| VIRGIN INSTRUMENTS CORPORATION Patent applications |
| Patent application number | Title | Published |
|---|
| 20110266431 | Tandem TOF Mass Spectrometer With High Resolution Precursor Selection And Multiplexed MS-MS And MS-MS Operation - A tandem time-of-flight mass spectrometer includes a first TOF mass analyzer that generates an ion beam comprising a plurality of precursor ions and that selects a group of precursor ions from the plurality of precursor ions. A first pulsed ion accelerator accelerates the selected group of precursor ions. A first ion fragmentation chamber fragments at least some of the selected group of precursor ions. A second pulsed ion accelerator accelerates the selected group of precursor ions and fragments thereof. A second ion fragmentation chamber further fragments at least some of the selected group of precursor ion fragments. A second TOF mass analyzer separates the fragments and detects a fragment ion mass spectrum. | 11-03-2011 |
| 20110155901 | Merged Ion Beam Tandem TOF-TOF Mass Spectrometer - A tandem time-of-flight mass spectrometer includes a first pulsed ion source that produces ions with a first mass and charge that directs the ions into a first stage of a tandem TOF mass spectrometer. In addition, a second pulsed ion source produces ions with a second mass and an opposite charge directs the ions into the first stage of the tandem TOF mass spectrometer. A field-free reaction region is positioned in the ion flight path so that ions from first and second pulsed ion source arrive at the entrance of the field-free reaction region substantially simultaneously in at least one of time and space. At least some of the ions from the first and second pulsed ion source are fragmented by ion-ion collision between positive and negative ions. A second stage of the tandem mass spectrometer separates fragment ions produced in the reaction region according to their mass-to-charge ratio. | 06-30-2011 |
| 20110049350 | Tandem TOF Mass Spectrometer With Pulsed Accelerator To Reduce Velocity Spread - A tandem TOF mass spectrometer includes a pulsed ion source that generates a pulse of precursor ions from a sample to be analyzed. A first pulsed ion accelerator accelerates and refocuses a predetermined group of precursor ions. A first timed ion passes the predetermined group of precursor ions and rejects substantially all other ions. An ion fragmentation chamber fragments at least some of the precursor ions in the predetermined group. A second timed ion selector selects a predetermined range of masses centered on each precursor in the predetermined group and rejects substantially all other ions. A second pulsed ion accelerator accelerates and refocuses the selected precursor ions and fragments thereof. An ion mirror generates a reflected ion beam. An ion detector detects precursor ions and fragments, wherein a flight time from the second pulsed ion accelerator to the ion detector is dependent on a mass-to-charge ratio of the selected precursor ions and fragments thereof and nearly independent of an initial velocity distribution of ions in the pulse of ions. | 03-03-2011 |
| 20100301202 | Tandem TOF Mass Spectrometer With High Resolution Precursor Selection And Multiplexed MS-MS - A tandem TOF mass spectrometer includes a first TOF mass analyzer that generates an ion beam comprising a plurality of ions and that selects a group of precursor ions from the plurality of ions. A pulsed ion accelerator accelerates and refocuses the selected group of precursor ions. An ion fragmentation chamber is positioned to receive the selected group of precursor ions that is refocused by the pulsed ion accelerator. At least some of the selected group of precursor ions is fragmented in the ion fragmentation chamber. A second TOF mass analyzer receives the selected group of precursor ions and ion fragments thereof from the ion fragmentation chamber and separates the ion fragments and then detects a fragment ion mass spectrum. | 12-02-2010 |
| 20100193681 | Quantitative Measurement Of Isotope Ratios By Time-Of-Flight Mass Spectrometry - A mass spectrometer includes a pulsed ion source that generates an ion beam comprising a plurality of ions. A first timed ion selector passes a first group of ions. A first ion mirror generates a reflected ion beam comprising the first group of ions that at least partially compensates for an initial kinetic energy distribution of the first group of ions. A second timed ion selector passes a second group of ions. A second ion mirror generates a reflected ion beam comprising the second group of ions that at least partially compensates for an initial kinetic energy distribution of the second group of ions. A timed ion deflector deflects the second group of ions to a detector assembly comprising at least two ion detectors which detects the deflected ion beam. | 08-05-2010 |
| 20090294658 | TOF MASS SPECTROMETRY WITH CORRECTION FOR TRAJECTORY ERROR - A time-of-flight mass spectrometer includes a pulsed ion source that generates a pulse of ions from a sample to be analyzed. An ion lens focuses the pulse of ions into an ion beam. An ion deflector deflects the ion beam into a deflected ion beam path. An ion mirror is positioned in the deflected ion beam path so that a plane of constant ion flight time is parallel to an input surface of the ion mirror. The ion mirror decelerates and then accelerates ions so that ions of like mass and like charge exit the ion mirror in a reflected ion beam and reach an ion detector at substantially the same time. An ion detector is positioned in the path of the reflected ion beam so that a plane of constant ion flight time is substantially parallel to an input surface of the ion detector. The ion detector detects a time-of-flight of ions from the pulsed ion source to the ion detector that is substantially independent of a path traveled. | 12-03-2009 |
