OF SURFACES - The present invent provides a particle detector for counting and measuring the flight time of secondary electrons and scattered ions and neutrals and to correlate coincidences between these and backscattered ions/and neutrals while maintaining a continuous unpulsed microfocused primary ion beam for impinging a surface. Intensities of the primary particle scattering and secondary particle emissions are correlated with the position of impact of the focused beam onto a materials surface so that a spatially resolved surface elemental and electronic structural mapping is obtained by scanning the focused beam across the surface. | 07-30-2009 |
20090200461 | Closed Loop Control And Process Optimization In Plasma Doping Processes Using A Time of Flight Ion Detector - A method of controlling a plasma doping process using a time-of-flight ion detector includes generating a plasma comprising dopant ions in a plasma chamber proximate to a platen supporting a substrate. The platen is biased with a bias voltage waveform having a negative potential that attracts ions in the plasma to the substrate for plasma doping. A spectrum of ions present in the plasma is measured as a function of ion mass with a time-of-flight ion detector. The total number ions impacting the substrate is measured with a Faraday dosimetry system. An implant profile is determined from the measured spectrum of ions. An integrated dose is determined from the measured total number of ions and the calculated implant profile. At least one plasma doping parameter is modified in response to the calculated integrated dose. | 08-13-2009 |
20090236516 | Mass spectrometer, method of mass spectrometry and program for mass spectrometry - An object of the present invention is to provide a mass spectrometer, a method of mass spectrometry, and a program for mass spectrometry for narrowing the range in which the mass-to-charge ratio is scanned without the ion peak of the fragment ion becoming out of the range. In order to achieve the above object, a mass spectrometer including a control unit, a display unit provided with an user interface, an ionization chamber, a dissociation chamber, a mass separator, and a detector is provided. | 09-24-2009 |
20090236517 | TIME OF FLIGHT MASS SPECTROMETER AND CHARGED PARTICLE DETECTOR THEREFOR - In a charged particle detecting apparatus | 09-24-2009 |
20090261243 | IMAGING MASS SPECTROMETRY PRINCIPLE AND ITS APPLICATION IN A DEVICE - A method of imaging mass spectroscopy and a corresponding apparatus are provided, wherein the m/z-ratio of ions as well as the location of said ions on a sample surface are detected simultaneously in a time of flight mass spectrometer. The detector is a semiconductor array detector comprising pixels, that each can be arranged to measure a signal intensity of a signal induced by the ions or their time of arrival. A four-dimensional image consisting of the two lateral dimensions on the sample surface, the m/z-ratio representing the ion type and the abundance of an ion type on the surface can be reconstructed from repeated measurements for which a correspondingly adapted computer program product can be involved. | 10-22-2009 |
20090266983 | METHOD FOR PROCESSING MASS ANALYSIS DATA AND MASS SPECTROMETER - Intensity data of the signals produced by an ion detector are sequentially stored in a data processor, with each piece of intensity data being associated with time t required for each of the various ions ejected from an ion trap to fly through a time-of-flight space and reach the ion detector. The data obtained within a time range T | 10-29-2009 |
20090278041 | Method and apparatus for qualitatively analyzing high-molecular additives in metal plating solution - Disclosed herein is a method of qualitatively analyzing high-molecular additives in a metal plating solution, including: removing sulfate ions and metal ions from a metal plating solution; and qualitatively analyzing the metal plating solution, from which sulfate ions and metal ions are removed, using Matrix-Assisted Laser Desorption/Ionization Time-Of-Flight Mass Spectroscopy (MALDI-TOF MS). The method is advantageous in that the structure and molecular weight of high-molecular additives present in very small amounts in a plating solution can be accurately measured while maintaining the specific structure and molecular weight thereof without degrading the high-molecular additives. | 11-12-2009 |
20090278042 | ION TRAP TIME-OF-FLIGHT MASS SPECTROMETER - The main voltage generator ( | 11-12-2009 |
20090294658 | TOF MASS SPECTROMETRY WITH CORRECTION FOR TRAJECTORY ERROR - A time-of-flight mass spectrometer includes a pulsed ion source that generates a pulse of ions from a sample to be analyzed. An ion lens focuses the pulse of ions into an ion beam. An ion deflector deflects the ion beam into a deflected ion beam path. An ion mirror is positioned in the deflected ion beam path so that a plane of constant ion flight time is parallel to an input surface of the ion mirror. The ion mirror decelerates and then accelerates ions so that ions of like mass and like charge exit the ion mirror in a reflected ion beam and reach an ion detector at substantially the same time. An ion detector is positioned in the path of the reflected ion beam so that a plane of constant ion flight time is substantially parallel to an input surface of the ion detector. The ion detector detects a time-of-flight of ions from the pulsed ion source to the ion detector that is substantially independent of a path traveled. | 12-03-2009 |
20090294659 | Time-Of-Flight Mass Spectrometer - A time-of-flight mass spectrometer includes a detector and is adapted to measure the time it takes for an accelerated ion to reach the detector and thereby measure the mass of the ion. The time-of-flight mass spectrometer scans a voltage applied to an ion incident side surface of the detector in accordance with a mass to be measured. An electrode is provided between the detector and a space in which an ion flies. The time-of-flight mass spectrometer is capable of measuring ions of a wide range of masses with high detection efficiency by scanning a voltage applied to the electrode. | 12-03-2009 |
20100012833 | Detector Apparatus and Pre-Concentrator - An IMS detector has a pin-hole or capillary inlet having a coating of an adsorbent material, such as polydimethylsiloxane, which is adsorbent to an analyte substance of interest. The analyte is adsorbed into the material until a heater is energized to heat the adsorbent material and release the adsorbed analyte substance for detection in a detector. | 01-21-2010 |
20100012834 | Gas Pre-Concentrator for Detection Apparatus - IMS apparatus has a preconcentrator in an inlet passage. A pressure pulser connected to the interior of a housing applies small alternating negative and positive pressure pulses to the housing so that air is drawn in and out of the inlet passage in a “panting” fashion. This causes analyte to be adsorbed by the preconcentrator but does not allow analyte to enter sufficiently to be ionized and detected. After a time sufficient to accumulate a detectable amount of analyte on the preconcentrator the apparatus switches to a desorb phase. The preconcentrator is heated to desorb the analyte, and the pressure pulser produces a larger negative pulse sufficient to draw the liberated analyte far enough into the reaction region for ionization and detection. | 01-21-2010 |
20100038531 | Foreign Matter or Abnormal Unsmoothness Inspection Apparatus and Foreign Matter or Abnormal Unsmoothness Inspection Method - A foreign matter detecting apparatus includes a detecting device for detecting foreign matter by measuring smoothness of a surface of an object undergoing measurement, a marking device for providing a dent on the surface of the object with a predetermined horizontal distance from the foreign matter detected by the detecting device, and a mass spectrum measuring device for irradiating and scanning a small area with a primary ion beam, as a part of the object, including the foreign matter and the dent, so as to measure a mass spectrum of secondary ions emitted from the foreign matter located at a position within a predetermined horizontal distance from the dent. | 02-18-2010 |
20100072362 | TIME-OF-FLIGHT MASS SPECTROMETER AND A METHOD OF ANALYSING IONS IN A TIME-OF-FLIGHT MASS SPECTROMETER - A time-of-flight mass spectrometer ( | 03-25-2010 |
20100072363 | CO-AXIAL TIME-OF-FLIGHT MASS SPECTROMETER - A co-axial time-of-flight mass spectrometer having a longitudinal axis and first and second ion mirrors at opposite ends of the longitudinal axis. Ions enter the spectrometer along an input trajectory offset from the longitudinal axis and after one or more passes between the mirrors ions leave along an output trajectory offset from the longitudinal axis for detection by an ion detector. The input and output trajectories are offset from the longitudinal axis by an angle no greater than formula (I): where D | 03-25-2010 |
