RIGAKU CORPORATION Patent applications |
Patent application number | Title | Published |
20160055639 | IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD AND IMAGE PROCESSING PROGRAM - There are provided an image processing apparatus, an image processing method and an image processing program which can easily and accurately specify and analyze an abnormal part of a subject. An image processing apparatus | 02-25-2016 |
20150233845 | X-RAY ANALYZING APPARATUS AND METHOD - An X-ray analyzing apparatus is such that a diffraction pattern, in which the intensity of secondary X-rays ( | 08-20-2015 |
20150213623 | IMAGE PROCESSING METHOD AND IMAGE PROCESSING APPARATUS - An image processing method and an image processing apparatus which remove the effects of cosmic rays, noise and defective pixels without losing data in a specified time and which can correct image data efficiently and with high accuracy are provided. An image processing method of performing correction processing on an abnormal value of X-ray image data is provided which includes the steps of: (S | 07-30-2015 |
20150212213 | RADIATION DETECTOR, AND X-RAY ANALYSIS APPARATUS AND RADIATION DETECTION METHOD USING THE SAME - There are provided a radiation detector capable of detecting radiation without occurrence of dead time while maintaining an exposure state in which radiation enters continuously, and an X-ray analysis apparatus and a radiation detection method using the radiation detector. A radiation detector | 07-30-2015 |
20150146960 | CORRECTION INFORMATION GENERATION METHOD AND CORRECTION INFORMATION GENERATION APPARATUS - A correction information generation method and a correction information generation apparatus enabling easy Flat-Field Correction operation without special accessory equipment are provided. The correction information generation method for performing Flat-Field Correction of X-ray detection sensitivity on a pixel detector, includes the steps of: moving the relative position of a detector | 05-28-2015 |
20150146860 | OPTICAL AXIS ADJUSTMENT DEVICE FOR X-RAY ANALYZER - Provided is an optical axis adjustment device for an X-ray analyzer comprising an incident-side arm, a receiving-side arm, an X-ray source, an incident-side slit, and an X-ray detector, wherein the device comprises a shielding strip disposed at a position blocking X-rays received by the X-ray detector from the X-ray source, and a shielding strip-moving device that rotates the shielding strip around the sample axis relative to the optical axis of X-rays reaching the X-ray detector from the X-ray source to two angle positions, and the amount of deviation in parallelism of the surface of a sample with respect to the optical axis of the X-rays is found on the basis of X-ray intensity values found by the X-ray detector for the two angle positions. | 05-28-2015 |
20150146859 | OPTICAL AXIS ADJUSTMENT METHOD FOR X-RAY ANALYZER AND X-RAY ANALYZER - An optical axis adjustment method for an X-ray analyzer. In a 2θ-adjustment step, a 0° position of the rotation of a receiving-side arm and a 0° position of the angle of diffraction 2θ are aligned. In a Zs-axis adjustment step, the position of an incident-side slit along a direction orthogonal to the centerline of the X-rays incident upon a sample from an X-ray source is adjusted. In a θ-adjustment step, the centerline of X-rays incident upon the sample from the X-ray source and the surface of the sample are adjusted so as to be parallel. In the 2θ-adjustment step, the Zs-axis adjustment step, and the θ-adjustment step, the capability for X-ray intensity positional resolution upon a straight line possessed by a one-dimensional X-ray detector is used to perform 2θ-adjustment, Zs-axis adjustment, and θ-adjustment. | 05-28-2015 |
20150146858 | X-RAY TOPOGRAPHY APPARATUS - Disclosed is an X-ray topography apparatus including an X-ray source, a multilayer film mirror, a slit, a two-dimensional X-ray detector, and a sample moving device that sequentially moves the sample to a plurality of step positions. The X-ray source is a minute focal spot. The multilayer film mirror forms monochromatic, collimated, high-intensity X-rays. The direction in which the multilayer film mirror collimates the X-rays coincides with the width direction of the slit. The step size by which the sample is moved is smaller than the width of the slit. The combination of the size of the minute focal spot, the width of the slit, and the intensity of the X-rays that exit out of the multilayer film mirror allows the contrast of an X-ray image produced when the detector receives X-rays for a predetermined period of 1 minute or shorter to be high enough for observation of the X-ray image. | 05-28-2015 |
