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Teradyne,Inc.

Teradyne,Inc. Patent applications
Patent application numberTitlePublished
20090063085PMU TESTING VIA A PE STAGE - An apparatus for use in testing a device includes a parametric measurement unit to measure a first signal from the device, and pin electronics to provide a second signal to the device. The pin electronics includes circuitry along a path to the device. The parametric measurement unit is electrically connected to the device via the circuitry to receive the first signal via the circuitry.03-05-2009