Inventors list

Assignees list

Classification tree browser

Top 100 Inventors

Top 100 Assignees


PARTICLE MEASURING SYSTEMS, INC.

PARTICLE MEASURING SYSTEMS, INC. Patent applications
Patent application numberTitlePublished
20120012757Non-Orthogonal Particle Detection Systems and Methods - Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.01-19-2012
20110155927Non-Orthogonal Particle Detection Systems and Methods - Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.06-30-2011
20090268202Particle Counter with Laser Diode - A liquid particle counter for optically detecting an unconstrained particle suspended in a flowing liquid includes a sample chamber having a liquid inlet and a liquid outlet; a laser diode module producing a symmetrically collimated laser beam; a beam shaping optical system directing the laser beam at the sample chamber; and an optical detector located to detect light scattered by the particle in the sample chamber, the detector producing an electric signal characteristic of a parameter of the particle. The laser beam has an energy of a watt or more and passed through an aperture in a black glass aperture element in the sample chamber. The black glass aperture element removes diffracted and stray light from the beam without damage to the sample chamber.10-29-2009
20090190128Particle Counter With Improved Image Sensor Array - A particle counter for optically detecting an unconstrained particle of less than one micron in size suspended in a flowing liquid includes a sample chamber having a fluid inlet and a fluid outlet; a laser module producing a laser beam; a beam shaping optical system providing a multiple laser beam pattern in the sample chamber; and a CMOS optical detector located to detect light scattered by the particles in the sample chamber. The particle counter has a particle sensing area within the sample chamber in which the intensity of light is at least 10 Watts/mm07-30-2009
20090128810SYSTEM AND METHOD FOR CALIBRATION VERIFICATION OF AN OPTICAL PARTICLE COUNTER - Described herein is a portable, low power consuming optical particle counter calibration verification system and reliable and sensitive methods for verifying the calibration status of a gas or liquid particle counter. The calibration verification systems described herein are useful for quickly determining the calibration status of an optical particle counter at its point of use, as well as for allowing the end user to determine if an optical particle counter is in need of a recalibration before the recommended calibration schedule suggests.05-21-2009

Patent applications by PARTICLE MEASURING SYSTEMS, INC.