20140379282 | METHOD AND APPARATUS FOR MEASURING BOWING OF SINGLE-CRYSTAL SUBSTRATE - At least two values of an X-ray irradiation width are set for a single specimen. A rocking curve is measured for each of the X-ray irradiation widths. A rocking curve width value is determined for each of the rocking curves. The values of the X-ray irradiation width and the values of the rocking curve width are plotted on a planar coordinate system having a vertical axis representing the rocking curve width value and a horizontal axis representing the X-ray irradiation width value, and a rocking curve width shift line is determined based on the plotted points. A gradient of the rocking curve width shift line is determined. A curvature radius of the specimen is determined based on the gradient. The amount of bowing of a single-crystal substrate under measurement can be measured without a need to move the single-crystal substrate for reliable measurement with a small amount of error. | 12-25-2014 |
20140314206 | X-RAY DIFFRACTION APPARATUS, X-RAY DIFFRACTION MEASURING METHOD, AND CONTROL PROGRAM - The X-ray diffraction apparatus irradiates a sample with an X-ray and performs frame photographing in each X-ray diffraction angle, and includes a control section ( | 10-23-2014 |
20140284478 | X-RAY ANALYZING APPARATUS - Conjointly provided are a first correcting unit ( | 09-25-2014 |
20140278147 | CRYSTALLINE PHASE IDENTIFICATION METHOD, CRYSTALLINE PHASE IDENTIFICATION DEVICE, AND CRYSTALLINE PHASE IDENTIFICATION PROGRAM - A crystalline phase identification method, a crystalline phase identification device, and a crystalline phase identification program which can conduct qualitative analysis with higher precision are provided. The crystalline phase identification method for identifying crystalline phases contained in a sample by powder diffraction pattern of the sample with use of database includes: a whole pattern fitting step of subjecting a first diffraction pattern which is the powder diffraction pattern to whole pattern fitting with the use of crystalline phase information contained in the sample to calculate a theoretical diffraction pattern of the crystalline phase(s) already identified; a residual information generating step of generating residual information on the sample on the basis of a difference between the theoretical diffraction pattern and the first diffraction pattern; and a residual information search and matching step of comparing the residual information with the database to select a new crystalline phase contained in the sample. | 09-18-2014 |
20140236523 | X-RAY DATA PROCESSING APPARATUS, X-RAY DATA PROCESSING METHOD, AND X-RAY DATA PROCESSING PROGRAM - An X-ray data processing apparatus for processing X-ray data that is obtained by simultaneously measuring X-rays of multiple wavelengths. The apparatus includes a management unit | 08-21-2014 |
20140203182 | RADIATION DETECTOR - There is provided a radiation detector that appropriately corrects an offset within a minute read cell without increasing area while achieving high-speed measurement at a high counting rate. A radiation detector | 07-24-2014 |
20140131588 | RADIATION DETECTOR - There is provided a radiation detector which shortens the data read time to outside in accordance with the necessity to increase the frame rate. A radiation detector | 05-15-2014 |
20140126689 | X-RAY CT APPARATUS - An X-ray CT apparatus for obtaining an internal image of a test subject by using X-rays. The X-ray CT apparatus has: an X-ray generator; an X-ray detector; a first casing for enclosing the X-ray generator and the X-ray detector; a test-subject table; a first table transporting mechanism for transporting the test-subject table between a first table position and a second table position, the first table position being a position where the main portion of the test-subject table receives X-rays from the X-ray generator, and the second table position being a position where the main portion of the test-subject table is on the outside of the first casing; and a second table transporting mechanism capable of vertically transporting the test-subject table. The first table transporting mechanism and the second table transporting mechanism operate in association with each other. | 05-08-2014 |
20140119512 | X-RAY DETECTOR AND X-RAY DIFFRACTION DEVICE - A silicon strip detector having a first X-ray detection unit having plural strips arranged in parallel to one another in a first direction, and a second X-ray detection unit having plural strips arranged in parallel to one another in a second direction orthogonal to the first direction is used as an X-ray detector. The X-ray detector is mounted in an X-ray diffraction device while the first direction is matched with the tangential direction of 2θ-rotation, and the second direction is matched with the tangential direction of χ-rotation for executing in-plane diffraction measurement. | 05-01-2014 |
20140105368 | X-RAY ANALYSIS APPARATUS - An X-ray analysis apparatus for detecting, using an X-ray detector, X-rays given off by a sample when the sample is irradiated with X-rays, the X-ray analysis apparatus having replaceable components. The X-ray analysis apparatus comprises labels attached to the replaceable components and including symbols indicating the types of replaceable components, a camera for photographing the replaceable components and the labels, and CPU and image recognition software for specifying the types of replaceable components by calculation based on the symbols in the labels. | 04-17-2014 |