20100084550 | Apparatus and Method for Identifying Metalloproteins - A device and a method for identifying metalloproteins are disclosed. The device includes a first separation device for separating sample molecules according to their retention times, a first ionization device for ionizing the separated molecules into molecular ions, a second separation device for separating the molecular ions by their size-to-charge ratio, a second ionization device for atomizing the molecular ions and creating atomic ions of interest, and a mass spectrometer for separating and identifying both the molecular ions and the atomic ions by their mass-to-charge ratios. A method includes separating sample molecules according to their retention time, ionizing the separated molecules to form molecular ions, separating the molecular ions according to their size-to-charge ratio, atomizing and ionizing a portion of the molecular ions and identifying the atomic and molecular ions by their mass-to-charge ratio. | 04-08-2010 |
20100084551 | INPUT PROTECTION CIRCUIT FOR HIGH-SPEED ANALOGUE SIGNAL AND TIME-OF-FLIGHT MASS SPECTROMETER - The present invention is provided to reduce the distortion or delay of the input waveform of a high-speed analogue signal due to the capacitance of a protection element inserted for the purpose of ESD protection in an input circuit for a high-speed analogue signal, so as to determine the correct waveform of the high-speed analogue signal. In an input protection circuit for a high-speed analogue signal, a resistor is provided on a signal path connecting an input connector and an input circuit; a polymer ESD protection element is connected between a portion of the signal path, which extends from the resistor to the input connector, and the ground; a semiconductor ESD protection element is connected between a portion of the signal path, which extends from the resistor to the input circuit, and either the ground or power source; and the sum of the resistance value of an input resistor of the input circuit and the resistance value of the resistor is equal to the characteristic impedance of a high-speed analogue signal input. | 04-08-2010 |
20100090103 | MASS SPECTROMETER - A mass spectrometer with an ionization chamber with a feed channel for a gas to be examined, including an electron source (d, n) for ionizing the gas to be examined, electrodes (c) for accelerating the ionizing electrons, electrodes (g, h, j, m) for the mass-dependent separation of the ions by acceleration/deceleration thereof, a detector (l) for the separated ions, a wiring with metallic conductors. The components are arranged on a plane nonconductive substrate ( | 04-15-2010 |
20100133431 | Device, Apparatus And Methods For Mass Spectrometry - The invention comprises apparatus for use with atmospheric pressure ionization sources in which an aerosol is formed from a solution of a sample. The aerosol is received in a hollow member and discharged outside the chamber of the ionization source in order to reduce contamination of the ionization source itself by involatile material in the solution and by previously analysed samples. The hollow member is easily removable from the ionization source to facilitate cleaning and replacement. Ionization sources, mass spectrometers, and ion mobility spectrometers comprising the apparatus are also described. | 06-03-2010 |
20100140469 | MASS SPECTROMETER - One cycle of loop orbit is formed by two identical time-focusing unit structures (T | 06-10-2010 |
20100148061 | MASS SPECTROMETER - A basic ion optical system ( | 06-17-2010 |
20100176292 | TIME-OF-FLIGHT MASS SPECTROMETER - A shift of mass axis that occurs when the temperature of a vacuum container consisting of a vacuum chamber ( | 07-15-2010 |
20100193681 | Quantitative Measurement Of Isotope Ratios By Time-Of-Flight Mass Spectrometry - A mass spectrometer includes a pulsed ion source that generates an ion beam comprising a plurality of ions. A first timed ion selector passes a first group of ions. A first ion mirror generates a reflected ion beam comprising the first group of ions that at least partially compensates for an initial kinetic energy distribution of the first group of ions. A second timed ion selector passes a second group of ions. A second ion mirror generates a reflected ion beam comprising the second group of ions that at least partially compensates for an initial kinetic energy distribution of the second group of ions. A timed ion deflector deflects the second group of ions to a detector assembly comprising at least two ion detectors which detects the deflected ion beam. | 08-05-2010 |
20100193682 | MULTI-REFLECTING ION OPTICAL DEVICE - A multi-reflecting ion optical device includes electrostatic field generating means configured to generate electrostatic field defined by a superposition of first and second distributions of electrostatic potential φ | 08-05-2010 |
20100237239 | Ion Beam Detector - In order to attain an object to realize an ion beam capable of (i) immediately determining energy of the ion beam to be generated, and (ii) measuring an ion beam in real time while carrying out laser irradiation, an ion beam detector ( | 09-23-2010 |
20100243886 | Cylindrical Geometry Time-of-flight mass spectrometer - The mass spectrometer includes a mass analyzer having a pair of planar electrode structures. The electrode structures are disposed opposite one another, parallel to one another, and axially offset from one another, and are structured to generate, in response to a common pattern of voltages applied to them, a cylindrically-symmetric, annular electric field surrounding a cylindrical central region. The electric field includes an annular axially focusing lens region surrounding the central region, and an annular mirror region surrounding the lens region. Ions injected tangentially in the central region towards the electric field reach an ion detector after executing a number of ellipse-like orbits, which enables a long flight path to be accommodated within a small evacuated space. | 09-30-2010 |
20100243887 | MASS SPECTROMETER - A mass spectrometer that allows easy replacement of an MCP (microchannel plate) and is enabled to secure orthogonality between an incident surface of the MCP and an ion track at high accuracy is provided. A flight tube | 09-30-2010 |
20100252731 | REAL-TIME AIRBORNE PARTICLE ANALYZER - An aerosol particle analyzer includes a laser ablation chamber, a gas-filled conduit, and a mass spectrometer. The laser ablation chamber can be operated at a low pressure, which can be from 0.1 mTorr to 30 mTorr. The ablated ions are transferred into a gas-filled conduit. The gas-filled conduit reduces the electrical charge and the speed of ablated ions as they collide and mix with buffer gases in the gas-filled conduit. Preferably, the gas filled-conduit includes an electromagnetic multipole structure that collimates the nascent ions into a beam, which is guided into the mass spectrometer. Because the gas-filled conduit allows storage of vast quantities of the ions from the ablated particles, the ions from a single ablated particle can be analyzed multiple times and by a variety of techniques to supply statistically meaningful analysis of composition and isotope ratios. | 10-07-2010 |
20100258716 | MASS SPECTROMETER - A mass analysis is initially performed while applying appropriate voltages to the electrodes so that ions injected through an entrance gate electrode ( | 10-14-2010 |
20100288921 | SIZE SEGREGATED AEROSOL MASS CONCENTRATION MEASUREMENT WITH INLET CONDITIONERS AND MULTIPLE DETECTORS - A system for measuring size segregated mass concentration of an aerosol. The system includes an electromagnetic radiation source with beam-shaping optics for generation of a beam of electromagnetic radiation, an inlet sample conditioner with adjustable cut-size that selects particles of a specific size range, and an inlet nozzle for passage of an aerosol flow stream. The aerosol flow stream contains particles intersecting the beam of electromagnetic radiation to define an interrogation volume, and scatters the electromagnetic radiation from the interrogation volume. The system also includes a detector for detection of the scattered electromagnetic radiation an integrated signal conditioner coupled to the detector and generating a photometric output, and a processor coupled with the conditioner for conversion of the photometric output and cut-size to a size segregated mass distribution. | 11-18-2010 |
