ProMOS Technologies PTE.LTD.
|ProMOS Technologies PTE.LTD. Patent applications|
|Patent application number||Title||Published|
|20120008445||DUAL BIT LINE PRECHARGE ARCHITECTURE AND METHOD FOR LOW POWER DYNAMIC RANDOM ACCESS MEMORY (DRAM) INTEGRATED CIRCUIT DEVICES AND DEVICES INCORPORATING EMBEDDED DRAM - A dual bit line precharge architecture and method for low power DRAM which provides the low operating voltage of a non-half supply voltage (VCC/2) precharge with the low memory array current consumption and low memory array noise spike of VCC/2 precharge techniques. The architecture and technique of the present invention provides both reference voltage (VSS) precharged sub arrays and VCC precharged sub arrays on the same DRAM memory either with or without the novel charge sharing or charge recycling circuitry between these two different sub arrays as disclosed herein.||01-12-2012|
|20120008444||DUAL BIT LINE PRECHARGE ARCHITECTURE AND METHOD FOR LOW POWER DYNAMIC RANDOM ACCESS MEMORY (DRAM) INTEGRATED CIRCUIT DEVICES AND DEVICES INCORPORATING EMBEDDED DRAM - A dual bit line precharge architecture and method for low power DRAM which provides the low operating voltage of a non-half supply voltage (VCC/2) precharge with the low memory array current consumption and low memory array noise spike of VCC/2 precharge techniques. The architecture and technique of the present invention provides both reference voltage (VSS) precharged sub arrays and VCC precharged sub arrays on the same DRAM memory either with or without the novel charge sharing or charge recycling circuitry between these two different sub arrays as disclosed herein.||01-12-2012|
|20100060315||HIGH CAPACITIVE LOAD AND NOISE TOLERANT SYSTEM AND METHOD FOR CONTROLLING THE DRIVE STRENGTH OF OUTPUT DRIVERS IN INTEGRATED CIRCUIT DEVICES - An output driver calibration circuit includes a programmable drive strength output pullup driver including a strongest transistor and a number of other transistors, a programmable drive strength output pulldown driver including a strongest transistor and a number of other transistors, and a calibration circuit for generating a number of control signals for controlling the transistors in the output pullup driver and the transistors in the output pulldown driver, wherein the control signals are generated simultaneously, except for two the strongest driver transistors.||03-11-2010|
|20090300255||SHIELDING OF DATALINES WITH PHYSICAL PLACEMENT BASED ON TIME STAGGERED ACCESS - A bus driver circuit divides an internal data bus for an integrated circuit memory into at least two groups, designated by speed. A faster group of data lines and a slower group of data lines are placed in an interleaved fashion in order to provide a two group shielding solution. At the earliest opportunity following the reception of a read command, the data from memory banks in the memory is sorted into these two groups. For a DDR3 memory, the sorting method is based on the A2 column address, known as C2. All of the data is brought out of the banks in parallel and sorted as it enters the main amplifiers. These main amplifiers are also divided into two groups, faster and slower. Each amplifier then connects to a data line (G-line) of the same group. The clock assigned to the fast group fires right away, thereby connecting the data associated with the fast amplifiers to the fast data group. This data group then proceeds to the output buffers through the entire data path as fast as possible. The second, slower data group is started with a delayed clock signal and proceeds through the data path to the output buffer maintaining a fixed delay. Since the first and second data groups are not switching at the same time they act as shields to one another.||12-03-2009|
|20090237162||LOW SKEW DIFFERENTIAL AMPLIFIER USING TAIL VOLTAGE REFERENCE AND TAIL FEEDBACK - Using the tail level referencing for an inverter stage immediately following a differential amplifier provides trip point tracking with the variations in magnitude of the output level swings on the differential amplifier stage output over the operating range of the circuit. When the tail voltage increases and the V||09-24-2009|
|20090231945||ASSYMETRIC DATA PATH POSITION AND DELAYS TECHNIQUE ENABLING HIGH SPEED ACCESS IN INTEGRATED CIRCUIT MEMORY DEVICES - An asymmetric data path position and delays technique enabling high speed access in integrated circuit memory devices which is asymmetric in terms of the delay from the array to the I/O buffers based on the position relative within a known starting address of a pre-fetch field. In accordance with the technique of the present invention, the delay is not only asymmetric in terms of its physical length, but also in the number of pipeline stages and the clocks that control them and can also be asymmetric in terms of the column address required to access each section of the array and its designated pre-fetch field.||09-17-2009|