20140105367 | X-RAY GENERATING APPARATUS - The X-ray generating apparatus | 04-17-2014 |
20130294577 | WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER - In the wavelength dispersive X-ray fluorescence spectrometer of the present invention, a counting loss correcting unit ( | 11-07-2013 |
20130279646 | 3 DIMENSIONAL X-RAY CT APPARATUS, 3 DIMENSIONAL CT IMAGE RECONSTRUCTION METHOD, AND PROGRAM - Provided are a three-dimensional X-ray CT apparatus, a three-dimensional CT image reconstruction method, and a program, which are capable of reducing an operating time. A three-dimensional X-ray CT apparatus includes: a CT imaging portion for continuously and relatively rotating a measurement system with respect to a subject to perform a CT imaging measurement for taking data on a plurality of transmission images for reconstructing a three-dimensional CT image of the subject; and an image reconstruction portion for reconstructing the three-dimensional CT image based on the data on the plurality of transmission images taken by the CT imaging portion and displaying the three-dimensional CT image. During a period in which the CT imaging measurement is being performed, the image reconstruction portion reconstructs the three-dimensional CT image based on already-taken data on transmission images and displays the three-dimensional CT image before the CT imaging measurement is completed. | 10-24-2013 |
20130259207 | TARGET FOR X-RAY GENERATOR, METHOD OF MANUFACTURING THE SAME AND X-RAY GENERATOR - There is provided a target for an X-ray generator, including: a holder part made of an electrically conductive material and having an opening part; a diamond plate air-tightly joined to the holder part so as to close the opening part; a thin film target provided on a surface of the diamond plate, with its outer peripheral part extending to the holder part to be electrically connected to the holder part, wherein the holder part is configured to be electrically connected to a power supply of the X-ray generator, and the diamond plate is incorporated into the X-ray generator with one side disposed in a vacuum atmosphere where the thin film target is formed, and an opposite side thereto disposed at a side where the diamond plate is brought into thermal contact with a refrigerant and cooled. | 10-03-2013 |
20130259200 | X-RAY TOPOGRAPHY APPARATUS - Provided is an X-ray topography apparatus capable of separating a desired characteristic X-ray which enters a sample from an X-ray which is radiated from an X-ray source, and increasing an irradiation region of the desired characteristic X-ray. The X-ray topography apparatus includes: the X-ray source for radiating the X-ray from a fine focal point, the X-ray containing a predetermined characteristic X-ray; an optical system including a multilayer mirror with a graded multilayer spacing which corresponds to the predetermined characteristic X-ray, the optical system being configured to cause the X-ray reflected on the multilayer mirror to enter the sample; and an X-ray detector for detecting a diffracted X-ray. The multilayer mirror includes a curved reflective surface having a parabolic cross section, and the fine focal point of the X-ray source is provided onto a focal point of the curved reflective surface. | 10-03-2013 |
20130259199 | X-RAY MEASUREMENT APPARATUS - A portable, for example, a hand-held-type, X-ray measurement apparatus, wherein the vibration or hand-shaking of the X-ray measurement apparatus is detected by a vibration-detection sensor such as a distance sensor, a gyro sensor, or the like, and a measurement value for the X-ray intensity obtained using a two-dimensional X-ray detector is corrected on the basis of a variation quantity obtained using the vibration-detection sensor. The correction may be a correction related to an X-ray source, a correction related to an X-ray detector, a correction calculated using the CPU of a computer and a software program, or the like. | 10-03-2013 |
20130259197 | ELECTRON GUN, X-RAY GENERATOR AND X-RAY MEASUREMENT APPARATUS - An electron gun having: a cathode for emitting electrons; a first Wehnelt electrode equipped with a first aperture through which electrons are allowed to pass; and a second Wehnelt electrode that is equipped with a second aperture disposed at a predetermined position with respect to the cathode and the first aperture, and that is furnished at a position closer to the cathode than the first Wehnelt electrode, wherein: the cathode and the second Wehnelt electrode are included within a single assembly constituting a unitary body; and the assembly is detachably attached to the first Wehnelt electrode. Replacement of the cathode can be performed by detaching the cathode unit from the first Wehnelt electrode, and then ejecting the cathode unit out from the Wehnelt cover. The emitter of the cathode can thereby be reliably positioned with respect to the second aperture. | 10-03-2013 |
20130251100 | X-RAY COMPOSITE APPARATUS - There is provided an X-ray composite apparatus capable of performing, with one unit, X-ray CT and element analysis by fluorescent X-rays. The X-ray composite apparatus | 09-26-2013 |