20110024620 | Dithered Multi-Pulsing Time-of-Flight Mass Spectrometer - A detection signal generated in response to incident ions accelerated at temporally-irregular intervals having an average repetition rate greater than a reference repetition rate represents detection events each having an event time and an intensity. For each detection event, respective allowed TOFs between the event time and the transient times are calculated. Using respective initial probabilities, initial apportionments of the intensity of each detection event among the allowed TOFs linked thereto are determined. For each allowed TOF, the intensity apportionments thereto are accumulated to generate an intensity accumulation linked thereto. For each detection event, respective revised probabilities are iteratively determined using the intensity accumulations linked to the allowed TOFs linked thereto, and the respective intensity is iteratively reapportioned among the allowed TOFs linked thereto using the revised probabilities to transform the detection signal to a time-of-flight spectrum. | 02-03-2011 |
20110042564 | LASER ABLATION MASS ANALYZING APPARATUS - A laser ablation mass analyzing apparatus includes a sample stage, a laser irradiation unit, a pneumatic transport unit, an ion source, and an analyzer. The sample stage holds a hair sample to be positioned accurately, and the laser irradiation unit irradiates an optional position on the hair such as a tip of the hair to generate ablation. The elements contained in the hair atomized by the ablation are extracted by the pneumatic transport system, and reach the ion source. Neutral atoms of the elements contained in the hair are ionized in the ion source by electron beam irradiation or light irradiation, to analyze mass of the ions obtained of the elements contained in the hair, by the analyzer. | 02-24-2011 |
20110042565 | Mass Spectrometer - A mass spectrometer is disclosed comprising an ion mobility spectrometer or separator | 02-24-2011 |
20110095180 | Mass Spectrometer - In performing an isolation of specific ions or performing a dissociation operation by CID, ions are captured by applying a radio-frequency high voltage to a ring electrode | 04-28-2011 |
20110133076 | TANDEM DIFFERENTIAL MOBILITY SPECTROMETERS AND MASS SPECTROMETER FOR ENHANCED ANALYSIS - The invention relates generally to systems, methods and devices for analyzing samples and, more particularly, to systems using a differential mobility spectrometer in combination with a mass analyzer to enhance the analysis process of constituents of a sample. | 06-09-2011 |
20110174967 | Time-of-Flight Mass Spectrometer - A time-of-flight mass spectrometer has an ion transport region and a time-of-flight (TOF) mass analyzer. The ion transport region includes a collision cell (ion storage region), a steady potential region, and a variable potential region such that the difference in potential between the steady potential region and the variable potential region when ions passed through the steady potential region enter the steady potential region increases with increasing mass-to-charge ratio of ions. The mass analyzer causes the ions transported via the transport region to be accelerated along another optical axis at a given acceleration timing and guides the ions toward a detector. | 07-21-2011 |
20110180705 | Mass Spectrometer - A basic ion optical system having a guaranteed capability for the temporal focusing of ions, including sector-shaped electrodes, an injection slit and an ejection slit, is arranged on the same plane. Four or more sets of the basic ion optical systems are arrayed at predetermined intervals in a direction substantially orthogonal to the aforementioned plane. The injection slit on a topmost basic ion optical system plane and the ejection slit on a basic ion optical system plane located immediate below, as well as the injection slit on a bottommost basic ion optical system plane and the ejection slit on a basic ion optical system plane located immediate above, are respectively connected by another type of basic ion optical system having a guaranteed capability for the temporal focusing of ions. The other injection slits and ejection slits are respectively connected by another type of basic ion optical system having a guaranteed capability for the temporal focusing of ions. Thus, a loop orbit having a three-dimensionally deformed figure “8”-shape is formed, whereby the flight distance is elongated while ensuring the temporal focusing of the ions for the entire system, simultaneously with utilizing the three-dimensional space to compactify the ion optical system. | 07-28-2011 |
20110186730 | Reflector for a Time-of-Flight Mass Spectrometer - A reflector for a time-of-flight mass spectrometer for reflecting ionized atoms and/or molecules, with an entry opening and with an arrangement of successively arranged ring electrodes extending away from the entry opening along a longitudinal axis of the reflector is illustrated and described, as is a time-of-flight mass spectrometer. The object of providing a reflector for a time-of-flight mass spectrometer or providing such a mass spectrometer, with improved mass resolution at a high detection probability, is achieved by virtue of the fact that the ring electrode closest to the entry opening serves as a correction electrode and is at an opposite electric potential compared to the other ring electrodes, that a screening electrode is provided on the side of the entry opening facing away from the ring electrodes and that the screening electrode lies at a potential that differs from that of the ring electrodes, more preferably at earth potential. | 08-04-2011 |
20110192972 | Time-Of-Flight Mass Spectrometer - A first mass analysis is executed in a condition that gas is not introduced into a loop-flight chamber ( | 08-11-2011 |
20110215239 | Mass Spectrometer - Ions originating from sample components are made to fly along a loop orbit (P) multiple times, and are deviated from the loop orbit (P) when a predetermined period of time has elapsed after the ejection of the ions. A time-of-flight spectrum recording unit ( | 09-08-2011 |
20110220786 | Tandem Time-of-Flight Mass Spectrometer - A tandem time-of-flight (TOF) mass spectrometer is offered whose first mass analyzer is a TOF mass spectrometer having a flight distance smaller than the flight distance sufficient to impart a desired mass resolution to the first mass analyzer. When a mass spectrum is measured with the first mass analyzer, a reflectron field is activated. When precursor ions are selected by the first mass analyzer, the reflectron field is deactivated to permit ions to pass through without being reflected. | 09-15-2011 |
20110248161 | Multi-Turn Time-of-Flight Mass Spectrometer - The present invention aims at automatically obtaining a mass spectrum over a wide mass range with a high mass resolution, without the need of the complicated determination of the number of turns or other troublesome computations due to the overtaking of ions on a loop orbit. First, a mass analysis of a target sample is performed under conditions which ensure that the overtaking of ions does not occur, to obtain a mass spectrum with a low mass resolution (S | 10-13-2011 |
20110266436 | APPARATUSES AND METHODS FOR FORMING ELECTROMAGNETIC FIELDS - An electromagnetic field generator includes a semiconductive material shaped to form a complex electromagnetic field including a magnetic field and an electric field. An instrument includes a passage configured such that charged particle may travel therein, and a semiconductive material configured to form a complex electromagnetic field that is configured to control motion of the charged particles within the passage. Another instrument includes a housing defining a chamber, and an electromagnetic field generator within the chamber that comprises a material configured to form an electric field component of an electromagnetic field, and a material configured to form a magnetic field component of the electromagnetic field. A method of controlling motion of charged particles includes controlling motion of at least one charged particle by forming a complex electromagnetic field with a semiconductive material that is shaped to form the complex electromagnetic field. | 11-03-2011 |
20110272574 | SECURITY APPARATUS - An ion mobility spectrometer for analysing a gas is described which comprises a concentric arrangement of an inner ionisation region | 11-10-2011 |
