| VITA ZAHNFABRIK H. RAUTER GMBH & CO. KG Patent applications |
| Patent application number | Title | Published |
|---|
| 20120008145 | SYSTEM AND METHOD FOR CALIBRATING OPTICAL CHARACTERISTICS - A miniaturized spectrometer/spectrophotometer system and methods are disclosed. A probe tip including one or more light sources and a plurality of light receivers is provided. A first spectrometer system receives light from a first set of the plurality of light receivers. A second spectrometer system receives light from a second set of the plurality of light receivers. A processor, wherein the processor receives data generated by the first spectrometer system and the second spectrometer system, wherein an optical measurement of a sample under test is produced based on the data generated by the first and second spectrometer systems. | 01-12-2012 |
| 20110235039 | MINIATURIZED SYSTEM AND METHOD FOR MEASURING OPTICAL CHARACTERISTICS - A miniaturized spectrometer/spectrophotometer system and methods are disclosed. A probe tip including one or more light sources and a plurality of light receivers is provided. A first spectrometer system receives light from a first set of the plurality of light receivers. A second spectrometer system receives light from a second set of the plurality of light receivers. A processor, wherein the processor receives data generated by the first spectrometer system and the second spectrometer system, wherein an optical measurement of a sample under test is produced based on the data generated by the first and second spectrometer systems. | 09-29-2011 |
| 20110128544 | SYSTEM AND METHOD FOR CALIBRATING OPTICAL CHARACTERISTICS - A miniaturized spectrometer/spectrophotometer system and methods are disclosed. A probe tip including one or more light sources and a plurality of light receivers is provided. A first spectrometer system receives light from a first set of the plurality of light receivers. A second spectrometer system receives light from a second set of the plurality of light receivers. A processor, wherein the processor receives data generated by the first spectrometer system and the second spectrometer system, wherein an optical measurement of a sample under test is produced based on the data generated by the first and second spectrometer systems. | 06-02-2011 |
| 20110006450 | DENTAL SINTERING FURNACE AND METHOD FOR SINTERING CERAMIC DENTAL ELEMENTS - A dental sintering furnace for sintering ceramic dental elements comprises a receiving chamber ( | 01-13-2011 |
| 20100291510 | SYSTEM AND METHOD FOR CALIBRATING OPTICAL CHARACTERISTICS - A miniaturized spectrometer/spectrophotometer system and methods are disclosed. A probe tip including one or more light sources and a plurality of light receivers is provided. A first spectrometer system receives light from a first set of the plurality of light receivers. A second spectrometer system receives light from a second set of the plurality of light receivers. A processor, wherein the processor receives data generated by the first spectrometer system and the second spectrometer system, wherein an optical measurement of a sample under test is produced based on the data generated by the first and second spectrometer systems. | 11-18-2010 |
| 20100055638 | SUPPLY SYSTEM FOR TOOTH SAMPLES - A supply system for tooth samples for determining brightness, chroma and/or shade of natural and/or bleached teeth, has a plurality of receiving elements ( | 03-04-2010 |
| 20090190133 | MINIATURIZED SYSTEM AND METHOD FOR MEASURING OPTICAL CHARACTERISTICS - A miniaturized spectrometer/spectrophotometer system and methods are disclosed. A probe tip including one or more light sources and a plurality of light receivers is provided. A first spectrometer system receives light from a first set of the plurality of light receivers. A second spectrometer system receives light from a second set of the plurality of light receivers. A processor, wherein the processor receives data generated by the first spectrometer system and the second spectrometer system, wherein an optical measurement of a sample under test is produced based on the data generated by the first and second spectrometer systems. | 07-30-2009 |
