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SHINCRON CO., LTD.
| SHINCRON CO., LTD. Patent applications | ||
| Patent application number | Title | Published |
|---|---|---|
| 20120105872 | OPTICAL FILM THICKNESS METER AND THIN FILM FORMING APPARATUS PROVIDED WITH OPTICAL FILM THICKNESS METER - An optical film thickness meter capable of measurement of an optical film thickness and spectroscopic characteristics with high accuracy and a thin film forming apparatus provided with the optical film thickness meter are provided. The optical film thickness meter includes a light projector ( | 05-03-2012 |
| 20110168544 | Manufacturing Method of Optical Filter - [Object]To provide a manufacturing method of an optical filter having favorable film quality by removing a foreign substance adhered onto a surface of a substrate by cleaning before a thin film is formed. | 07-14-2011 |
| 20110151247 | METHOD FOR DEPOSITING FILM AND OIL-REPELLENT SUBSTRATE - The method for depositing a film of the present invention comprises the first film deposition step of depositing a first film | 06-23-2011 |
| 20110151138 | METHOD FOR DEPOSITING FILM - The method for depositing a film of the present invention comprises the first irradiation step of irradiating particles having energy on a surface of a substrate | 06-23-2011 |
| 20110111581 | DEPOSITION APPARATUS AND MANUFACTURING METHOD OF THIN FILM DEVICE - [Object] To provide a deposition apparatus | 05-12-2011 |
| 20110097511 | DEPOSITION APPARATUS AND MANUFACTURING METHOD OF THIN FILM DEVICE - [Object] To provide a deposition apparatus | 04-28-2011 |