| Radiation Watch Limited Patent applications |
| Patent application number | Title | Published |
|---|
| 20110210262 | APPARATUS AND METHOD FOR DETECTING HIGH-ENERGY RADIATION - An apparatus for spatially correcting an image frame is disclosed. In some embodiments, the apparatus stores a frame of pixel values and scans a multi-pixel correction window across the frame. Spatial correction is performed on pixels within the window at correction positions during the scan. The spatial correction comprises estimating pixel values at value estimation positions based on one or more pixel values within the window for pixels satisfying a logical condition. The value estimation positions correspond to pixel values which do not fall within the window again during the scan. Further disclosed is an apparatus for detecting high-energy radiation, in which integration circuitry is used for integrating charge responsive to radiation photon interaction events. The circuits are controllable in accordance with an exposure control signal to vary an exposure window duration according to an operating parameter of the apparatus. | 09-01-2011 |
| 20110008959 | METHOD OF ETCHING A SEMICONDUCTOR WAFER - A method for anisotropically plasma etching a semiconductor wafer is disclosed. The method comprises supporting a wafer in an environment operative to form a plasma, such as a plasma reactor, and providing an etching mixture to the environment. The etching mixture comprises at least one etch component, at least one passivation component, and at least one passivation material removal component. | 01-13-2011 |
| 20110006195 | APPARATUS AND METHOD FOR DETECTING HIGH-ENGERY RADIATION - A high-energy radiation detector apparatus, comprising a high-energy radiation detector substrate and a plurality of charge collection electrodes operatively coupled to first and second opposing sides of the detector substrate is disclosed. Charge collection circuitry is associated with the plurality of charge collection electrodes for collecting charge induced on the charge collection electrodes by a high energy radiation photon interaction event caused by high-energy radiation incident on the detector substrate. | 01-13-2011 |
| 20100223218 | DATA PROCESSING APPARATUS AND METHOD FOR AUTOMATICALLY GENERATING A CLASSIFICATION COMPONENT - Data processing apparatus operative ( | 09-02-2010 |