20130138382 | X-RAY ANALYSIS APPARATUS - An X-ray analysis apparatus having a function for enabling a plurality of measurement methods to be implemented, the X-ray analysis apparatus having: a measurement system capable of implementing a plurality of measurement methods; measurement software for implementing, in a selective manner, each of the measurement methods; a material evaluation table for storing information relating to a material that may be measured, and a name of an evaluation performed on the material; an input device for inputting the information relating to the material; a wizard program for performing computation for selecting the name of an evaluation on the basis of the information relating to the material inputted using the input device; and a wizard program for selecting a corresponding measurement method on the basis of the selected name of the evaluation. | 05-30-2013 |
20130136236 | X-RAY ANALYSIS APPARATUS - An X-ray analysis apparatus having a function for enabling a plurality of measurement methods to be implemented, the apparatus having: measurement software for implementing each of the individual measurement methods and acquiring measurement data; analysis software for performing a predetermined analysis on the measurement data and acquiring analysis data; reduced-size-image-creating means for creating a reduced-size image on the basis of each item of the measurement data and the analysis data; analysis-icon-creating means for creating an icon for denoting the analysis software; and image display means for displaying the reduced-size image and the icon on the same screen while indicating that the reduced-size image and the icon are correlated. | 05-30-2013 |
20130121460 | X-RAY INTENSITY CORRECTION METHOD AND X-RAY DIFFRACTOMETER - An X-ray intensity correction method makes the background uniform by adjusting a raster element and an X-ray diffractometer. An X-ray intensity correction method for correcting the intensity of diffracted X-rays includes the steps of focusing X-rays on a sample for correction placed at a gonio center, entering fluorescent X-rays excited by the focused X-rays into a raster element formed by polycapillaries and having a unique focal point, detecting the fluorescent X-rays having passed through the raster element; and adjusting the arrangement of the raster element so that the fluorescent X-rays can uniformly be detected regardless of the detecting position. Since fluorescent X-rays are used, it is possible to adjust the position of the raster element because if the focal point of the raster element coincides with the gonio center, the intensity becomes uniform regardless of the detected position. | 05-16-2013 |
20130101085 | X-RAY FLUORESCENCE SPECTROMETER AND X-RAY FLUORESCENCE ANALYZING METHOD - The X-ray fluorescence spectrometer of the present invention includes a sample table ( | 04-25-2013 |
20130077754 | ANALYSIS METHOD FOR X-RAY DIFFRACTION MEASUREMENT DATA - Peak positions and integrated intensities of diffraction X-ray are determined on the basis of X-ray diffraction measurement data output from an X-ray diffractometer, the number of determined peaks of the diffraction X-ray is counted, and analysis processing is started when the counted number of peaks reaches a preset peak number. The analysis processing is repetitively executed on the basis of X-ray diffraction measurement data. The peak positions and the integrated intensities of the diffraction X-ray are determined from the X-ray diffraction measurement data obtained from the start of the measurement till the analysis processing concerned, and qualitative analysis of collating the determined peak positions and integrated intensities with standard peak card data whose data base is made in advance and searching materials contained in a measurement sample, and quantitative analysis of determining the quantities of the materials contained in the measurement sample are executed. | 03-28-2013 |
20130062721 | SEMICONDUCTOR STRIP DETECTOR - The present invention provides a semiconductor strip detector that can reduce noise generated from floating capacitance between electrodes while maintaining high detection efficiency. The semiconductor strip detector for detecting radiation includes: a substrate integrally formed from semiconductor and receiving incident radiation; a first electrode group made up of a plurality of strip-shaped electrodes to provided in parallel to each other on a major surface of the substrate; and a second electrode group made up of a plurality of strip-shaped electrodes to provided coaxially with an orthogonal projection of the plurality of strip-shaped electrodes to of the first electrode group onto the major surface of the substrate, and the electrode groups are formed so that a ratio of a longitudinal length to an electrode-to-electrode length is 10 or more. Therefore, noise can be sufficiently reduced while a detection range is being maintained. | 03-14-2013 |
