| Otsuka Electronics Co., Ltd. Patent applications |
| Patent application number | Title | Published |
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| 20120075628 | OPTICAL CHARACTERISTIC MEASUREMENT DEVICE AND OPTICAL CHARACTERISTIC MEASUREMENT METHOD SUITABLE FOR SPECTRUM MEASUREMENT - An optical characteristic measurement device includes a photodetector and a processor. The photodetector has a detection surface greater than a light incident surface receiving light from a spectrometer. The processor is configured to obtain a measurement spectrum detected in a first detection area corresponding to the light incident surface and a signal intensity detected in a second detection area different from the light incident surface, correct a pattern prepared in advance and exhibiting a noise characteristic of the photodetector based on the signal intensity to calculate a first correction spectrum, subtract a correction value calculated based on the signal intensity from each component value of the measurement spectrum to calculate a second correction spectrum, and subtract each component value of the first correction spectrum from a corresponding component value of the second correction spectrum to calculate an output spectrum. | 03-29-2012 |
| 20120019831 | OPTICAL MEASUREMENT APPARATUS - An optical measurement apparatus using an optical fiber to measure the characteristic of an object to be measured arranged along the circumference of a circle includes a first pulley, a second pulley which is turnable on its own axis at a second angular velocity while revolving about the first pulley at a first angular velocity, and the optical fiber which is held by the second pulley and projects detection light on the object to be measured and receives reflected light from the object to be measured. The first angular velocity and the second angular velocity are the same in magnitude and opposite in the direction. Occurrence of a twist in the optical fiber is suppressed, and therefore, the optical measurement apparatus is capable of measuring the characteristics of the object to be measured with high accuracy. | 01-26-2012 |
| 20120018280 | TRANSFERRED OBJECT ROTATING DEVICE - A transferred object rotating device includes a mounting plate having an opening corresponding to a shape of a transferred object and being capable of moving from a mounting position to a rotating position, a boost unit capable of moving up to pass through the opening of the mounting plate in the rotating position, and a rotation plate capable of rotating about a power transmission shaft. The mounting plate moves to the rotating position after the transferred object is mounted on the mounting plate to close the opening. The transferred object is lifted by upward movement of the boost unit. The transferred object rotates while being sandwiched between the boost unit and the rotation plate. The transferred object mounted on the mounting plate in the mounting position can be transferred to the rotating position by the mounting plate, and rotate in the rotating position. | 01-26-2012 |
| 20110235036 | OPTICAL MEASUREMENT APPARATUS, OPTICAL MEASUREMENT SYSTEM, AND FIBER COUPLER - An optical measurement apparatus includes a spectroscopic measurement device, a first optical fiber for propagating light to be measured, a hemispherical portion having a light diffuse reflection layer on an inner wall of the hemispherical portion, and a plane portion disposed to close an opening of the hemispherical portion and having a mirror reflection layer located to face the inner wall of the hemispherical portion. The plane portion includes a first window for directing the light emitted thorough the first optical fiber into an integrating space. The integrating space is formed by the hemispherical portion and the plane portion. The optical measurement apparatus further includes a second optical fiber for propagating the light in the integrating space to the spectroscopic measurement device through a second window of the plane portion. | 09-29-2011 |
| 20110226961 | QUANTUM EFFICIENCY MEASUREMENT METHOD, QUANTUM EFFICIENCY MEASUREMENT APPARATUS, AND INTEGRATOR - A quantum efficiency measurement method includes the steps of: disposing a sample at a predetermined position in an integrator having an integrating space; applying excitation light to the sample and measuring a spectrum in the integrating space as a first spectrum through a second window; configuring an excitation light incident portion so that excitation light after having passed through the sample is not reflected in the integrating space; applying the excitation light to the sample and measuring a spectrum in the integrating space as a second spectrum through the second window; and calculating a quantum efficiency of the sample based on a component constituting a part of the first spectrum and corresponding to a wavelength range of the excitation light, and a component constituting a part of the second spectrum and corresponding to a wavelength range of light generated by the sample from the received excitation light. | 09-22-2011 |
