Inventors list |
Agents list |
Assignees list |
List by place |
Classification tree browser |
Top 100 Inventors |
Top 100 Agents |
Top 100 Assignees |
HIGHLANDS RANCH, CO US
1. 20110043382 AIRCRAFT CABIN NOISE EXPOSURE ANALYSIS - Systems and methods for aircraft cabin noise analysis are disclosed 02-24-20112. 20100319455 DAMAGE VOLUME AND DEPTH ESTIMATION - In one embodiment a system to characterize an anomaly in a laminate structure comprises a plurality of actuators to 12-23-2010
3. 20100313545 GAS TURBINE ENGINE NOZZLE CONFIGURATIONS 12-16-2010
4. 20100302065 Environmental Sensor System - In one embodiment a system to detect one or more environmental conditions in proximity to a surface comprises a first 12-02-2010
5. 20100300202 GYROSCOPE PACKAGING ASSEMBLY - Packaging techniques for planar resonator gyroscopes, such as disc resonator gyroscopes are disclosed 12-02-2010
6. 20100241490 EVALUATING EXTENDED SUPPLY CHAINS - Techniques described herein generally relate to evaluating extended supply chains 09-23-2010
7. 20100217988 ELECTRONIC DOCUMENT MANAGEMENT AND DELIVERY 08-26-2010
8. 20100170896 Collapsible cargo organizer - organizer for holding and organizing cargo comprises a case and a collapsible wall 07-08-2010
9. 20100063653 SINGULARITY ESCAPE AND AVOIDANCE USING A VIRTUAL ARRAY ROTATION 03-11-2010
10. 20100023188 SINGULARITY ESCAPE AND AVOIDANCE USING A VIRTUAL ARRAY ROTATION 01-28-2010
11. 20100013703 GPS GYRO CALIBRATION - methods and systems are described 01-21-2010
12. 20090300745 ENHANCED MULTI FACTOR AUTHENTICATION - In one embodiment, a network element comprises one or more processors, and a memory module communicatively 12-03-2009
13. 20090251069 SYSTEMS AND METHODS FOR LIGHTING CONTROL IN FLIGHT DECK DEVICES 10-08-2009
14. 20090172981 Three-dimensional sign and method of making same 07-09-2009
15. 20090154687 METHOD AND APPARATUS TO ALLOW CUSTOMERS TO INITIATE CALL CENTER CONTACT 06-18-2009
16. 20090073440 System and method for detecting surface features on a semiconductor workpiece surface 03-19-2009
17. 20080304078 METHOD AND APPARATUS FOR OPTICALLY ANALYZING A SURFACE 12-11-2008
18. 20080304057 SYSTEM AND METHOD FOR CONTROLLING LIGHT SCATTERED FROM A WORKPIECE SURFACE IN A SURFACE INSPECTION SYSTEM 12-11-2008
19. 20080285053 MEASURING THE SHAPE, THICKNESS VARIATION, AND MATERIAL INHOMOGENEITY OF A WAFER 11-20-2008
20. 20080245958 SYSTEM AND METHOD TO CREATE HAZE STANDARD 10-09-2008
21. 20080225267 Optical Measurement Apparatus and Method 09-18-2008
22. 20080218741 Optical Inspection Apparatus and Method - In one embodiment a modulation spectroscopy method comprises the steps of directing a probe beam and a pump 09-11-2008
23. 20080198385 Integrated Visible Pilot Beam for Non-Visible Optical Waveguide Devices 08-21-2008