20130039469 | X-RAY STRESS MEASUREMENT APPARATUS - An X-ray stress measurement apparatus having: a camera for producing an optical image of a sample; a display for displaying the optical image; an input device capable of inputting positions on a display screen; an X-ray source for generating an X-ray; a table for moving the sample; an X-ray detector for detecting an X-ray exiting the sample; a measurement program for determining the measurement positions of the sample on the basis of the positions indicated by the input device, and measuring the determined measurement positions of the sample; a stress computation program for computing the stress at the measurement positions of the sample on the basis of an output signal from the X-ray detector; and an image formation program for causing the optical image, the measurement positions of the sample, the absolute value of the stress, and the direction of the stress to be displayed on the same display screen. | 02-14-2013 |
20120288058 | X-RAY MULTIPLE SPECTROSCOPIC ANALYZER - An X-ray multiple spectroscopic analyzer includes an X-ray source, an optical system inputting X-rays to a single-crystal sample, a sample stage supporting the single-crystal sample, an X-ray diffraction detector, a rotation driving system that changes the angle of the X-ray diffraction detector, an X-ray diffraction measurement data storage unit, a structural analysis data analyzing unit, an energy-dispersive X-ray fluorescence detector, an X-ray fluorescence measurement data storage unit, an X-ray fluorescence analyzing unit, an X-ray fluorescence analysis data storage unit, and X-ray fluorescence analysis data acquiring unit. The structural analysis data analyzing unit analyzes the data of the crystal structure further on the basis of the analysis data of the fluorescent X-rays output from the X-ray fluorescence analysis data acquiring unit. | 11-15-2012 |
20120275567 | SAMPLE COOLING APPARATUS FOR X-RAY DIFFRACTOMETER AND X-RAY DIFFRACTOMETER - The sample cooling apparatus is used in an X-ray diffractometer for rotating a sample supported by a sample rod about an ω axis, directing X-rays thereto, and detecting X-rays deflected from the sample using an X-ray detector. The apparatus has a nozzle for blowing a cooling gas on the sample; and a gas-suctioning device for suctioning, via an aperture, gas that has passed over the sample. The sample rod moves when rotated about the ω axis forming a conical surface having the sample as a vertex. The nozzle is provided so that the extension direction of the sample rod and the direction of the blown gas form an acute angle of 90° or less. The gas-suctioning device suctions the gas so the path of gas having contacted the sample rod bends when the extension direction of the sample rod and the blown direction of the gas form an acute angle. | 11-01-2012 |
20120269322 | WAVELENGTH-CLASSIFYING TYPE X-RAY DIFFRACTION DEVICE - A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the sample using an X-ray detector. The X-ray generation source is composed of several metals of different atomic number, respective metals generating several characteristic X-rays of different wavelengths. An X-ray detector is composed of several pixels for receiving X-rays and outputting pulse signals corresponding to X-ray wavelengths. Pixels are respectively furnished with classification circuits. The classification circuits classify and output pixel output signals based on each of characteristic X-ray wavelengths. X-ray intensity is detected on a per-wavelength basis in individual pixels | 10-25-2012 |
20120237099 | CT IMAGE PROCESSING DEVICE AND CT IMAGE PROCESSING METHOD - A CT image processing device | 09-20-2012 |
20120207277 | X-RAY DETECTION SIGNAL PROCESSING APPARATUS AND METHOD THEREFOR - An X-ray detection signal processing apparatus of the present invention is such that after a signal from a preamplifier has been converted into a digital signal at a high speed by means of a high speed analog-to-digital converter ( | 08-16-2012 |
20120195406 | X-RAY DIFFRACTION APPARATUS - An X-ray shielding member is provided so as to confront an X-ray incident face of a sample, and a gap through which an X-ray emitted from an X-ray source is passed and irradiated to an X-ray incident face of the sample is formed between the X-ray shielding member and the X-ray incident face of the sample. A gap adjusting mechanism for moving the X-ray shielding member is further provided to move the X-ray shielding member in accordance with change of an X-ray incident angle to the sample by a goniometer, whereby the breadth of the gap formed between the X-ray shielding member and the X-ray incident face of the sample can be adjusted. | 08-02-2012 |
20120163550 | X-RAY GENERATOR - Provided is an X-ray generator for generating X-rays from an X-ray focal point that is a region in which electrons emitted from a filament impinge upon a rotating anode. The X-ray generator has a Wehnelt electrode for surrounding the filament, an attachment part formed integrally with the Wehnelt electrode, a pedestal to which the attachment part is attached, and a casing for housing the pedestal and the anticathode. The width of the space in which the anticathode is housed by the casing is less than the width of the space in which the pedestal is housed by the casing. The Wehnelt electrode extends into the space in which the anticathode is housed by the casing, in a state in which the attachment part is attached to the pedestal. | 06-28-2012 |
