PARTICLE MEASURING SYSTEMS, INC.
|PARTICLE MEASURING SYSTEMS, INC. Patent applications|
|Patent application number||Title||Published|
|20120222495||FLOW MONITORED PARTICLE SENSOR - Provided are devices and methods for monitoring flow rate in aerosol particle counters. The particle sensor has a particle counter, a flow measurement orifice comprising a differential pressure sensor for measuring differential pressure (DP) across the flow measurement orifice during particle sensor operation and a critical flow orifice. A vacuum source pulls ambient gas through each of the particle counter, flow measurement orifice and critical flow orifice. An atmospheric pressure sensor measures atmospheric pressure (AP) and a bench pressure sensor measures pressure in the particle sensor (BP). The output from the sensors is used to identify a flow condition, such as by a monitor operably connected to each of the differential pressure sensor, atmospheric pressure sensor and bench pressure sensor. In this manner, deviation in flow rate from a target flow rate is readily monitored without the need for expensive sensors or other flow-controlling components.||09-06-2012|
|20120140223||Two-Dimensional Optical Imaging Methods and Systems for Particle Detection - The present invention provides methods and systems for particle detection and analysis using two-dimensional optical imaging to access enhanced detection sensitivity and expanded sensing functionality relative to conventional point and array detection-based optical particle counters. Methods and systems of the present invention provide a two-dimensional optical imaging-based particle sensing platform wherein system components and specifications are selected to generate reproducible and readily identifiable signals, including particle detection signatures, from optical scattering or emission from particles provided to the system. Systems and methods of the present invention are capable of accurately and sensitively detecting, identifying, and characterizing (e.g., determining the size of) particles in liquid phase or gas phase samples.||06-07-2012|
|20120012757||Non-Orthogonal Particle Detection Systems and Methods - Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.||01-19-2012|
|20110155927||Non-Orthogonal Particle Detection Systems and Methods - Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.||06-30-2011|
|20090268202||Particle Counter with Laser Diode - A liquid particle counter for optically detecting an unconstrained particle suspended in a flowing liquid includes a sample chamber having a liquid inlet and a liquid outlet; a laser diode module producing a symmetrically collimated laser beam; a beam shaping optical system directing the laser beam at the sample chamber; and an optical detector located to detect light scattered by the particle in the sample chamber, the detector producing an electric signal characteristic of a parameter of the particle. The laser beam has an energy of a watt or more and passed through an aperture in a black glass aperture element in the sample chamber. The black glass aperture element removes diffracted and stray light from the beam without damage to the sample chamber.||10-29-2009|
|20090190128||Particle Counter With Improved Image Sensor Array - A particle counter for optically detecting an unconstrained particle of less than one micron in size suspended in a flowing liquid includes a sample chamber having a fluid inlet and a fluid outlet; a laser module producing a laser beam; a beam shaping optical system providing a multiple laser beam pattern in the sample chamber; and a CMOS optical detector located to detect light scattered by the particles in the sample chamber. The particle counter has a particle sensing area within the sample chamber in which the intensity of light is at least 10 Watts/mm||07-30-2009|
|20090128810||SYSTEM AND METHOD FOR CALIBRATION VERIFICATION OF AN OPTICAL PARTICLE COUNTER - Described herein is a portable, low power consuming optical particle counter calibration verification system and reliable and sensitive methods for verifying the calibration status of a gas or liquid particle counter. The calibration verification systems described herein are useful for quickly determining the calibration status of an optical particle counter at its point of use, as well as for allowing the end user to determine if an optical particle counter is in need of a recalibration before the recommended calibration schedule suggests.||05-21-2009|
Patent applications by PARTICLE MEASURING SYSTEMS, INC.