PROCESS METRIX Patent applications |
Patent application number | Title | Published |
20130120738 | Apparatus, Process, and System for Monitoring the Integrity of Containers - Apparatuses, systems, and methods to monitor the integrity of a container protected by a refractory material are disclosed having a first radiation detector to measure an external surface temperature of the container, a first radiation source to measure a thickness of the refractory material, and a central controller configured to display to a user the measurement of the external surface temperature of the container and the measurement of the thickness of the refractory material. | 05-16-2013 |
20100277733 | LASER-BASED APPARATUS AND METHOD FOR MEASURING AGGLOMERATE CONCENTRATION AND MEAN AGGLOMERATE SIZE - Apparatuses, methods, and systems for measuring mean particle size and concentration of a polydispersion of agglomerates are disclosed. In one embodiment, the apparatuses include a light source; a focusing lens to form a probe volume; a first light detector positioned at a first angular position from the beam of light; and a second light detector positioned at a second angular position from the first direction of the beam of light, the mean particle size and concentration being determined using nearly invariant functions of a ratio of the light scattered measured by the first and second detectors. | 11-04-2010 |
20090079981 | LASER-BASED APPARATUS AND METHOD FOR MEASURING AGGLOMERATE CONCENTRATION AND MEAN AGGLOMERATE SIZE - Apparatuses, methods, and systems for measuring mean particle size and concentration of a polydispersion of agglomerates are disclosed. In one embodiment, the apparatuses include a light source; a focusing lens to form a probe volume; a first light detector positioned at a first angular position from the beam of light; and a second light detector positioned at a second angular position from the first direction of the beam of light, the mean particle size and concentration being determined using nearly invariant functions of a ratio of the light scattered measured by the first and second detectors. | 03-26-2009 |