POWER PROBE, INC. Patent applications |
Patent application number | Title | Published |
20160131316 | MODULAR ILLUMINATION SYSTEM - An apparatus and a method are provided for a smart modular illumination system configured to orient and illuminate a plurality of illumination nodes toward a moving object within a target area. The system comprises a controller that signals the illumination nodes when a motion detector observes movement within the target area. The controller refrains from signaling the illumination nodes when ambient light within the target area exceeds a predetermined value. An adjustable mounting member coupled with each of the illumination nodes orients the illumination nodes according to signals received from the controller. The smart modular illumination system is configured to adjust the orientation and brightness of all of the illumination nodes so as to cast light on the moving object from a variety of angles with a reduced occurrence of shadows. | 05-12-2016 |
20150241489 | Electrical Test Device And Method - An electrical test device may include a power supply, a conductive probe element, and a spectral analysis block. The power supply may be connected to an external power source. The conductive probe element may be connected to the power supply and may be configured to be energized by the power supply. The probe element may be configured to be placed in contact with an electrical system under test and apply an input signal containing current for measuring at least one parameter of the electrical system. The spectral analysis block may be connected to the probe element and may be configured to receive an output signal from the electrical system in response to the application of the current to the electrical system. The spectral analysis block may be configured to analyze frequency spectra of the output signal and detect a broadband increase in energy of the frequency spectra above a predetermined energy threshold. The broadband increase in energy may be representative of the occurrence of arcing in the electrical system. | 08-27-2015 |
20140184260 | CONDUCTIVE TEST PROBE - A conductive probe may include a probe body for communicating with a circuit tester or a jumper. The probe body may be formed of metal and may have a free end. A probe tip may be mounted to the end of the probe body. The probe tip may be formed of thorium-tungsten. The probe tip may be configured for contacting a circuit node. | 07-03-2014 |
20130221973 | ELECTRICAL TEST DEVICE AND METHOD - An electrical test device may include a power supply, a conductive probe element, and a spectral analysis block. The conductive probe element may be energized by a power supply. The probe element may be placed in contact with an electrical system under test and apply an input signal containing current for measuring at least one parameter of the electrical system. The spectral analysis block may be connected to the probe element and may receive an output signal from the electrical system in response to the application of the current to the electrical system. The spectral analysis block may analyze frequency spectra of the output signal and detect a broadband increase in energy of the frequency spectra above a predetermined energy threshold. The broadband increase in energy may be representative of the occurrence of arcing in the electrical system. | 08-29-2013 |