| 20100125377 | APPARATUS TO TEST SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE USING THE SAME - An apparatus to test a semiconductor device includes a chamber defining an inner space to receive a plurality of semiconductor devices, a temperature control apparatus connected to the chamber and configured to heat or cool the chamber to a predetermined level, and a control module to transmit an electrical signal to the temperature control apparatus to heat or cool an inner space of the chamber. As a result, the semiconductor devices can be exposed to heating and cooling environments having set test temperature values to selectively perform a test. | 05-20-2010 |