20120163548 | X-RAY GENERATOR - Provided is an X-ray generator comprising a cathode for generating electrons; a rotating anode having a cylindrical electron impingement surface, an X-ray focal point being formed by a region in which the electrons impinge upon the electron impingement surface; and a Wehnelt electrode for imparting an electric field to the electrons emitted from the cathode. The Wehnelt electrode has a field formation surface for forming the electric field, and an electron passage aperture formed by the field formation surface. The field formation surface of the Wehnelt electrode is inclined with respect to a plane tangent to an outer circumferential surface of the rotating anode at the center of the X-ray focal point. The center of the cathode is in a plane orthogonal to the field formation surface and aligned with the center of the electron passage aperture. | 06-28-2012 |
20120161027 | X-RAY DETECTOR - An X-ray detector is connected to a large number of detector modules connected in series. The X-ray detector detects X-ray image data for each detection module, each module synchronously reading X-ray image data detected by itself based on an internal clock φ, each module transferring the read X-ray image data one after another. Each of the detection modules receives the transferred X-ray image data, and resynchronizes the received X-ray image data by using the internal clock, and transfers the same together with the detected X-ray image data. This enables arranging the detection module at an arbitrary position without a change in the method of transferring data for each measurement or without a load on a control device. | 06-28-2012 |
20120161019 | X-RAY DETECTOR - To provide an X-ray detector facilitating the installing and replacement work of a module while reducing the possibility of breakage. An X-ray detector | 06-28-2012 |
20120140890 | X-RAY DIFFRACTION APPARATUS AND X-RAY DIFFRACTION MEASUREMENT METHOD - There is provided an X-ray diffraction apparatus comprising an X-ray topography device for providing a spatial geometric correspondence to an X-ray exiting from a planar region of a sample to detect the X-ray as a planar X-ray topograph, and outputting the X-ray topograph as a signal; a two-dimensional imaging device for receiving a light-image of the planar region of the sample and outputting the light-image as a signal specified by planar positional information; and a video-synthesizing arithmetic control device for generating synthesized video data on the basis of an output signal from the X-ray topograph and an output signal from the imaging device. | 06-07-2012 |
20120093299 | ANALYZING APPARATUS - An analyzing apparatus of the present invention includes a cassette unit ( | 04-19-2012 |
20120087473 | SURFACE MICROSTRUCTURE MEASUREMENT METHOD, SURFACE MICROSTRUCTURE MEASUREMENT DATA ANALYSIS METHOD AND X-RAY SCATTERING MEASUREMENT DEVICE - There is provided a surface microstructure measurement method, a surface microstructure measurement data analysis method, and an X-ray scattering measurement device which can accurately measure a microstructure on a surface and which can evaluate a three-dimensional structural feature. In the surface microstructure measurement method, the specimen surface is irradiated with X-ray at a grazing incident angle and a scattering intensity is measured; a specimen model with a microstructure on a surface in which one or more layers is formed in a direction perpendicular to the surface and unit structures are periodically arranged in a direction parallel to the surface within the layers is assumed; a scattering intensity of X-ray scattered by the microstructure is calculated in consideration of effects of refraction and reflection caused by the layer; and the scattering intensity of X-ray calculated by the specimen model is fitted to the measured scattering intensity. Then, as a result of the fitting, an optimum value of a parameter for specifying the shape of the unit structures is determined. Therefore, it is possible to accurately measure a microstructure. | 04-12-2012 |
20120087470 | X-RAY IMAGE PHOTOGRAPHING METHOD AND X-RAY IMAGE PHOTOGRAPHING APPARATUS - An X-ray image photographing method and apparatus is capable of photographing a high resolution phase contrast image and a high resolution absorption contrast image in a short time by finely adjusting the distance between a specimen and a detector with respect to an X-ray source. | 04-12-2012 |
20120027179 | INDUSTRIAL X-RAY GENERATOR - An X-ray generator includes a booster circuit formed by sequentially connecting a plurality of boosting steps extending from a low-voltage terminal to a high-voltage terminal of its own. | 02-02-2012 |
