| POLYTEC GMBH Patent applications |
| Patent application number | Title | Published |
|---|
| 20110096325 | METHOD AND DEVICE FOR THE SPECTROMETRIC MEASUREMENT OF A MATERIAL FLOW MOVING IN THE LONGITUDINAL DIRECTION - A method for the spectrometric measurement of a material flow moving in the longitudinal direction, that includes illumination of an illumination area ( | 04-28-2011 |
| 20110090508 | DEVICE AND METHOD FOR INTERFEROMETRIC VIBRATION MEASUREMENT OF AN OBJECT - A device for interferometric vibration measurement on an object ( | 04-21-2011 |
| 20100201990 | INTERFEROMETER FOR OPTICALLY MEASURING AN OBJECT - An interferometer for optically measuring an object ( | 08-12-2010 |
| 20090251706 | VIBROMETER AND METHOD FOR OPTICALLY MEASURING AN OBJECT - A vibrometer and a method for optically measuring oscillations at an object, including a radiation source for creating a source beam, a beam splitter to split the source beam into a measuring beam and a reference beam, an optic interference device for interfering the reference beam with a measuring beam, at least partially reflected by the object, and a detector, with the interference device and the detector being embodied cooperating such that a measuring beam, at least partially deflected by the object, and the reference beam interfere on the detector. The vibrometer is embodied as a heterodyne vibrometer, having an optic frequency shift unit, which is arranged in the optical path of the vibrometer, to form a carrier frequency by creating a frequency difference between the measuring beam and the reference beam. The beam splitter and the frequency shift unit are embodied as an acousto-optic modulator in an optic construction element to deflect the source beam, with the acousto-optic modulator being embodied such that the source beam entering the acousto-optic modulator can be split into at least two diffraction beams: a first diffraction beam of diffraction order of 1 and a second diffraction beam of diffraction order of −1, and the acousto-optic modulator is arranged in the optical path of the vibrometer such that one of the two diffraction beams represents the measurement beam and the other diffraction beam represents the reference beam. | 10-08-2009 |
| 20080304075 | INTERFEROMETER FOR OPTICALLY MEASURING AN OBJECT - An interferometer for optically measuring an object ( | 12-11-2008 |
| 20080291466 | METHOD AND DEVICE FOR NON-CONTACT OSCILLATION MEASUREMENTS - A method and a device to measure oscillations of an object. The method includes the processing steps: Determining at least one point of the object to be measured, moving at least one laser interferometer fastened on a carrier into a measuring position for measuring the measuring point on the object, emitting at least one measuring beam of the laser interferometer to at least one measuring point on the object, detecting the measuring beam reflected by the object, determining the oscillation data from the emitted and reflected measuring beam, allocating the oscillation data to the measuring point, as well as evaluating the oscillation data and displaying the oscillation data of the measuring point, with at least one comparison of a position of the laser interferometer being performed using at least one position of a known freely predetermined point on the object and a transformation rule being prepared to determine the position of the laser interferometer in reference to the object for arbitrary measuring positions based on the comparison. The device for measuring oscillations includes at least one laser interferometer with a measuring beam emitter and a detector for the measuring beam reflected by the object, a movably arranged carrier on which the laser interferometer is mounted, a control unit to control the carrier arranged in a mobile fashion, as well as a data collection and processing device to record and process oscillation data cooperating with the emitter and detector and with the carrier. A device is provided to calculate measuring positions of the laser interferometer, with the calculation of the measuring positions comprising a direct or indirect comparison of the position of a known point on the object to the position of the laser interferometer. | 11-27-2008 |
| 20080285049 | DEVICE FOR OPTICALLY MEASURING AN OBJECT - A device for the optic measuring of an object ( | 11-20-2008 |