20110309244 | MULTIPOLE ION GUIDE ION TRAP MASS SPECTROMETRY WITH MS/MSN ANALYSIS - A Time-Of-Flight mass analyzer includes a multipole ion guide located in the ion flight path between the ion source and the flight tube of the Time-Of-Flight mass analyzer. In one preferred embodiment, a Time-Of-Flight (TOF) mass analyzer is configured such that a multipole ion guide is positioned in the ion path between the ion source and the ion pulsing region of the TOF mass analyzer. The multipole ion guide electronics and the ion guide entrance and exit electrostatic lenses are configured to enable the trapping or passing through of ions delivered from an atmospheric pressure ion source. The ion guide electronics can be set to select the mass to charge (m/z) range of ions which can be successfully transmitted or trapped in the ion guide. More than one set of m/z values can be selected using techniques such as notch filtering with resonant frequency ion ejection of unwanted m/z values. All or a portion of the ions with stable ion guide trajectories in transmission or trapping mode can then undergo Collisional Induced Dissociation (CID) using one of at least three techniques. During the ion fragmentation step the multipole ion guide AC and DC electric potentials are set to transmit or trap all or a portion of the fragment ions produced by the CID process. All or a portion of the parent and fragment ion population are delivered from the multipole ion guide to the pulsing region of Time-OF-Flight mass analyzer for mass analysis. After the first ion fragmentation step, the multipole ion guide AC and DC electric potentials can again be set to select a narrow m/z range to clear the ion guide in trapping mode of all but a selected set of fragment ions. The m/z selection and ion fragmentation step can be repeated a number of times with mass analysis occurring at the end of all the MS/MS | 12-22-2011 |
20120012744 | SIZE SEGREGATED AEROSOL MASS CONCENTRATION MEASUREMENT WITH INLET CONDITIONERS AND MULTIPLE DETECTORS - A system for measuring size segregated mass concentration of an aerosol. The system includes an electromagnetic radiation source with beam-shaping optics for generation of a beam of electromagnetic radiation, an inlet sample conditioner with adjustable cut-size that selects particles of a specific size range, and an inlet nozzle for passage of an aerosol flow stream. The aerosol flow stream contains particles intersecting the beam of electromagnetic radiation to define an interrogation volume, and scatters the electromagnetic radiation from the interrogation volume. The system also includes a detector for detection of the scattered electromagnetic radiation an integrated signal conditioner coupled to the detector and generating a photometric output, and a processor coupled with the conditioner for conversion of the photometric output and cut-size to a size segregated mass distribution. | 01-19-2012 |
20120018632 | SINGLE AND MULTIPLE OPERATING MODE ION SOURCES WITH ATMOSPHERIC PRESSURE CHEMICAL IONIZATION - An Atmospheric Pressure Chemical Ionization (APCI) source interfaced to a mass spectrometer is configured with a corona discharge needle positioned inside the APCI inlet probe assembly. Liquid sample flowing into the APCI inlet probe is nebulized and vaporized prior to passing through the corona discharge region all contained in the APCI inlet probe assembly Ions produced in the corona discharge region are focused toward the APCI probe centerline to maximize ion transmission through the APCI probe exit. External electric fields penetrating into the APCI probe exit end opening providing additional centerline focusing of sample ions exiting the APCI probe. The APCI probe is configured to shield the electric field from the corona discharge region while allowing penetration of an external electric field to focus APCI generated ions into an orifice into vacuum for mass to charge analysis. Ions that exit the APCI probe are directed only by external electric fields and gas flow maximizing ion transmission into a mass to charge analyzer. The new APCI probe can be configured to operate as a stand alone APCI source inlet probe, as a reagent ion gun for ionizing samples introduced on solids or liquid sample probes or through gas inlets in a multiple function ion source or as the APCI portion of a combination Electrospray and APCI multiple function ion source. Sample ions and gas phase reagent ions are generated in the APCI probe from liquid or gas inlet species or mixtures of both. | 01-26-2012 |
20120025070 | METHOD AND APPARATUS FOR ENHANCED ION MOBILITY BASED SAMPLE ANALYSIS USING VARIOUS ANALYZER CONFIGURATIONS - A ion mobility-based analyzer system including a first ion mobility-based filter for passing selected ions through a time-varying field where the time-varying field being compensated by an adjustable compensation setting. The analyzer also includes a second ion mobility-based filter for receiving a first portion of ions from the first ion mobility-based filter. The second ion mobility-based filter includes a voltage gradient for separating ions of the first portion of ions where the ions have associated retention times based on their times of flight through the voltage gradient. The second ion mobility-based filter includes a detector for detecting the ions at their retention times. The analyzer system further includes a display that displays the detected ions in a plot relating the retention times of the ions in the second ion mobility-based filter with compensation settings of the first ion mobility-based filter. | 02-02-2012 |
20120025071 | Ion Sources for Improved Ionization - Improved apparatuses and methods are provided for ionizing samples and analyzing the samples with mass spectrometry. | 02-02-2012 |
20120025072 | Ion Source, And Mass Spectroscope Provided With Same - An ion source is provided with a push-out electrode, a pull-out electrode, and a pull-in electrode all for ionizing a sample and accelerating generated ions in a pulsed manner, wherein the push-out electrode and/or the pull-in electrode has a curved surface shape having a depression curved in the direction opposite to the direction of travel of the ions. As a result, a compact ion source capable of temporally and spatially focusing ions and outputting the ions, and a compact time-of-flight mass spectroscope with good detection resolution and detection sensitivity which is provided with the compact ion source can be provided. | 02-02-2012 |
20120056086 | Mass Spectrometry Based Multi-Parametric Particle Analyzer - An analytical instrument has a sample introduction system for generating a stream of particles from a sample. An ionization system atomizes and ionizes particles in the stream as they are received. The instrument has an ion pretreatment system and a mass analyzer. The ion pretreatment system is adapted to transport ions generated by the ionization system to the mass analyzer. The mass analyzer is adapted measure the amount of at least one element in individual particles from the stream by performing mass analysis on the ions from the atomized particles. The instrument can be adapted to measure the amount of many different tags, for example at least five different tags, at the same time to facilitate multi-parametric analysis of cells and other particles. | 03-08-2012 |
20120068064 | Time-Of-Flight Mass Spectrometer - There is provided a time-of-flight mass spectrometer of a simple configuration and low cost that prevents temperature drift and provides stable mass spectrum without the use of expensive Invar material for the flight tube which nevertheless is not easily affected by external vibrations and does not deflect under its own weight when held as a cantilever. The flight-tube is made of a CFRP pipe | 03-22-2012 |
20120085905 | Tandem Time-of-Flight Mass Spectrometer - A tandem time-of-flight mass spectrometer having enhanced duty cycle is offered. The inventive mass spectrometer has an ion storage means and a time-calculating means, in addition to the components of a normal tandem time-of-flight mass spectrometer. The time-calculating means finds the time between the instant at which precursor ions are ejected from the ion storage means and the instant at which the ions arrive at a position inside the orthogonal acceleration region where the ions pass into the following first TOF ion optical system at a maximum passage efficiency. The precursor ions are accelerated in a pulsed manner according to the instant at which the ions reach the position giving the maximum passage efficiency. | 04-12-2012 |
20120104245 | Multi-Channel Detection - A mass spectrometer and method of mass spectrometry wherein charged particles in a beam undergo multiple changes of direction. A detection arrangement detects a first portion of the charged particle beam, and provides a first output based upon the intensity of the detected first portion of the charged particle beam. The detection arrangement detects a second portion of the charged particle beam that has traveled a greater path length through the mass spectrometer than the first portion of the charged particle beam, and provides a second output based upon the detected second portion of the charged particle beam. A controller adjusts the parameters of the charged particle beam and/or the detection arrangement, based upon the first output of the detection arrangement, so as to adjust the second output of the detection arrangement. | 05-03-2012 |
