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PINTAIL TECHNOLOGIES, INC.

PINTAIL TECHNOLOGIES, INC. Patent applications
Patent application numberTitlePublished
20080256406Testing System - There is provided an improved testing system. More specifically, in one embodiment, there is provided a method including accessing machine overall equipment effectiveness or efficiency (OEE) data including machine generated operational event states of an automated testing (ATE) system and times the machine generated operational event states occurred, receiving operator OEE data including operator entered operational event states of the ATE and times the operator observed operational event states, and combining the machine OEE data and the operator OEE data to generate merge OEE data.10-16-2008