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TOPCON 3D INSPECTION LABORATORIES INC.

TOPCON 3D INSPECTION LABORATORIES INC. Patent applications
Patent application numberTitlePublished
20110241298WAFER FLATTENING APPARATUS AND METHOD - An apparatus and method are disclosed for securing a substantially circular wafer comprising a chuck comprising a plurality of tensioning grooves each comprising at least one arcuate bend having a bend radius substantially less than an outer region radius, and a vacuum source interconnected with each of the grooves. When the wafer is placed upon the surface concentric with the chuck centre and the vacuum source applied to the grooves, the wafer is held securely to the surface.10-06-2011