20120112060 | Multi-Turn Time-of-Flight Mass Spectrometer - A multi-turn time-of-flight mass spectrometer creates, an accurate mass spectrum of a wide mass range, with the smallest number of measurements. Deflecting electrodes are provided on an ejection path through which ions deviating from a loop orbit fly to a detector having a two-dimensional array elements. A varying voltage applied to the deflecting electrodes creates an electric field. When two ions having different mass-to-charge ratios simultaneously arrive at the detector, these ions are affected with differing strengths since they pass through the deflecting electric field at different times. This results in arrival for the ions on a detection surface. The time an ion passing through the deflecting electric field can be calculated from the displacement of the arrival position of that ion. Then the flight speed of the ion is obtained and its number of turns is roughly deduced to arrive at its mass-to-charge ratio. | 05-10-2012 |
20120126112 | MOLECULAR ION ACCELERATOR - A novel system and methods for accelerating analytes including, without limitation, molecular ions, biomolecules, polymers, nano- and microparticles, is provided. The invention can be useful for increasing detection sensitivity in applications such as mass spectrometry, performing collision-induced dissociation molecular structure analysis, and probing surfaces and samples using accelerated analyte. | 05-24-2012 |
20120138788 | Ion Trap Time-Of-Flight Mass Spectrometer - A technique for improving the mass-resolving power of an ion trap time-of-flight mass spectrometer is provided. At the final stage of a cooling process before the ejection of ions from an ion trap, the frequency of a rectangular-wave voltage applied to a ring electrode of the ion trap is increased for a few to several cycles. This operation reduces the confining potential depth of the ion trap and decelerates the captured ions. The turn-around time of the ions is shortened when the rectangular-wave voltage is halted and an accelerating electric field is created. Thus, the variation in the time of flight of the ions with the same mass-to-charge ratio is reduced. The time for increasing the frequency is determined so that a spread of the ions because of the depth reduction of the confining potential will fall within the range that can be corrected in the time-of-flight mass spectrometer. | 06-07-2012 |
20120168620 | SAMPLE FEEDING DEVICE FOR TRACE DETECTOR AND TRACE DETECTOR WITH SAMPLE FEEDING DEVICE - A sample feeding device for a trace detector is disclosed. The sample feeding device comprises: a sample feeding chamber disposed in the sample feeding device to desorb a sample from a sample feeding member; and a valve assembly configured to fluidly communicate the sample feeding chamber with a drift tube of the trace detector during feeding sample. With the above configuration of the present invention, for example, the sensitivity of the detector can be increased by improving the permeation ratio of the sample. In addition, interior environment of the drift tube is isolated from exterior environment to avoid a drift region of the drift tube from being polluted. The important parameters, such as sensitivity, a position of a peak of a substance, a resolution, of the detector can be kept constant. As a result, operation reliability and consistency of the detector can be achieved. | 07-05-2012 |
20120168621 | MASS SPECTROMETER SYSTEM - The invention provides a mass spectrometer system ( | 07-05-2012 |
20120175518 | TECHNIQUE AND APPARATUS FOR MONITORING ION MASS, ENERGY, AND ANGLE IN PROCESSING SYSTEMS - A time-of-flight (TOF) ion sensor system for monitoring an angular distribution of ion species having an ion energy and incident on a substrate includes a drift tube wherein the ion sensor system is configured to vary an angle of the drift tube with respect to a plane of the substrate. The drift tube may have a first end configured to receive a pulse of ions from the ion species wherein heavier ions and lighter ions of the pulse of ions arrive in packets at a second end of the drift tube. An ion detector may be disposed at the second end of the ion sensor, wherein the ion detector is configured to detect the packets of ions derived from the pulse of ions and corresponding to respective different ion masses. | 07-12-2012 |
20120199736 | MICRO-REFLECTRON FOR TIME-OF-FLIGHT MASS SPECTROMETER - A micro-reflectron for a time-of-flight mass spectrometer including a substrate and integrated with the volume of the substrate, means for application of a potential gradient in a volume suitable for constituting a flight zone of the ions. The means of application includes at least two polarization electrodes and a wall of at least one resistive material that can be polarized between these electrodes so as to generate a continuous potential gradient, itself providing the function of reflectron, this flight zone, these electrodes and this wall being obtained by the technology of microelectromechanical systems (MEMS) and this micro-reflectron having a thickness of less than 5 millimetres while its other dimensions are less than 10 times this thickness. | 08-09-2012 |
20120217388 | Bladed Ion Slicer - Provided herein is a bladed ion slicer for blocking ions in an ion beam that have significant distance from the beam axis. In certain embodiments, the bladed ion slicer comprises a body; a first elongated blade; and a second elongated blade; wherein the ion slicer comprises a slit that extends through the body through which ions pass and wherein the edges of the first and second elongated blades define the entrance of the slit and are pointing towards the ion beam. A mass spectrometer system and method for removing unwanted ions are also provided. | 08-30-2012 |
20120235034 | DEVICE FOR MEASURING MEAN FREE PATH, VACUUM GAUGE, AND METHOD FOR MEASURING MEAN FREE PATH - The present invention provides a device for measuring a mean free path capable of measuring directly the mean free path of a charged particle, a vacuum gauge, and a method for measuring a mean free path. The device for measuring a mean free path according to one embodiment of the invention includes an ion source for generating an ion, a collector ( | 09-20-2012 |
20120261570 | MICROCHIP AND WEDGE ION FUNNELS AND PLANAR ION BEAM ANALYZERS USING SAME - Electrodynamic on funnels confine, guide, or focus ions in gases using the Dehmelt potential of oscillatory electric field. New funnel designs operating at or close to atmospheric gas pressure are described. Effective on focusing at such pressures is enabled by fields of extreme amplitude and frequency, allowed in microscopic gaps that have much higher electrical breakdown thresholds in any gas than the macroscopic gaps of present funnels. The new microscopic-gap funnels are useful for interfacing atmospheric-pressure ionization sources to mass spectrometry (MS) and on mobility separation (IMS) stages including differential IMS or FAIMS, as well as IMS and MS stages in various configurations. In particular, “wedge” funnels comprising two planar surfaces positioned at an angle and wedge funnel traps derived therefrom can compress on beams in one dimension, producing narrow belt-shaped beams and laterally elongated cuboid packets. This beam profile reduces the ion density and thus space-charge effects, mitigating the adverse impact thereof on the resolving power, measurement accuracy, and dynamic range of MS and IMS analyzers, while a greater overlap with coplanar light or particle beams can benefit spectroscopic methods. | 10-18-2012 |
20120280121 | DEVICE, SYSTEM, AND METHOD FOR REFLECTING IONS - Devices and systems for reflecting ions are provided. In general, the devices and systems include a plurality of curved lens plates adapted for connection to at least one voltage source and having a passage therein to allow the ions to pass therethrough. The plurality of curved lens plates generates electric fields having elliptic equipotential surfaces that reflect and focus the ions as they pass through the passage. Reflectron time-of-flight (RE-TOF) spectrometers are also provided that include an ion source, ion detector, and such a reflectron as described above. Mass spectrometer systems are provided that comprise an ion source that generates ions and a reflectron TOF spectrometer such as described above. | 11-08-2012 |
20130037710 | METHODS AND APPARATUS FOR THE ION MOBILITY BASED SEPARATION AND COLLECTION OF MOLECULES - This invention describes an apparatus and method with a combined primary electrospray and secondary electrospray ionization source used to enhance ionization efficiency. The solid phase as well as liquid phase sampling, ionization, and detection is described. | 02-14-2013 |
