| Willtechnology Co., Ltd. Patent applications |
| Patent application number | Title | Published |
|---|
| 20090261850 | Probe card - Disclosed is a probe card capable of simplifying the manufacturing process and the repair work. The probe card includes a printed circuit board including a substrate through hole; at least one probe substrate disposed on the printed circuit board; at least one probe including a probe body supported by the probe substrate and a probe lead part extending from the probe body to an inside of the substrate through hole in the printed circuit board; and a guide block disposed between the printed circuit board and the probe substrate, and including a block through hole through which the probe lead part passes, wherein the probe is fixed to the probe substrate by moving the guide block in a Y axis direction so that the probe lead part is bent in the Y axis direction. | 10-22-2009 |
| 20090260459 | Probe substrate and probe card having the same - A probe card includes a printed circuit board; at least one probe substrate including a probe substrate body disposed on the printed circuit board and at least one probe through hole extending by passing through the probe substrate body; and at least one probe including a probe body supported by the probe substrate and a probe lead part extending from the probe body to an inside of the probe through hole in the printed circuit board, wherein the probe substrate body includes at least one fixing slit which extends in an X axis direction at one side surface of the probe substrate body where the probe body is exposed, and has a width substantially equal to a thickness of the probe; and at least some of the probe bodies are received in the fixing slit so that the probes are arranged in the a Y axis direction. | 10-22-2009 |
| 20080265920 | PROBE CARD - Disclosed is a probe card providing an upper structure formed to be separatable from a lower structure and a lower structure including a lower substrate electrically connected with a plurality of the needles and a plurality of the lower terminals independently connected with the needles formed above the lower substrate. In particular, the lower structure of the probe card includes a needle fixing structure, a plurality of the needles fixed on the needle fixing structure, a lower substrate provided on the needle fixing structure while electrically connecting with the needles, and a plurality of the lower terminals formed on the upper surface of the lower substrate in order to be independently connected with the each needle. Meanwhile, the upper structure separatable from the lower structure includes a main substrate and a plurality of the upper terminals formed on the lower surface corresponding to the lower terminals. | 10-30-2008 |
