QUALTERA Patent applications |
Patent application number | Title | Published |
20120316803 | SEMICONDUCTOR TEST DATA ANALYSIS SYSTEM - The invention concerns a system for processing semi-conductor test data relating to a plurality of dies formed by a manufacturing process on at least one silicon wafer, the system comprising: an input arranged to receive said semiconductor test data ( | 12-13-2012 |
20120271801 | DATA PROCESSING METHOD AND DEVICE - The invention concerns a method of processing data to provide output data based on a group of data samples having a time stamp falling within at least one rolling time period, the method comprising: receiving a new data sample (D | 10-25-2012 |