| UNIVERSITE DE SAVOIE Patent applications |
| Patent application number | Title | Published |
|---|
| 20090274410 | ELECTROOPTIC PROBE FOR MEASURING TEMPERATURE AND ELECTROMAGNETIC FIELD - A device for measuring an electromagnetic field and the temperature in an analysis zone includes a light source for sending a light beam into a polarization-maintaining optical fiber. The light beam is directed along one axis of the fiber. An anisotropic electrooptic material is placed in the zone for receiving the beam from optical fiber and for sending the beam into the fiber. The device further includes an arrangement for analyzing the intensity of the linear wave and a mechanism for determining the variations in the orientation of the linear wave output by phase-shifting means. A quarter-wave plate is inserted between the optical fiber and the crystal, wherein the plate has its axes oriented at substantially 45° to the axes of the optical fiber. | 11-05-2009 |
| 20090262349 | ELECTROOPTIC PROBE FOR VECTOR MEASUREMENT OF AN ELECTROMAGNETIC FIELD - A device for measuring two components of an electromagnetic field in an analysis zone includes a light source for sending a polarized light beam into a polarization-maintaining optical fiber. The beam is directed along one axis of the fiber. An isotropic electrooptic material is placed in the zone for receiving the beam from the optical fiber via a substantially quarter-wave plate, which has its axes oriented at an angle of substantially 45° to the axes of the optical fiber and for sending a beam into the fiber. The plate is slightly detuned in regard to its characteristics or its orientation. The device further includes a phase-shifter for phase-shifting the beam sent into the fiber, wherein the phase-shifter is set so as to impose a phase shift equal and opposite to that imposed by the fiber and mechanism for analyzing the orientation and ellipticity of the wave exiting the phase-shifter. | 10-22-2009 |
