| STOTZ FEINMESSTECHNIK GMBH Patent applications |
| Patent application number | Title | Published |
|---|
| 20110247409 | APPARATUS AND METHOD FOR MEASURING BORES - An apparatus for the industrial measurement of bores in a measurement object is provided. The apparatus includes a measurement probe which can be introduced into the bore and at which at least one distance sensor is provided with which the instantaneous distance of a reference point of the measurement probe from a wall of the bore can be determined The measurement probe is rotatably supported at a holder which is fixed with respect to the measurement object and/or whose position relative to the measurement object is known. An evaluation device receives a number of sequentially determined distances in the course of a rotation of the measurement probe. | 10-13-2011 |
| 20110247228 | APPARATUS FOR MEASURING OBJECTS - An apparatus for measuring objects, in particular to a coordinate measuring unit, is provided. The unit has a probe which is movable relative to an object to be measured by means of an actuator to sample the surface of the object in a contacting manner, wherein a sampling body, whose front end is designed as a measuring tip for a contact with the object is supported at the probe. The relative position of the measuring tip with respect to the probe is determined. The sampling body is supported at the probe with movement play along at least one direction. A change in the inclination of the sampling body relative to the probe, or vice versa, can be detected via a measurement of a test parameter. | 10-13-2011 |
| 20110247227 | APPARATUS FOR MEASURING OBJECTS - An apparatus for measuring objects includes a base plate for supporting an object to be measured and includes a probe. The probe is movable relative to the object by means of an actuator to sample the object in a contacting manner, wherein the probe carries, and in particular supports in a mount, a sampling body, in particular an elongate sampling body, whose front end is designed as a measuring tip for a contact with the object. The probe is arranged beneath the base plate, wherein at least one recess is provided in the base plate for leading through at least one section of the sampling body. | 10-13-2011 |
