TransTech Systems, Inc. Patent applications |
Patent application number | Title | Published |
20140278300 | ELECTRONIC EMULATION OF MATERIAL IMPEDANCE FOR STANDARIZATION AND CALIBRATION OF ELECTROMAGNETIC MEASURING DEVICE - Apparatuses, systems, methods, and computer program products are presented for electronically emulating the impedance characteristics of materials, e.g., for standardizing and calibrating electromagnetic measuring devices for the measurement of physical properties of materials. The electronic impedance emulation apparatus according to some embodiments includes an electronic material emulation circuit in communication with the electromagnetic measuring device. The electronic material emulation circuit and the electromagnetic measuring device are controlled by a at least one computing device, which can control the frequency of signal(s) generated by the electromagnetic measuring device. The at least one computing device can instruct the electronic emulator to produce signals having complex impedance characteristics of the material under test at the test frequency. The emulation data can be stored and used for the calibration and/or standardization of the electromagnetic measuring device. | 09-18-2014 |
20140266268 | System and Circuit for Self-Adjusting Impedance Measurement - Various embodiments of the invention relate generally to the measurement of the impedance of materials, electronic devices, or components over a range of frequencies, with a system for self-adjusting an input transmit signal and/or a reference signal to produce a measured signal within a desired range of the electronic measuring components over the frequency range based upon the value of the measured signal. | 09-18-2014 |
20130307564 | IN-PROCESS MATERIAL CHARACTERIZATION - Various embodiments include solutions for in-process material characterization. Various particular embodiments include a computer-implemented method including: providing instructions for transmitting oscillating electromagnetic field signals to a material under test (MUT); obtaining a return signal associated with the transmitted oscillating electromagnetic field signals; comparing the return signal with the oscillating electromagnetic field signals to determine a difference in an aspect of the return signal and the aspect of the oscillating electromagnetic field signals; comparing the difference in the aspect to a predetermined threshold; and determining a characteristic of the MUT based upon the compared difference. | 11-21-2013 |