20130126726 | Molecule Mass Detection via Field Emission of Electrons from Membranes - An active detector and methods for detecting molecules, including large molecules such as proteins and oligonucleotides, at or near room temperature based on the generation of electrons via field emission (FE) and/or secondary electron emission (SEE). The detector comprises a semiconductor membrane having an external surface that is contacted by one or more molecules, and an internal surface having a thin metallic layer or other type of electron emitting layer. The kinetic energy of molecules contacting the semiconductor membrane is transferred through the membrane and induces the emission of electrons from the emitting layer. An electron detector, which optionally includes means for electron amplification, is positioned to detect the emitted electrons. | 05-23-2013 |
20130168547 | Time-Of-Flight Mass Spectrometer - Provided is a time-of-flight mass spectrometer having a reflectron which eliminates energy dependency of the flight time of ions having the same m/z while ensuring a high degree of design freedom. An electric field created by the reflectron is virtually divided into a decelerating region for decelerating ions and a reflecting region for reflecting ions. For an ion having a mass-to-charge ratio which has departed with initial energy higher than U | 07-04-2013 |
20130181126 | Sample Transferring Apparatus for Mass Cytometry - In a mass cytometer or mass spectrometer, a sample of elemental tagged particles is transferred from a dispersion to a gas flow through a carrier aerosol spray for atomization and ionization by inductively coupled plasma (ICP) source. The configuration of the sample transfer apparatus allow for total consumption of the sample by passing the sample spray through a deceleration stage to decelerate the spray of particles from its high velocity expansion. Following the deceleration stage, the decelerated sample of particles can be accelerated and focused through an acceleration stage for transferring into the ICP. This effectively improves the particle transfer between the sample spray and the ICP. | 07-18-2013 |
20130187043 | Multireflection Time-of-flight Mass Spectrometer - A method of reflecting ions in a multireflection time of flight mass spectrometer is disclosed. The method includes guiding ions toward an ion mirror having multiple electrodes, and applying a voltage to the ion mirror electrodes to create an electric field that causes the mean trajectory of the ions to intersect a plane of symmetry of the ion mirror and to exit the ion mirror, wherein the ion are spatially focussed by the mirror to a first location and temporally focused to a second location different from the first location. Apparatus for carrying out the method is also disclosed. | 07-25-2013 |
20130193320 | Mass spectrometer with a wide dynamic range - A mass spectrometer with a wide dynamic range, having:—a source ( | 08-01-2013 |
20130264474 | Ion Detection System and Method - A detection system and a method for detecting ions which have been separated in a time-of-flight (TOF) mass analyser, comprising an amplifying arrangement for converting ions into packets of secondary particles and amplifying the packets of secondary particles, wherein the amplifying arrangement is arranged so that each packet of secondary particles produces at least a first output and a second output separated in time and so that during the delay between producing the first and second output the first output produced by a packet of secondary particles is used for modulating the second output produced by the same packet. An increased dynamic range of detection and protection of the detection system against intense ion pulses is thereby provided. | 10-10-2013 |
20130341503 | Single and Multiple Operating Mode Ion Sources with Atmospheric Pressure Chemical Ionization - An Atmospheric Pressure Chemical Ionization (APCI) source interfaced to a mass spectrometer is configured with a corona discharge needle positioned inside an APCI inlet probe assembly. Liquid sample flowing into the APCI inlet probe is nebulized and vaporized prior to passing through the corona discharge region all contained in the APCI inlet probe assembly. The APCI probe is configured to shield the electric field from the corona discharge region while allowing penetration of an external electric field to focus APCI generated ions into an orifice into vacuum for mass to charge analysis. Ions that exit the APCI probe are directed only by external electric fields and gas flow maximizing ion transmission into a mass to charge analyzer. Sample ions and gas phase reagent ions are generated in the APCI probe from liquid or gas inlet species or mixtures of both. | 12-26-2013 |
20140001353 | MICRO-REFLECTRON FOR TIME-OF-FLIGHT MASS SPECTROMETER | 01-02-2014 |
20140008532 | ION GENERATION USING WETTED POROUS MATERIAL - The invention generally relates to systems and methods for mass spectrometry analysis of samples. In certain embodiments, the invention provides a mass spectrometry probe including at least one porous material connected to a high voltage source, in which the porous material is discrete from a flow of solvent. | 01-09-2014 |
20140054455 | ZERO DEAD TIME, HIGH EVENT RATE, MULTI-STOP TIME-TO-DIGITAL CONVERTER - Time-to-digital converters adapted to analog and digital inputs and methods of use are described. A time-to-digital converter has an event frame latches and logic module with memory cells, an analog front-end module connected to the memory cells, and a bin increment generator module connected to the memory cells. The bin increment generator is configured to issue bin increments separated by a time increment, and the analog front end is configured to issue a start event followed by a plurality of stop events. Upon receipt of a first time increment following a start event, the event frame latches and logic module updates a first memory cell with a first bit-type; upon receipt of a second time increment following an intervening stop event, the event frame latches and logic module updates a second memory cell with a second bit-type different from the first bit-type. | 02-27-2014 |
20140054456 | TIME-OF-FLIGHT MASS SPECTROMETER - An embodiment with a dual-stage reflectron is as follows: (1) On the assumption that a reflector has a base potential X | 02-27-2014 |
20140070092 | Elemental flow cytometer - An elemental flow cytometer includes a device to vaporize, atomize, and ionize material and an introduction system for introducing packets of discrete entities into said device to vaporize, atomize and ionize materials to vaporize, atomize and ionize the entities in the packets. A spectrometer is adapted to individually analyze elemental composition of one or more of the vaporized, atomized and excited or ionized packets. | 03-13-2014 |
20140097339 | MCP UNIT, MCP DETECTOR, AND TIME-OF-FLIGHT MASS SPECTROMETER - An MCP unit of the present invention has a triode structure with a structure to achieve a desired time response characteristic independent of restrictions from a channel diameter of MCP, and is provided with an MCP group, a first electrode, a second electrode, an anode, and an acceleration electrode. Particularly, the MCP unit further comprises a ring member between the acceleration electrode and the anode, as s restriction structure for confining reflected electrons emitted from the anode in response to incidence of secondary electrons from the MCP group, within a space between the acceleration electrode and the anode. | 04-10-2014 |
20140097340 | MCP UNIT, MCP DETECTOR, AND TIME-OF-FLIGHT MASS SPECTROMETER - An MCP unit of the present invention has a triode structure with a structure to achieve a desired time response characteristic independent of restrictions from a channel diameter of MCP, and is provided with an MCP group, a first electrode, a second electrode, an anode, and an acceleration electrode. Particularly, the MCP unit further comprises an electron lens structure for confining reflected electrons emitted from the anode in response to incidence of secondary electrons from the MCP group, within a space between the acceleration electrode and the anode. | 04-10-2014 |
20140183354 | FLIGHT TIME BASED MASS MICROSCOPE SYSTEM FOR ULTRA HIGH-SPEED MULTI MODE MASS ANALYSIS - The present invention aims to provide a time-of-flight based mass microscope system for an ultra-high speed multi-mode mass analysis, for using a laser beam or an ion beam simultaneously to enable both a low molecular weight analysis such as for drugs/metabolome/lipids/peptides and a high molecular weight analysis such as for genes/proteins, without being limited by the molecular weight of the object being analyzed, and for significantly increasing the measuring speed by using a microscope method instead of a microprobe method. | 07-03-2014 |
