XSENSOR TECHNOLOGY CORPORATION Patent applications |
Patent application number | Title | Published |
20140109697 | PRESSURE SENSOR CARRIER - A pressure sensor carrier system of fasteners is provided for conveniently and removably attaching a pressure sensor carrier to the top surface of a bed mattress in a manner that minimizes stress concentrations, wrinkles and folds in the carrier. The carrier includes pliable elastic straps at each corner and articulated semi-rigid flaps at each longitudinal side. The tension in the elastic straps and the position of the articulated flaps are independently adjustable to accommodate mattresses of different dimensions. | 04-24-2014 |
20130283530 | Bedding System with Support Surface Control - A bedding system uses machine vision to makes adjustments for comfort and/or support. In one aspect, a pressure mapping engine measures a two-dimensional pressure image of a sleeper on the bedding system while the sleeper is sleeping on the bedding system. A machine vision process analyzes the pressure image. A comfort and support engine adjusts a comfort and/or support of the bedding system based on the machine vision analysis. | 10-31-2013 |
20130144751 | Graphical Display for Recommending Sleep Comfort and Support Systems - A pressure sensor measures the surface pressure distribution of a body supported by a surface, for example a person lying on a mattress. In one approach, a pressure mapping system acquires a customer's pressure map using a reference mattress and presents this pressure data in the form of a pressure map. The pressure map measurement data is then analyzed to determine body characterizing parameters such as body mass index, contact area and average peak pressure. The pressure map measurements are then located on a mattress category grid that has been referenced and aligned to a large population sample of measurements taken with a reference mattress. Alternatively, the pressure map measurements are matched to a physical profile category within a database. Each category provides ranked mattress recommendations based on selection and ranking criteria derived from pressure map data obtained from a large sample of test subjects. In this way, a customer's pressure map can be translated to a recommendation of specific mattresses or mattress categories that are offered by a mattress retailer or manufacturer. | 06-06-2013 |
20130006151 | RISK MODELING FOR PRESSURE ULCER FORMATION - A method for modelling pressure exposure and/or the risk of pressure ulcer formation includes steps of using pressure sensors to derive pressure exposure or risk values and displaying the pressure exposure or risk values in a graphical manner to a user. Computer-implemented systems includes a pressure-sensing interface mat and components for implementing the steps of the methods. | 01-03-2013 |
20110120228 | CAPACITIVE PRESSURE SENSOR - A capacitive pressure sensor array is made of two conductive layers, wherein each conductive layer is formed with a plurality of elongated conductors disposed in a substantially parallel manner between an upper and a lower insulating sheet, wherein the upper and lower insulating sheets are bonded to each other between adjacent conductors. | 05-26-2011 |
20100282000 | DIELECTRIC TEXTURED ELASTOMER IN A PRESSURE MAPPING SYSTEM - A capacitance pressure mapping system includes a plurality of sensor cells created by the intersection of electrode columns and rows, and a solid elastomer dielectric separating the electrode columns and rows. The elastomer is at least one planar sheet having a surface comprising a pattern of projections. There may be two sheets having opposing patterns of projections. The opposing patterns may be interlocking or corresponding. | 11-11-2010 |
20090216466 | CAPACITATIVE NODE MEASUREMENT IN A CAPACITATIVE MATRIX PRESSURE INDUCER - A method and system for measuring the distribution of pressure forces over a selected area includes a sensor having an array of pressure sensing capacitance nodes formed by intersecting rows and columns, where measured capacitance of a node is compared to a fixed value of reference capacitance placed on each row that can be measured as if it was another node. | 08-27-2009 |