Spectro Analytical Instruments GmbH Patent applications |
Patent application number | Title | Published |
20140312219 | SIMULTANEOUS INORGANIC MASS SPECTROMETER AND METHOD OF INORGANIC MASS SPECTROMETRY - An inorganic mass spectrometer capable of measuring a relevant and large or the full mass spectral range simultaneously may include a suitable ion source (e.g., an ICP mass spectrometer with an ICP ion source), an ion transfer region, ion optics to separate ions out of a plasma beam, a Mattauch-Herzog type mass spectrometer with a set of charged particle beam optics to condition the ion beam before an entrance slit, and a solid state multi-channel detector substantially separated from ground potential and separated from the potential of the magnet. | 10-23-2014 |
20130057858 | PLASMA EMISSION TRANSFER AND MODIFICATION DEVICE - A Plasma Emission Transfer and Modification Device allowing for alteration of the plasma shape or characteristics for e.g. optimized viewing of relevant Plasma zones or improved coupling of a Plasma to the subsequent spectrometer optics, at the same time avoiding negative effects (e.g. heat transfer from the spectro-chemical source into subsequent system components) is described. | 03-07-2013 |
20120300204 | METHOD FOR DETERMINING CARBON IN CAST IRON - A method of determining the carbon content of an iron alloy may include starting of the measurement of a sample in a spark spectrometer, creation of a plasma in a pre-sparking phase, detection and recording of an intensity signal for the carbon, calculation and cutting out of an unstable plasma phase, calculation of an excessive rise in the carbon signal, and calculation of the content of dissolved and undissolved carbon. | 11-29-2012 |
20110155903 | SIMULTANEOUS INORGANIC MASS SPECTROMETER AND METHOD OF INORGANIC MASS SPECTROMETRY - An inorganic mass spectrometer capable of measuring a relevant and large or the full mass spectral range simultaneously may include a suitable ion source (e.g., an ICP mass spectrometer with an ICP ion source), an ion transfer region, an ion optics to separate ions out of a plasma beam, a Mattauch Herzog type mass spectrometer with a set of charged particle beam optics to condition the ion beam before the entrance slit, and a solid state multi channel detector substantially separated from ground potential and separated from the potential of the magnet is introduced. | 06-30-2011 |
20100177308 | SPECTROMETER COMPRISING SOLID BODY SENSORS AND SECONDARY ELECTRON MULTIPLIERS - The invention relates to a spectrometer for analysing the optical emission of a sample by means of pulsed excitation of an optical spectral emission, having an excitation source, a gap arrangement, at least one dispersive element and having detectors for the emitted spectrum, in which two beam paths are provided with two dispersive elements, the first dispersive element of which images the spectrum of the emission onto a number of spatially resolving detectors and the second dispersive element of which images the spectrum of the emission onto a number of time-resolving detectors. | 07-15-2010 |
20100141941 | OPTICAL SPECTROMETER ELEMENT HAVING NON-SPHERICAL MIRRORS - The invention relates to a spectrometer for analysing the optical emission of a sample, having an excitation source, an entrance gap and a dispersive element, which fans out the spectrum of the light generated in the excitation source in a plane, and having solid body sensors with one or more lines, which are arranged in the region of the focal curve of the beam path in order to evaluate the spectral information, wherein the sensors are arranged above or below the plane and the spectral emission is deflected onto the sensors by mirrors and focused, wherein the reflecting surface of the mirrors is aspherically formed in a direction of curvature. | 06-10-2010 |