20120027177 | INDUSTRIAL X-RAY TUBE - An industrial X-ray tube formed by accommodating a cathode and anode in a container having an evacuated interior, in which electrons emitted from the cathode are caused to strike the anode and X-rays are emitted from the anode. The cathode is formed from graphite. The graphite is a layered crystal obtained by layering a plurality of carbon hexagonal planes. The graphite is cut based on crystal axes of the carbon hexagonal planes. The resulting cut surface is caused to function as an electron-emitting surface. For example, directions of an a- and b-crystal axis may be set so as to be arbitrary between each of the layers of the carbon hexagonal planes, the graphite may be cut along a surface parallel to the c-axis, and the resulting cut surface may be caused to function as an electron-emitting surface. The graphite may also be cut along a surface orthogonal to the c-axis. | 02-02-2012 |
20110317813 | WAVELENGTH-CLASSIFYING TYPE X-RAY DIFFRACTION DEVICE - A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the sample using an X-ray detector. The X-ray generation source is composed of several metals of different atomic number, respective metals generating several characteristic X-rays of different wavelengths. An X-ray detector is composed of several pixels for receiving X-rays and outputting pulse signals corresponding to X-ray wavelengths. Pixels are respectively furnished with classification circuits. The classification circuits classify and output pixel output signals based on each of characteristic X-ray wavelengths. X-ray intensity is detected on a per-wavelength basis in individual pixels | 12-29-2011 |
20110268252 | X-RAY APPARATUS, METHOD OF USING THE SAME AND X-RAY IRRADIATION METHOD - An X-ray apparatus that creates a virtual source having a narrow energy bandwidth and enables a high-resolution X-ray diffraction measurement; a method of using the same; and an X-ray irradiation method are provided. | 11-03-2011 |
20110243301 | X-RAY FLUORESCENCE ANALYZING METHOD - An X-ray fluorescence analyzing method includes irradiating a liquid sample ( | 10-06-2011 |
20110164729 | X-RAY TOPOGRAPHY APPARATUS - An x-ray topography apparatus in which x-rays diffracted from a sample which is scanned with a linear x-ray are detected by an x-ray detector to obtain a planar diffraction image. In this x-ray topography apparatus, the x-ray detector is an imaging plate shaped as a cylinder and provided with a surface area that is larger than the sample, and the imaging plate is made to undergo α-rotation about the center axis of the cylindrical shape in coordination with scanning movement of the linear x-rays. The center axis of the cylindrical shape extends in a direction at a right angle with respect to the direction of the scanning movement of the linear x-rays. | 07-07-2011 |
20110064199 | CRYSTALLITE SIZE ANALYSIS METHOD AND APPARATUS USING POWDER X-RAY DIFFRACTION - A sample is supported on a flat rotary specimen stage and irradiated at an incidence angle θ via a divergence slit with an x-ray beam emitted by an x-ray source, the diffraction beam from the sample is received via a divergence slit and the light-receiving slit by an x-ray detector placed at the position of a diffraction angle | 03-17-2011 |
20100246768 | X-RAY DIFFRACTION METHOD AND X-RAY DIFFRACTION APPARATUS - In an X-ray diffraction method using the parallel beam method, an X-ray parallel beam is incident on a sample, and diffracted X-rays from the sample are reflected at a mirror and thereafter detected by an X-ray detector. The reflective surface of the mirror consists of a combination of plural flat reflective surfaces. The respective centers of the flat reflective surfaces are located on an equiangular spiral having a center that is located on a surface of the sample. The X-ray detector is one-dimensional position-sensitive in a plane parallel to the diffraction plane. X-rays that have been reflected at different flat reflective surfaces reach different points on the X-ray detector respectively. A corrective operation is performed for separately recognizing the different reflected X-rays on the assumption that the different reflected X-rays that have been reflected at the different flat reflective surfaces might be unfortunately mixed each other on the same detecting region of the X-ray detector. This X-ray diffraction method is superior in angular resolution, and is small in X-ray intensity reduction, and is simple in structure. | 09-30-2010 |
20100111254 | METHOD FOR X-RAY WAVELENGTH MEASUREMENT AND X-RAY WAVELENGTH MEASUREMENT APPARATUS - A Method for X-ray wavelength measurement and an X-ray wavelength measurement apparatus capable of determining absolute wavelength easily and carrying out wavelength measurement having high precision with a simple structure are provided. The present invention is a Method for X-ray wavelength measurement carried out by using a channel-cut crystal for wavelength measurement ( | 05-06-2010 |
