Inventors list |
Assignees list |
Classification tree browser |
Top 100 Inventors |
Top 100 Assignees |
VERITY IA, LLC
| VERITY IA, LLC Patent applications | ||
| Patent application number | Title | Published |
|---|---|---|
| 20100231708 | Method of, and Apparatus for, Measuring the Quality of a Surface of a Substrate - A method of measuring the quality of a surface of a substrate is described. The method includes the steps of obtaining a digital image of a portion of a surface of the substrate using an image obtaining apparatus; and measuring one or more physical characteristics of the obtained digital image so as to provide an indication of the quality of the surface of the substrate. | 09-16-2010 |