| TROXLER ELECTRONIC LABORATORIES, INC. Patent applications |
| Patent application number | Title | Published |
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| 20120085899 | METHODS, SYSTEMS, AND COMPUTER PROGRAM PRODUCTS FOR MEASURING THE DENSITY OF MATERIAL INCLUDING A NON-NUCLEAR MOISTURE PROPERTY DETECTOR - The subject matter described herein includes methods, systems, and computer program products for measuring the density of a material. According to one aspect, a material property gauge includes a nuclear density gauge for measuring the density of a material. A radiation source adapted to emit radiation into a material and a radiation detector operable to produce a signal representing the detected radiation. A first material property calculation function may calculate a value associated with the density of the material based upon the signal produced by the radiation detector. The material property gauge includes an electromagnetic moisture property gauge that determines a moisture property of the material. An electromagnetic field generator may generate an electromagnetic field where the electromagnetic field sweeps through one or more frequencies and penetrates into the material. An electromagnetic sensor may determine a frequency response of the material to the electromagnetic field across the several frequencies. | 04-12-2012 |
| 20100288053 | GYRATORY COMPACTOR APPARATUSES AND ASSOCIATED METHODS - A gyratory compactor apparatus adapted to interact with a mold that defines a mold axis is provided. The gyratory compactor apparatus includes a frame defining a frame axis and having a first mounting plate and a pivoted support carried by the frame and capable of rotation in at least a first and a second rotational degree of freedom. A mold-engaging device is carried by the pivoted support and includes a first carriage plate proximal the pivoted support and a spaced-apart second carriage plate that defines a space therebetween for receiving the mold. The second carriage plate has at least one clamping rod in communication with an actuator for translating the second carriage plate about the mold axis to thereby secure the mold in the space between the first and second carriage plates. An associated method is also provided. | 11-18-2010 |
| 20100281995 | GYRATORY COMPACTOR APPARATUSES AND ASSOCIATED METHODS - A gyratory compactor apparatus is provided that is adapted to interact with a mold that defines a mold axis. The gyratory compactor apparatus includes a frame that defines a frame axis and has a first mounting plate and a spaced-apart second mounting plate. A pivoted support is carried by the frame and capable of rotation in at least a first and a second rotational degree of freedom. A mold-engaging device is carried by the pivoted support and has a first carriage plate proximal the pivoted support and a second carriage plate axially spaced-apart from the pivoted support for receiving the mold therebetween. At least one actuator having a first end is carried by the frame and a second end is carried by the second carriage plate for imparting lateral translation to the second carriage plate relative to the frame axis. An associated method is also provided. | 11-11-2010 |
| 20100281945 | CALIBRATION OF GYRATORY COMPACTOR APPARATUSES AND ASSOCIATED METHODS - A method for calibrating a gyratory compactor apparatus is provided. The gyratory compactor apparatus is of the type being configured to compact and impart an orbital motion to a sample in a mold that defines a mold axis and includes at least one actuator for imparting lateral displacement of the mold relative to a longitudinal axis of the gyratory compactor apparatus. The method includes the steps of imparting lateral orbital displacement of the mold relative to the gyratory compactor apparatus by actuation of the at least one actuator to thereby define a gyratory angle between the gyratory compactor apparatus and the mold axis, measuring the gyratory angle, and determining adjustments to actuation of the at least one actuator based on the measured gyratory angle and a target angle. An associated apparatus and method for calibrating the apparatus are also included. | 11-11-2010 |
