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TOPCON Corporation
| TOPCON Corporation Patent applications | ||
| Patent application number | Title | Published |
|---|---|---|
| 20120127279 | IMAGE PHOTOGRAPHING DEVICE AND METHOD FOR THREE-DIMENSIONAL MEASUREMENT - An image photographing device for three-dimensional measurement is provided that enables efficient photographing with just sufficient images in a case that a photographer uses a single camera to photograph while moving. An image photographing device | 05-24-2012 |
| 20090039274 | SURFACE CONTAMINATION ANALYZER FOR SEMICONDUCTOR WAFERS, METHOD USED THEREIN AND PROCESS FOR FABRICATING SEMICONDUCTOR DEVICE - A semiconductor wafer is radiated with an electron beam so that the inelastic scattering takes place in the narrow region, and current flows out from the narrow region; the amount of current is dependent on the substance or substances in the narrow region so that the analyst evaluates the degree of contamination on the basis of the substance or substances specified in the narrow region. | 02-12-2009 |