20140191124 | ARRANGEMENT FOR A REMOVABLE ION-OPTICAL ASSEMBLY IN A MASS SPECTROMETER - Presented is a mass spectrometer comprising an ion path along which ions are transported between different sections of the mass spectrometer, and further comprising an arrangement with a receptacle being located along the ion path in the mass spectrometer and a complementary mount for carrying a removable ion-optical assembly, such as a carrier of electrodes for a MALDI ion source, wherein the mount can be removed from and reinserted into the receptacle in a plane approximately perpendicular to an ion path axis. | 07-10-2014 |
20140264011 | ORTHOGONAL ACCELERATION SYSTEM FOR TIME-OF-FLIGHT MASS SPECTROMETER - An orthogonal pulse accelerator for a Time-of-Flight mass analyzer includes an electrically-conductive first plate extending in a first plane, and a second plate spaced from the first plate. The second plate includes a grid that defines a plurality of apertures each having a first dimension extending in a first direction and a second dimension orthogonal to the first dimension, the first and second dimensions lying in the second plane and the second dimension begin larger than the first dimension. The first and second plates are positioned in the Time-of-Flight mass analyzer to receive, during operation of the mass analyzer, an ion beam propagating in the first direction in a region between the first and second plates, and the orthogonal pulse accelerator directs ions in the ion beam through the apertures. | 09-18-2014 |
20140299763 | APPARATUS FOR ELEMENTAL ANALYSIS OF PARTICLES BY MASS SPECTROMETRY - A mass spectrometer has a particle introduction system and a vaporizer, atomizer, and ionizer configured to produce ions from elements associated with the particle. An ion mass-to-charge ratio analyzer is configured to separate ions according to their mass-to-charge ratio. A detector is positioned to detect at least some of the separated ions. A digital processor is configured to: (a) acquire data from the detector including at least first data in a primary detection group defined to comprise one or more mass-to-charge ratio channels of the mass spectrometer; (b) determine whether or not ions detected during at least one sampling cycle meet at least one selection criterion indicating a presence of a particle in the mass spectrometer; and (c) determine whether or not to use data in a secondary detection group based on whether or not the at least one selection criterion is met. | 10-09-2014 |
20140339422 | MASS SPECTROMETER - A mass spectrometer including chromatogram creation means for creating a chromatogram showing changes over time in an ion intensity within a predetermined mass range based on the MS analysis results, and timing determination means for determining a timing to perform MS/MS analysis based on the chromatogram. The timing determination means determines, as a timing to perform MS/MS analysis, a point in time at which a signal intensity in the chromatogram reaches a predetermined upper limit after exceeding a predetermined lower limit or a point in time at which a signal intensity in the chromatogram reaches a top of a peak without reaching the upper limit after exceeding the lower limit. It is thus possible to collect precursor ions at a timing at which the signal intensity of a peak originating from sample components is highest between the upper limit and lower limit, thereby obtaining a high quality MS/MS spectrum. | 11-20-2014 |
20140346346 | AC GATE ION FILTER METHOD AND APPARATUS - The present invention uses an AC voltage instead of DC voltage on an ion gate to filter/selectively pass ions. The ions that pass through the AC ion gate can be further separated in a spectrometric instrument. An ion mobility spectrometer using the AC ion gate can achieve better gating performance. For a time of flight ion mobility spectrometer with an AC ion gate, a narrow pulse of selected ions can be passed into a drift tube where they are separated based on their low field ion mobility. Moreover, when the AC voltage at the AC ion gate has a waveform as used for differential ion mobility spectrometry, the time of flight ion mobility spectrometer is converted into a two dimensional separation spectrometer, where ions are first separated based on their high field ion mobility and then further separated based on their low field ion mobility. | 11-27-2014 |
20140353493 | ION MOBILITY SPECTROMETRY-MASS SPECTROMETRY (IMS-MS) WITH IMPROVED ION TRANSMISSION AND IMS RESOLUTION - An interface for an ion mobility spectrometry-mass spectrometry (IMS-MS) system includes a first ion guide for receiving ions from an IMS drift cell, and a second ion guide for receiving ions from the first ion guide, and positioned in a chamber separate from the first ion guide. Electrodes of the second ion guide subject the ions to an axial DC electric field while the second ion guide is held at a lower pressure than the first ion guide. In some embodiments, the first ion guide may be an ion funnel and the second ion guide may be a linear multipole device. | 12-04-2014 |
20140361163 | MASS SPECTROMETER AND METHOD OF DRIVING ION GUIDE - A method of operating an electrode changeover switch which switches the connection state of electrodes, the electrode changeover switch is provided in the wiring path between eight electrodes through, arranged rotation-symmetrically about ion optical axis, and voltage generation switch which generates square wave high voltage ±V. When switch is switched as shown in the drawing, two circumferentially adjacent rod electrodes are connected to form one set, a square wave voltage of opposite phase is applied to circumferentially adjacent sets, and an effectively quadrupole electric field is formed. When switch is switched, a square wave voltage of opposite phase is applied to circumferentially adjacent rod electrodes and an octupole electric field is formed. In this way, by switching the switch according to the mass range, etc., it becomes possible to rapidly switch the number of poles of a multipole electric field and to suitably transport ions. | 12-11-2014 |
20150014524 | TIME OF FLIGHT TUBES AND METHODS OF USING THEM - Certain embodiments described herein are directed to time of flight tubes comprising a cylindrical tube comprising an inner surface and an outer surface, the cylindrical tube comprising an effective thickness and sized and arranged to couple to and support a reflectron assembly inside the cylindrical tube. In some configurations, the cylindrical tube further comprises a conductive material disposed on the inner surface of the cylindrical tube, the conductive material present in an effective amount to provide a field free region for ions when the conductive material is charged. | 01-15-2015 |
20150014525 | SYSTEMS AND METHODS FOR TRANSFER OF IONS FOR ANALYSIS - The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device. | 01-15-2015 |
20150028201 | ARRANGEMENT FOR A REMOVABLE ION-OPTICAL ASSEMBLY IN A MASS SPECTROMETER - Presented is a mass spectrometer comprising an ion path along which ions are transported between different sections of the mass spectrometer, and further comprising an arrangement with a receptacle being located along the ion path in the mass spectrometer and a complementary mount for carrying a removable ion-optical assembly, such as a carrier of electrodes for a MALDI ion source, wherein the mount can be removed from and reinserted into the receptacle in a plane approximately perpendicular to an ion path axis. | 01-29-2015 |
20150028202 | REFLECTRONS AND METHODS OF PRODUCING AND USING THEM - Certain embodiments described herein are directed to reflectron assemblies and methods of producing them. In some configurations, a reflectron comprising a plurality of lenses each comprising a planar body and comprising a plurality of separate and individual conductors spanning a central aperture from a first side to a second side of a first surface of the planar body is described. In some instances, the plurality of conductors are each substantially parallel to each other and are positioned in the same plane. | 01-29-2015 |
20150034821 | IONIZATION APPARATUS, MASS SPECTROMETER INCLUDING IONIZATION APPARATUS, AND IMAGE FORMING SYSTEM - Provided is an ionization apparatus including: a holder configured to hold a sample; a probe configured to determine a part to be ionized of the sample held by the holder; an extract electrode configured to extract ionized ions of the sample; a liquid supply unit configured to supply liquid to a part of a region of the sample; and a unit configured to apply a first voltage between the probe and the extract electrode, in which the first voltage is pulse-modulated. | 02-05-2015 |
20150144783 | GLYCOPEPTIDE ANALYZER - The same sample S is analyzed using an ion-trap (IT) mass spectrometer section | 05-28-2015 |
