| SIDEC TECHNOLOGIES AB Patent applications |
| Patent application number | Title | Published |
|---|
| 20100223036 | Apparatus, Method and Simulation Objects for Simulation of the Image Formation in a Transmission Electron Microscope - An apparatus and a method for simulating the behaviour of a TEM based on the first-order Born approximation, the method including the following steps:—providing at least one mathematical model of a virtual specimen;—simulating the image formation in the TEM when imaging the specimen, the simulation being based on a model for image formation which fully accounts for the wave nature of the electrons within the realm of the first order Born approximation and one model for the imaging properties of the TEM instrument. This is particularly suitable for use in solving the structure determination problem in ET. | 09-02-2010 |
| 20100054565 | PARALLEL BEAM LOCAL TOMOGRAPHY RECONSTRUCTION METHOD - A method to image objects from local three-dimensional parallel beam tomographic data (line integrals) over lines parallel an arbitrary curve of directions on a sphere. Such data are used in electron microscopy, SPECT (with weighted integrals), and synchrotron tomography. The algorithm is adaptable to a number of data sets including single-axis and double-axis tilt electron tomography and truly three-dimensional curves of directions. The method stably gives pictures of the internal structure of objects and does not add strong singularities or artefacts. It is less influenced by objects outside the region of interest than standard non-local methods. The algorithm is combined with an electron microscope and computer to provide computer readable files showing the pictures of small objects such as molecules. | 03-04-2010 |
| 20100005130 | ITERATED VARIATIONAL REGULARIZATION COMBINED WITH COMPONENTWISE REGULARIZATION - The present invention relates to a solution for solving an ill-posed inverse problem in image analysis, e.g. in an electron tomography application in order to recover a structure of a sample. The solution is provided for instance as a method comprising steps of determining reliable prior knowledge about the solution, determining initial guess for the solution and determining the corresponding forward operator, deciding upon model of stochasticity, deciding on suitable regularization method, deciding on updating scheme, and producing a sequence using the set configuration. | 01-07-2010 |
| 20090283676 | EXTENDED ELECTRON TOMOGRAPHY - A method for improving image resolution of a three dimensional structure of at least one molecule conformation includes: determining a three dimensional structure of at least one conformation of a molecule in a sample from a first data set obtained from a series of 2D measurements of different geometrical projections of the molecule at a low electron beam dose in an electron microscope; producing a second data set including calculated two dimensional projections of the determined three dimensional structure of the at least one conformation of the same molecule; correlating data from a third data set obtained from at least one measurement of the same molecule using a higher electron beam dose with the second data set; and using the correlated data to improve the resolution of the three dimensional structure of the at least one conformation of the molecule by increasing the first data set with the correlated data and re-determining a three dimensional structure. | 11-19-2009 |
