Inventors list |
Assignees list |
Classification tree browser |
Top 100 Inventors |
Top 100 Assignees |
Teradyne,Inc.
| Teradyne,Inc. Patent applications | ||
| Patent application number | Title | Published |
|---|---|---|
| 20090063085 | PMU TESTING VIA A PE STAGE - An apparatus for use in testing a device includes a parametric measurement unit to measure a first signal from the device, and pin electronics to provide a second signal to the device. The pin electronics includes circuitry along a path to the device. The parametric measurement unit is electrically connected to the device via the circuitry to receive the first signal via the circuitry. | 03-05-2009 |