20150294849 | Multireflection Time-of-flight Mass Spectrometer - A method of reflecting ions in a multireflection time of flight mass spectrometer is disclosed. The method includes guiding ions toward an ion mirror having multiple electrodes, and applying a voltage to the ion mirror electrodes to create an electric field that causes the mean trajectory of the ions to intersect a plane of symmetry of the ion mirror and to exit the ion mirror, wherein the ion are spatially focussed by the mirror to a first location and temporally focused to a second location different from the first location. Apparatus for carrying out the method is also disclosed. | 10-15-2015 |
20150318156 | ION OPTICAL ELEMENTS - Ion optics devices and related methods of making and using the same are disclosed herein that generally involve forming a plurality of electrode structures on a single substrate. An aspect ratio of the structures relative to a plurality of recesses which separate the structures can be selected so as to substantially prevent ions passing through the finished device from contacting exposed, electrically-insulating portions of the substrate. The substrate material can be a material that is relatively inexpensive and easy to machine into complex shapes with high precision (e.g., a printed circuit board material). In some embodiments, discrete ion optical elements are disclosed which can be formed from a core material to which an electrically- conductive coating is applied, the core material being relatively inexpensive and easy to machine with high precision. The coating can be configured to substantially prevent outgassing from the core under the vacuum conditions typically experienced in a mass spectrometer. | 11-05-2015 |
20150357176 | MASS ANALYSIS DEVICE AND MASS SEPARATION DEVICE - An object of the present invention is to provide a mass spectrometer and a mass separator whose design and performance are less restricted by problems arising from the principle of operation, and which have in principle no limitation on the mass-to-charge ratio range to be able to deal with and are each capable of repeatedly analyzing or extracting plural ionic species of different mass-to-charge ratios in a short time. | 12-10-2015 |
20160005583 | REFLECTORS FOR TIME-OF-FLIGHT MASS SPECTROMETERS - The invention relates to reflectors for time-of-flight mass spectrometers, and especially their design. A Mamyrin reflector is provided which consists of metal plates with cut-out internal apertures, and symmetric shielding edges which are set back from the inner edges. The dipole field formed by these shielding edges penetrates only slightly through the plates and into the interior of the reflector. With a good mechanical design, the resolving power of the time-of-flight mass spectrometer increases by around fifteen percent compared to the best prior art to date. | 01-07-2016 |
20160035558 | Multi-Reflecting Mass Spectrometer - To improve spatial and energy acceptance of multi-reflecting time-of-flight, open traps, and electrostatic trap analyzers, a novel ion mirror is disclosed. Incorporation of immersion lens between ion mirrors allows reaching the fifth order time per energy focusing simultaneously with the third order time per spatial focusing including energy-spatial cross terms. Preferably the analyzer has hollow cylindrical geometry for extended flight path. The time-of-flight analyzer preferably incorporates spatially modulated ion mirror field for isochronous ion focusing in the tangential direction. | 02-04-2016 |
20160071714 | ION GUIDING DEVICE AND ION GUIDING METHOD - An ion guiding device ( | 03-10-2016 |
20160093483 | Method of Generating Electric Field for Manipulating Charged Particles - A method of manufacturing a device for manipulating charged particles using an axial electric field as they travel along a longitudinal axis of the device is disclosed. The method comprises providing first electrodes of different lengths, supplying different voltages to these electrodes and arranging grounded electrodes between the first electrodes in order to form the desired axial potential profile. | 03-31-2016 |
20160099139 | MASS MICROSCOPE APPARATUS - A mass microscope apparatus includes: a measuring unit including an ionization unit configured to ionize a sample present in an observation region, and a mass spectrometry unit configured to perform mass spectrometry of ions generated by the ionization unit; an object moving device configured to relatively move the observation region as to the sample; and a switching unit configured to switch measurement conditions of the measuring unit depending on whether the mass microscope apparatus is operating in a moving measurement mode where the observation region is moved by the object moving device to sequentially perform measurement by the measuring unit, and a stationary measurement mode where the observation region is stationary and measurement is performed by the measuring unit. | 04-07-2016 |
20160148795 | TIME-OF-FLIGHT MASS SPECTROMETERS WITH CASSINI REFLECTOR - The invention relates to embodiments of high-resolution time-of-flight (TOF) mass spectrometers with special reflectors. The invention provides reflectors with ideal energy and solid angle focusing, based on Cassini ion traps, and proposes that a section of the flight path of the TOF mass spectrometers takes the form of a Cassini reflector. It is particularly favorable to make the ions fly through this Cassini reflector in a TOF mass spectrometer at relatively low energies, with kinetic energies of below one or two kiloelectronvolts. This results in a long, mass-dispersive passage time in addition to the time of flight of the other flight paths, without increasing the energy spread, angular spread or temporal distribution width of ions of the same mass. It is also possible to place several Cassini reflectors in series in order to extend the mass-dispersive time of flight. Several TOF mass spectrometers for axial as well as orthogonal ion injection with Cassini reflectors are presented. | 05-26-2016 |
20160148796 | CONSTRAINING ARCUATE DIVERGENCE IN AN ION MIRROR MASS ANALYSER - A charged particle analyzer apparatus comprising two opposing ion mirrors each mirror comprising inner and outer field-defining electrode systems elongated along an axis z, the outer system surrounding the inner, whereby when the electrode systems are electrically biased the mirrors create an electrical field comprising opposing electrical fields along z; and at least one arcuate focusing lens for constraining the arcuate divergence of a beam of charged particles within the analyzer whilst the beam orbits around the axis z, the analyzer further comprising a disc having two faces at least partly spanning the space between the inner and outer field defining electrode systems and lying in a plane perpendicular to the axis z, the disc having resistive coating upon both faces. A mass spectrometer system comprising a plurality of the charged particle analyzers arranged as a parallel array. | 05-26-2016 |
20160163526 | Mass Spectrometer - A mass spectrometer is disclosed comprising a time of flight mass analyser. The time of flight mass analyser comprises an ion guide comprising a plurality of electrodes which are interconnected by a series of resistors forming a potential divider. Ions are confined radially within the ion guide by the application of a two-phase RF voltage to the electrodes. A single phase additional RF voltage is applied across the potential divider so that an inhomogeneous pseudo-potential force is maintained along the length of the ion guide. | 06-09-2016 |
20160189946 | ION TRANSPORT APPARATUS AND MASS SPECTROMETER USING THE SAME - Within an intermediate vacuum chamber next to an ionization chamber maintained at atmospheric pressure, an electrode group of a radio-frequency carpet composed of a plurality of concentrically arranged ring electrodes is placed before a skimmer, with its central axis coinciding with that of an ion-passing hole. Each ring electrode has a circular radial sectional shape. Radio-frequency voltages with mutually inverted phases are applied to the ring electrodes neighboring each other in the radial direction. Additionally, a different level of direct-current voltage is applied to each ring electrode to create a potential which is sloped downward from the outer ring electrode to the inner ring electrode. The circular cross section of the electrode produces a steep pseudo-potential near the electrode and thereby increases the repulsive force which acts on the ions to repel them from the electrode. | 06-30-2016 |
20160254134 | MASS SPECTROMETER AND LIQUID-METAL ION SOURCE FOR A MASS SPECTROMETER OF THIS TYPE | 09-01-2016 |
20170236701 | TIME-OF-FLIGHT MASS SPECTROMETER | 08-17-2017 |