20090173879 | GAS ANALYZING METHOD AND GAS ANALYZING APPARATUS - Ions obtained through EI process from a first gas are subjected to mass analysis to obtain ion intensities which are stored in a first file, and ions obtained through soft ionization process from a second gas having same concentration of components as that of the first gas are subjected to mass analysis to obtain ion intensities which stored in a second file, and molecular weights are determined based on parent ions from soft ionization measurement data. A mass spectrum corresponding to the determined molecular weight is read out based on an NIST database, and the ion intensity data stored in the first file and the read out NIST data are compared with each other, and component molecules of the first gas are determined based on the comparison results. Qualitative analysis of mixed gas can be conducted in real time with high accuracy by making effective use of the measurement data of both mass analysis based on EI process and mass analysis based on soft ionization process. | 07-09-2009 |
20090115137 | Magnetic Fluid Sealing Device - A magnet is embedded in an outer rotational shaft provided in a bearing hole of a case, and an outer magnetic circuit and an inner magnetic circuit are formed on the outer peripheral surface and inner peripheral surface of the outer rotational shaft, respectively. In a magnetic fluid seal device, magnetic fluid is filled in minute gaps coming in contact with the outer peripheral surface and inner peripheral surface of the outer rotational shaft, and the two rotational shafts can be strongly sealed by the magnetic circuits formed by a magnet. As a result, the rotational shafts can be rotated while supported in a non-contact style. In addition, the dimension can be reduced, and the number of parts can be reduced. | 05-07-2009 |
20090086921 | X-RAY DIFFRACTION APPARATUS AND X-RAY DIFFRACTION METHOD - In an X-ray diffraction method using the parallel beam method, an X-ray parallel beam is incident on a sample, and diffracted X-rays from the sample are reflected at a mirror and thereafter detected by an X-ray detector. The reflective surface of the mirror has a shape of an equiangular spiral that has a center located on the surface of the sample. A crystal lattice plane that causes reflection is parallel to the reflective surface at any point on the reflective surface. The X-ray detector is one-dimensional position sensitive in a plane parallel to the diffraction plane. A relative positional relationship between the mirror and the X-ray detector is determined so that reflected X-rays from different points on the reflective surface of the mirror reach different points on the X-ray detector respectively. This X-ray diffraction method is superior in angular resolution, and is small in X-ray intensity reduction, and is simple in structure. | 04-02-2009 |
20090046835 | X-Ray CT Apparatus - In an X-ray CT apparatus, an X-ray source and an X-ray detector mounted in a guide arm are freely movable in such a direction as to approach to and separate from a sample. With respect to this movement, the center of gravity of the whole containing respective constituent elements mounted in the guide arm is kept on the rotational axis by a weight balance adjusting mechanism. The weight balance adjusting mechanism contains a movable weight which is freely movable to the guide arm. The movement of the movable weight is controlled so that a difference between the rotational moment around the rotational axis is offset and substantially equal to zero. The moving passage of the movable weight is set on a straight line which is parallel to the moving direction of the X-ray source and the X-ray detector and does not pass through the rotational axis. | 02-19-2009 |
20090026362 | GAS ANALYZER - A plurality of molecule components included in a gas are to be ionized at the same time by PI method. For instance, a plurality of molecule components included in a gas generated at a certain instance are accurately analyzed in real time based on PI method. A gas analyzer is provided with a gas transfer apparatus for transferring a gas generated from a sample in a sample chamber to an analyzing chamber; an ionizer for ionizing the gas; a quadruple filter for separating ions by mass/charge ratio; and an ion detector for detecting the separated ions. The ionizer is provided with an ionizing region arranged in the vicinity of a gas exhaust of the gas transfer apparatus, and a lamp for applying light on the ionizing region. Since the lamp outputs light which has light directivity lower than that of a laser beam and travels by spreading, the gas entered the ionizing region in the ionizer receives light in a wide range, and the gas components inside are ionized at the same time. | 01-29-2009 |
20080240354 | Method for X-ray wavelength measurement and X-ray wavelength measurement apparatus - A Method for X-ray wavelength measurement and an X-ray wavelength measurement apparatus capable of determining absolute wavelength easily and carrying out wavelength measurement having high precision with a simple structure are provided. The present invention is a Method for X-ray wavelength measurement carried out by using a channel-cut crystal for wavelength measurement ( | 10-02-2008 |