|20090231944||MULTI-BANK BLOCK ARCHITECTURE FOR INTEGRATED CIRCUIT MEMORY DEVICES HAVING NON-SHARED SENSE AMPLIFIER BANDS BETWEEN BANKS - A multi-bank block architecture for integrated circuit memory devices which effectively reduces the total length of the datapath for a given input/output (I/O) from the memory cells in the memory array to the actual device I/O pad. In accordance with the present, a memory block in a memory device is effectively divided into two or more banks, and between these banks an additional non-shared sense amplifier band is added as a sense amplifier cannot be shared across a bank boundary. Within this multi-bank block, separate data paths are provided for the banks with the column (Y-Select) lines being common.||09-17-2009|
|20090190410||USING DIFFERENTIAL DATA STROBES IN NON-DIFFERENTIAL MODE TO ENHANCE DATA CAPTURE WINDOW - A data capture circuit includes strobes that track input data even when conditions arise that cause the differences in skew from interpreting data state ones and zeros. This is accomplished whether these skews arise from reference voltage variation, data pattern loading, power supply droop, process variations within the chip itself, or other causes. The differential input strobes of the data capture circuit are input into individual input buffers, each compared against a reference voltage individually, as well as a data input pin. The outputs from these buffers are maintained separate from each other all the way to the point where the input data is latched. In latching the input data, data ones are latched entirely based on input signals derived from a rising edge (both strobes and data), and zeros are latched entirely based on input signals derived from a falling edge (both strobes and data).||07-30-2009|
|20090154286||N-BIT SHIFT REGISTER CONTROLLER - A column repair circuit uses a system of circuits that automatically stops the shifting of register contents independently of the number of bits to be shifted. The circuit is only dependent on the number of bits in a column address repair block. By adding shift register positions to one end of each shift register chain, a dedicated block of bits is used to detect the end of the shift chain without explicitly knowing the length of the chain. The shift register positions provide a hard-programmed code that can be used to stop the shifting of data automatically. The shift register positions also provide a space for hard-programmed code bits that can be examined to determine when the shift process ends. A shift chain can be controlled with a controller so long as the information is organized into groups of ‘k’ bits. The controller only requires information regarding the value of the number ‘k’ and the pre-programmed stop code in order to control any number of bits in a shift chain.||06-18-2009|
|20080315929||AUTOMATIC DUTY CYCLE CORRECTION CIRCUIT WITH PROGRAMMABLE DUTY CYCLE TARGET - A duty cycle correcting circuit for an integrated circuit memory automatically corrects the duty cycle of an input clock by measuring the relative difference between the high time and low time of the input signal and using this measurement to achieve a same-frequency, duty cycle adjusted output signal. The duty cycle correcting circuit includes a duty cycle adjust circuit that uses two series-connected N-channel transistors to control the pull-up slew rate of a signal and another N-channel transistor to control the pull-down slew rate of the same signal, two dual-slope integrator circuits, and input and output signal buffering.||12-25-2008|
|20080291748||WIDE WINDOW CLOCK SCHEME FOR LOADING OUTPUT FIFO REGISTERS - A circuit provides the widest possible window for capturing data and preventing run-through in a FIFO register. The FIFO register includes two registers per I/O. Two FIFO input clocks are used, one for each FIFO register. When one FIFO clock is active, the other is automatically disabled. Initially, the circuit is reset such that one clock is active, and the other disabled. Upon receiving a valid READ command, a shift chain attached to the FICLK that is currently low begins counting the clock cycles. This eventually determines when the FICLK that is currently low can be enabled. The final enable is dependent upon the turning off the FICLK that is currently high. The FICLK that is enabled during the reset turns off a fixed delay after the falling edge of the YCLK associated with the READ command.||11-27-2008|
|20080278211||USE OF MULTIPLE VOLTAGE CONTROLLED DELAY LINES FOR PRECISE ALIGNMENT AND DUTY CYCLE CONTROL OF THE DATA OUTPUT OF A DDR MEMORY DEVICE - A DLL circuit uses a rising edge DLL to align the rising edge of the output data to the system clock and a falling edge DLL to align the falling edge of the output data. The DLL circuit does not use the falling edge of the input clock to provide a reference for the falling edge DLL. The DLL circuit uses the rising edge of a first reference clock (a buffered version of the input clock) to align the rising edge of the output data. An additional DLL is used to generate a precise second reference clock that is delayed by exactly one-half period of the first reference clock to align the falling edge of the output data. Any variation in the duty cycle of the input clock or the input clock buffer does not effect the duty cycle of the output data.||11-13-2008|
Patent applications by ProMOS Technologies PTE.LTD.