| 20110205541 | OPTICAL MEASUREMENT APPARATUS INCLUDING HEMISPHERICAL OPTICAL INTEGRATOR - An optical measurement apparatus includes a hemispherical portion having a diffuse reflection layer on an inner wall, and a plane portion disposed to involve a substantial center of curvature of the hemispherical portion and close an opening of the hemispherical portion, and having a reflection layer on an inner surface side of the hemispherical portion. The plane portion includes: at least one of a window for introducing light to be homogenized in an integrating space formed between the hemispherical portion and the plane portion, and a window for extracting light homogenized in the integrating space; an outer portion formed of a first material chiefly causing specular reflection, and occupying at least a region of a predetermined width from an outermost circumference; and an inner portion formed of a second material chiefly causing diffuse reflection and having a higher reflectance for at least an ultraviolet region than the first material. | 08-25-2011 |
| 20100296082 | APPARATUS AND METHOD FOR MEASURING TOTAL LUMINOUS FLUX - In a total luminous flux measurement apparatus according to an embodiment, a total luminous flux emitted by an object is calculated based on a result of measuring illuminances using a measuring unit when providing relative movement between the object and an integrating unit to expose a substantially entire light emitting surface of the object to an inner space of the integrating unit. Specifically, under conditions that the object is disposed to penetrate the integrating unit from one sample hole to the other sample hole, a luminous flux of a portion of the object within the inner space of the integrating unit is measured, then the integrating unit is moved relative to the object, and a luminous flux of a portion accordingly contained in the inner space of the integrating unit is measured. | 11-25-2010 |
| 20100091280 | OPTICAL CHARACTERISTIC MEASUREMENT DEVICE AND OPTICAL CHARACTERISTIC MEASUREMENT METHOD SUITABLE FOR SPECTRUM MEASUREMENT - A processing unit obtains a first spectrum detected in a first detection area and a first signal intensity detected in a second detection area after the light entering the housing is cut off, and then calculates a first correction spectrum by subtracting a first correction value calculated based on the first signal intensity from each component value of the first spectrum. The processing unit obtains a second spectrum detected in the first detection area and a second signal intensity detected in the second detection area while a cut-off portion is opened, and then calculates a second correction spectrum by subtracting a second correction value calculated based on the second signal intensity from each component value of the second spectrum. The processing unit calculates an output spectrum representing a measurement result by subtracting a corresponding component value of the first correction spectrum from each component value of the second correction spectrum. | 04-15-2010 |
| 20090109428 | Integrating Photometer for Measuring Total Flux of Light Generated from Light Source to be Measured, and Method for Measuring Total Flux of Light through Use of the Same - A mirror is provided with a light source window and an illumination window each establishing communicative connection between an inner face side and an outer side of a hemispherical unit. The light source window is an opening to which a light source OBJ to be measured is attached mainly. The illumination window is an opening for guiding a flux of light from a correcting light source used for measurement of self-absorption toward the inner face of the hemispherical unit. A self-absorption correcting coefficient of the light source OBJ is calculated based on an illuminance by a correcting flux of light in a case where the light source to be measured OBJ in a non-light emitting state is attached to the light source window and an illuminance by a correcting flux of light in a case where a calibration mirror is attached to the light source window. | 04-30-2009 |
| 20080285026 | OPTICAL CHARACTERISTIC MEASURING APPARATUS AND MEASURING METHOD USING LIGHT REFLECTED FROM OBJECT TO BE MEASURED - A measurement-purpose light source generates a measurement light used for measuring an optical characteristic of an object to be measured, and the measurement light includes a component in a wavelength range for measurement of the optical characteristic of the object. An observation-purpose light source generates an observation light used for focusing on the object to be measured and checking a position of measurement. The observation light is selected such that the observation light includes a component that can be reflected from the object to be measured. The measurement light and the observation light are thus applied independently to the object to be measured, through a common objective lens, and accordingly improvement of the precision in measurement of the optical characteristic and facilitation of focusing on the object to be measured are achieved simultaneously. | 11-20-2008 |
| 20080283723 | OPTICAL CHARACTERISTIC MEASURING APPARATUS USING LIGHT REFLECTED FROM OBJECT TO BE MEASURED AND FOCUS ADJUSTING METHOD THEREFOR - An observation light generated by an observation-purpose light source has a beam cross section where the light intensity (light quantity) is substantially uniform. A mask portion masks a part of the observation light so that the light intensity of a region corresponding to a reticle image at the beam cross section is substantially zero. The observation light including a shadow region formed corresponding to the reticle image is reflected from a beam splitter and applied to an object to be measured. Based on the contrast (difference between light and dark parts) of a reflected image corresponding to the reticle image projected on the object to be measured, the focus state of the measurement light on the object to be measured is determined. | 11-20-2008 |
