| SMT Research Ltd. Patent applications |
| Patent application number | Title | Published |
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| 20100225341 | APPARATUS, SYSTEM AND METHOD FOR DETECTING DEFECTS IN BUILDING STRUCTURES - An apparatus, system and method for detecting defects in building structures is provided. The apparatus includes a detector operable to determine an indication of the defect; and a transmitter operable to wirelessly transmit the indication from the apparatus to a central controller. The system includes the detection unit; a locator operable to determine the location of the detection unit; and a memory for storing the indication and the location in association with each other. The memory may be part of a central controller in wireless communication with the detection unit. The apparatus or central controller may include a processor operable to determine from a plurality of measurements performed by the detection unit a resultant measurement vector indicating a direction from the detection unit toward the defect. The detection unit may be operable to autonomously change its location. A display showing resultant measurement vectors at various locations can be produced. | 09-09-2010 |
| 20100127848 | SYSTEM, APPARATUS, METHOD AND SENSORS FOR MONITORING STRUCTURES - A system, apparatus and method for monitoring structures is provided. The system includes a measurement acquisition unit having a first connection point for receiving a sensor unit and a second connection point that is electrically isolated from the first connection point when invoking the sensor unit. A measurement sensor for detecting moisture includes a pair of spaced apart conductors; and an impedance circuit in parallel with the conductors and having a finite impedance such that an impedance of the measurement sensor greater than the finite impedance indicates an impaired connection. A termination module includes a base attachable to a measurement sensor, and the impedance circuit. A moisture content measurement sensor includes: a pair of conductors in electrically insulating material; and electrically conductive probe supports attached to the conductors for receiving probes and forming electrical connections between conductors and probes. Eyelet rivets may be used as probe supports. | 05-27-2010 |
