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PLACERVILLE, CA US
1. 20100213960 Probe Card Test Apparatus And Method - probe card analyzer mounts on a probe card in a wafer prober and a use a fixture in the wafer probe and switch 08-26-20102. 20100150716 CYCLICAL WAVE ENERGY CONVERTER - Systems and methods use cyclical propellers with dynamic blade angle control to extract power from waves 06-17-2010
3. 20100001029 WHEEL-LESS CARGO CARRIER WITH EXTENDABLE BEAMS 01-07-2010
4. 20090323321 Authoring, recording, and replication of lighting 12-31-2009
5. 20090167884 Self-Similar Capture Systems - image capture system providing self-similar image elements 07-02-2009
6. 20090102146 MULTI-EDGE SNOWBOARD - includes multiple boards with attached bindings 04-23-2009
7. 20090064498 Membrane spring fabrication process - Processes are described for building low compliance MEMS type C-spring probes in a coupon form that can be used as 03-12-2009