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Electricity: electrical systems and devices

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Class / Patent application numberDescriptionNumber of patent applications / Date published
361600000 HOUSING OR MOUNTING ASSEMBLIES WITH DIVERSE ELECTRICAL COMPONENTS 11908
361001000 SAFETY AND PROTECTION OF SYSTEMS AND DEVICES 2702
361271000 ELECTROSTATIC CAPACITORS 1100
361500000 ELECTROLYTIC SYSTEMS OR DEVICES 942
361230000 ELECTRIC CHARGE GENERATING OR CONDUCTING MEANS (E.G., CHARGING OF GASES) 294
361139000 CONTROL CIRCUITS FOR ELECTROMAGNETIC DEVICES 210
361212000 DISCHARGING OR PREVENTING ACCUMULATION OF ELECTRIC CHARGE (E.G., STATIC ELECTRICITY) 187
361247000 IGNITING SYSTEMS 39
361225000 ELECTRIC CHARGING OF OBJECTS OR MATERIALS 28
361268000 TRANSFORMERS AND INDUCTORS WITH INTEGRAL SWITCH, CAPACITOR, OR LOCK (E.G., IGNITION COIL) 21
361211000 CONTROL CIRCUITS FOR NONELECTROMAGNETIC TYPE RELAY (E.G., THERMAL RELAYS) 15
361437000 MISCELLANEOUS 5
20110194230PROTECTING DEVICES FROM IMPACT DAMAGE - A system and method for protecting devices from impact damage is provided. Prior to impact between a surface and a device, a determination of a risk of damage to the device is made. If the risk of damage to the device exceeds a threshold, a protection system is activated to reduce or substantially eliminate damage to the device.08-11-2011
20120194967SIGNAL-PROCESSING DEVICES HAVING ONE OR MORE MEMRISTORS - Signal-processing devices having memristors are described for performing frequency-discrimination functions, amplitude-discrimination functions, and time-oriented functions. In each case, the time-domain behavior of the memristors described herein enables these functions to be performed. In one embodiment, memristance of an arrangement of memristors of a device is, after an initial transitional period, predominantly at a first level if frequency of an input signal of the device is less than a first frequency and predominantly at a second level if the frequency of the input signal is greater than a second frequency.08-02-2012
20100110610ELECTRONIC DEVICE - An electronic device including electronics arranged in an electronics compartment and having electronic and/or electromechanical components. The device automatically detects and/or monitors wear of its electronic and/or electromechanical components and includes an apparatus for detecting and/or monitoring wear of the electronic and/or electromechanical components. Included is at least one element arranged in the electronics compartment. This element is independent of the electronics and has at least one physical property, which changes irreversibly as a function of wear of the element. The apparatus further includes a circuit for measuring the physical property, and an evaluating unit, which, based on the measured physical property, detects and/or monitors wear of the element and makes available a wear-dependent output signal.05-06-2010
20080285206Vaux box - This invention uses the new concept of converting RCA or YCbCr to your computer monitor (SCSI). Although all computers are different, the connection for the computer monitor may differ depending on the computer brand.11-20-2008
20110235237ELECTRONIC APPARATUS - An electronic apparatus fixes a level to a level set by a level setting member when a detection unit detects that a lock member is operated to be brought into a lock state, and invalidates setting of the level made by the level setting member. After the detection unit detects that the lock member is operated to release the lock state, at the time the level setting member is operated, releases the fixation of the level.09-29-2011
361236000 ELECTRICAL SPEED SIGNAL PROCESSING SYSTEMS 3
20080291597Scanning beam device having different image acquisition modes - A method of one aspect may include monitoring movement of a scanning beam image acquisition device. Images may be acquired with the scanning beam image acquisition device using a first image acquisition mode when the monitoring indicates that the scanning beam image acquisition device is moving. Images may be acquired with the scanning beam image acquisition device using a second image acquisition mode when the monitoring indicates that the scanning beam image acquisition device is substantially still. The second image acquisition mode is different than the first image acquisition mode. In one aspect, the first mode has a relatively higher frame rate and relatively lower number of lines of image resolution than the second mode.11-27-2008
20080304201VOLTAGE SIGNAL CONVERTER CIRCUIT AND MOTOR - In a voltage signal converter circuit, a peak hold circuit, which is configured with an operational amplifier, a diode, and a capacitor, receives a sensor voltage signal and outputs a peak voltage signal. A bottom hold circuit, which is configured with an operational amplifier, a diode, and a capacitor, receives a sensor voltage signal and outputs a bottom voltage signal. An intermediate voltage signal generator circuit receives the peak voltage signal and the bottom voltage signal and generates an intermediate voltage signal having an intermediate value between a peak voltage value and a bottom voltage value. A comparator generates an accurate rectangular wave voltage signal having a duty ratio equal to 50% in accordance with a magnitude correlation between a sensor voltage value and an intermediate voltage value.12-11-2008
20090190283PREDICTIVE PHASE LOCKED LOOP SYSTEM - A phase locked loop (PLL) circuit includes a first signal detector having a first input terminal configured to receive a varying first input signal, a second input terminal configured to receive a feedback signal that corresponds to the center of the input frequency, and an output terminal configured to provide an output signal corresponding to a phase difference between the first input and feedback signals. A delay estimator has an input terminal configured to receive the output signal from the first phase detector and in response thereto, output a phase difference estimation signal. A variable delay circuit has an input terminal configured to receive the phase difference estimation signal and in response thereto, phase shift the second input signal.07-30-2009
361245000 POLARITY REVERSING 2
20080291598OUTPUT STAGE AND RELATED LOGIC CONTROL METHOD APPLIED TO SOURCE DRIVER/CHIP - Output stage and related method applied to source driver/chip of LCD panel. While performing dot polarization inversion for even/odd channels of LCD panel, n-channel and p-channel MOS transistors of symmetric layout are respectively adopted for alternately transmitting a positive polarization signal of higher swing range and a negative polarization signal of lower swing range from corresponding drivers of asymmetric layout to the even/odd channels, such that a layout area for alternating polarizations can be reduced. Also, the invention directly ties inputs of the output drivers to V11-27-2008
20100182729METHOD OF OPERATING TRANSISTORS AND STRUCTURES THEREOF FOR IMPROVED RELIABILITY AND LIFETIME - Embodiments of the present invention provide a semiconductor device that includes a transistor device having a first, a second, and a third node; and an interconnect structure having at least one wire and the wire having a first and a second end with the first end of the wire being connected to one of the first, the second, and the third node of the transistor device. The wire is conductive and adapted to provide an operating current in a first direction during a normal operating mode, and adapted to provide a repairing current in a second direction opposite to the first direction during a repair mode of the semiconductor device. In one embodiment the transistor device is a bipolar transistor with the first, second, and third nodes being an emitter, a base, and a collector of the bipolar transistor. The wire is connected to one of the emitter and the collector. Method of operating the semiconductor device and current supplying circuit for the semiconductor device are also disclosed.07-22-2010
361267000 DEMAGNETIZING SYSTEMS AND PROCESSES 1
20130094117METHOD AND APPARATUS FOR DEMAGNETIZING GENERATOR COMPONENTS PRIOR TO ELECTROMAGNETIC CORE IMPERFECTION TESTING OR EL-CID TESTING - A method and apparatus for determining and for reducing magnetism in a generator stator core (04-18-2013

Patent applications in class Electricity: electrical systems and devices

Patent applications in all subclasses Electricity: electrical systems and devices