| SEOUL NATIONAL UNIVERSITY R & DB FOUNDATION Patent applications |
| Patent application number | Title | Published |
| 20120111801 | Near-Field Photocatalyst Including Zinc Oxide Nanowire - Disclosed is a near-field photocatalyst using a ZnO (ZnO) nanowire. The photocatalyst is advantageous in that low-priced zinc is used instead of titanium, conventionally used as a photocatalyst to reduce expenses, and that it is possible to obtain overvoltage which is sufficient to generate hydrogen using an optical near field formed around an end of a ZnO nanowire without the application of additional external voltage, thus the use of a costly electrode, such as platinum, is avoided and a process is simplified. | 05-10-2012 |
| 20100148156 | Method for producing nanoparticle/block copolymer composites - A method for producing nanoparticle/block copolymer composites is provided. The method includes mixing nanoparticles having an organic ligand L and a block copolymer A-b-B having block repeating units A and B with different solubility parameters in a solvent S to form micelles by self-assembly. The solubility parameters of the organic ligand L, the block repeating units A and B of the block copolymer A-b-B and the solvent S satisfy the following inequalities: | 06-17-2010 |
| 20100091294 | METHOD OF AND APPARATUS FOR MEASURING ELECTRIC FIELD VECTOR AND MICROSCOPE USING SAME - A system for measuring an electric field vector includes an optical extractor configured to extract an optical signal having a spatial resolution of a nanometer level. The optical signal corresponds to incident light at a measuring position within an examination area of a surface of a specimen. The system further includes a polarization analyzer for analyzing a polarization characteristic of the optical signal extracted by the optical extractor, and an electric field vector determinator for determining at least a size and an orientation axis of an electric vector at the measuring position using the polarization characteristic analyzed by the polarization analyzer. | 04-15-2010 |