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OPTOPOL TECNOLOGY S.A.

OPTOPOL TECNOLOGY S.A. Patent applications
Patent application numberTitlePublished
20110164791METHOD AND APPARATUS FOR IMAGING OF SEMI-TRANSPARENT MATTER - The invention relates to a method and apparatus for measuring the spatial and velocity distribution of scattering structures of a sample in semi-transparent matter. The acquired spectral data I(k, t) are transformed in two steps to image data I(z, v). A Doppler shift is imposed on the light to a separate real and mirror images in the v space to suppress the complex ambiguity artifact.07-07-2011